JP6105586B2 - エネルギー高感度検出の微分位相コントラストイメージング - Google Patents
エネルギー高感度検出の微分位相コントラストイメージング Download PDFInfo
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- JP6105586B2 JP6105586B2 JP2014527761A JP2014527761A JP6105586B2 JP 6105586 B2 JP6105586 B2 JP 6105586B2 JP 2014527761 A JP2014527761 A JP 2014527761A JP 2014527761 A JP2014527761 A JP 2014527761A JP 6105586 B2 JP6105586 B2 JP 6105586B2
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Classifications
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0012—Biomedical image inspection
- G06T7/0014—Biomedical image inspection using an image reference approach
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T11/00—2D [Two Dimensional] image generation
- G06T11/003—Reconstruction from projections, e.g. tomography
- G06T11/005—Specific pre-processing for tomographic reconstruction, e.g. calibration, source positioning, rebinning, scatter correction, retrospective gating
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T5/00—Image enhancement or restoration
- G06T5/50—Image enhancement or restoration using two or more images, e.g. averaging or subtraction
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2211/00—Image generation
- G06T2211/40—Computed tomography
- G06T2211/408—Dual energy
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Chemical & Material Sciences (AREA)
- Pulmonology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Medical Informatics (AREA)
- Quality & Reliability (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201161529450P | 2011-08-31 | 2011-08-31 | |
US61/529,450 | 2011-08-31 | ||
PCT/IB2012/054032 WO2013030698A1 (en) | 2011-08-31 | 2012-08-08 | Differential phase contrast imaging with energy sensitive detection |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2014525304A JP2014525304A (ja) | 2014-09-29 |
JP6105586B2 true JP6105586B2 (ja) | 2017-03-29 |
Family
ID=47089091
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2014527761A Expired - Fee Related JP6105586B2 (ja) | 2011-08-31 | 2012-08-08 | エネルギー高感度検出の微分位相コントラストイメージング |
Country Status (7)
Families Citing this family (33)
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US20150117599A1 (en) | 2013-10-31 | 2015-04-30 | Sigray, Inc. | X-ray interferometric imaging system |
KR20140111818A (ko) * | 2013-03-12 | 2014-09-22 | 삼성전자주식회사 | 엑스선 영상 장치 및 그 제어 방법 |
US10269528B2 (en) | 2013-09-19 | 2019-04-23 | Sigray, Inc. | Diverging X-ray sources using linear accumulation |
US10295485B2 (en) | 2013-12-05 | 2019-05-21 | Sigray, Inc. | X-ray transmission spectrometer system |
US10416099B2 (en) | 2013-09-19 | 2019-09-17 | Sigray, Inc. | Method of performing X-ray spectroscopy and X-ray absorption spectrometer system |
US10297359B2 (en) | 2013-09-19 | 2019-05-21 | Sigray, Inc. | X-ray illumination system with multiple target microstructures |
US10304580B2 (en) | 2013-10-31 | 2019-05-28 | Sigray, Inc. | Talbot X-ray microscope |
USRE48612E1 (en) | 2013-10-31 | 2021-06-29 | Sigray, Inc. | X-ray interferometric imaging system |
US10401309B2 (en) | 2014-05-15 | 2019-09-03 | Sigray, Inc. | X-ray techniques using structured illumination |
EP2953097B1 (en) * | 2014-06-02 | 2016-10-26 | Koninklijke Philips N.V. | Biais-free regularization for spectral phase-unwrapping in differential phase contrast imaging |
US10352880B2 (en) | 2015-04-29 | 2019-07-16 | Sigray, Inc. | Method and apparatus for x-ray microscopy |
