JP5943687B2 - 濃度測定装置 - Google Patents

濃度測定装置 Download PDF

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Publication number
JP5943687B2
JP5943687B2 JP2012092454A JP2012092454A JP5943687B2 JP 5943687 B2 JP5943687 B2 JP 5943687B2 JP 2012092454 A JP2012092454 A JP 2012092454A JP 2012092454 A JP2012092454 A JP 2012092454A JP 5943687 B2 JP5943687 B2 JP 5943687B2
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concentration
gas
measurement
internal space
opening
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Japanese (ja)
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JP2013221804A (ja
JP2013221804A5 (https=
Inventor
翼 宮▲崎▼
翼 宮▲崎▼
土橋　晋作
晋作 土橋
政治 高田
政治 高田
園田　圭介
圭介 園田
正志 清澤
正志 清澤
健二 海野
健二 海野
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Mitsubishi Power Ltd
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Mitsubishi Hitachi Power Systems Ltd
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Priority to JP2012092454A priority Critical patent/JP5943687B2/ja
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JP2012092454A 2012-04-13 2012-04-13 濃度測定装置 Expired - Fee Related JP5943687B2 (ja)

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JP2012092454A JP5943687B2 (ja) 2012-04-13 2012-04-13 濃度測定装置

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JP2012092454A JP5943687B2 (ja) 2012-04-13 2012-04-13 濃度測定装置

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JP2013221804A JP2013221804A (ja) 2013-10-28
JP2013221804A5 JP2013221804A5 (https=) 2015-04-16
JP5943687B2 true JP5943687B2 (ja) 2016-07-05

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Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6016777B2 (ja) * 2013-12-27 2016-10-26 三菱重工業株式会社 ガス成分濃度分布測定装置及び排ガス脱硝システム
JP6076895B2 (ja) * 2013-12-27 2017-02-08 三菱重工業株式会社 ガス成分濃度分布測定装置及び排ガス脱硝システム
JP6128075B2 (ja) * 2014-08-01 2017-05-17 中国電力株式会社 排ガス濃度測定装置及び排ガス濃度測定方法
WO2016208424A1 (ja) * 2015-06-22 2016-12-29 国立大学法人京都大学 Ｎｄｉｒ式のガスセンサ、ガス分析計、光合成速度測定装置、及び、光合成速度測定方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6361143A (ja) * 1986-08-30 1988-03-17 Shimadzu Corp ガス濃度分布測定システム
JPS6379550U (https=) * 1986-11-13 1988-05-26
US5384640A (en) * 1993-01-19 1995-01-24 Gaztech International Corporation Gas sample chamber for use with a source of coherent radiation
JPH0763672A (ja) * 1993-08-26 1995-03-10 Kansai Electric Power Co Inc:The ガス濃度分布測定装置
JP5529701B2 (ja) * 2010-09-28 2014-06-25 三菱重工業株式会社 ガス分析装置、水銀除去システム及び水銀除去方法

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