JP6604730B2 - 半導体装置 - Google Patents
半導体装置 Download PDFInfo
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- JP6604730B2 JP6604730B2 JP2015053799A JP2015053799A JP6604730B2 JP 6604730 B2 JP6604730 B2 JP 6604730B2 JP 2015053799 A JP2015053799 A JP 2015053799A JP 2015053799 A JP2015053799 A JP 2015053799A JP 6604730 B2 JP6604730 B2 JP 6604730B2
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- 239000004065 semiconductor Substances 0.000 title claims description 34
- 230000004907 flux Effects 0.000 claims description 28
- 239000000758 substrate Substances 0.000 claims description 17
- 230000003321 amplification Effects 0.000 description 8
- 238000003199 nucleic acid amplification method Methods 0.000 description 8
- 238000000034 method Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 4
- 239000010410 layer Substances 0.000 description 4
- 239000000696 magnetic material Substances 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 238000001514 detection method Methods 0.000 description 3
- 229920006332 epoxy adhesive Polymers 0.000 description 3
- 239000010953 base metal Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000009713 electroplating Methods 0.000 description 2
- 230000005389 magnetism Effects 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000005300 metallic glass Substances 0.000 description 2
- 239000011241 protective layer Substances 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910000595 mu-metal Inorganic materials 0.000 description 1
- 229910000889 permalloy Inorganic materials 0.000 description 1
- 230000035699 permeability Effects 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 229910000815 supermalloy Inorganic materials 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/07—Hall effect devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/20—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/20—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices
- G01R15/202—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices using Hall-effect devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R21/00—Arrangements for measuring electric power or power factor
- G01R21/08—Arrangements for measuring electric power or power factor by using galvanomagnetic-effect devices, e.g. Hall-effect devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/0011—Arrangements or instruments for measuring magnetic variables comprising means, e.g. flux concentrators, flux guides, for guiding or concentrating the magnetic flux, e.g. to the magnetic sensor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/07—Hall effect devices
- G01R33/077—Vertical Hall-effect devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B61/00—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N52/00—Hall-effect devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N52/00—Hall-effect devices
- H10N52/101—Semiconductor Hall-effect devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N52/00—Hall-effect devices
- H10N52/80—Constructional details
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N59/00—Integrated devices, or assemblies of multiple devices, comprising at least one galvanomagnetic or Hall-effect element covered by groups H10N50/00 - H10N52/00
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Hall/Mr Elements (AREA)
- Measuring Magnetic Variables (AREA)
Description
前記磁気収束板は、外縁から内側にかけて設けられた複数のスリットを有し、
前記磁気収束板の中心には前記複数のスリットが到達しておらず、前記磁気収束板は、2つ以上の部分に分離されていないことを特徴とする半導体装置とする。
また、半導体基板上に設けられた複数のホール素子と、前記半導体基板上に設けられ、前記複数のホール素子の各々の少なくとも一部を覆っている磁気収束板とを有する磁気センサを備え、
前記磁気収束板は、内側に開口部である複数のスロットを有しており、前記磁気収束板は、前記複数のスロットにより2つ以上の部分に分離されていないことを特徴とする半導体装置とする。
図1(a)、(b)、(c)は本発明の半導体装置である磁気センサの一実施例を示す平面図である。半導体基板31の表面にホール素子32a、32bが離間して配置され、そのうえに磁気収束板33が、ホール素子32a、32bの上に設けられた保護膜を介して設けられている。磁気収束板33は外周であるその縁がホール素子32a、32bの上に来るように配置されている。磁気収束板33にはスリット6が設けられている。ここで、スリット6とは、磁気収束板33の外周(縁)から内部にかけて設けられた溝のこととする。溝は磁気収束板33の上面から下面まで貫通している。
磁気収束板33は電解メッキにより形成することが可能である。また、磁気収束板33は磁性体箔を加工して形成することも可能である。
2a、2b、22a、22b、32 ホール素子
3 保護層
4 下地金属層
5、21、23、33 磁気収束板
6、7 スリット
12 エポキシ接着剤
14 磁束収束パターン
Claims (4)
- 半導体基板上に設けられた複数のホール素子と、前記半導体基板上に設けられ、前記複数のホール素子の各々の少なくとも一部を覆っている磁気収束板とを有する磁気センサを備え、
前記磁気収束板は、外縁から内側にかけて設けられた複数のスリットを有し、
前記磁気収束板の中心には前記複数のスリットが到達しておらず、前記磁気収束板は、2つ以上の部分に分離されていないことを特徴とする半導体装置。 - 半導体基板上に設けられた複数のホール素子と、前記半導体基板上に設けられ、前記複数のホール素子の各々の少なくとも一部を覆っている磁気収束板とを有する磁気センサを備え、
前記磁気収束板は、内側に開口部である複数のスロットを有しており、前記磁気収束板は、前記複数のスロットにより2つ以上の部分に分離されていないことを特徴とする半導体装置。 - 前記スリットの幅は1〜50umである事を特徴とする請求項第1記載の半導体装置。
- 前記スロットの幅は1〜50umである事を特徴とする請求項第2記載の半導体装置。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015053799A JP6604730B2 (ja) | 2015-03-17 | 2015-03-17 | 半導体装置 |
TW105106510A TWI675211B (zh) | 2015-03-17 | 2016-03-03 | 半導體裝置 |
US15/066,266 US10205087B2 (en) | 2015-03-17 | 2016-03-10 | Semiconductor device |
KR1020160031342A KR20160111867A (ko) | 2015-03-17 | 2016-03-16 | 반도체 장치 |
CN201610151916.6A CN105988091B (zh) | 2015-03-17 | 2016-03-17 | 半导体装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015053799A JP6604730B2 (ja) | 2015-03-17 | 2015-03-17 | 半導体装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2016173317A JP2016173317A (ja) | 2016-09-29 |
JP6604730B2 true JP6604730B2 (ja) | 2019-11-13 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2015053799A Expired - Fee Related JP6604730B2 (ja) | 2015-03-17 | 2015-03-17 | 半導体装置 |
Country Status (5)
Country | Link |
---|---|
US (1) | US10205087B2 (ja) |
JP (1) | JP6604730B2 (ja) |
KR (1) | KR20160111867A (ja) |
CN (1) | CN105988091B (ja) |
TW (1) | TWI675211B (ja) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9741924B2 (en) * | 2015-02-26 | 2017-08-22 | Sii Semiconductor Corporation | Magnetic sensor having a recessed die pad |
JP6663259B2 (ja) * | 2016-03-15 | 2020-03-11 | エイブリック株式会社 | 半導体装置とその製造方法 |
JP2017167021A (ja) * | 2016-03-17 | 2017-09-21 | Tdk株式会社 | 磁気センサ |
JP2018189388A (ja) * | 2017-04-28 | 2018-11-29 | Tdk株式会社 | 磁界センサ |
CN111448470B (zh) * | 2017-12-04 | 2022-07-22 | 株式会社村田制作所 | 磁传感器 |
WO2019111782A1 (ja) * | 2017-12-04 | 2019-06-13 | 株式会社村田製作所 | 磁気センサ |
WO2019111766A1 (ja) | 2017-12-04 | 2019-06-13 | 株式会社村田製作所 | 磁気センサ |
EP3992652A1 (en) * | 2020-11-03 | 2022-05-04 | Melexis Technologies SA | Magnetic sensor device |
EP4002503B1 (en) * | 2020-11-23 | 2024-04-17 | Melexis Technologies SA | Semiconductor device with integrated magnetic flux concentrator, and method for producing same |
DE102021201008A1 (de) * | 2021-02-04 | 2022-08-04 | Zf Friedrichshafen Ag | Leiterplattenanordnung |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2154744B (en) * | 1984-02-25 | 1987-10-07 | Standard Telephones Cables Ltd | Magnetic field sensor |
KR940010586B1 (ko) * | 1988-07-20 | 1994-10-24 | 삼성전기 주식회사 | 자기센서 |
JPH0564706A (ja) | 1991-09-06 | 1993-03-19 | Ngk Insulators Ltd | 脱酸素水の製造装置 |
JP4936299B2 (ja) * | 2000-08-21 | 2012-05-23 | メレクシス・テクノロジーズ・ナムローゼフェンノートシャップ | 磁場方向検出センサ |
CN100375308C (zh) * | 2001-07-26 | 2008-03-12 | 旭化成电子材料元件株式会社 | 半导体霍尔传感器 |
JP2003142752A (ja) * | 2001-11-01 | 2003-05-16 | Asahi Kasei Corp | 磁気センサの製造方法 |
JP2003302428A (ja) * | 2002-04-09 | 2003-10-24 | Asahi Kasei Corp | 基板実装型電流センサ及び電流測定方法 |
JP5064706B2 (ja) * | 2006-03-28 | 2012-10-31 | 旭化成エレクトロニクス株式会社 | 磁気センサ及びその製造方法 |
US8169215B2 (en) * | 2006-04-13 | 2012-05-01 | Asahi Kasei Emd Corporation | Magnetic sensor and method of manufacturing thereof |
IT1397983B1 (it) * | 2010-02-05 | 2013-02-04 | St Microelectronics Srl | Sensore magnetico integrato di rilevamento di campi magnetici verticali e relativo procedimento di fabbricazione |
US8717016B2 (en) * | 2010-02-24 | 2014-05-06 | Infineon Technologies Ag | Current sensors and methods |
JP5793059B2 (ja) * | 2011-10-31 | 2015-10-14 | 旭化成エレクトロニクス株式会社 | 磁気センサ |
KR101876587B1 (ko) * | 2013-03-08 | 2018-08-03 | 매그나칩 반도체 유한회사 | 자기 센서 및 그 제조 방법 |
KR101768254B1 (ko) * | 2013-06-12 | 2017-08-16 | 매그나칩 반도체 유한회사 | 반도체 기반의 자기 센서 및 그 제조 방법 |
JP6632373B2 (ja) * | 2015-02-26 | 2020-01-22 | エイブリック株式会社 | 磁気センサおよびその製造方法 |
-
2015
- 2015-03-17 JP JP2015053799A patent/JP6604730B2/ja not_active Expired - Fee Related
-
2016
- 2016-03-03 TW TW105106510A patent/TWI675211B/zh not_active IP Right Cessation
- 2016-03-10 US US15/066,266 patent/US10205087B2/en not_active Expired - Fee Related
- 2016-03-16 KR KR1020160031342A patent/KR20160111867A/ko unknown
- 2016-03-17 CN CN201610151916.6A patent/CN105988091B/zh active Active
Also Published As
Publication number | Publication date |
---|---|
US20160276577A1 (en) | 2016-09-22 |
TW201704768A (zh) | 2017-02-01 |
CN105988091B (zh) | 2020-02-14 |
JP2016173317A (ja) | 2016-09-29 |
CN105988091A (zh) | 2016-10-05 |
TWI675211B (zh) | 2019-10-21 |
KR20160111867A (ko) | 2016-09-27 |
US10205087B2 (en) | 2019-02-12 |
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