JP6593447B2 - 樹脂基板、部品実装樹脂基板、樹脂基板の製造方法、部品実装樹脂基板の製造方法 - Google Patents
樹脂基板、部品実装樹脂基板、樹脂基板の製造方法、部品実装樹脂基板の製造方法 Download PDFInfo
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- JP6593447B2 JP6593447B2 JP2017545149A JP2017545149A JP6593447B2 JP 6593447 B2 JP6593447 B2 JP 6593447B2 JP 2017545149 A JP2017545149 A JP 2017545149A JP 2017545149 A JP2017545149 A JP 2017545149A JP 6593447 B2 JP6593447 B2 JP 6593447B2
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- 230000003014 reinforcing effect Effects 0.000 claims description 53
- 238000000034 method Methods 0.000 claims description 12
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- 229920001187 thermosetting polymer Polymers 0.000 description 3
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- 230000015572 biosynthetic process Effects 0.000 description 1
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- H01L2224/8319—Arrangement of the layer connectors prior to mounting
- H01L2224/83192—Arrangement of the layer connectors prior to mounting wherein the layer connectors are disposed only on another item or body to be connected to the semiconductor or solid-state body
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- H01L2224/832—Applying energy for connecting
- H01L2224/83201—Compression bonding
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- H01L2224/83851—Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester being an anisotropic conductive adhesive
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- H01L2224/83855—Hardening the adhesive by curing, i.e. thermosetting
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- H01L2224/92—Specific sequence of method steps
- H01L2224/921—Connecting a surface with connectors of different types
- H01L2224/9211—Parallel connecting processes
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- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
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- H01L2224/92—Specific sequence of method steps
- H01L2224/921—Connecting a surface with connectors of different types
- H01L2224/9212—Sequential connecting processes
- H01L2224/92122—Sequential connecting processes the first connecting process involving a bump connector
- H01L2224/92125—Sequential connecting processes the first connecting process involving a bump connector the second connecting process involving a layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
- H01L23/14—Mountings, e.g. non-detachable insulating substrates characterised by the material or its electrical properties
- H01L23/145—Organic substrates, e.g. plastic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L24/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
-
- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L24/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L24/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/156—Material
- H01L2924/1579—Material with a principal constituent of the material being a polymer, e.g. polyester, phenolic based polymer, epoxy
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09818—Shape or layout details not covered by a single group of H05K2201/09009 - H05K2201/09809
- H05K2201/099—Coating over pads, e.g. solder resist partly over pads
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10613—Details of electrical connections of non-printed components, e.g. special leads
- H05K2201/10621—Components characterised by their electrical contacts
- H05K2201/10674—Flip chip
-
- H—ELECTRICITY
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/02—Details related to mechanical or acoustic processing, e.g. drilling, punching, cutting, using ultrasound
- H05K2203/0285—Using ultrasound, e.g. for cleaning, soldering or wet treatment
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Manufacturing & Machinery (AREA)
- Ceramic Engineering (AREA)
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- Structure Of Printed Boards (AREA)
Description
20,20A,20B,20C,20D:樹脂基板
21:樹脂素体
30:電子部品
31:バンプ
40:アンダーフィル樹脂
41:異方性導電フィルム
101,102:加熱プレス治具
221,221A:実装用ランド導体
222,223:内層導体パターン
231,231B,231C,231D:補強樹脂
Claims (12)
- 熱可塑性の樹脂素体と、
前記樹脂素体の表面側に形成された実装用ランド導体と、
前記樹脂素体の前記表面に形成され、前記実装用ランド導体の側面の少なくとも一部に当接し、前記実装用ランド導体の高さ未満の高さを有する補強樹脂と、
を備え、
前記実装用ランド導体は、側面視して底面が天面よりも幅広なテーパ形状であり、
前記実装用ランド導体の前記底面側は前記樹脂素体内に埋まっており、前記天面側は前記樹脂素体に埋まっていない、樹脂基板。 - 前記補強樹脂は、前記樹脂素体よりも硬質な材質からなる、
請求項1に記載の樹脂基板。 - 前記実装用ランド導体は、互いに離間して複数備えられており、
前記補強樹脂は、前記側面のうち隣り合う前記実装用ランド導体の対向する部分に当接する形状である、
請求項1または請求項2に記載の樹脂基板。 - 前記補強樹脂は、前記樹脂素体の前記表面の一部のみに形成され、前記樹脂基板の前記表面における全ての複数の前記実装用ランド導体間を埋め、且つ、全ての前記複数の実装用ランド導体の全側面に当接するように形成されている、
請求項3に記載の樹脂基板。 - 前記補強樹脂は、前記樹脂素体の前記表面の一部のみに形成され、前記樹脂素体の前記表面における全ての複数の前記実装用ランド導体間を埋め、且つ、1つの電子部品のバンプが接合される前記複数の実装用ランド導体の前記側面の一部を、角部または端辺の一部とする最小領域全体に亘って形成されている、
請求項3に記載の樹脂基板。 - 熱可塑性の樹脂素体と、
前記樹脂素体の表面に形成された実装用ランド導体と、
前記樹脂素体の前記表面の一部のみに形成され、前記実装用ランド導体の側面の少なくとも一部に当接し、前記実装用ランド導体の高さ未満の高さを有する補強樹脂と、
を備え、
前記実装用ランド導体は、互いに離間して複数備えられており、
前記補強樹脂は、前記樹脂素体の前記表面における全ての複数の前記実装用ランド導体間を埋め、且つ、1つの電子部品のバンプが接合される前記複数の実装用ランド導体の前記側面の一部を、角部または端辺の一部とする最小領域全体に亘って形成されている、
樹脂基板。 - 前記補強樹脂は、前記樹脂素体よりも硬質な材料からなる、
請求項6に記載の樹脂基板。 - 請求項1乃至請求項7のいずれかに記載の樹脂基板と、
前記実装用ランド導体に超音波接合によってバンプが接合される電子部品と、
を備えた部品実装樹脂基板。 - 前記電子部品と前記樹脂基板の表面との間に充填されたアンダーフィル樹脂を備える、
請求項8に記載の部品実装樹脂基板。 - 熱可塑性を有する複数の樹脂層のうち一層の表面に、側面視して底面が天面よりも幅広なテーパ形状である実装用ランド導体を形成する工程と、
前記実装用ランド導体が形成された樹脂層を最上層として、前記複数の樹脂層を積層して、前記実装用ランド導体の前記底面側が内部に埋まっており前記天面側が内部に埋まっていない樹脂素体、を形成する工程と、
前記樹脂素体の表面に、前記実装用ランド導体の側面に当接し、前記実装用ランド導体の高さ未満の高さを有する補強樹脂を形成する工程と、
を有する、樹脂基板の製造方法。 - 熱可塑性を有する複数の樹脂層のうち一層の表面に、側面視して底面が天面よりも幅広なテーパ形状である実装用ランド導体を形成する工程と、
前記実装用ランド導体が形成された樹脂層を最上層として、前記複数の樹脂層を積層して、前記実装用ランド導体の前記底面側が内部に埋まっており前記天面側が内部に埋まっていない樹脂素体、を形成する工程と、
前記樹脂素体の表面に、前記実装用ランド導体の側面に当接し、前記実装用ランド導体の高さ未満の高さを有する補強樹脂を形成する工程と、
前記実装用ランド導体に超音波接合にて電子部品のバンプを接合する工程と、
を有する、部品実装樹脂基板の製造方法。 - 熱可塑性を有する複数の樹脂層のうち一層の表面に、側面視して底面が天面よりも幅広なテーパ形状である実装用ランド導体を形成する工程と、
前記実装用ランド導体が形成された樹脂層を最上層として、前記複数の樹脂層を積層して、前記実装用ランド導体の前記底面側が内部に埋まっており前記天面側が内部に埋まっていない樹脂素体、を形成する工程と、
前記樹脂素体の表面に、前記実装用ランド導体の側面に当接し、前記実装用ランド導体の高さ未満の高さを有する補強樹脂を形成する工程と、
前記実装用ランド導体に異方性導電フィルムを介して電子部品のバンプを接合する工程と、
を有する、部品実装樹脂基板の製造方法。
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JP2015201698 | 2015-10-13 | ||
PCT/JP2016/079210 WO2017065027A1 (ja) | 2015-10-13 | 2016-10-03 | 樹脂基板、部品実装樹脂基板、樹脂基板の製造方法、部品実装樹脂基板の製造方法 |
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TW434646B (en) * | 1997-11-21 | 2001-05-16 | Rohm Co Ltd | Semiconductor device and method for making the same |
JP2000058986A (ja) * | 1998-08-04 | 2000-02-25 | Matsushita Electric Ind Co Ltd | 配線基板およびその製造方法 |
US7557452B1 (en) * | 2000-06-08 | 2009-07-07 | Micron Technology, Inc. | Reinforced, self-aligning conductive structures for semiconductor device components and methods for fabricating same |
TWI248384B (en) * | 2000-06-12 | 2006-02-01 | Hitachi Ltd | Electronic device |
WO2002058108A2 (en) * | 2000-11-14 | 2002-07-25 | Henkel Loctite Corporation | Wafer applied fluxing and underfill material, and layered electronic assemblies manufactured therewith |
JP3855947B2 (ja) | 2003-03-10 | 2006-12-13 | 株式会社村田製作所 | 電子部品装置およびその製造方法 |
US6885108B2 (en) * | 2003-03-18 | 2005-04-26 | Micron Technology, Inc. | Protective layers formed on semiconductor device components so as to reduce or eliminate the occurrence of delamination thereof and cracking therein |
JP2005123332A (ja) * | 2003-10-15 | 2005-05-12 | Denso Corp | 回路基板及びその製造方法 |
JP2005243899A (ja) * | 2004-02-26 | 2005-09-08 | Toppan Printing Co Ltd | プリント配線板及びその製造方法 |
US7410824B2 (en) * | 2004-12-09 | 2008-08-12 | Stats Chippac Ltd. | Method for solder bumping, and solder-bumping structures produced thereby |
DE102005005749A1 (de) * | 2005-02-07 | 2006-08-17 | Infineon Technologies Ag | Halbleiterbauteil mit oberflächenmontierbaren Aussenkontakten und Verfahren zur Herstellung desselben |
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