JP6760638B2 - 平面研磨装置 - Google Patents
平面研磨装置 Download PDFInfo
- Publication number
- JP6760638B2 JP6760638B2 JP2016081116A JP2016081116A JP6760638B2 JP 6760638 B2 JP6760638 B2 JP 6760638B2 JP 2016081116 A JP2016081116 A JP 2016081116A JP 2016081116 A JP2016081116 A JP 2016081116A JP 6760638 B2 JP6760638 B2 JP 6760638B2
- Authority
- JP
- Japan
- Prior art keywords
- thickness
- work
- carrier
- surface plate
- thickness measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000005498 polishing Methods 0.000 title claims description 55
- 239000000463 material Substances 0.000 claims description 13
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- 238000005259 measurement Methods 0.000 description 25
- 230000003028 elevating effect Effects 0.000 description 13
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- 239000011521 glass Substances 0.000 description 8
- 239000013307 optical fiber Substances 0.000 description 7
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- 239000002002 slurry Substances 0.000 description 4
- 239000000969 carrier Substances 0.000 description 3
- 230000002093 peripheral effect Effects 0.000 description 3
- 239000010980 sapphire Substances 0.000 description 3
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- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
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- 229920000139 polyethylene terephthalate Polymers 0.000 description 2
- 239000005020 polyethylene terephthalate Substances 0.000 description 2
- 239000000523 sample Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 229920003002 synthetic resin Polymers 0.000 description 2
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- 238000005406 washing Methods 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 229920000178 Acrylic resin Polymers 0.000 description 1
- 239000004925 Acrylic resin Substances 0.000 description 1
- 239000004593 Epoxy Substances 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
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- 239000000919 ceramic Substances 0.000 description 1
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- 229920005668 polycarbonate resin Polymers 0.000 description 1
- 239000004431 polycarbonate resin Substances 0.000 description 1
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Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/07—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
- B24B37/08—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for double side lapping
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/28—Work carriers for double side lapping of plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/34—Accessories
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/02—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation according to the instantaneous size and required size of the workpiece acted upon, the measuring or gauging being continuous or intermittent
- B24B49/04—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation according to the instantaneous size and required size of the workpiece acted upon, the measuring or gauging being continuous or intermittent involving measurement of the workpiece at the place of grinding during grinding operation
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/12—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation involving optical means
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B57/00—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents
- B24B57/02—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents for feeding of fluid, sprayed, pulverised, or liquefied grinding, polishing or lapping agents
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
- B24B7/20—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground
- B24B7/22—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain
- B24B7/228—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain for grinding thin, brittle parts, e.g. semiconductors, wafers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
- B24B7/20—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground
- B24B7/22—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain
- B24B7/24—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain for grinding or polishing glass
- B24B7/242—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain for grinding or polishing glass for plate glass
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/30625—With simultaneous mechanical treatment, e.g. mechanico-chemical polishing
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Inorganic Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016081116A JP6760638B2 (ja) | 2016-04-14 | 2016-04-14 | 平面研磨装置 |
KR1020170045067A KR102315142B1 (ko) | 2016-04-14 | 2017-04-07 | 평면 연마 장치 |
CN201710228022.7A CN107297678A (zh) | 2016-04-14 | 2017-04-10 | 平面研磨装置 |
TW106112056A TWI704613B (zh) | 2016-04-14 | 2017-04-11 | 平面研磨裝置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016081116A JP6760638B2 (ja) | 2016-04-14 | 2016-04-14 | 平面研磨装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2017189849A JP2017189849A (ja) | 2017-10-19 |
JP2017189849A5 JP2017189849A5 (zh) | 2019-05-16 |
JP6760638B2 true JP6760638B2 (ja) | 2020-09-23 |
Family
ID=60085360
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2016081116A Active JP6760638B2 (ja) | 2016-04-14 | 2016-04-14 | 平面研磨装置 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP6760638B2 (zh) |
KR (1) | KR102315142B1 (zh) |
CN (1) | CN107297678A (zh) |
TW (1) | TWI704613B (zh) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7046358B2 (ja) * | 2018-04-17 | 2022-04-04 | スピードファム株式会社 | 研磨装置 |
CN110193775B (zh) * | 2019-03-12 | 2021-09-17 | 上海新昇半导体科技有限公司 | 化学机械抛光方法以及化学抛光系统 |
JP2021102245A (ja) * | 2019-12-25 | 2021-07-15 | スピードファム株式会社 | ワークホール検出装置及びワークホール検出方法 |
JP7435113B2 (ja) * | 2020-03-23 | 2024-02-21 | 株式会社Sumco | ワークの両面研磨装置 |
CN113245973B (zh) * | 2021-06-08 | 2022-07-22 | 唐山国芯晶源电子有限公司 | 一种石英晶片抛光游轮修磨厚度检测方法 |
IT202100022463A1 (it) | 2021-08-27 | 2023-02-27 | Biesse Spa | Metodo per controllare la lavorazione di pannelli di forma sostanzialmente parallelepipeda e macchina per la lavorazione di pannelli di forma sostanzialmente parallelepipeda, in particolare macchina levigatrice per la levigatura/satinatura di pannelli di legno, metallo, o simili |
JP7296161B1 (ja) * | 2022-06-27 | 2023-06-22 | 不二越機械工業株式会社 | 両面研磨装置 |
CN117359435B (zh) * | 2023-12-05 | 2024-03-05 | 福建荣德光电科技有限公司 | 一种光学镜片加工用的数控平面精密铣磨机 |
CN117583975B (zh) * | 2024-01-18 | 2024-03-19 | 山西日盛达太阳能科技股份有限公司 | 一种光伏玻璃抛光装置 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0740233A (ja) * | 1993-07-27 | 1995-02-10 | Speedfam Co Ltd | ワークの厚さ測定装置 |
JP2888339B1 (ja) * | 1998-03-27 | 1999-05-10 | 直江津電子工業株式会社 | 被加工物保持プレート |
JP4324933B2 (ja) | 2000-08-23 | 2009-09-02 | Sumco Techxiv株式会社 | 平面研磨装置 |
JP4202841B2 (ja) * | 2003-06-30 | 2008-12-24 | 株式会社Sumco | 表面研磨装置 |
JP2008227393A (ja) * | 2007-03-15 | 2008-09-25 | Fujikoshi Mach Corp | ウェーハの両面研磨装置 |
JP2010023167A (ja) * | 2008-07-18 | 2010-02-04 | Epson Toyocom Corp | 砥粒加工装置およびそれを用いた砥粒加工方法 |
JP4955624B2 (ja) * | 2008-07-31 | 2012-06-20 | 信越半導体株式会社 | 両面研磨装置 |
KR20100079199A (ko) * | 2008-12-30 | 2010-07-08 | 주식회사 동부하이텍 | 화학적 기계 연마 장치 및 방법 |
US20120276662A1 (en) * | 2011-04-27 | 2012-11-01 | Iravani Hassan G | Eddy current monitoring of metal features |
JP5917994B2 (ja) * | 2012-04-23 | 2016-05-18 | スピードファム株式会社 | 研磨装置の計測用窓構造 |
JP6146213B2 (ja) * | 2013-08-30 | 2017-06-14 | 株式会社Sumco | ワークの両面研磨装置及び両面研磨方法 |
JP6622117B2 (ja) * | 2016-03-08 | 2019-12-18 | スピードファム株式会社 | 平面研磨装置及びキャリア |
-
2016
- 2016-04-14 JP JP2016081116A patent/JP6760638B2/ja active Active
-
2017
- 2017-04-07 KR KR1020170045067A patent/KR102315142B1/ko active IP Right Grant
- 2017-04-10 CN CN201710228022.7A patent/CN107297678A/zh active Pending
- 2017-04-11 TW TW106112056A patent/TWI704613B/zh active
Also Published As
Publication number | Publication date |
---|---|
TWI704613B (zh) | 2020-09-11 |
JP2017189849A (ja) | 2017-10-19 |
KR102315142B1 (ko) | 2021-10-20 |
CN107297678A (zh) | 2017-10-27 |
TW201737336A (zh) | 2017-10-16 |
KR20170117878A (ko) | 2017-10-24 |
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