JP5871528B2 - 透過型ｘ線発生装置及びそれを用いたｘ線撮影装置 - Google Patents

透過型ｘ線発生装置及びそれを用いたｘ線撮影装置 Download PDF

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Publication number
JP5871528B2
JP5871528B2 JP2011189109A JP2011189109A JP5871528B2 JP 5871528 B2 JP5871528 B2 JP 5871528B2 JP 2011189109 A JP2011189109 A JP 2011189109A JP 2011189109 A JP2011189109 A JP 2011189109A JP 5871528 B2 JP5871528 B2 JP 5871528B2
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Japan
Prior art keywords
transmission
ray
ray generation
target
electron passage
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Expired - Fee Related
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JP2011189109A
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English (en)
Japanese (ja)
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JP2013051154A5 (enExample
JP2013051154A (ja
Inventor
美樹 田村
美樹 田村
珠代 廣木
珠代 廣木
松谷　茂樹
茂樹 松谷
孝夫 小倉
孝夫 小倉
上田　和幸
和幸 上田
芳浩 柳沢
芳浩 柳沢
野村　一郎
一郎 野村
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Canon Inc
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Canon Inc
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Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2011189109A priority Critical patent/JP5871528B2/ja
Priority to PCT/JP2012/072518 priority patent/WO2013032017A2/en
Priority to US14/241,817 priority patent/US9425021B2/en
Publication of JP2013051154A publication Critical patent/JP2013051154A/ja
Publication of JP2013051154A5 publication Critical patent/JP2013051154A5/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/08—Anodes; Anti cathodes
    • H01J35/112—Non-rotating anodes
    • H01J35/116—Transmissive anodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/16—Vessels; Containers; Shields associated therewith
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/70—Circuit arrangements for X-ray tubes with more than one anode; Circuit arrangements for apparatus comprising more than one X ray tube or more than one cathode
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2235/00—X-ray tubes
    • H01J2235/16—Vessels
    • H01J2235/165—Shielding arrangements
    • H01J2235/168—Shielding arrangements against charged particles
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/16—Vessels; Containers; Shields associated therewith
    • H01J35/18—Windows
    • H01J35/186—Windows used as targets or X-ray converters

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • X-Ray Techniques (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP2011189109A 2011-08-31 2011-08-31 透過型ｘ線発生装置及びそれを用いたｘ線撮影装置 Expired - Fee Related JP5871528B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2011189109A JP5871528B2 (ja) 2011-08-31 2011-08-31 透過型ｘ線発生装置及びそれを用いたｘ線撮影装置
PCT/JP2012/072518 WO2013032017A2 (en) 2011-08-31 2012-08-29 X-ray generation apparatus and x-ray radiographic apparatus
US14/241,817 US9425021B2 (en) 2011-08-31 2012-08-29 X-ray generation apparatus and X-ray radiographic apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011189109A JP5871528B2 (ja) 2011-08-31 2011-08-31 透過型ｘ線発生装置及びそれを用いたｘ線撮影装置

Publications (3)

Publication Number Publication Date
JP2013051154A JP2013051154A (ja) 2013-03-14
JP2013051154A5 JP2013051154A5 (enExample) 2014-10-09
JP5871528B2 true JP5871528B2 (ja) 2016-03-01

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JP2011189109A Expired - Fee Related JP5871528B2 (ja) 2011-08-31 2011-08-31 透過型ｘ線発生装置及びそれを用いたｘ線撮影装置

Country Status (3)

Country Link
US (1) US9425021B2 (enExample)
JP (1) JP5871528B2 (enExample)
WO (1) WO2013032017A2 (enExample)

Families Citing this family (13)

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CN102484934A (zh) 2009-04-16 2012-05-30 埃里克·H·西尔弗 单色x-射线方法和装置
JP2015028879A (ja) * 2013-07-30 2015-02-12 東京エレクトロン株式会社 Ｘ線発生用ターゲット及びｘ線発生装置
US20150369758A1 (en) 2014-06-24 2015-12-24 Eric H. Silver Methods and apparatus for determining information regarding chemical composition using x-ray radiation
JP6598538B2 (ja) 2014-07-18 2019-10-30 キヤノン株式会社 陽極及びこれを用いたｘ線発生管、ｘ線発生装置、ｘ線撮影システム
GB201414393D0 (en) * 2014-08-13 2014-09-24 Nikon Metrology Nv Z-ray beam collimator
CN111225613B (zh) 2017-05-19 2024-08-02 想像科学有限公司 单色x射线成像系统及方法
KR101966794B1 (ko) * 2017-07-12 2019-08-27 (주)선재하이테크 전자 집속 개선용 엑스선관
CA3129632A1 (en) 2018-02-09 2019-08-15 Imagine Scientific, Inc. Monochromatic x-ray imaging systems and methods
US10818467B2 (en) * 2018-02-09 2020-10-27 Imagine Scientific, Inc. Monochromatic x-ray imaging systems and methods
WO2020056281A1 (en) 2018-09-14 2020-03-19 Imagine Scientific, Inc. Monochromatic x-ray component systems and methods
US11315751B2 (en) * 2019-04-25 2022-04-26 The Boeing Company Electromagnetic X-ray control
JP6792676B1 (ja) 2019-07-24 2020-11-25 浜松ホトニクス株式会社 Ｘ線管
CN111966603B (zh) * 2020-09-04 2024-01-19 网易（杭州）网络有限公司 内存泄露的检测方法及装置、可读存储介质及电子设备

Family Cites Families (26)

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Publication number Priority date Publication date Assignee Title
FR2355428A1 (fr) * 1976-06-14 1978-01-13 Elf Aquitaine Dispositif d'irradiation a haut rendement comportant un tube generateur de rayons x avec anode fenetre
DE19544203A1 (de) 1995-11-28 1997-06-05 Philips Patentverwaltung Röntgenröhre, insbesondere Mikrofokusröntgenröhre
JPH11144653A (ja) * 1997-11-06 1999-05-28 Mitsubishi Heavy Ind Ltd Ｘ線発生装置
JP2002343290A (ja) 2001-05-21 2002-11-29 Medeiekkusutekku Kk Ｘ線管ターゲット、ｘ線発生器、ｘ線検査装置およびｘ線管ターゲットの製造方法
US6661876B2 (en) * 2001-07-30 2003-12-09 Moxtek, Inc. Mobile miniature X-ray source
EP1488441A2 (en) * 2002-01-31 2004-12-22 The Johns Hopkins University X-ray source and method for more efficiently producing selectable x-ray frequencies
JP4174626B2 (ja) * 2002-07-19 2008-11-05 株式会社島津製作所 Ｘ線発生装置
WO2004025682A1 (en) * 2002-09-13 2004-03-25 Moxtek, Inc. Radiation window and method of manufacture
US7466799B2 (en) 2003-04-09 2008-12-16 Varian Medical Systems, Inc. X-ray tube having an internal radiation shield
JP5128752B2 (ja) * 2004-04-07 2013-01-23 日立協和エンジニアリング株式会社 透過型ｘ線管及びその製造方法
JP4375110B2 (ja) * 2004-05-12 2009-12-02 株式会社島津製作所 Ｘ線発生装置
JP4344280B2 (ja) * 2004-05-31 2009-10-14 浜松ホトニクス株式会社 冷陰極電子源及びそれを用いた電子管
US7382862B2 (en) * 2005-09-30 2008-06-03 Moxtek, Inc. X-ray tube cathode with reduced unintended electrical field emission
WO2007088934A1 (ja) 2006-02-01 2007-08-09 Toshiba Electron Tubes & Devices Co., Ltd. Ｘ線源及び蛍光ｘ線分析装置
JP4738189B2 (ja) 2006-02-01 2011-08-03 東芝電子管デバイス株式会社 Ｘ線源および蛍光ｘ線分析装置
JP4878311B2 (ja) 2006-03-03 2012-02-15 キヤノン株式会社 マルチｘ線発生装置
JP2008050667A (ja) * 2006-08-25 2008-03-06 Mitsubishi Electric Corp 薄膜形成装置
US7410296B2 (en) * 2006-11-09 2008-08-12 General Electric Company Electron absorption apparatus for an x-ray device
EP2006880A1 (en) * 2007-06-19 2008-12-24 Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO Miniature X-ray source with guiding means for electrons and / or ions
JP5622146B2 (ja) 2010-02-22 2014-11-12 株式会社丸八プロダクト 寝具
JP5641916B2 (ja) * 2010-02-23 2014-12-17 キヤノン株式会社 放射線発生装置および放射線撮像システム
JP2013051165A (ja) * 2011-08-31 2013-03-14 Canon Inc 透過型ｘ線発生装置
JP5854707B2 (ja) * 2011-08-31 2016-02-09 キヤノン株式会社 透過型ｘ線発生管及び透過型ｘ線発生装置
JP5871529B2 (ja) * 2011-08-31 2016-03-01 キヤノン株式会社 透過型ｘ線発生装置及びそれを用いたｘ線撮影装置
JP5901180B2 (ja) * 2011-08-31 2016-04-06 キヤノン株式会社 透過型ｘ線発生装置及びそれを用いたｘ線撮影装置
CN104285270A (zh) * 2012-05-11 2015-01-14 浜松光子学株式会社 X射线产生装置及x射线产生方法

Also Published As

Publication number Publication date
US9425021B2 (en) 2016-08-23
WO2013032017A2 (en) 2013-03-07
US20140192957A1 (en) 2014-07-10
JP2013051154A (ja) 2013-03-14
WO2013032017A3 (en) 2013-05-23

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