FR2941787B1 - Procede et dispositif d'acquisition de signaux en microscopie laser a balayage. - Google Patents

Procede et dispositif d'acquisition de signaux en microscopie laser a balayage.

Info

Publication number
FR2941787B1
FR2941787B1 FR0950693A FR0950693A FR2941787B1 FR 2941787 B1 FR2941787 B1 FR 2941787B1 FR 0950693 A FR0950693 A FR 0950693A FR 0950693 A FR0950693 A FR 0950693A FR 2941787 B1 FR2941787 B1 FR 2941787B1
Authority
FR
France
Prior art keywords
laser scanning
scanning microscopy
acquiring signals
acquiring
signals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0950693A
Other languages
English (en)
French (fr)
Other versions
FR2941787A1 (fr
Inventor
Emmanuel Jean Marc Beaurepaire
Israel Veilleux
Nicolas Olivier
Delphine Malvina Daniele Marie Debarre
Jean Louis Martin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ECOLE POLYTECH
Ecole Polytechnique
Original Assignee
ECOLE POLYTECH
Ecole Polytechnique
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ECOLE POLYTECH, Ecole Polytechnique filed Critical ECOLE POLYTECH
Priority to FR0950693A priority Critical patent/FR2941787B1/fr
Priority to US13/147,232 priority patent/US8284483B2/en
Priority to PCT/FR2010/050173 priority patent/WO2010089504A1/fr
Priority to JP2011548748A priority patent/JP5873721B2/ja
Priority to EP10708273.7A priority patent/EP2394194B1/fr
Publication of FR2941787A1 publication Critical patent/FR2941787A1/fr
Application granted granted Critical
Publication of FR2941787B1 publication Critical patent/FR2941787B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036—Scanning details, e.g. scanning stages
    • G02B21/0048—Scanning details, e.g. scanning stages scanning mirrors, e.g. rotating or galvanomirrors, MEMS mirrors

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
FR0950693A 2009-02-04 2009-02-04 Procede et dispositif d'acquisition de signaux en microscopie laser a balayage. Expired - Fee Related FR2941787B1 (fr)

Priority Applications (5)

Application Number Priority Date Filing Date Title
FR0950693A FR2941787B1 (fr) 2009-02-04 2009-02-04 Procede et dispositif d'acquisition de signaux en microscopie laser a balayage.
US13/147,232 US8284483B2 (en) 2009-02-04 2010-02-03 Method and device for acquiring signals in laser scanning microscopy
PCT/FR2010/050173 WO2010089504A1 (fr) 2009-02-04 2010-02-03 Procede et dispositif d'acquisition de signaux en microscopie laser a balayage
JP2011548748A JP5873721B2 (ja) 2009-02-04 2010-02-03 レーザ走査顕微鏡法における信号取得の方法及びデバイス
EP10708273.7A EP2394194B1 (fr) 2009-02-04 2010-02-03 Procede et dispositif d'acquisition de signaux en microscopie laser a balayage

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0950693A FR2941787B1 (fr) 2009-02-04 2009-02-04 Procede et dispositif d'acquisition de signaux en microscopie laser a balayage.

Publications (2)

Publication Number Publication Date
FR2941787A1 FR2941787A1 (fr) 2010-08-06
FR2941787B1 true FR2941787B1 (fr) 2011-04-15

Family

ID=40852177

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0950693A Expired - Fee Related FR2941787B1 (fr) 2009-02-04 2009-02-04 Procede et dispositif d'acquisition de signaux en microscopie laser a balayage.

Country Status (5)

Country Link
US (1) US8284483B2 (enExample)
EP (1) EP2394194B1 (enExample)
JP (1) JP5873721B2 (enExample)
FR (1) FR2941787B1 (enExample)
WO (1) WO2010089504A1 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103439533A (zh) * 2013-09-05 2013-12-11 南开大学 纳米金属螺旋轴锥探针
CN105509645A (zh) * 2016-02-06 2016-04-20 哈尔滨工业大学 双向飞秒脉冲高精度位移探测方法及装置

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US8201268B1 (en) * 2008-11-13 2012-06-12 Optonet Inc. Integrated high index contrast sub-wavelength optical transforming tip (HICSWOTT) for near-field scanning optical microscope
ES2371901B1 (es) * 2011-07-11 2012-11-20 Ismael Royo Bieto Ovoscopio de medición portátil.
US20140368904A1 (en) * 2012-02-29 2014-12-18 Agilent Technologies, Inc. Software Defined Microscope
DE102012101778A1 (de) * 2012-03-02 2013-09-05 Leica Microsystems Cms Gmbh Scanmikroskopisches Verfahren und Scanmikroskop
DE102012218624B4 (de) 2012-09-07 2020-07-09 Leica Microsystems Cms Gmbh Konfokales Laser-Raster-Mikroskop mit einer gepulst angesteuerten Laserlichtquelle
EP2725348A1 (en) * 2012-10-29 2014-04-30 Scientific Visual SARL Optical quality control device
US9820652B2 (en) 2013-12-09 2017-11-21 The Board Of Trustees Of The Leland Stanford Junior University Multi-photon microscope having an excitation-beam array
US10690897B2 (en) 2015-04-20 2020-06-23 Canon Kabushiki Kaisha Laser scanning microscope apparatus
CN105572685B (zh) * 2016-02-06 2017-11-10 哈尔滨工业大学 基于双向飞秒脉冲的深空引力波探测方法及装置
CN105674892B (zh) * 2016-02-06 2018-05-15 哈尔滨工业大学 中继式飞秒脉冲高精度位移探测方法
CN105676228B (zh) * 2016-02-06 2018-02-23 哈尔滨工业大学 双向飞秒脉冲高精度测距方法及装置
US11506877B2 (en) 2016-11-10 2022-11-22 The Trustees Of Columbia University In The City Of New York Imaging instrument having objective axis and light sheet or light beam projector axis intersecting at less than 90 degrees
WO2019118433A1 (en) * 2017-12-12 2019-06-20 Allen Institute Systems, apparatuses, and methods for simultaneous multi-plane imaging
KR102860250B1 (ko) * 2019-03-28 2025-09-17 나노포톤 가부시키가이샤 이미지 데이터 취득 방법

Family Cites Families (18)

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US5034613A (en) 1989-11-14 1991-07-23 Cornell Research Foundation, Inc. Two-photon laser microscopy
JP3816632B2 (ja) * 1997-05-14 2006-08-30 オリンパス株式会社 走査型顕微鏡
DE19733193B4 (de) * 1997-08-01 2005-09-08 Carl Zeiss Jena Gmbh Mikroskop mit adaptiver Optik
JP2000098238A (ja) * 1998-09-22 2000-04-07 Olympus Optical Co Ltd 走査型レーザ顕微鏡
DE19957418B4 (de) 1999-11-29 2016-02-04 Leica Microsystems Cms Gmbh Verfahren zur lichtoptischen Abtastung eines Objekts und Rastermikroskop zur Anwendung des Verfahrens
US6820032B2 (en) * 2001-02-05 2004-11-16 National Instruments Corporation System and method for scanning a region using conformal mapping
JP4020638B2 (ja) * 2001-12-28 2007-12-12 オリンパス株式会社 走査型レーザ顕微鏡システム
DE10254139A1 (de) * 2002-11-15 2004-05-27 Carl Zeiss Jena Gmbh Verfahren und Anordnung zur tiefenaufgelösten optischen Erfassung einer Probe
JP4480976B2 (ja) * 2003-01-28 2010-06-16 オリンパス株式会社 走査型光学顕微鏡装置及びその制御方法並びにプログラム
US7009172B2 (en) * 2003-03-06 2006-03-07 Board Of Regents Of The University And Community College System Of Nevada, Reno Method and apparatus for imaging using continuous non-raster patterns
JP4468684B2 (ja) * 2003-12-05 2010-05-26 オリンパス株式会社 走査型共焦点顕微鏡装置
JP4615886B2 (ja) * 2004-04-01 2011-01-19 オリンパス株式会社 走査型光学顕微鏡
JP4700299B2 (ja) * 2004-07-07 2011-06-15 オリンパス株式会社 共焦点走査型顕微鏡
GB0414201D0 (en) * 2004-06-24 2004-07-28 Fujifilm Electronic Imaging Method and apparatus for forming a multiple focus stack image
DE102004034970A1 (de) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Lichtrastermikroskop und Verwendung
WO2006042130A2 (en) 2004-10-06 2006-04-20 Baylor College Of Medicine High speed microscope with three-dimensional laser beam scanning
WO2006058187A2 (en) * 2004-11-23 2006-06-01 Robert Eric Betzig Optical lattice microscopy
JP4915071B2 (ja) * 2005-09-22 2012-04-11 株式会社ニコン 顕微鏡、およびバーチャルスライド作成システム

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103439533A (zh) * 2013-09-05 2013-12-11 南开大学 纳米金属螺旋轴锥探针
CN105509645A (zh) * 2016-02-06 2016-04-20 哈尔滨工业大学 双向飞秒脉冲高精度位移探测方法及装置
CN105509645B (zh) * 2016-02-06 2018-07-17 哈尔滨工业大学 双向飞秒脉冲高精度位移探测方法及装置

Also Published As

Publication number Publication date
US20110296562A1 (en) 2011-12-01
JP5873721B2 (ja) 2016-03-01
US8284483B2 (en) 2012-10-09
JP2012517035A (ja) 2012-07-26
WO2010089504A1 (fr) 2010-08-12
EP2394194B1 (fr) 2016-08-03
FR2941787A1 (fr) 2010-08-06
EP2394194A1 (fr) 2011-12-14

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