JP6038890B2 - ゼロ熱流束深部組織温度測定システム - Google Patents
ゼロ熱流束深部組織温度測定システム Download PDFInfo
- Publication number
- JP6038890B2 JP6038890B2 JP2014510300A JP2014510300A JP6038890B2 JP 6038890 B2 JP6038890 B2 JP 6038890B2 JP 2014510300 A JP2014510300 A JP 2014510300A JP 2014510300 A JP2014510300 A JP 2014510300A JP 6038890 B2 JP6038890 B2 JP 6038890B2
- Authority
- JP
- Japan
- Prior art keywords
- probe
- temperature
- heater
- heat flux
- zero heat
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K13/00—Thermometers specially adapted for specific purposes
- G01K13/20—Clinical contact thermometers for use with humans or animals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K1/00—Details of thermometers not specially adapted for particular types of thermometer
- G01K1/16—Special arrangements for conducting heat from the object to the sensitive element
- G01K1/165—Special arrangements for conducting heat from the object to the sensitive element for application in zero heat flux sensors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K15/00—Testing or calibrating of thermometers
- G01K15/005—Calibration
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/22—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Measuring And Recording Apparatus For Diagnosis (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161518766P | 2011-05-10 | 2011-05-10 | |
| US61/518,766 | 2011-05-10 | ||
| US13/373,529 US9354122B2 (en) | 2011-05-10 | 2011-11-17 | Zero-heat-flux, deep tissue temperature measurement system |
| US13/373,529 | 2011-11-17 | ||
| PCT/US2012/000112 WO2012154212A2 (en) | 2011-05-10 | 2012-03-01 | A zero-heat-flux, deep tissue temperature measurement system |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2014513310A JP2014513310A (ja) | 2014-05-29 |
| JP2014513310A5 JP2014513310A5 (cg-RX-API-DMAC7.html) | 2015-04-02 |
| JP6038890B2 true JP6038890B2 (ja) | 2016-12-07 |
Family
ID=45977012
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014510300A Active JP6038890B2 (ja) | 2011-05-10 | 2012-03-01 | ゼロ熱流束深部組織温度測定システム |
Country Status (9)
| Country | Link |
|---|---|
| US (2) | US9354122B2 (cg-RX-API-DMAC7.html) |
| EP (1) | EP2707682B1 (cg-RX-API-DMAC7.html) |
| JP (1) | JP6038890B2 (cg-RX-API-DMAC7.html) |
| CN (1) | CN103582806A (cg-RX-API-DMAC7.html) |
| AU (2) | AU2012254171A1 (cg-RX-API-DMAC7.html) |
| BR (1) | BR112013028136A2 (cg-RX-API-DMAC7.html) |
| CA (1) | CA2834717A1 (cg-RX-API-DMAC7.html) |
| MX (1) | MX2013012705A (cg-RX-API-DMAC7.html) |
| WO (1) | WO2012154212A2 (cg-RX-API-DMAC7.html) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US12422308B2 (en) | 2022-05-27 | 2025-09-23 | Semitec Corporation | Deep temperature measuring device and deep temperature measuring method |
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| US8292495B2 (en) | 2010-04-07 | 2012-10-23 | Arizant Healthcare Inc. | Zero-heat-flux, deep tissue temperature measurement devices with thermal sensor calibration |
| US8292502B2 (en) | 2010-04-07 | 2012-10-23 | Arizant Healthcare Inc. | Constructions for zero-heat-flux, deep tissue temperature measurement devices |
| WO2014088886A1 (en) * | 2012-12-06 | 2014-06-12 | Shuntcheck, Inc. | Csf shunt flow evaluation apparatus and method using a conformable expanded dynamic range thermosensor |
| JP6337416B2 (ja) * | 2013-03-12 | 2018-06-06 | セイコーエプソン株式会社 | 温度測定装置 |
| US9622336B2 (en) * | 2013-10-25 | 2017-04-11 | Tektronix, Inc. | Releasable probe connection |
| US9468485B2 (en) | 2013-12-12 | 2016-10-18 | Medtronic Cryocath Lp | Real-time lesion formation assessment |
| US10009993B2 (en) * | 2014-04-18 | 2018-06-26 | Xerox Corporation | Circuit board reflow of components using on board copper traces as heating element |
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| JP6662869B2 (ja) * | 2014-10-29 | 2020-03-11 | コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. | 温度を制御するシステム及び方法 |
