JP5945108B2 - 付着物検査装置及び検査方法 - Google Patents

付着物検査装置及び検査方法 Download PDF

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Publication number
JP5945108B2
JP5945108B2 JP2011221847A JP2011221847A JP5945108B2 JP 5945108 B2 JP5945108 B2 JP 5945108B2 JP 2011221847 A JP2011221847 A JP 2011221847A JP 2011221847 A JP2011221847 A JP 2011221847A JP 5945108 B2 JP5945108 B2 JP 5945108B2
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air
unit
inspection
air nozzle
baggage
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Japanese (ja)
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JP2013083472A5 (enExample
JP2013083472A (ja
Inventor
鹿島　秀夫
秀夫 鹿島
菅谷　昌和
昌和 菅谷
光一 寺田
光一 寺田
泰徳 土井
泰徳 土井
康孝 鈴木
康孝 鈴木
永野　久志
久志 永野
橋本　雄一郎
雄一郎 橋本
高田　安章
安章 高田
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Hitachi Ltd
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Hitachi Ltd
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Priority to JP2011221847A priority Critical patent/JP5945108B2/ja
Priority to PCT/JP2012/075459 priority patent/WO2013051530A1/ja
Priority to US14/349,672 priority patent/US9696288B2/en
Publication of JP2013083472A publication Critical patent/JP2013083472A/ja
Publication of JP2013083472A5 publication Critical patent/JP2013083472A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0004—Gaseous mixtures, e.g. polluted air
    • G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
    • G01N33/0011—Sample conditioning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/22—Devices for withdrawing samples in the gaseous state
    • G01N1/2202—Devices for withdrawing samples in the gaseous state involving separation of sample components during sampling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N2001/022—Devices for withdrawing samples sampling for security purposes, e.g. contraband, warfare agents
    • G01N2001/024—Devices for withdrawing samples sampling for security purposes, e.g. contraband, warfare agents passengers or luggage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N2001/028—Sampling from a surface, swabbing, vaporising

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  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Pathology (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Combustion & Propulsion (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Molecular Biology (AREA)
  • Biomedical Technology (AREA)
  • Sampling And Sample Adjustment (AREA)
JP2011221847A 2011-10-06 2011-10-06 付着物検査装置及び検査方法 Active JP5945108B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2011221847A JP5945108B2 (ja) 2011-10-06 2011-10-06 付着物検査装置及び検査方法
PCT/JP2012/075459 WO2013051530A1 (ja) 2011-10-06 2012-10-02 付着物検査装置及び検査方法
US14/349,672 US9696288B2 (en) 2011-10-06 2012-10-02 Attached matter testing device and testing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011221847A JP5945108B2 (ja) 2011-10-06 2011-10-06 付着物検査装置及び検査方法

Publications (3)

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JP2013083472A JP2013083472A (ja) 2013-05-09
JP2013083472A5 JP2013083472A5 (enExample) 2014-09-04
JP5945108B2 true JP5945108B2 (ja) 2016-07-05

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JP2011221847A Active JP5945108B2 (ja) 2011-10-06 2011-10-06 付着物検査装置及び検査方法

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US (1) US9696288B2 (enExample)
JP (1) JP5945108B2 (enExample)
WO (1) WO2013051530A1 (enExample)

