RU2598310C2 - Формирование дифференциальных фазовых контрастных изображений с помощью чувствительного к энергии обнаружения - Google Patents

Формирование дифференциальных фазовых контрастных изображений с помощью чувствительного к энергии обнаружения Download PDF

Info

Publication number
RU2598310C2
RU2598310C2 RU2014111826/08A RU2014111826A RU2598310C2 RU 2598310 C2 RU2598310 C2 RU 2598310C2 RU 2014111826/08 A RU2014111826/08 A RU 2014111826/08A RU 2014111826 A RU2014111826 A RU 2014111826A RU 2598310 C2 RU2598310 C2 RU 2598310C2
Authority
RU
Russia
Prior art keywords
phase
pixel
coagulation
values
gradient
Prior art date
Application number
RU2014111826/08A
Other languages
English (en)
Russian (ru)
Other versions
RU2014111826A (ru
Inventor
Томас КЕЛЕР
Йенс-Петер ШЛОМКА
Original Assignee
Конинклейке Филипс Н.В.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Конинклейке Филипс Н.В. filed Critical Конинклейке Филипс Н.В.
Publication of RU2014111826A publication Critical patent/RU2014111826A/ru
Application granted granted Critical
Publication of RU2598310C2 publication Critical patent/RU2598310C2/ru

Links

Images

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0012—Biomedical image inspection
    • G06T7/0014—Biomedical image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/50—Image enhancement or restoration using two or more images, e.g. averaging or subtraction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T11/00—2D [Two Dimensional] image generation
    • G06T11/003—Reconstruction from projections, e.g. tomography
    • G06T11/005—Specific pre-processing for tomographic reconstruction, e.g. calibration, source positioning, rebinning, scatter correction, retrospective gating
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2211/00—Image generation
    • G06T2211/40—Computed tomography
    • G06T2211/408—Dual energy

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Pulmonology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Medical Informatics (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
RU2014111826/08A 2011-08-31 2012-08-08 Формирование дифференциальных фазовых контрастных изображений с помощью чувствительного к энергии обнаружения RU2598310C2 (ru)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201161529450P 2011-08-31 2011-08-31
US61/529,450 2011-08-31
PCT/IB2012/054032 WO2013030698A1 (en) 2011-08-31 2012-08-08 Differential phase contrast imaging with energy sensitive detection

Publications (2)

Publication Number Publication Date
RU2014111826A RU2014111826A (ru) 2015-10-10
RU2598310C2 true RU2598310C2 (ru) 2016-09-20

Family

ID=47089091

Family Applications (1)

Application Number Title Priority Date Filing Date
RU2014111826/08A RU2598310C2 (ru) 2011-08-31 2012-08-08 Формирование дифференциальных фазовых контрастных изображений с помощью чувствительного к энергии обнаружения

Country Status (7)

Country Link
US (1) US9430832B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
EP (1) EP2761586B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JP6105586B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
CN (1) CN103918005B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
IN (1) IN2014CN01546A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
RU (1) RU2598310C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
WO (1) WO2013030698A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20150117599A1 (en) 2013-10-31 2015-04-30 Sigray, Inc. X-ray interferometric imaging system
KR20140111818A (ko) * 2013-03-12 2014-09-22 삼성전자주식회사 엑스선 영상 장치 및 그 제어 방법
US10269528B2 (en) 2013-09-19 2019-04-23 Sigray, Inc. Diverging X-ray sources using linear accumulation
US10295485B2 (en) 2013-12-05 2019-05-21 Sigray, Inc. X-ray transmission spectrometer system
US10416099B2 (en) 2013-09-19 2019-09-17 Sigray, Inc. Method of performing X-ray spectroscopy and X-ray absorption spectrometer system
US10297359B2 (en) 2013-09-19 2019-05-21 Sigray, Inc. X-ray illumination system with multiple target microstructures
US10304580B2 (en) 2013-10-31 2019-05-28 Sigray, Inc. Talbot X-ray microscope
USRE48612E1 (en) 2013-10-31 2021-06-29 Sigray, Inc. X-ray interferometric imaging system
US10401309B2 (en) 2014-05-15 2019-09-03 Sigray, Inc. X-ray techniques using structured illumination
EP2953097B1 (en) * 2014-06-02 2016-10-26 Koninklijke Philips N.V. Biais-free regularization for spectral phase-unwrapping in differential phase contrast imaging
US10352880B2 (en) 2015-04-29 2019-07-16 Sigray, Inc. Method and apparatus for x-ray microscopy
US10706536B2 (en) 2015-07-20 2020-07-07 Min Xu Photon structure and chemometrics pathologic system
US10295486B2 (en) 2015-08-18 2019-05-21 Sigray, Inc. Detector for X-rays with high spatial and high spectral resolution
US10247683B2 (en) 2016-12-03 2019-04-02 Sigray, Inc. Material measurement techniques using multiple X-ray micro-beams
JP6683118B2 (ja) * 2016-12-20 2020-04-15 株式会社島津製作所 Ｘ線位相撮影装置
US10578566B2 (en) 2018-04-03 2020-03-03 Sigray, Inc. X-ray emission spectrometer system
JP7195341B2 (ja) 2018-06-04 2022-12-23 シグレイ、インコーポレイテッド 波長分散型ｘ線分光計
US11113851B2 (en) * 2018-07-20 2021-09-07 The Board Of Trustees Of The Leland Stanford Junior University Correction of sharp-edge artifacts in differential phase contrast CT images and its improvement in automatic material identification
JP7117452B2 (ja) 2018-07-26 2022-08-12 シグレイ、インコーポレイテッド 高輝度反射型ｘ線源
US10656105B2 (en) 2018-08-06 2020-05-19 Sigray, Inc. Talbot-lau x-ray source and interferometric system
WO2020051061A1 (en) 2018-09-04 2020-03-12 Sigray, Inc. System and method for x-ray fluorescence with filtering
US11056308B2 (en) 2018-09-07 2021-07-06 Sigray, Inc. System and method for depth-selectable x-ray analysis
WO2021046059A1 (en) 2019-09-03 2021-03-11 Sigray, Inc. System and method for computed laminography x-ray fluorescence imaging
US11175243B1 (en) 2020-02-06 2021-11-16 Sigray, Inc. X-ray dark-field in-line inspection for semiconductor samples
WO2021237237A1 (en) 2020-05-18 2021-11-25 Sigray, Inc. System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements
DE112021004828T5 (de) 2020-09-17 2023-08-03 Sigray, Inc. System und verfahren unter verwendung von röntgenstrahlen für tiefenauflösende messtechnik und analyse
JP7626856B2 (ja) 2020-12-07 2025-02-04 シグレイ、インコーポレイテッド 透過ｘ線源を用いた高スループット３ｄ ｘ線撮像システム
US12360067B2 (en) 2022-03-02 2025-07-15 Sigray, Inc. X-ray fluorescence system and x-ray source with electrically insulative target material
DE112023001408T5 (de) 2022-03-15 2025-02-13 Sigray, Inc. System und verfahren für die kompakte laminographie unter verwendung einer mikrofokus-transmissionsröntgenquelle und eines röntgendetektors mit variabler vergrösserung
CN119173759A (zh) 2022-05-02 2024-12-20 斯格瑞公司 X射线顺序阵列波长色散光谱仪
WO2024173256A1 (en) 2023-02-16 2024-08-22 Sigray, Inc. X-ray detector system with at least two stacked flat bragg diffractors
US12181423B1 (en) 2023-09-07 2024-12-31 Sigray, Inc. Secondary image removal using high resolution x-ray transmission sources
CN117475172B (zh) * 2023-12-28 2024-03-26 湖北工业大学 一种基于深度学习的高噪声环境相位图解包裹方法和系统

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1731099A1 (en) * 2005-06-06 2006-12-13 Paul Scherrer Institut Interferometer for quantitative phase contrast imaging and tomography with an incoherent polychromatic x-ray source
RU2379712C1 (ru) * 2005-11-29 2010-01-20 Кэнон Кабусики Кайся Устройство формирования изображений методом излучения, способ управления для него и машиночитаемый носитель, хранящий программу осуществления способа
WO2010146503A1 (en) * 2009-06-16 2010-12-23 Koninklijke Philips Electronics N. V. Correction method for differential phase contrast imaging
WO2011010750A2 (en) * 2009-07-24 2011-01-27 Canon Kabushiki Kaisha X-ray imaging apparatus and x-ray imaging method
RU2413207C1 (ru) * 2008-08-13 2011-02-27 Тсинхуа Юниверсити Способ реконструкции изображений для высокоэнергетической двухэнергетической системы компьютерной томографии

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6526121B1 (en) * 2000-03-29 2003-02-25 Yeu-Kuang Hwu Apparatus and method for imaging an object with real-time response
JP2002336230A (ja) * 2001-05-16 2002-11-26 Fuji Photo Film Co Ltd 位相コントラスト画像生成方法および装置並びにプログラム
US7424173B2 (en) 2002-09-30 2008-09-09 Fujifilm Corporation Method, apparatus and program for restoring phase information
US8014575B2 (en) * 2004-03-11 2011-09-06 Weiss Kenneth L Automated neuroaxis (brain and spine) imaging with iterative scan prescriptions, analysis, reconstructions, labeling, surface localization and guided intervention
DE102006037257B4 (de) * 2006-02-01 2017-06-01 Siemens Healthcare Gmbh Verfahren und Messanordnung zur zerstörungsfreien Analyse eines Untersuchungsobjektes mit Röntgenstrahlung
US20080299588A1 (en) * 2007-05-30 2008-12-04 The Curators Of The University Of Missouri A Public Corporation Of The State Of Missouri Methods For Measuring Bone Formation
ATE524056T1 (de) * 2007-11-15 2011-09-15 Suisse Electronique Microtech Interferometervorrichtung und verfahren
WO2009069040A1 (en) * 2007-11-26 2009-06-04 Koninklijke Philips Electronics N.V. Detection setup for x-ray phase contrast imaging
CN101413905B (zh) * 2008-10-10 2011-03-16 深圳大学 X射线微分干涉相衬成像系统
DE102009035286A1 (de) * 2009-07-30 2011-02-10 Siemens Aktiengesellschaft Verfahren und Vorrichtung zur Darstellung computertomographischer Untersuchungsdaten eines Untersuchungsobjektes
EP2488104A1 (en) * 2009-10-13 2012-08-22 Koninklijke Philips Electronics N.V. Device and method for generating soft tissue contrast images
US8208602B2 (en) * 2010-02-22 2012-06-26 General Electric Company High flux photon beams using optic devices
EP2572331A1 (en) * 2010-05-21 2013-03-27 Koninklijke Philips Electronics N.V. Edge-preserving noise filtering
US9518105B2 (en) * 2010-12-08 2016-12-13 The Research Foundation For The State University Of New York Polypeptides derived from calcitonin receptors and methods of use
US9486175B2 (en) * 2011-07-04 2016-11-08 Koninklijke Philips N.V. Phase contrast imaging apparatus
AU2012290646B2 (en) * 2011-07-29 2014-09-04 The Johns Hopkins University Differential phase contrast X-ray imaging system and components