| CN104434048B (zh) * | 2014-12-01 | 2016-08-24 | 电子科技大学 | 一种人体深层组织温度测量仪及测量方法 |
| JP2016164525A (ja) * | 2015-03-06 | 2016-09-08 | セイコーエプソン株式会社 | 温度測定装置及び温度測定方法 |
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| JP6783604B2 (ja) * | 2016-09-27 | 2020-11-11 | 株式会社トプコン | 測温装置及び測温方法 |
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| US10820802B2 (en) * | 2016-12-30 | 2020-11-03 | Welch Allyn, Inc. | Wearable patch for patient monitoring |
| US11406326B2 (en) | 2017-03-14 | 2022-08-09 | Mordehy HABER | Method, system and device for noninvasive core body temperature monitoring |
| JP7116286B2 (ja) | 2017-03-31 | 2022-08-10 | 日本電気株式会社 | 温度拡散係数計測装置、それを用いた深部体温計、深部体温計測装置、および深部体温計測方法 |
| JP6999385B2 (ja) * | 2017-11-30 | 2022-01-18 | 株式会社テクノ・コモンズ | 物体のデータ測定装置 |
| WO2019126607A1 (en) * | 2017-12-22 | 2019-06-27 | Robert Bosch Gmbh | Core temperature sensor with thermal conductivity compensation |
| CN108038331B (zh) * | 2017-12-27 | 2022-11-11 | 重庆工商职业学院 | 一种基于云计算的高精度温度数据校正方法 |
| US11751768B2 (en) * | 2017-12-28 | 2023-09-12 | Techno-Commons, Inc. | Biological data measuring device |
| JP6962464B2 (ja) | 2018-05-21 | 2021-11-05 | 株式会社村田製作所 | 貼付型深部体温計 |
| CN109008989B (zh) * | 2018-06-14 | 2024-06-11 | 杭州感到科技有限公司 | 腹部核温的测量方法和设备 |
| US11872156B2 (en) | 2018-08-22 | 2024-01-16 | Masimo Corporation | Core body temperature measurement |
| US12329679B2 (en) | 2018-09-20 | 2025-06-17 | Solventum Intellectual Properties Company | Apparatus with sensor feedback |
| JP7340600B2 (ja) * | 2018-10-04 | 2023-09-07 | オニオ アーエス | センサ、生体の深部温度を推定する方法、及びセンサを使用する方法 |
| EP3881042A1 (en) * | 2018-11-12 | 2021-09-22 | Koninklijke Philips N.V. | Switched capacitor resistance emulation |
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| CN111446118B (zh) * | 2020-04-29 | 2024-05-28 | 上海乐研电气有限公司 | 具有仿真校验功能的气体密度继电器及其仿真校验方法 |
| CN111693177A (zh) * | 2020-06-23 | 2020-09-22 | 广东小天才科技有限公司 | 体核温度测量方法、装置、介质和智能可穿戴设备 |
| CN111880585B (zh) * | 2020-07-23 | 2024-08-06 | 昆山迈致治具科技有限公司 | 一种温度控制板 |
| CN112384040B (zh) * | 2020-11-12 | 2022-05-24 | 中国电子科技集团公司第二十九研究所 | 一种蒙皮换热旁路控制系统及其控制方法 |
| US20220252467A1 (en) * | 2021-02-05 | 2022-08-11 | Tommy Gene Cooper | Temperature sensor devices and methods for the use thereof |
| CN113558582B (zh) * | 2021-07-23 | 2024-12-17 | 中国人民解放军联勤保障部队第九〇〇医院 | 核心体温测量装置、方法及电子设备 |
| KR20230017981A (ko) | 2021-07-29 | 2023-02-07 | 삼성전자주식회사 | 체온 추정 장치 및 방법 |
| KR20230032212A (ko) | 2021-08-30 | 2023-03-07 | 삼성전자주식회사 | 체온 추정 장치 및 방법 |
| US12474223B2 (en) | 2021-09-24 | 2025-11-18 | Apple Inc. | Temperature sensing systems and methods including multiple temperature sensors |
| KR20230096348A (ko) * | 2021-12-23 | 2023-06-30 | 삼성전자주식회사 | 체온 추정 장치 및 방법 |
| CN114414099A (zh) * | 2022-03-16 | 2022-04-29 | 广东恒翼能科技有限公司 | 一种针床设备温度探针校准、线序检测工装系统 |
| CN115081316A (zh) | 2022-06-07 | 2022-09-20 | 武汉大学 | 基于改进麻雀搜索算法的dc/dc变换器故障诊断方法及系统 |
| KR20240073613A (ko) * | 2022-11-18 | 2024-05-27 | 삼성전자주식회사 | 전자 장치 및 그 전자 장치를 이용한 피부 표면 온도 추정 방법 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US12422308B2 (en) | 2022-05-27 | 2025-09-23 | Semitec Corporation | Deep temperature measuring device and deep temperature measuring method |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2014513310A (ja) | 2014-05-29 |
| US20120289855A1 (en) | 2012-11-15 |
| WO2012154212A2 (en) | 2012-11-15 |
| US10274383B2 (en) | 2019-04-30 |
| CN103582806A (zh) | 2014-02-12 |
| US9354122B2 (en) | 2016-05-31 |
| EP2707682A2 (en) | 2014-03-19 |
| EP2707682B1 (en) | 2019-11-27 |
| AU2012254171A1 (en) | 2013-11-14 |
| CA2834717A1 (en) | 2012-11-15 |
| AU2015202681B2 (en) | 2017-02-02 |
| US20160238463A1 (en) | 2016-08-18 |
| WO2012154212A3 (en) | 2013-04-11 |
| MX2013012705A (es) | 2014-03-05 |
| AU2015202681A1 (en) | 2015-06-11 |
| BR112013028136A2 (pt) | 2017-01-10 |
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