US10706536B2 (en) | 2015-07-20 | 2020-07-07 | Min Xu | Photon structure and chemometrics pathologic system |
US10295486B2 (en) | 2015-08-18 | 2019-05-21 | Sigray, Inc. | Detector for X-rays with high spatial and high spectral resolution |
US10247683B2 (en) | 2016-12-03 | 2019-04-02 | Sigray, Inc. | Material measurement techniques using multiple X-ray micro-beams |
JP6683118B2 (ja) * | 2016-12-20 | 2020-04-15 | 株式会社島津製作所 | X線位相撮影装置 |
US10578566B2 (en) | 2018-04-03 | 2020-03-03 | Sigray, Inc. | X-ray emission spectrometer system |
JP7195341B2 (ja) | 2018-06-04 | 2022-12-23 | シグレイ、インコーポレイテッド | 波長分散型x線分光計 |
US11113851B2 (en) * | 2018-07-20 | 2021-09-07 | The Board Of Trustees Of The Leland Stanford Junior University | Correction of sharp-edge artifacts in differential phase contrast CT images and its improvement in automatic material identification |
JP7117452B2 (ja) | 2018-07-26 | 2022-08-12 | シグレイ、インコーポレイテッド | 高輝度反射型x線源 |
US10656105B2 (en) | 2018-08-06 | 2020-05-19 | Sigray, Inc. | Talbot-lau x-ray source and interferometric system |
WO2020051061A1 (en) | 2018-09-04 | 2020-03-12 | Sigray, Inc. | System and method for x-ray fluorescence with filtering |
US11056308B2 (en) | 2018-09-07 | 2021-07-06 | Sigray, Inc. | System and method for depth-selectable x-ray analysis |
WO2021046059A1 (en) | 2019-09-03 | 2021-03-11 | Sigray, Inc. | System and method for computed laminography x-ray fluorescence imaging |
US11175243B1 (en) | 2020-02-06 | 2021-11-16 | Sigray, Inc. | X-ray dark-field in-line inspection for semiconductor samples |
WO2021237237A1 (en) | 2020-05-18 | 2021-11-25 | Sigray, Inc. | System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements |
DE112021004828T5 (de) | 2020-09-17 | 2023-08-03 | Sigray, Inc. | System und verfahren unter verwendung von röntgenstrahlen für tiefenauflösende messtechnik und analyse |
JP7626856B2 (ja) | 2020-12-07 | 2025-02-04 | シグレイ、インコーポレイテッド | 透過x線源を用いた高スループット3d x線撮像システム |
US12360067B2 (en) | 2022-03-02 | 2025-07-15 | Sigray, Inc. | X-ray fluorescence system and x-ray source with electrically insulative target material |
DE112023001408T5 (de) | 2022-03-15 | 2025-02-13 | Sigray, Inc. | System und verfahren für die kompakte laminographie unter verwendung einer mikrofokus-transmissionsröntgenquelle und eines röntgendetektors mit variabler vergrösserung |
CN119173759A (zh) | 2022-05-02 | 2024-12-20 | 斯格瑞公司 | X射线顺序阵列波长色散光谱仪 |
WO2024173256A1 (en) | 2023-02-16 | 2024-08-22 | Sigray, Inc. | X-ray detector system with at least two stacked flat bragg diffractors |
US12181423B1 (en) | 2023-09-07 | 2024-12-31 | Sigray, Inc. | Secondary image removal using high resolution x-ray transmission sources |
CN117475172B (zh) * | 2023-12-28 | 2024-03-26 | 湖北工业大学 | 一种基于深度学习的高噪声环境相位图解包裹方法和系统 |
Family Cites Families (21)
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US6526121B1 (en) * | 2000-03-29 | 2003-02-25 | Yeu-Kuang Hwu | Apparatus and method for imaging an object with real-time response |
JP2002336230A (ja) * | 2001-05-16 | 2002-11-26 | Fuji Photo Film Co Ltd | 位相コントラスト画像生成方法および装置並びにプログラム |
US7424173B2 (en) | 2002-09-30 | 2008-09-09 | Fujifilm Corporation | Method, apparatus and program for restoring phase information |
US8014575B2 (en) * | 2004-03-11 | 2011-09-06 | Weiss Kenneth L | Automated neuroaxis (brain and spine) imaging with iterative scan prescriptions, analysis, reconstructions, labeling, surface localization and guided intervention |
