JP5873721B2 - レーザ走査顕微鏡法における信号取得の方法及びデバイス - Google Patents

レーザ走査顕微鏡法における信号取得の方法及びデバイス Download PDF

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JP5873721B2
JP5873721B2 JP2011548748A JP2011548748A JP5873721B2 JP 5873721 B2 JP5873721 B2 JP 5873721B2 JP 2011548748 A JP2011548748 A JP 2011548748A JP 2011548748 A JP2011548748 A JP 2011548748A JP 5873721 B2 JP5873721 B2 JP 5873721B2
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JP2012517035A5 (enExample
JP2012517035A (ja
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エマニュエル ジャン＝マルク ボールペール
エマニュエル ジャン＝マルク ボールペール
イスラエル ヴェイユー
イスラエル ヴェイユー
ニコラ オリヴィエ
ニコラ オリヴィエ
デルフィーヌ マルヴィーナ ダニエル マリー ドゥバール
デルフィーヌ マルヴィーナ ダニエル マリー ドゥバール
ジャン＝ルイ マルタン
ジャン＝ルイ マルタン
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Ecole Polytechnique
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Ecole Polytechnique
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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036—Scanning details, e.g. scanning stages
    • G02B21/0048—Scanning details, e.g. scanning stages scanning mirrors, e.g. rotating or galvanomirrors, MEMS mirrors

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP2011548748A 2009-02-04 2010-02-03 レーザ走査顕微鏡法における信号取得の方法及びデバイス Expired - Fee Related JP5873721B2 (ja)

Applications Claiming Priority (3)

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FR0950693 2009-02-04
FR0950693A FR2941787B1 (fr) 2009-02-04 2009-02-04 Procede et dispositif d'acquisition de signaux en microscopie laser a balayage.
PCT/FR2010/050173 WO2010089504A1 (fr) 2009-02-04 2010-02-03 Procede et dispositif d'acquisition de signaux en microscopie laser a balayage

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JP2012517035A JP2012517035A (ja) 2012-07-26
JP2012517035A5 JP2012517035A5 (enExample) 2015-03-19
JP5873721B2 true JP5873721B2 (ja) 2016-03-01

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JP2011548748A Expired - Fee Related JP5873721B2 (ja) 2009-02-04 2010-02-03 レーザ走査顕微鏡法における信号取得の方法及びデバイス

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US (1) US8284483B2 (enExample)
EP (1) EP2394194B1 (enExample)
JP (1) JP5873721B2 (enExample)
FR (1) FR2941787B1 (enExample)
WO (1) WO2010089504A1 (enExample)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8201268B1 (en) * 2008-11-13 2012-06-12 Optonet Inc. Integrated high index contrast sub-wavelength optical transforming tip (HICSWOTT) for near-field scanning optical microscope
ES2371901B1 (es) * 2011-07-11 2012-11-20 Ismael Royo Bieto Ovoscopio de medición portátil.
US20140368904A1 (en) * 2012-02-29 2014-12-18 Agilent Technologies, Inc. Software Defined Microscope
DE102012101778A1 (de) * 2012-03-02 2013-09-05 Leica Microsystems Cms Gmbh Scanmikroskopisches Verfahren und Scanmikroskop
DE102012218624B4 (de) 2012-09-07 2020-07-09 Leica Microsystems Cms Gmbh Konfokales Laser-Raster-Mikroskop mit einer gepulst angesteuerten Laserlichtquelle
EP2725348A1 (en) * 2012-10-29 2014-04-30 Scientific Visual SARL Optical quality control device
CN103439533B (zh) * 2013-09-05 2015-07-15 南开大学 纳米金属螺旋轴锥探针
US9820652B2 (en) 2013-12-09 2017-11-21 The Board Of Trustees Of The Leland Stanford Junior University Multi-photon microscope having an excitation-beam array
US10690897B2 (en) 2015-04-20 2020-06-23 Canon Kabushiki Kaisha Laser scanning microscope apparatus
CN105509645B (zh) * 2016-02-06 2018-07-17 哈尔滨工业大学 双向飞秒脉冲高精度位移探测方法及装置
CN105572685B (zh) * 2016-02-06 2017-11-10 哈尔滨工业大学 基于双向飞秒脉冲的深空引力波探测方法及装置
CN105674892B (zh) * 2016-02-06 2018-05-15 哈尔滨工业大学 中继式飞秒脉冲高精度位移探测方法
CN105676228B (zh) * 2016-02-06 2018-02-23 哈尔滨工业大学 双向飞秒脉冲高精度测距方法及装置
US11506877B2 (en) 2016-11-10 2022-11-22 The Trustees Of Columbia University In The City Of New York Imaging instrument having objective axis and light sheet or light beam projector axis intersecting at less than 90 degrees
WO2019118433A1 (en) * 2017-12-12 2019-06-20 Allen Institute Systems, apparatuses, and methods for simultaneous multi-plane imaging
KR102860250B1 (ko) * 2019-03-28 2025-09-17 나노포톤 가부시키가이샤 이미지 데이터 취득 방법

