JP6105586B2 - エネルギー高感度検出の微分位相コントラストイメージング - Google Patents

エネルギー高感度検出の微分位相コントラストイメージング Download PDF

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JP6105586B2
JP6105586B2 JP2014527761A JP2014527761A JP6105586B2 JP 6105586 B2 JP6105586 B2 JP 6105586B2 JP 2014527761 A JP2014527761 A JP 2014527761A JP 2014527761 A JP2014527761 A JP 2014527761A JP 6105586 B2 JP6105586 B2 JP 6105586B2
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phase
wrapping
image data
pixel
phase gradient
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JP2014525304A (ja
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トーマス ケーラー
トーマス ケーラー
ジェンス‐ペーター シュロムカ
ジェンス‐ペーター シュロムカ
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Koninklijke Philips NV
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    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0012Biomedical image inspection
    • G06T7/0014Biomedical image inspection using an image reference approach
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T11/002D [Two Dimensional] image generation
    • G06T11/003Reconstruction from projections, e.g. tomography
    • G06T11/005Specific pre-processing for tomographic reconstruction, e.g. calibration, source positioning, rebinning, scatter correction, retrospective gating
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00Image enhancement or restoration
    • G06T5/50Image enhancement or restoration using two or more images, e.g. averaging or subtraction
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2211/00Image generation
    • G06T2211/40Computed tomography
    • G06T2211/408Dual energy

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Pulmonology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Medical Informatics (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP2014527761A 2011-08-31 2012-08-08 エネルギー高感度検出の微分位相コントラストイメージング Expired - Fee Related JP6105586B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201161529450P 2011-08-31 2011-08-31
US61/529,450 2011-08-31
PCT/IB2012/054032 WO2013030698A1 (en) 2011-08-31 2012-08-08 Differential phase contrast imaging with energy sensitive detection

Publications (2)

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JP2014525304A JP2014525304A (ja) 2014-09-29
JP6105586B2 true JP6105586B2 (ja) 2017-03-29

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Country Status (7)

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US (1) US9430832B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
EP (1) EP2761586B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JP6105586B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
CN (1) CN103918005B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
IN (1) IN2014CN01546A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
RU (1) RU2598310C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
WO (1) WO2013030698A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

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JP6683118B2 (ja) * 2016-12-20 2020-04-15 株式会社島津製作所 X線位相撮影装置
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US11113851B2 (en) * 2018-07-20 2021-09-07 The Board Of Trustees Of The Leland Stanford Junior University Correction of sharp-edge artifacts in differential phase contrast CT images and its improvement in automatic material identification
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JP7626856B2 (ja) 2020-12-07 2025-02-04 シグレイ、インコーポレイテッド 透過x線源を用いた高スループット3d x線撮像システム
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DE112023001408T5 (de) 2022-03-15 2025-02-13 Sigray, Inc. System und verfahren für die kompakte laminographie unter verwendung einer mikrofokus-transmissionsröntgenquelle und eines röntgendetektors mit variabler vergrösserung
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Also Published As

Publication number Publication date
EP2761586A1 (en) 2014-08-06
EP2761586B1 (en) 2022-10-12
WO2013030698A1 (en) 2013-03-07
CN103918005A (zh) 2014-07-09
RU2014111826A (ru) 2015-10-10
RU2598310C2 (ru) 2016-09-20
US9430832B2 (en) 2016-08-30
CN103918005B (zh) 2017-06-09
US20140205057A1 (en) 2014-07-24
JP2014525304A (ja) 2014-09-29
IN2014CN01546A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 2015-05-08

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