JP5998479B2 - 光伝導アンテナ、テラヘルツ波発生装置、カメラ、イメージング装置および計測装置 - Google Patents

光伝導アンテナ、テラヘルツ波発生装置、カメラ、イメージング装置および計測装置 Download PDF

Info

Publication number
JP5998479B2
JP5998479B2 JP2011290068A JP2011290068A JP5998479B2 JP 5998479 B2 JP5998479 B2 JP 5998479B2 JP 2011290068 A JP2011290068 A JP 2011290068A JP 2011290068 A JP2011290068 A JP 2011290068A JP 5998479 B2 JP5998479 B2 JP 5998479B2
Authority
JP
Japan
Prior art keywords
conductive layer
layer
terahertz wave
semiconductor
semiconductor layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2011290068A
Other languages
English (en)
Japanese (ja)
Other versions
JP2013140854A (ja
JP2013140854A5 (enExample
Inventor
紘斗 冨岡
紘斗 冨岡
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP2011290068A priority Critical patent/JP5998479B2/ja
Priority to US13/717,857 priority patent/US8872107B2/en
Priority to EP12199071.7A priority patent/EP2610923A3/en
Priority to KR1020120152330A priority patent/KR20130076732A/ko
Priority to TW101149905A priority patent/TW201328087A/zh
Priority to CN2012105753357A priority patent/CN103187679A/zh
Publication of JP2013140854A publication Critical patent/JP2013140854A/ja
Publication of JP2013140854A5 publication Critical patent/JP2013140854A5/ja
Application granted granted Critical
Publication of JP5998479B2 publication Critical patent/JP5998479B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01QANTENNAS, i.e. RADIO AERIALS
    • H01Q1/00Details of, or arrangements associated with, antennas
    • H01Q1/36Structural form of radiating elements, e.g. cone, spiral, umbrella; Particular materials used therewith
    • H01Q1/38Structural form of radiating elements, e.g. cone, spiral, umbrella; Particular materials used therewith formed by a conductive layer on an insulating support
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01QANTENNAS, i.e. RADIO AERIALS
    • H01Q1/00Details of, or arrangements associated with, antennas
    • H01Q1/36Structural form of radiating elements, e.g. cone, spiral, umbrella; Particular materials used therewith
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01QANTENNAS, i.e. RADIO AERIALS
    • H01Q23/00Antennas with active circuits or circuit elements integrated within them or attached to them
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S1/00Masers, i.e. devices using stimulated emission of electromagnetic radiation in the microwave range
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/10Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices being sensitive to infrared radiation, visible or ultraviolet radiation, and having no potential barriers, e.g. photoresistors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/21Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
    • H10F30/22Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes
    • H10F30/223Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes the potential barrier being a PIN barrier
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F55/00Radiation-sensitive semiconductor devices covered by groups H10F10/00, H10F19/00 or H10F30/00 being structurally associated with electric light sources and electrically or optically coupled thereto
    • H10F55/20Radiation-sensitive semiconductor devices covered by groups H10F10/00, H10F19/00 or H10F30/00 being structurally associated with electric light sources and electrically or optically coupled thereto wherein the electric light source controls the radiation-sensitive semiconductor devices, e.g. optocouplers

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Light Receiving Elements (AREA)
JP2011290068A 2011-12-28 2011-12-28 光伝導アンテナ、テラヘルツ波発生装置、カメラ、イメージング装置および計測装置 Expired - Fee Related JP5998479B2 (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2011290068A JP5998479B2 (ja) 2011-12-28 2011-12-28 光伝導アンテナ、テラヘルツ波発生装置、カメラ、イメージング装置および計測装置
US13/717,857 US8872107B2 (en) 2011-12-28 2012-12-18 Photoconductive antenna, terahertz wave generating device, camera, imaging device, and measuring device
EP12199071.7A EP2610923A3 (en) 2011-12-28 2012-12-21 Photoconductive antenna, terahertz wave generating device, camera, imaging device, and measuring device
KR1020120152330A KR20130076732A (ko) 2011-12-28 2012-12-24 광 전도 안테나, 테라헤르츠파 발생 장치, 카메라, 이미징 장치 및 계측 장치
TW101149905A TW201328087A (zh) 2011-12-28 2012-12-25 光傳導天線、兆赫波產生裝置、相機、成像裝置及測量裝置
CN2012105753357A CN103187679A (zh) 2011-12-28 2012-12-26 光导天线、太赫兹波产生装置、拍摄装置、成像装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011290068A JP5998479B2 (ja) 2011-12-28 2011-12-28 光伝導アンテナ、テラヘルツ波発生装置、カメラ、イメージング装置および計測装置

Publications (3)

Publication Number Publication Date
JP2013140854A JP2013140854A (ja) 2013-07-18
JP2013140854A5 JP2013140854A5 (enExample) 2015-02-19
JP5998479B2 true JP5998479B2 (ja) 2016-09-28

Family

ID=47678515

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011290068A Expired - Fee Related JP5998479B2 (ja) 2011-12-28 2011-12-28 光伝導アンテナ、テラヘルツ波発生装置、カメラ、イメージング装置および計測装置

Country Status (6)

Country Link
US (1) US8872107B2 (enExample)
EP (1) EP2610923A3 (enExample)
JP (1) JP5998479B2 (enExample)
KR (1) KR20130076732A (enExample)
CN (1) CN103187679A (enExample)
TW (1) TW201328087A (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI481825B (zh) * 2013-11-21 2015-04-21 Finetek Co Ltd Level detection device with integrated lens antenna
JP2015148541A (ja) * 2014-02-07 2015-08-20 セイコーエプソン株式会社 光伝導アンテナ、カメラ、イメージング装置、および計測装置
JP6485624B2 (ja) * 2014-10-28 2019-03-20 セイコーエプソン株式会社 計測装置
NL2015262B9 (en) * 2015-08-04 2017-04-10 Univ Delft Tech Photoconductive antenna array.
JP2017084991A (ja) * 2015-10-29 2017-05-18 セイコーエプソン株式会社 テラヘルツ波発生装置、イメージング装置、カメラ、および計測装置
CN108369967B (zh) * 2016-01-20 2021-12-14 索尼公司 光接收元件、光接收元件的制造方法、成像元件和电子设备
KR102666357B1 (ko) * 2019-09-19 2024-05-17 한국전력공사 대구경 어레이형 테라헤르츠 광전도 안테나
JP7577675B2 (ja) * 2019-10-10 2024-11-05 ローム株式会社 テラヘルツ装置

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5371399A (en) * 1991-06-14 1994-12-06 International Business Machines Corporation Compound semiconductor having metallic inclusions and devices fabricated therefrom
US5894125A (en) * 1997-08-18 1999-04-13 Lucent Technologies Inc. Near field terahertz imaging
GB2396695B (en) * 2001-01-16 2005-05-04 Teraview Ltd Apparatus and method for investigating a sample
CN1993869A (zh) * 2004-07-30 2007-07-04 佳能株式会社 光学半导体器件
JP3913253B2 (ja) * 2004-07-30 2007-05-09 キヤノン株式会社 光半導体装置およびその製造方法
JP2006313803A (ja) 2005-05-09 2006-11-16 Matsushita Electric Ind Co Ltd テラヘルツ電磁波発生装置
JP2007300022A (ja) 2006-05-02 2007-11-15 Material Design Factory:Kk テラヘルツ波増幅装置、テラヘルツ波変調装置ならびにこれを用いた通信装置およびセンシング装置
JP5127360B2 (ja) * 2007-08-20 2013-01-23 キヤノン株式会社 発振素子、及び検査装置
US9117133B2 (en) * 2008-06-18 2015-08-25 Spectral Image, Inc. Systems and methods for hyperspectral imaging
JP5419411B2 (ja) * 2008-10-08 2014-02-19 キヤノン株式会社 テラヘルツ波発生素子
KR101385108B1 (ko) * 2009-12-17 2014-04-29 한국전자통신연구원 포토믹서 모듈 및 그것의 테라헤르츠파 발생 방법
JP5582822B2 (ja) * 2010-02-26 2014-09-03 キヤノン株式会社 電磁波発生装置
JP5709562B2 (ja) * 2010-03-04 2015-04-30 キヤノン株式会社 テラヘルツ波発生素子、およびテラヘルツ時間領域分光装置
JP2011202972A (ja) * 2010-03-24 2011-10-13 Fujitsu Ltd イメージング装置
JP5418916B2 (ja) * 2010-06-04 2014-02-19 日本電気株式会社 反射型イメージング装置

Also Published As

Publication number Publication date
EP2610923A2 (en) 2013-07-03
EP2610923A3 (en) 2017-08-16
JP2013140854A (ja) 2013-07-18
US8872107B2 (en) 2014-10-28
TW201328087A (zh) 2013-07-01
US20130168550A1 (en) 2013-07-04
CN103187679A (zh) 2013-07-03
KR20130076732A (ko) 2013-07-08

Similar Documents

Publication Publication Date Title
JP5998479B2 (ja) 光伝導アンテナ、テラヘルツ波発生装置、カメラ、イメージング装置および計測装置
JP6003063B2 (ja) 光伝導アンテナ、テラヘルツ波発生装置、カメラ、イメージング装置および計測装置
US9341567B2 (en) Terahertz wave generation device, light source device, camera, imaging device, and measurement device
US20130134309A1 (en) Nonlinear optical and electro-optical devices and methods of use thereof for amplification of non-linear properties
JP5910064B2 (ja) 光伝導アンテナ、テラヘルツ波発生装置、カメラ、イメージング装置および計測装置
US8859970B2 (en) Terahertz wave generating device, camera, imaging device, and measurement device
CN103682957B (zh) 短光脉冲产生装置、太赫兹波产生装置、及其应用装置
JP6721431B2 (ja) 量子カスケード検出器
JP2015159176A (ja) 光伝導アンテナ、カメラ、イメージング装置、および計測装置
US20130120584A1 (en) Short light pulse generating device, terahertz wave generating device, camera, imaging device, and measuring device
US9929292B2 (en) Quantum cascade detector
US20150228840A1 (en) Photoconductive antenna, camera, imaging device, and measurement device
JP5987346B2 (ja) アンテナ、テラヘルツ波発生装置、カメラ、イメージング装置、および計測装置
JP2017084991A (ja) テラヘルツ波発生装置、イメージング装置、カメラ、および計測装置
JP2015118244A (ja) 短光パルス発生装置、テラヘルツ波発生装置、カメラ、イメージング装置、および計測装置
JP2016009778A (ja) 光伝導アンテナ、テラヘルツ波発生装置、カメラ、イメージング装置、および計測装置
Yardimci et al. High-sensitivity, broadband terahertz detectors based on plasmonic nano-antenna arrays
JP2015119034A (ja) 短光パルス発生装置、テラヘルツ波発生装置、カメラ、イメージング装置、および計測装置

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20141224

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20141224

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20160105

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20160303

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20160802

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20160815

R150 Certificate of patent or registration of utility model

Ref document number: 5998479

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

LAPS Cancellation because of no payment of annual fees