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5034613A (en) 1989-11-14 1991-07-23 Cornell Research Foundation, Inc. Two-photon laser microscopy
JP3816632B2 (ja) * 1997-05-14 2006-08-30 オリンパス株式会社 走査型顕微鏡
DE19733193B4 (de) * 1997-08-01 2005-09-08 Carl Zeiss Jena Gmbh Mikroskop mit adaptiver Optik
JP2000098238A (ja) * 1998-09-22 2000-04-07 Olympus Optical Co Ltd 走査型レーザ顕微鏡
DE19957418B4 (de) 1999-11-29 2016-02-04 Leica Microsystems Cms Gmbh Verfahren zur lichtoptischen Abtastung eines Objekts und Rastermikroskop zur Anwendung des Verfahrens
US6820032B2 (en) * 2001-02-05 2004-11-16 National Instruments Corporation System and method for scanning a region using conformal mapping
JP4020638B2 (ja) * 2001-12-28 2007-12-12 オリンパス株式会社 走査型レーザ顕微鏡システム
DE10254139A1 (de) * 2002-11-15 2004-05-27 Carl Zeiss Jena Gmbh Verfahren und Anordnung zur tiefenaufgelösten optischen Erfassung einer Probe
JP4480976B2 (ja) * 2003-01-28 2010-06-16 オリンパス株式会社 走査型光学顕微鏡装置及びその制御方法並びにプログラム
US7009172B2 (en) * 2003-03-06 2006-03-07 Board Of Regents Of The University And Community College System Of Nevada, Reno Method and apparatus for imaging using continuous non-raster patterns
JP4468684B2 (ja) * 2003-12-05 2010-05-26 オリンパス株式会社 走査型共焦点顕微鏡装置
JP4615886B2 (ja) * 2004-04-01 2011-01-19 オリンパス株式会社 走査型光学顕微鏡
JP4700299B2 (ja) * 2004-07-07 2011-06-15 オリンパス株式会社 共焦点走査型顕微鏡
GB0414201D0 (en) * 2004-06-24 2004-07-28 Fujifilm Electronic Imaging Method and apparatus for forming a multiple focus stack image
DE102004034970A1 (de) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Lichtrastermikroskop und Verwendung
WO2006042130A2 (en) 2004-10-06 2006-04-20 Baylor College Of Medicine High speed microscope with three-dimensional laser beam scanning
WO2006058187A2 (en) * 2004-11-23 2006-06-01 Robert Eric Betzig Optical lattice microscopy
JP4915071B2 (ja) * 2005-09-22 2012-04-11 株式会社ニコン 顕微鏡、およびバーチャルスライド作成システム

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Publication number Publication date
US20110296562A1 (en) 2011-12-01
US8284483B2 (en) 2012-10-09
JP2012517035A (ja) 2012-07-26
WO2010089504A1 (fr) 2010-08-12
EP2394194B1 (fr) 2016-08-03
FR2941787B1 (fr) 2011-04-15
FR2941787A1 (fr) 2010-08-06
EP2394194A1 (fr) 2011-12-14

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