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US20150030874A1 (en) * 2011-09-23 2015-01-29 Lucas-Milhaupt, Inc. Luminescent Braze Preforms
JP5945108B2 (ja) 2011-10-06 2016-07-05 株式会社日立製作所 付着物検査装置及び検査方法
JP6002061B2 (ja) * 2013-02-27 2016-10-05 株式会社日立製作所 微粒子分析装置
JP6200577B2 (ja) * 2014-03-24 2017-09-20 株式会社日立製作所 物質検査システム及び物質検査方法
JP6313123B2 (ja) * 2014-05-28 2018-04-18 東京エレクトロン株式会社 測定装置及び測定方法
WO2015200926A1 (en) * 2014-06-27 2015-12-30 Pulse Heath Llc Fluorescence detection assembly
JP6581786B2 (ja) * 2015-03-18 2019-09-25 株式会社日立ハイテクソリューションズ 薬物探知装置
US9671320B2 (en) * 2015-08-20 2017-06-06 Jusun Instruments Co., Ltd. Semi-dry type electrostatic cyclone sampler and method for sampling gas and/or water sample
FI20155830A7 (fi) * 2015-11-11 2017-05-12 Univ Helsinki Menetelmä ja järjestely haitallisten ainesten havaitsemiseksi
JP6691011B2 (ja) * 2016-07-20 2020-04-28 株式会社日立製作所 分析システム及びクリーニング方法
FI20165702A7 (fi) * 2016-09-19 2018-03-20 Karsa Oy Laite ja menetelmä pienissä ja keskisuurissa matkatavaroissa olevien laittomien aineiden jäämien seulomiseen
JP6727722B2 (ja) 2016-11-29 2020-07-22 株式会社日立製作所 気流型分析システムの標準試料作成方法
US10401264B2 (en) * 2017-08-08 2019-09-03 National Chiao Tung University Efficient electrostatic particle-into-liquid sampler which prevents sampling artifacts
US10471373B2 (en) * 2017-08-11 2019-11-12 Vahid Atharinia Water disinfection method and apparatus
CN108061669A (zh) * 2017-12-29 2018-05-22 同方威视技术股份有限公司 半挥发性、难挥发性物质采集装置
KR102590033B1 (ko) * 2018-11-20 2023-10-16 (주)코미코 파티클 측정 장치 및 이를 이용한 측정 방법
JP7286346B2 (ja) * 2019-03-04 2023-06-05 清水建設株式会社 医薬品の飛散状態のモニタリングシステム及び医薬品の飛散状態のモニタリング方法
US11313771B1 (en) * 2020-10-16 2022-04-26 The Government of the United States of America, as renresenten by the Secretary of Homeland Securitv Sample collection apparatus for scent detection
JP7538884B2 (ja) 2020-12-02 2024-08-22 株式会社日立ハイテク 分析装置、分析システム及び分析方法
JP7635630B2 (ja) * 2021-05-07 2025-02-26 株式会社島津製作所 分析装置、表示制御方法、表示制御プログラム
JP2022172827A (ja) 2021-05-07 2022-11-17 株式会社島津製作所 情報提供システム、サーバ装置、分析装置
CN115493895B (zh) * 2021-06-17 2024-07-26 苏州微木智能系统有限公司 用于探测系统的采样装置、探测系统及采样方法
CN115389602A (zh) * 2022-04-10 2022-11-25 宁波华仪宁创智能科技有限公司 具有痕量检测功能的安检装置和方法
CN116818671B (zh) * 2023-08-31 2023-11-10 常州中冷环保技术有限公司 滤筒自动检测设备

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JP4568327B2 (ja) 2005-03-14 2010-10-27 株式会社日立製作所 付着物検査装置及び付着物検査方法
US8389062B2 (en) 2005-05-12 2013-03-05 Spraying Systems Co. Spraying system for progressive spraying of non-rectangular objects
JP4875426B2 (ja) * 2006-07-13 2012-02-15 シブヤ精機株式会社 農産物の選別装置
JP5464726B2 (ja) * 2006-12-04 2014-04-09 五洋建設株式会社 エアシャワー装置及びエアシャワー方法
JP4714257B2 (ja) * 2008-11-14 2011-06-29 株式会社日立製作所 付着物検査装置
JP5044530B2 (ja) 2008-11-14 2012-10-10 株式会社日立製作所 付着物検査装置及び付着物検査方法
US8561486B2 (en) * 2009-07-13 2013-10-22 Enertechnix, Inc Particle interrogation devices and methods
JP5690840B2 (ja) 2010-11-11 2015-03-25 株式会社日立製作所 分析装置及び分析方法
JP5945108B2 (ja) 2011-10-06 2016-07-05 株式会社日立製作所 付着物検査装置及び検査方法
JP5973760B2 (ja) 2012-03-27 2016-08-23 株式会社日立製作所 検査装置
JP5914164B2 (ja) 2012-05-23 2016-05-11 株式会社日立製作所 微粒子検出装置及びセキュリティゲート

Also Published As

Publication number Publication date
US20140238106A1 (en) 2014-08-28
US9696288B2 (en) 2017-07-04
JP2013083472A (ja) 2013-05-09
WO2013051530A1 (ja) 2013-04-11

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