JP6707477B2 - コンパレータ - Google Patents

コンパレータ Download PDF

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Publication number
JP6707477B2
JP6707477B2 JP2017020663A JP2017020663A JP6707477B2 JP 6707477 B2 JP6707477 B2 JP 6707477B2 JP 2017020663 A JP2017020663 A JP 2017020663A JP 2017020663 A JP2017020663 A JP 2017020663A JP 6707477 B2 JP6707477 B2 JP 6707477B2
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JP
Japan
Prior art keywords
signal
circuit
input
input signal
value
Prior art date
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Expired - Fee Related
Application number
JP2017020663A
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English (en)
Japanese (ja)
Other versions
JP2018129627A5 (enExample
JP2018129627A (ja
Inventor
誠一 呉屋
誠一 呉屋
内田　英明
英明 内田
昇広 植田
昇広 植田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Toshiba Electronic Devices and Storage Corp
Original Assignee
Toshiba Corp
Toshiba Electronic Devices and Storage Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Toshiba Electronic Devices and Storage Corp filed Critical Toshiba Corp
Priority to JP2017020663A priority Critical patent/JP6707477B2/ja
Priority to US15/694,833 priority patent/US10601411B2/en
Publication of JP2018129627A publication Critical patent/JP2018129627A/ja
Publication of JP2018129627A5 publication Critical patent/JP2018129627A5/ja
Application granted granted Critical
Publication of JP6707477B2 publication Critical patent/JP6707477B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
    • H03K5/24—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude
    • H03K5/2472—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors
    • H03K5/2481—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors with at least one differential stage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/10—Measuring sum, difference or ratio
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/0175—Coupling arrangements; Interface arrangements
    • H03K19/0185—Coupling arrangements; Interface arrangements using field effect transistors only
    • H03K19/018507—Interface arrangements
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/19—Monitoring patterns of pulse trains
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
    • H03K5/24—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude
    • H03K5/2472—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Manipulation Of Pulses (AREA)
  • Amplifiers (AREA)
JP2017020663A 2017-02-07 2017-02-07 コンパレータ Expired - Fee Related JP6707477B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2017020663A JP6707477B2 (ja) 2017-02-07 2017-02-07 コンパレータ
US15/694,833 US10601411B2 (en) 2017-02-07 2017-09-03 Comparator

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2017020663A JP6707477B2 (ja) 2017-02-07 2017-02-07 コンパレータ

Publications (3)

Publication Number Publication Date
JP2018129627A JP2018129627A (ja) 2018-08-16
JP2018129627A5 JP2018129627A5 (enExample) 2019-01-31
JP6707477B2 true JP6707477B2 (ja) 2020-06-10

Family

ID=63037455

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2017020663A Expired - Fee Related JP6707477B2 (ja) 2017-02-07 2017-02-07 コンパレータ

Country Status (2)

Country Link
US (1) US10601411B2 (enExample)
JP (1) JP6707477B2 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109245752B (zh) * 2018-10-22 2024-02-27 上海艾为电子技术股份有限公司 一种调整电路和模拟开关
CN110514883B (zh) * 2019-09-18 2021-04-13 中国电子科技集团公司第五十八研究所 一种高压宽输入范围电流采样运放电路
CN112511139B (zh) * 2020-12-25 2024-02-13 上海贝岭股份有限公司 比较器电路及包括其的芯片
US12081221B2 (en) * 2021-09-23 2024-09-03 Texas Instruments Incorporated Comparator architecture supporting lower oxide breakdown voltages
JP2024098757A (ja) * 2023-01-11 2024-07-24 株式会社デンソー 劣化抑制回路

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2734963B2 (ja) 1993-12-28 1998-04-02 日本電気株式会社 低電圧コンパレータ回路
JP3676904B2 (ja) * 1997-04-11 2005-07-27 株式会社ルネサステクノロジ 半導体集積回路
JP3595153B2 (ja) * 1998-03-03 2004-12-02 株式会社 日立ディスプレイズ 液晶表示装置および映像信号線駆動手段
FR2806856B1 (fr) * 2000-03-21 2004-10-15 St Microelectronics Sa Dispositif de comparaison a tres basse consommation
WO2002049208A2 (en) 2000-12-15 2002-06-20 Broadcom Corporation Differential amplifier with large input common mode signal range
US6801080B1 (en) * 2003-04-07 2004-10-05 Pericom Semiconductor Corp. CMOS differential input buffer with source-follower input clamps
US6940318B1 (en) * 2003-10-06 2005-09-06 Pericom Semiconductor Corp. Accurate voltage comparator with voltage-to-current converters for both reference and input voltages
US7233174B2 (en) * 2004-07-19 2007-06-19 Texas Instruments Incorporated Dual polarity, high input voltage swing comparator using MOS input transistors
JP2008219655A (ja) 2007-03-06 2008-09-18 Sanyo Electric Co Ltd レールトゥレール型増幅回路及び半導体装置
US7589568B2 (en) * 2007-05-04 2009-09-15 Microchip Technology Incorporated Variable power and response time brown-out-reset circuit
JP4528819B2 (ja) * 2007-09-27 2010-08-25 Ｏｋｉセミコンダクタ株式会社 多入力演算増幅回路、それを用いたデジタル／アナログ変換器、及びそれを用いた表示装置の駆動回路
JP2009105726A (ja) * 2007-10-24 2009-05-14 Panasonic Corp 高周波電力検波回路及び無線通信装置
JP2011166555A (ja) * 2010-02-12 2011-08-25 Renesas Electronics Corp ソースドライバ及び液晶表示装置
US8330500B2 (en) * 2010-11-25 2012-12-11 Elite Semiconductor Memory Technology Inc. Comparator
JP2012199664A (ja) 2011-03-18 2012-10-18 Seiko Epson Corp 差動増幅回路及び集積回路装置
JP2013090136A (ja) 2011-10-18 2013-05-13 Asahi Kasei Electronics Co Ltd ソースフォロア回路
JP5756424B2 (ja) * 2012-03-14 2015-07-29 ルネサスエレクトロニクス株式会社 半導体装置
US8917136B1 (en) * 2014-01-10 2014-12-23 Freescale Semiconductor, Inc. Charge pump system and method of operation
JP6321411B2 (ja) * 2014-03-13 2018-05-09 エイブリック株式会社 電圧検出回路
DE102014226136B3 (de) * 2014-12-16 2016-02-11 Dialog Semiconductor (UK) Ltd Messschaltung
US20160322965A1 (en) * 2015-04-30 2016-11-03 Sandisk Technologies Inc. Differential comparator with stable offset
US9973183B2 (en) * 2015-09-28 2018-05-15 Power Integrations, Inc. Field-effect transistor device with partial finger current sensing FETs

Also Published As

Publication number Publication date
US10601411B2 (en) 2020-03-24
JP2018129627A (ja) 2018-08-16
US20180226960A1 (en) 2018-08-09

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