EP1731099A1 (en) | 2005-06-06 | 2006-12-13 | Paul Scherrer Institut | Interferometer for quantitative phase contrast imaging and tomography with an incoherent polychromatic x-ray source |
JP4834518B2 (ja) * | 2005-11-29 | 2011-12-14 | キヤノン株式会社 | 放射線撮像装置、その制御方法、及びそれを実行させるためのプログラムを記録した記録媒体 |
DE102006037257B4 (de) * | 2006-02-01 | 2017-06-01 | Siemens Healthcare Gmbh | Verfahren und Messanordnung zur zerstörungsfreien Analyse eines Untersuchungsobjektes mit Röntgenstrahlung |
US20080299588A1 (en) * | 2007-05-30 | 2008-12-04 | The Curators Of The University Of Missouri A Public Corporation Of The State Of Missouri | Methods For Measuring Bone Formation |
ATE524056T1 (de) * | 2007-11-15 | 2011-09-15 | Suisse Electronique Microtech | Interferometervorrichtung und verfahren |
WO2009069040A1 (en) * | 2007-11-26 | 2009-06-04 | Koninklijke Philips Electronics N.V. | Detection setup for x-ray phase contrast imaging |
CN101647706B (zh) * | 2008-08-13 | 2012-05-30 | 清华大学 | 高能双能ct系统的图象重建方法 |
CN101413905B (zh) * | 2008-10-10 | 2011-03-16 | 深圳大学 | X射线微分干涉相衬成像系统 |
EP2442722B1 (en) * | 2009-06-16 | 2017-03-29 | Koninklijke Philips N.V. | Correction method for differential phase contrast imaging |
JP5697370B2 (ja) * | 2009-07-24 | 2015-04-08 | キヤノン株式会社 | X線撮像装置 |
DE102009035286A1 (de) * | 2009-07-30 | 2011-02-10 | Siemens Aktiengesellschaft | Verfahren und Vorrichtung zur Darstellung computertomographischer Untersuchungsdaten eines Untersuchungsobjektes |
EP2488104A1 (en) * | 2009-10-13 | 2012-08-22 | Koninklijke Philips Electronics N.V. | Device and method for generating soft tissue contrast images |
US8208602B2 (en) * | 2010-02-22 | 2012-06-26 | General Electric Company | High flux photon beams using optic devices |
EP2572331A1 (en) * | 2010-05-21 | 2013-03-27 | Koninklijke Philips Electronics N.V. | Edge-preserving noise filtering |
US9518105B2 (en) * | 2010-12-08 | 2016-12-13 | The Research Foundation For The State University Of New York | Polypeptides derived from calcitonin receptors and methods of use |
US9486175B2 (en) * | 2011-07-04 | 2016-11-08 | Koninklijke Philips N.V. | Phase contrast imaging apparatus |
AU2012290646B2 (en) * | 2011-07-29 | 2014-09-04 | The Johns Hopkins University | Differential phase contrast X-ray imaging system and components |
-
2012
- 2012-08-08 JP JP2014527761A patent/JP6105586B2/ja not_active Expired - Fee Related
- 2012-08-08 WO PCT/IB2012/054032 patent/WO2013030698A1/en active Application Filing
- 2012-08-08 RU RU2014111826/08A patent/RU2598310C2/ru not_active IP Right Cessation
- 2012-08-08 US US14/240,783 patent/US9430832B2/en not_active Expired - Fee Related
- 2012-08-08 EP EP12779159.8A patent/EP2761586B1/en active Active
- 2012-08-08 IN IN1546CHN2014 patent/IN2014CN01546A/en unknown
- 2012-08-08 CN CN201280053647.XA patent/CN103918005B/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP2761586A1 (en) | 2014-08-06 |
EP2761586B1 (en) | 2022-10-12 |
WO2013030698A1 (en) | 2013-03-07 |
CN103918005A (zh) | 2014-07-09 |
RU2014111826A (ru) | 2015-10-10 |
RU2598310C2 (ru) | 2016-09-20 |
US9430832B2 (en) | 2016-08-30 |
CN103918005B (zh) | 2017-06-09 |
US20140205057A1 (en) | 2014-07-24 |
JP2014525304A (ja) | 2014-09-29 |
IN2014CN01546A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 2015-05-08 |
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