JP6460364B2 - 軸外し反射位相顕微鏡システムおよび軸外し位相顕微鏡のための方法 - Google Patents
軸外し反射位相顕微鏡システムおよび軸外し位相顕微鏡のための方法 Download PDFInfo
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Description
この事業は、米国国立衛生研究所の国立研究資源センター(P41−PR02594−18)、及び、米国国立科学財団(DBI−0754339)の資金援助を受けている。
本願は、2011年1月25日に出願された米国特許出願第61/436,026号の優先権を主張している。この出願の内容全体をここに参照として組み込む。
Claims (32)
- 低コヒーレンスの光源と、
前記光源に光学的に連結された第1の光路沿いに配置された計測対象の材料と、
前記材料に対してコヒーレンスゲートを配置させるように、レンズと前記材料との間の相対位置を制御するための、移動可能な並進ステージであって、前記コヒーレンスゲートは、撮像される前記材料の一部を規定し、これにより、前記材料の表面領域が撮像され、または、前記コヒーレンスゲートの前記材料内の深さ方向への移動の後に前記移動されたコヒーレンスゲートにより画像が検知される、前記並進ステージと、
前記光源に光学的に連結され、参照光路に配置された参照反射器と、
前記参照反射器により反射された光の回折次数を選択する光学系と、
前記材料からの反射された光と、前記参照反射器からの前記選択された光の回折次数とを検知する撮像検知器と
を備え、
前記材料からの前記光は、前記参照反射器から受けた前記光とは異なる角度で、前記撮像検知器に入射する
軸外し反射位相顕微鏡システム。 - 前記光源からの光は、反射器へ前記材料を透過する又は前記材料の表面で反射される、請求項1に記載の軸外し反射位相顕微鏡システム。
- 前記並進ステージは、アクチュエータと、前記並進ステージ上の第1の鏡と、前記アクチュエータ上の第2の鏡とをさらに備える、請求項1又は2に記載の軸外し反射位相顕微鏡システム。
- 低いコヒーレンスの前記光源は、レーザを含む、請求項1から3のいずれか一項に記載の軸外し反射位相顕微鏡システム。
- 前記光源は、広帯域光源を含む、請求項1から3のいずれか一項に記載の軸外し反射位相顕微鏡システム。
- 参照光路は、前記材料から前記撮像検知器の表面に入射する光に対して特定の角度で前記撮像検知器の前記表面に入射する、請求項1から5のいずれか一項に記載の軸外し反射位相顕微鏡システム。
- 前記光学系は、回折格子から受けた光の1つの次数を透過する空間フィルタを有する、請求項1から6のいずれか一項に記載の軸外し反射位相顕微鏡システム。
- 前記参照光路は、反射する前記光の回折次数を分離し、シングルライトパルスに応じた前記材料の全視野画像の各点は、参照ビームにわたって等しいパスの長さを有する、請求項6に記載の軸外し反射位相顕微鏡システム。
- 前記撮像検知器に接続されたデータプロセッサと画像データを格納するためのメモリとをさらに備える、請求項1から8のいずれか一項に記載の軸外し反射位相顕微鏡システム。
- 前記材料の定量位相画像を表示するディスプレイをさらに備える、請求項9に記載の軸外し反射位相顕微鏡システム。
- 前記材料をある角度で傾けるために、前記光源と撮像対象の前記材料とを相対運動させるアクチュエータをさらに備える、請求項1から10のいずれか一項に記載の軸外し反射位相顕微鏡システム。
- 前記並進ステージは、入射光軸に対して斜めの角度に前記材料を配向する、請求項11に記載の軸外し反射位相顕微鏡システム。
- 前記材料は光を反射する、及び/又は前記材料は反射面に位置している、請求項1、3から12のいずれか一項に記載の軸外し反射位相顕微鏡システム。
- 前記参照光路は、反射器を有する、請求項6に記載の軸外し反射位相顕微鏡システム。
- ビームスプリッタは、前記参照光路と前記第1の光路とに対する光を分離させる、請求項1に記載の軸外し反射位相顕微鏡システム。
- 前記コヒーレンスゲートは、前記材料の透過画像を提供すべく又は前記材料の反射画像を提供すべく、前記材料に対して配置される、請求項1に記載の軸外し反射位相顕微鏡システム。
- 軸外し位相顕微鏡のための方法であって、
コヒーレンスの低い光源に光学的に連結された第1の光路沿いに配置された計測対象の材料に対して、前記光源から光を提供する段階と、
前記材料の表面領域に対してコヒーレンスゲートを配置させるように、撮像レンズと前記材料との相対位置を調節する段階と、
前記光源に光学的に連結された反射する参照に対して、レンズを通して光を提供する段階と、
前記反射する参照から受けた光の回折次数を分離する段階と、
撮像検知器で光を検知する段階と
を備え、
検知された前記光は、第1軸沿いに方向づけられた前記材料の前記表面領域からの反射された光と、前記撮像検知器において干渉パターンを形成して前記表面領域の画像を取得するべく、前記第1軸に対して異なる角度で配向された第2軸沿いに方向づけられた前記分離された回折次数の光とを含み、
前記方法は、前記コヒーレンスゲートを前記材料の更なるサンプル領域へ移動させ、前記材料の前記更なるサンプル領域の画像を取得すべく、前記提供する段階、前記分離する段階、および前記検知する段階を繰り返す段階を備える
軸外し位相顕微鏡のための方法。 - 前記光源からの光を前記材料に透過させる段階、又は前記光源からの光を、前記材料の表面で反射させる段階をさらに備える、請求項17に記載の方法。
- 並進ステージを利用して前記材料に対して前記コヒーレンスゲートを配置させる段階をさらに備える、請求項17又は18に記載の方法。
- 前記コヒーレンスの低い光源は、レーザを含む、又は前記光源は広帯域光源を含む、請求項17から19のいずれか一項に記載の方法。
- 参照光路は、前記材料から前記撮像検知器の表面に入射する光に対して特定の角度で前記撮像検知器の前記表面に入射する、請求項17から20のいずれか一項に記載の方法。
- 空間フィルタを利用して、回折格子から受けた光の1つの次数を透過する段階をさらに備える、請求項17から21のいずれか一項に記載の方法。
- 前記撮像検知器から画像データを受け取るデータプロセッサで画像データを処理する段階、ディスプレイに画像データを表示する段階、及び画像データをメモリに格納する段階をさらに備える、請求項17から22のいずれか一項に記載の方法。
- 画像データをヒルベルト変換して位相画像を提供する段階をさらに備える、請求項17から23のいずれか一項に記載の方法。
- 前記材料を、入射光軸に対して特定の角度で配向する段階をさらに備える、請求項17から24のいずれか一項に記載の方法。
- 移動する細胞構造または膜のような生体サンプルを、撮像する段階をさらに備える、請求項17から25のいずれか一項に記載の方法。
- 前記軸外し反射位相顕微鏡システムは、入射光に対して特定の角度で傾けることのできる反射器の上に、前記材料が配置されるように、又は前記光源からの光が前記材料を透過して、材料支持表面で反射され、前記材料を通って撮像されるように、軸外し干渉を実行する、請求項1から16のいずれか一項に記載の軸外し反射位相顕微鏡システム。
- 前記光学系は、前記材料が反射した光に干渉させるために光の第1の回折次数を利用する、請求項1から16,27のいずれか一項に記載の軸外し反射位相顕微鏡システム。
- 前記光学系は、フーリエ画像のコンポーネントの第1の回折次数を選択して、フーリエ平面で前記コンポーネントをずらす、及び前記軸外し反射位相顕微鏡システムは、画像の逆フーリエ変換を得る、請求項1から16、27、28のいずれか一項に記載の軸外し反射位相顕微鏡システム。
- 画像の位相をアンラッピングするデータプロセッサをさらに備える、及び/又は前記画像は、全視野定量位相画像を含む、請求項1から16、27から29のいずれか一項に記載の軸外し反射位相顕微鏡システム。
- 前記並進ステージに搭載された第1の鏡と、画像からノイズを取り除くように前記アクチュエータに連結された第2の鏡とをさらに備える、請求項11に記載の軸外し反射位相顕微鏡システム。
- 画像から共通モード位相ノイズを除去する、及び/又は前記軸外し反射位相顕微鏡システムは、前記材料の電力スペクトル密度を決定する、請求項1から16、27から31のいずれか一項に記載の軸外し反射位相顕微鏡システム。
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R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |