JP6442902B2 - 眼科装置 - Google Patents

眼科装置 Download PDF

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Publication number
JP6442902B2
JP6442902B2 JP2014156738A JP2014156738A JP6442902B2 JP 6442902 B2 JP6442902 B2 JP 6442902B2 JP 2014156738 A JP2014156738 A JP 2014156738A JP 2014156738 A JP2014156738 A JP 2014156738A JP 6442902 B2 JP6442902 B2 JP 6442902B2
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Japan
Prior art keywords
light
refractive power
eye
power variable
optical system
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Expired - Fee Related
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JP2014156738A
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Japanese (ja)
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JP2016032577A (ja
JP2016032577A5 (enExample
Inventor
遠藤　雅和
雅和 遠藤
佳史 村田
佳史 村田
昌明 羽根渕
昌明 羽根渕
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Nidek Co Ltd
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Nidek Co Ltd
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Priority to JP2014156738A priority Critical patent/JP6442902B2/ja
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  • Eye Examination Apparatus (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2014156738A 2014-07-31 2014-07-31 眼科装置 Expired - Fee Related JP6442902B2 (ja)

Priority Applications (1)

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JP2014156738A JP6442902B2 (ja) 2014-07-31 2014-07-31 眼科装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014156738A JP6442902B2 (ja) 2014-07-31 2014-07-31 眼科装置

Publications (3)

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JP2016032577A JP2016032577A (ja) 2016-03-10
JP2016032577A5 JP2016032577A5 (enExample) 2017-09-07
JP6442902B2 true JP6442902B2 (ja) 2018-12-26

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JP2014156738A Expired - Fee Related JP6442902B2 (ja) 2014-07-31 2014-07-31 眼科装置

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JP (1) JP6442902B2 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110221459A (zh) * 2019-05-24 2019-09-10 广州永士达医疗科技有限责任公司 可调焦距oct探头及oct探测设备

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61125323A (ja) * 1984-11-22 1986-06-13 オリンパス光学工業株式会社 眼底検査装置
JP4430378B2 (ja) * 2003-11-13 2010-03-10 興和株式会社 眼科撮影装置
JP5483873B2 (ja) * 2008-12-26 2014-05-07 キヤノン株式会社 光断層撮像装置、および光断層撮像方法
US20120013849A1 (en) * 2010-07-13 2012-01-19 University Of Kent At Canterbury Apparatus and method of monitoring and measurement using spectral low coherence interferometry
EP2485009A1 (de) * 2011-02-04 2012-08-08 Haag-Streit Ag Frequenzbereichs-OCT
JP5830264B2 (ja) * 2011-04-11 2015-12-09 株式会社トプコン 眼科撮影装置
US20130169971A1 (en) * 2011-11-23 2013-07-04 Wasatch Photonics, Inc. Oct imaging system for curved samples
KR101942976B1 (ko) * 2012-09-28 2019-01-28 삼성전자주식회사 광학 줌 프로브

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JP2016032577A (ja) 2016-03-10

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