JP6659857B2 - ワイヤボンディング装置 - Google Patents
ワイヤボンディング装置 Download PDFInfo
- Publication number
- JP6659857B2 JP6659857B2 JP2018538461A JP2018538461A JP6659857B2 JP 6659857 B2 JP6659857 B2 JP 6659857B2 JP 2018538461 A JP2018538461 A JP 2018538461A JP 2018538461 A JP2018538461 A JP 2018538461A JP 6659857 B2 JP6659857 B2 JP 6659857B2
- Authority
- JP
- Japan
- Prior art keywords
- pressing
- displacement
- load
- motor
- wire bonding
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000003825 pressing Methods 0.000 claims description 170
- 238000006073 displacement reaction Methods 0.000 claims description 66
- 238000001514 detection method Methods 0.000 claims 1
- 239000000758 substrate Substances 0.000 description 26
- 238000000034 method Methods 0.000 description 12
- 230000007423 decrease Effects 0.000 description 4
- 230000000712 assembly Effects 0.000 description 2
- 238000000429 assembly Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000000956 alloy Substances 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
- H01L24/741—Apparatus for manufacturing means for bonding, e.g. connectors
- H01L24/745—Apparatus for manufacturing wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
- H01L24/78—Apparatus for connecting with wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/78—Apparatus for connecting with wire connectors
- H01L2224/7825—Means for applying energy, e.g. heating means
- H01L2224/78251—Means for applying energy, e.g. heating means in the lower part of the bonding apparatus, e.g. in the apparatus chuck
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/78—Apparatus for connecting with wire connectors
- H01L2224/7825—Means for applying energy, e.g. heating means
- H01L2224/783—Means for applying energy, e.g. heating means by means of pressure
- H01L2224/78301—Capillary
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/78—Apparatus for connecting with wire connectors
- H01L2224/787—Means for aligning
- H01L2224/78743—Suction holding means
- H01L2224/78744—Suction holding means in the lower part of the bonding apparatus, e.g. in the apparatus chuck
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/859—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector involving monitoring, e.g. feedback loop
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Wire Bonding (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016174325 | 2016-09-07 | ||
JP2016174325 | 2016-09-07 | ||
PCT/JP2017/032224 WO2018047896A1 (ja) | 2016-09-07 | 2017-09-07 | ワイヤボンディング装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPWO2018047896A1 JPWO2018047896A1 (ja) | 2019-06-24 |
JP6659857B2 true JP6659857B2 (ja) | 2020-03-04 |
Family
ID=61562194
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2018538461A Active JP6659857B2 (ja) | 2016-09-07 | 2017-09-07 | ワイヤボンディング装置 |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP6659857B2 (zh) |
KR (1) | KR102206867B1 (zh) |
CN (1) | CN109923652B (zh) |
TW (1) | TWI663494B (zh) |
WO (1) | WO2018047896A1 (zh) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20220007247A (ko) * | 2020-07-10 | 2022-01-18 | 삼성전자주식회사 | 와이어 본딩 장치 |
US12087725B2 (en) * | 2020-09-04 | 2024-09-10 | Shinkawa Ltd. | Wire bonding apparatus, method for measuring opening amount of clamp apparatus, and method for calibrating clamp apparatus |
WO2022176182A1 (ja) * | 2021-02-22 | 2022-08-25 | 株式会社新川 | ワイヤボンディング装置 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5176310A (en) * | 1988-11-28 | 1993-01-05 | Hitachi, Ltd. | Method and apparatus for wire bond |
JPH1027818A (ja) * | 1996-07-10 | 1998-01-27 | Toshiba Mechatronics Kk | ボンディング装置におけるボンディング荷重検出装置 |
US6112972A (en) * | 1996-12-19 | 2000-09-05 | Texas Instruments Incorporated | Wire bonding with capillary realignment |
JP3370551B2 (ja) * | 1997-04-02 | 2003-01-27 | 株式会社新川 | ワイヤボンディング装置及びそのボンディング荷重補正方法 |
JPH11265907A (ja) * | 1998-03-17 | 1999-09-28 | Kyushu Electronics System:Kk | アルミワイヤボンディング装置及び方法 |
JP2957557B1 (ja) * | 1998-05-27 | 1999-10-04 | 株式会社カイジョー | ボンディング装置のボンディングツール支持機構およびボンディングツールの上下動制御方法 |
JP2000114308A (ja) * | 1998-10-09 | 2000-04-21 | Kaijo Corp | ワイヤボンディング装置 |
JP2000114305A (ja) * | 1998-10-09 | 2000-04-21 | Kaijo Corp | ワイヤボンディング装置 |
KR100896828B1 (ko) * | 2001-10-26 | 2009-05-12 | 외르리콘 어셈블리 이큅먼트 아게, 슈타인하우젠 | 와이어 본더를 보정하는 방법 |
JP3817207B2 (ja) * | 2002-08-21 | 2006-09-06 | Tdk株式会社 | 実装処理装置及び該実装処理装置の制御装置 |
US7549569B2 (en) * | 2006-06-29 | 2009-06-23 | Asm Technology Singapore Pte Ltd. | Wire clamp gap control mechanism and method |
JP4314313B1 (ja) * | 2008-06-30 | 2009-08-12 | 株式会社新川 | ボンディング装置 |
JP4275724B1 (ja) * | 2008-07-16 | 2009-06-10 | 株式会社新川 | ボンディング良否判定方法およびボンディング良否判定装置ならびにボンディング装置 |
JP5972153B2 (ja) * | 2012-11-21 | 2016-08-17 | 新日本無線株式会社 | ワイヤボンディング装置 |
TWI587416B (zh) * | 2013-01-25 | 2017-06-11 | 先進科技新加坡有限公司 | 導線鍵合機和校準導線鍵合機的方法 |
-
2017
- 2017-09-07 JP JP2018538461A patent/JP6659857B2/ja active Active
- 2017-09-07 WO PCT/JP2017/032224 patent/WO2018047896A1/ja active Application Filing
- 2017-09-07 TW TW106130655A patent/TWI663494B/zh active
- 2017-09-07 CN CN201780068756.1A patent/CN109923652B/zh active Active
- 2017-09-07 KR KR1020197009574A patent/KR102206867B1/ko active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
WO2018047896A1 (ja) | 2018-03-15 |
TWI663494B (zh) | 2019-06-21 |
CN109923652B (zh) | 2023-04-18 |
KR20190046943A (ko) | 2019-05-07 |
JPWO2018047896A1 (ja) | 2019-06-24 |
TW201812493A (zh) | 2018-04-01 |
CN109923652A (zh) | 2019-06-21 |
KR102206867B1 (ko) | 2021-01-25 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP6659857B2 (ja) | ワイヤボンディング装置 | |
KR101921527B1 (ko) | 와이어 본딩 장치 및 반도체 장치의 제조 방법 | |
JP6715402B2 (ja) | ワイヤボンディング方法及びワイヤボンディング装置 | |
US11257781B2 (en) | Method for calibrating wire clamp device | |
US8540135B2 (en) | Bonding method, bonding apparatus, and manufacturing method of semiconductor device using the same | |
TW201430978A (zh) | 導線鍵合機和校準導線鍵合機的方法 | |
JP2010056106A (ja) | ワイヤボンディング装置、これを用いたワイヤボンディング方法 | |
US11824038B2 (en) | Wire bonding apparatus | |
JP5732858B2 (ja) | 基板厚み測定装置及び基板厚み測定方法 | |
JP4595020B2 (ja) | ボンディング装置及びボンディングツール振巾測定方法ならびにボンディングツール振巾較正方法 | |
JP4980870B2 (ja) | 半導体検査装置及びその制御方法 | |
JP2019080437A (ja) | 巻線形成装置及びその制御方法 | |
US20110062216A1 (en) | Method for manufacturing semiconductor device and bonding apparatus | |
KR102536694B1 (ko) | 와이어 본딩 장치 및 와이어 본딩 방법 | |
JP2019211408A (ja) | 移動装置、基板検査装置および制御方法 | |
WO2024195812A1 (ja) | ワイヤボンディング装置及び該装置の較正方法 | |
JP7026406B2 (ja) | ワイヤボンディング装置 | |
JP2011033496A (ja) | 薄膜歪み電気特性評価装置及び薄膜歪み電気特性評価方法 | |
JP2007317738A (ja) | 部品圧着実装機の加重測定方法と装置、それらを用いた部品圧着実装機 | |
JP2024011603A (ja) | 半導体装置の製造装置および製造方法 | |
JP4605701B2 (ja) | スポット溶接装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20190115 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20190117 |
|
A711 | Notification of change in applicant |
Free format text: JAPANESE INTERMEDIATE CODE: A712 Effective date: 20191114 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20200114 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20200206 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 6659857 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |