JP6556830B2 - X線装置用の機器搭載台及びそれを備えるx線装置 - Google Patents
X線装置用の機器搭載台及びそれを備えるx線装置Info
- Publication number
- JP6556830B2 JP6556830B2 JP2017507729A JP2017507729A JP6556830B2 JP 6556830 B2 JP6556830 B2 JP 6556830B2 JP 2017507729 A JP2017507729 A JP 2017507729A JP 2017507729 A JP2017507729 A JP 2017507729A JP 6556830 B2 JP6556830 B2 JP 6556830B2
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- Prior art keywords
- shielding element
- opening
- main
- peripheral
- ray
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/20025—Sample holders or supports therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/2204—Specimen supports therefor; Sample conveying means therefore
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/308—Accessories, mechanical or electrical features support of radiation source
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/309—Accessories, mechanical or electrical features support of sample holder
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/419—Imaging computed tomograph
Landscapes
- Chemical & Material Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Pathology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Vibration Prevention Devices (AREA)
- Bearings For Parts Moving Linearly (AREA)
Description
110 主遮蔽要素
111 開口
121 機器支持面
122 基底面
123 ねじ穴
124 結合ボルト
131 周縁遮蔽要素
132 内部遮蔽要素
133 内部フランジ
140 2次遮蔽要素
141 2次遮蔽板
142 2次遮蔽壁
143 開口
200 操作機構台
210 基準板
220 供試品台
221 台座
222 回転駆動機構
223 X移動搬送機構
230 第1の支持部材
240 第2の支持部材
241 溝
242 従動体
250 第3の支持部材
251 従動体ナット
251A ラジアル軸受
251B ラジアル軸受
252 ボールねじ
253 ラジアル軸受
254 アンギュラコンタクト軸受
255 駆動ベルト
256 ギアボックス
257 ステッピングモータ
258 Z搬送機構
259 Zレール
310 支持枠
320 機器搭載要素
330 耐振台
340 ローラ
350 レール
Claims (12)
- X線装置用の機器搭載台であって、
供試品台、X線検出器、およびX線源を封入する遮蔽封入筐体の基底板の形をとる主遮蔽要素であって、該主遮蔽要素の一方の側から該主遮蔽要素の他方の側へ該主遮蔽要素を貫通する少なくとも1つの開口を有する、主遮蔽要素と、
前記主遮蔽要素の前記開口を通って延在するように配置された搭載要素であり、前記開口の一方の側に機器支持面を有し、前記開口の他方の側に基底面を有する、搭載要素と、
前記搭載要素の少なくとも一部分を少なくとも部分的に取り巻くように、前記主遮蔽要素の、前記開口を取り巻く領域から延在する周縁遮蔽要素と、
前記搭載要素の前記基底面および前記機器支持面の1つに配置され、前記周縁遮蔽要素の少なくとも一部分の外周を少なくとも部分的に取り巻くように、前記主遮蔽要素の方へ延出する2次遮蔽要素と
を備える機器搭載台。 - 前記開口が、該開口に垂直な軸を定義し、前記軸に関して、少なくとも1つの方向から、45度を超える角度で入射するX線放射が、前記主遮蔽要素、前記2次遮蔽要素、および前記周縁遮蔽要素の少なくとも1つに入射するように、前記主遮蔽要素、前記周縁遮蔽要素、および前記2次遮蔽要素が、共に構成、配置される、請求項1に記載の機器搭載台。
- 前記主遮蔽要素が板である、請求項1または2に記載の機器搭載台。
- 前記周縁遮蔽要素が、実質的に扇形中空円筒または扇形中空円錐、好ましくは、実質的に完全な中空円筒または完全な円錐である、請求項1から3のいずれか一項に記載の機器搭載台。
- 前記2次遮蔽要素が、2次遮蔽板と、前記2次遮蔽板から前記主遮蔽要素の方へ延出する周縁2次遮蔽壁とを備える、請求項1から4のいずれか一項に記載の機器搭載台。
- 前記周縁2次遮蔽壁が、実質的に扇形中空円筒または扇形中空円錐、好ましくは、実質的に完全な中空円筒または完全な円錐である、請求項5に記載の機器搭載台。
- 前記搭載要素が、前記機器支持面と前記基底面との間に延在するロッド部分を備える、請求項1から6のいずれか一項に記載の機器搭載台。
- 前記主遮蔽要素、前記周縁遮蔽要素、および前記2次遮蔽要素が、前記開口の一方の側または前記開口の他方の側のうちの一方に設けられ、さらに別の主遮蔽要素、さらに別の周縁遮蔽要素、およびさらに別の2次遮蔽要素が、前記開口の一方の側または前記開口の他方の側のうちの他方に設けられる、請求項1から7のいずれか一項に記載の機器搭載台。
- 前記さらに別の主遮蔽要素、前記さらに別の周縁遮蔽要素、および前記さらに別の2次遮蔽要素が、それぞれ、前記主遮蔽要素、前記周縁遮蔽要素、前記2次遮蔽要素と同様に構成される、請求項8に記載の機器搭載台。
- 前記2次遮蔽要素が開口を有し、前記搭載要素が、前記2次遮蔽要素の前記開口を通って延在する、請求項1から9のいずれか一項に記載の機器搭載台。
- 前記2次遮蔽要素が開口を有し、前記搭載要素の前記機器支持面が、前記2次遮蔽要素の前記開口の前記主遮蔽要素側に配置される、請求項1から8のいずれか一項に記載の機器搭載台。
- X線源、操作機構台、およびX線検出器を有するX線装置であって、前記操作機構台を支持するように配置された、請求項1から11のいずれか一項に記載の機器搭載台を備える、X線装置。
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB1414395.2 | 2014-08-13 | ||
| GBGB1414395.2A GB201414395D0 (en) | 2014-08-13 | 2014-08-13 | X-ray apparatus |
| PCT/EP2015/068555 WO2016023949A1 (en) | 2014-08-13 | 2015-08-12 | X-ray apparatus |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2018098659A Division JP6603752B2 (ja) | 2014-08-13 | 2018-05-23 | X線装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2017527353A JP2017527353A (ja) | 2017-09-21 |
| JP6556830B2 true JP6556830B2 (ja) | 2019-08-07 |
Family
ID=51629743
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2017507729A Active JP6556830B2 (ja) | 2014-08-13 | 2015-08-12 | X線装置用の機器搭載台及びそれを備えるx線装置 |
| JP2018098659A Active JP6603752B2 (ja) | 2014-08-13 | 2018-05-23 | X線装置 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2018098659A Active JP6603752B2 (ja) | 2014-08-13 | 2018-05-23 | X線装置 |
Country Status (6)
| Country | Link |
|---|---|
| US (3) | US10365233B2 (ja) |
| EP (3) | EP4607569A2 (ja) |
| JP (2) | JP6556830B2 (ja) |
| CN (1) | CN107110797B (ja) |
| GB (1) | GB201414395D0 (ja) |
| WO (1) | WO2016023949A1 (ja) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106018440A (zh) * | 2016-06-28 | 2016-10-12 | 国营芜湖机械厂 | 一种飞机方向舵射线检测工装 |
| JP7087916B2 (ja) * | 2017-11-21 | 2022-06-21 | 住友金属鉱山株式会社 | 試料測定装置および試料測定方法 |
| US11774333B2 (en) * | 2019-04-04 | 2023-10-03 | Mcp Ip, Llc | Shaft testing device with non-contact bearing |
| US11955308B1 (en) * | 2022-09-22 | 2024-04-09 | Kla Corporation | Water cooled, air bearing based rotating anode x-ray illumination source |
| CN115435043A (zh) * | 2022-09-30 | 2022-12-06 | 济南汉江光电科技有限公司 | 一种x射线显微镜隔振装置 |
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-
2014
- 2014-08-13 GB GBGB1414395.2A patent/GB201414395D0/en not_active Ceased
-
2015
- 2015-08-12 EP EP25180335.9A patent/EP4607569A2/en active Pending
- 2015-08-12 EP EP15748260.5A patent/EP3180604B1/en active Active
- 2015-08-12 US US15/503,318 patent/US10365233B2/en active Active
- 2015-08-12 CN CN201580054885.6A patent/CN107110797B/zh active Active
- 2015-08-12 EP EP25180338.3A patent/EP4657052A1/en active Pending
- 2015-08-12 WO PCT/EP2015/068555 patent/WO2016023949A1/en not_active Ceased
- 2015-08-12 JP JP2017507729A patent/JP6556830B2/ja active Active
-
2018
- 2018-05-23 JP JP2018098659A patent/JP6603752B2/ja active Active
- 2018-12-14 US US16/220,626 patent/US10571409B2/en active Active
- 2018-12-14 US US16/220,632 patent/US10571410B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| GB201414395D0 (en) | 2014-09-24 |
| US20190137418A1 (en) | 2019-05-09 |
| EP3180604A1 (en) | 2017-06-21 |
| US20170234810A1 (en) | 2017-08-17 |
| EP3180604B1 (en) | 2025-10-01 |
| JP6603752B2 (ja) | 2019-11-06 |
| US10571409B2 (en) | 2020-02-25 |
| JP2018159712A (ja) | 2018-10-11 |
| US10571410B2 (en) | 2020-02-25 |
| EP4657052A1 (en) | 2025-12-03 |
| WO2016023949A1 (en) | 2016-02-18 |
| JP2017527353A (ja) | 2017-09-21 |
| US10365233B2 (en) | 2019-07-30 |
| CN107110797B (zh) | 2020-07-03 |
| US20190137417A1 (en) | 2019-05-09 |
| EP4607569A2 (en) | 2025-08-27 |
| CN107110797A (zh) | 2017-08-29 |
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| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |