JP6775818B2 - Ｘ線検査装置 - Google Patents

Ｘ線検査装置 Download PDF

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Publication number
JP6775818B2
JP6775818B2 JP2016161458A JP2016161458A JP6775818B2 JP 6775818 B2 JP6775818 B2 JP 6775818B2 JP 2016161458 A JP2016161458 A JP 2016161458A JP 2016161458 A JP2016161458 A JP 2016161458A JP 6775818 B2 JP6775818 B2 JP 6775818B2
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Japan
Prior art keywords
ray
unit
output
irradiation
control
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JP2016161458A
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English (en)
Japanese (ja)
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JP2018028514A (ja
JP2018028514A5 (enExample
Inventor
一幸 杉本
一幸 杉本
栖原　一浩
一浩 栖原
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Ishida Co Ltd
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Ishida Co Ltd
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Publication date
Priority to JP2016161458A priority Critical patent/JP6775818B2/ja
Application filed by Ishida Co Ltd filed Critical Ishida Co Ltd
Priority to US16/326,547 priority patent/US10422757B2/en
Priority to PCT/JP2017/028304 priority patent/WO2018034170A1/ja
Priority to EP17841395.1A priority patent/EP3502673B1/en
Priority to KR1020197006565A priority patent/KR102012291B1/ko
Priority to CN201780049923.8A priority patent/CN109564175A/zh
Publication of JP2018028514A publication Critical patent/JP2018028514A/ja
Publication of JP2018028514A5 publication Critical patent/JP2018028514A5/ja
Application granted granted Critical
Publication of JP6775818B2 publication Critical patent/JP6775818B2/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/043—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/10—Power supply arrangements for feeding the X-ray tube
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • H05G1/30—Controlling
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • H05G1/30—Controlling
    • H05G1/36—Temperature of anode; Brightness of image power
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/303—Accessories, mechanical or electrical features calibrating, standardising
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10116—X-ray image

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  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Chemical & Material Sciences (AREA)
  • Toxicology (AREA)
  • Multimedia (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
JP2016161458A 2016-08-19 2016-08-19 Ｘ線検査装置 Active JP6775818B2 (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2016161458A JP6775818B2 (ja) 2016-08-19 2016-08-19 Ｘ線検査装置
PCT/JP2017/028304 WO2018034170A1 (ja) 2016-08-19 2017-08-03 Ｘ線検査装置
EP17841395.1A EP3502673B1 (en) 2016-08-19 2017-08-03 X-ray inspection device
KR1020197006565A KR102012291B1 (ko) 2016-08-19 2017-08-03 X선 검사 장치
US16/326,547 US10422757B2 (en) 2016-08-19 2017-08-03 X-ray inspection device
CN201780049923.8A CN109564175A (zh) 2016-08-19 2017-08-03 X射线检查装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2016161458A JP6775818B2 (ja) 2016-08-19 2016-08-19 Ｘ線検査装置

Publications (3)

Publication Number Publication Date
JP2018028514A JP2018028514A (ja) 2018-02-22
JP2018028514A5 JP2018028514A5 (enExample) 2019-09-26
JP6775818B2 true JP6775818B2 (ja) 2020-10-28

Family

ID=61197405

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016161458A Active JP6775818B2 (ja) 2016-08-19 2016-08-19 Ｘ線検査装置

Country Status (6)

Country Link
US (1) US10422757B2 (enExample)
EP (1) EP3502673B1 (enExample)
JP (1) JP6775818B2 (enExample)
KR (1) KR102012291B1 (enExample)
CN (1) CN109564175A (enExample)
WO (1) WO2018034170A1 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6717784B2 (ja) * 2017-06-30 2020-07-08 アンリツインフィビス株式会社 物品検査装置およびその校正方法
JP6752941B1 (ja) 2019-06-17 2020-09-09 Ckd株式会社 検査装置、包装体製造装置及び包装体製造方法
BR112022001264A2 (pt) * 2019-08-22 2022-03-15 John Bean Technologies Corp Módulos de tecnologia de unidade de raios-x e treinamento automatizado de aplicação
JP7411984B2 (ja) * 2019-09-24 2024-01-12 株式会社イシダ 検査装置
JP7321523B2 (ja) * 2019-11-20 2023-08-07 株式会社日立ハイテクサイエンス Ｘ線検査装置及びｘ線検査方法
JP2024129940A (ja) * 2023-03-14 2024-09-30 株式会社イシダ Ｘ線検査装置及びｘ線検査装置の感度補正方法

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3387760B2 (ja) * 1996-12-25 2003-03-17 株式会社日立メディコ Ｘ線荷物検査装置
JP4075166B2 (ja) 1998-11-30 2008-04-16 松下電器産業株式会社 Ｘ線基板検査装置
JP2001004560A (ja) 1999-06-16 2001-01-12 Shimadzu Corp Ｘ線検査装置
CN1331022C (zh) * 2000-03-31 2007-08-08 皇家菲利浦电子有限公司 用于获取辐射图像的系统和方法
JP3989777B2 (ja) * 2002-06-18 2007-10-10 東芝Ｉｔコントロールシステム株式会社 Ｘ線透視検査装置
JP2007132796A (ja) * 2005-11-10 2007-05-31 Ishida Co Ltd Ｘ線検査装置およびｘ線検査プログラム
JP2009080053A (ja) * 2007-09-27 2009-04-16 Hitachi Ltd Ｘ線ｃｔ装置，ｘ線ｃｔ装置のｘ線検出方法，ｘ線センサ信号処理システム、及びｘ線センサ信号処理方法
JP5416426B2 (ja) 2009-02-03 2014-02-12 富士フイルム株式会社 放射線画像撮影装置
JP5505416B2 (ja) * 2009-08-07 2014-05-28 コニカミノルタ株式会社 放射線画像撮影装置
JP5466560B2 (ja) * 2010-03-30 2014-04-09 アンリツ産機システム株式会社 Ｘ線検査装置およびその動作方法
JP2012198074A (ja) * 2011-03-18 2012-10-18 Ishida Co Ltd Ｘ線異物検査装置
JP5706269B2 (ja) * 2011-08-16 2015-04-22 富士フイルム株式会社 放射線撮影システムの線量情報共有化装置および方法
JP5860710B2 (ja) * 2012-02-02 2016-02-16 アンリツインフィビス株式会社 Ｘ線検査装置
JP6138715B2 (ja) * 2014-03-07 2017-05-31 富士フイルム株式会社 放射線画像撮影システム、放射線画像撮影システムの制御方法、及び放射線画像撮影システムの制御プログラム
JP6412340B2 (ja) 2014-05-20 2018-10-24 株式会社堀場製作所 分析装置及び校正方法
JP2016080593A (ja) * 2014-10-20 2016-05-16 株式会社東芝 放射線検査方法および放射線検査システム

Also Published As

Publication number Publication date
EP3502673B1 (en) 2021-10-06
CN109564175A (zh) 2019-04-02
KR102012291B1 (ko) 2019-08-20
JP2018028514A (ja) 2018-02-22
US10422757B2 (en) 2019-09-24
EP3502673A4 (en) 2020-05-20
KR20190027940A (ko) 2019-03-15
WO2018034170A1 (ja) 2018-02-22
US20190212280A1 (en) 2019-07-11
EP3502673A1 (en) 2019-06-26

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