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1731099A1 (en) * 2005-06-06 2006-12-13 Paul Scherrer Institut Interferometer for quantitative phase contrast imaging and tomography with an incoherent polychromatic x-ray source
RU2379712C1 (ru) * 2005-11-29 2010-01-20 Кэнон Кабусики Кайся Устройство формирования изображений методом излучения, способ управления для него и машиночитаемый носитель, хранящий программу осуществления способа
RU2413207C1 (ru) * 2008-08-13 2011-02-27 Тсинхуа Юниверсити Способ реконструкции изображений для высокоэнергетической двухэнергетической системы компьютерной томографии
WO2010146503A1 (en) * 2009-06-16 2010-12-23 Koninklijke Philips Electronics N. V. Correction method for differential phase contrast imaging
WO2011010750A2 (en) * 2009-07-24 2011-01-27 Canon Kabushiki Kaisha X-ray imaging apparatus and x-ray imaging method

Also Published As

Publication number Publication date
EP2761586A1 (en) 2014-08-06
EP2761586B1 (en) 2022-10-12
WO2013030698A1 (en) 2013-03-07
CN103918005A (zh) 2014-07-09
RU2014111826A (ru) 2015-10-10
US9430832B2 (en) 2016-08-30
CN103918005B (zh) 2017-06-09
US20140205057A1 (en) 2014-07-24
JP6105586B2 (ja) 2017-03-29
JP2014525304A (ja) 2014-09-29
IN2014CN01546A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 2015-05-08

Similar Documents

Publication Publication Date Title
RU2598310C2 (ru) Формирование дифференциальных фазовых контрастных изображений с помощью чувствительного к энергии обнаружения
JP6177800B2 (ja) Ｘ線システムにおける減衰画像データおよび位相画像データの生成
JP5142540B2 (ja) Ｘ線装置の焦点‐検出器システム
US9168013B2 (en) Breast density assessment
EP2611364B1 (en) Differential phase-contrast imaging with improved sampling
Rodríguez-Ruiz et al. Evaluation of the technical performance of three different commercial digital breast tomosynthesis systems in the clinical environment
JP6162241B2 (ja) Ｘ線ｃｔ装置
EP3383273B1 (en) Apparatus for x-ray imaging an object
JP2009525084A (ja) Ｘ線システムを用いた投影画像および断層撮影画像の作成方法
JP2004513690A (ja) Ｘ線コンピュータトモグラフィ装置の散乱放射補正方法
JP2011245117A (ja) Ｘ線画像診断装置
EP2721581B1 (en) Method to detect and indicate inaccuracies in long length imaging
Epple et al. Phase unwrapping in spectral X-ray differential phase-contrast imaging with an energy-resolving photon-counting pixel detector
CN110998653A (zh) 用于暗场成像的散射校正
JP2015213665A (ja) 放射線撮像装置
Jensen et al. Quantitative measurements versus receiver operating characteristics and visual grading regression in CT images reconstructed with iterative reconstruction: a phantom study
JP5699842B2 (ja) 画質評価方法およびそれを用いたｘ線透視撮影装置
JP6546201B2 (ja) オブジェクトの画像を生成するイメージングシステム
EP3930578B1 (en) System, method and computer program for acquiring phase imaging data of an object
Seifert et al. Single-shot talbot–lau x-ray dark-field imaging of a porcine lung applying the moiré imaging approach
EP3998948B1 (en) Apparatus for processing data acquired by a dark-field and/or phase contrast x-ray imaging system
EP2595115A1 (en) Method and apparatus for X-ray scattering estimation and reconstruction in digital tomosynthesis system
EP4497388A1 (en) Determining a scatter correction
EP3597105B1 (en) Medical image processing device and medical image photographing system
US20230218258A1 (en) Apparatus for correction of collimator penumbra in an x-ray image

Legal Events

Date Code Title Description
MM4A The patent is invalid due to non-payment of fees

Effective date: 20190809