JP5857129B2 - 窓なしのワイヤボンドアセンブリのためのスタブ最小化 - Google Patents

窓なしのワイヤボンドアセンブリのためのスタブ最小化 Download PDF

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JP5857129B2
JP5857129B2 JP2014534623A JP2014534623A JP5857129B2 JP 5857129 B2 JP5857129 B2 JP 5857129B2 JP 2014534623 A JP2014534623 A JP 2014534623A JP 2014534623 A JP2014534623 A JP 2014534623A JP 5857129 B2 JP5857129 B2 JP 5857129B2
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package
microelectronic
terminals
edge
microelectronic element
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Japanese (ja)
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JP2014534625A5 (enExample
JP2014534625A (ja
Inventor
クリスプ,リチャード・デューイット
ゾーニ,ワエル
ハーバ,ベルガセム
ランブレクト,フランク
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インヴェンサス・コーポレイション
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Priority claimed from US13/440,313 external-priority patent/US8405207B1/en
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Publication of JP2014534625A5 publication Critical patent/JP2014534625A5/ja
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    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C5/00Details of stores covered by group G11C11/00
    • G11C5/02Disposition of storage elements, e.g. in the form of a matrix array
    • G11C5/04Supports for storage elements, e.g. memory modules; Mounting or fixing of storage elements on such supports
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C5/00Details of stores covered by group G11C11/00
    • G11C5/02Disposition of storage elements, e.g. in the form of a matrix array
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C5/00Details of stores covered by group G11C11/00
    • G11C5/06Arrangements for interconnecting storage elements electrically, e.g. by wiring
    • G11C5/063Voltage and signal distribution in integrated semi-conductor memory access lines, e.g. word-line, bit-line, cross-over resistance, propagation delay
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C5/00Details of stores covered by group G11C11/00
    • G11C5/06Arrangements for interconnecting storage elements electrically, e.g. by wiring
    • G11C5/066Means for reducing external access-lines for a semiconductor memory clip, e.g. by multiplexing at least address and data signals
    • H10W40/10
    • H10W90/00
    • H10W90/701
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/18Printed circuits structurally associated with non-printed electric components
    • H05K1/181Printed circuits structurally associated with non-printed electric components associated with surface mounted components
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/09Shape and layout
    • H05K2201/09209Shape and layout details of conductors
    • H05K2201/09218Conductive traces
    • H05K2201/09227Layout details of a plurality of traces, e.g. escape layout for Ball Grid Array [BGA] mounting
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10007Types of components
    • H05K2201/10159Memory
    • H10W70/63
    • H10W70/635
    • H10W70/65
    • H10W70/654
    • H10W70/655
    • H10W70/68
    • H10W72/00
    • H10W72/241
    • H10W72/252
    • H10W72/29
    • H10W72/536
    • H10W72/5363
    • H10W72/5445
    • H10W72/5473
    • H10W72/59
    • H10W72/834
    • H10W72/859
    • H10W72/865
    • H10W72/877
    • H10W72/884
    • H10W72/932
    • H10W72/942
    • H10W72/944
    • H10W72/9445
    • H10W72/967
    • H10W74/00
    • H10W74/117
    • H10W74/142
    • H10W74/15
    • H10W90/20
    • H10W90/22
    • H10W90/231
    • H10W90/24
    • H10W90/26
    • H10W90/271
    • H10W90/28
    • H10W90/288
    • H10W90/297
    • H10W90/722
    • H10W90/724
    • H10W90/732
    • H10W90/734
    • H10W90/752
    • H10W90/754

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  • Semiconductor Memories (AREA)
  • Dram (AREA)
JP2014534623A 2011-10-03 2012-10-01 窓なしのワイヤボンドアセンブリのためのスタブ最小化 Active JP5857129B2 (ja)

Applications Claiming Priority (9)

Application Number Priority Date Filing Date Title
US201161542488P 2011-10-03 2011-10-03
US201161542553P 2011-10-03 2011-10-03
US61/542,553 2011-10-03
US61/542,488 2011-10-03
US201261600271P 2012-02-17 2012-02-17
US61/600,271 2012-02-17
US13/440,313 2012-04-05
US13/440,313 US8405207B1 (en) 2011-10-03 2012-04-05 Stub minimization for wirebond assemblies without windows
PCT/US2012/058273 WO2013052411A1 (en) 2011-10-03 2012-10-01 Stub minimization for wirebond assemblies without windows

Publications (3)

Publication Number Publication Date
JP2014534625A JP2014534625A (ja) 2014-12-18
JP2014534625A5 JP2014534625A5 (enExample) 2015-11-26
JP5857129B2 true JP5857129B2 (ja) 2016-02-10

Family

ID=47146660

Family Applications (2)

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JP2014534623A Active JP5857129B2 (ja) 2011-10-03 2012-10-01 窓なしのワイヤボンドアセンブリのためのスタブ最小化
JP2014534632A Active JP5857130B2 (ja) 2011-10-03 2012-10-02 窓なしのワイヤボンドアセンブリのためのスタブ最小化

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2014534632A Active JP5857130B2 (ja) 2011-10-03 2012-10-02 窓なしのワイヤボンドアセンブリのためのスタブ最小化

Country Status (5)

Country Link
EP (2) EP2766931B1 (enExample)
JP (2) JP5857129B2 (enExample)
KR (2) KR101945334B1 (enExample)
TW (3) TWI491015B (enExample)
WO (3) WO2013052411A1 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3017463A4 (en) * 2014-10-03 2017-03-01 Intel Corporation Overlapping stacked die package with vertical columns
KR102497239B1 (ko) * 2015-12-17 2023-02-08 삼성전자주식회사 고속 신호 특성을 갖는 반도체 모듈
JP7353729B2 (ja) 2018-02-09 2023-10-02 キヤノン株式会社 半導体装置、半導体装置の製造方法
US11227846B2 (en) 2019-01-30 2022-01-18 Mediatek Inc. Semiconductor package having improved thermal interface between semiconductor die and heat spreading structure
US11587919B2 (en) * 2020-07-17 2023-02-21 Micron Technology, Inc. Microelectronic devices, related electronic systems, and methods of forming microelectronic devices

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US6323436B1 (en) * 1997-04-08 2001-11-27 International Business Machines Corporation High density printed wiring board possessing controlled coefficient of thermal expansion with thin film redistribution layer
JP3685947B2 (ja) * 1999-03-15 2005-08-24 新光電気工業株式会社 半導体装置及びその製造方法
JP2000315776A (ja) * 1999-05-06 2000-11-14 Hitachi Ltd 半導体装置
US6713854B1 (en) * 2000-10-16 2004-03-30 Legacy Electronics, Inc Electronic circuit module with a carrier having a mounting pad array
US6633078B2 (en) * 2000-03-21 2003-10-14 Mitsubishi Denki Kabushiki Kaisha Semiconductor device, method for manufacturing an electronic equipment, electronic equipment and portable information terminal
JP3874062B2 (ja) 2000-09-05 2007-01-31 セイコーエプソン株式会社 半導体装置
DE10055001A1 (de) * 2000-11-07 2002-05-16 Infineon Technologies Ag Speicheranordnung mit einem zentralen Anschlussfeld
DE10139085A1 (de) * 2001-08-16 2003-05-22 Infineon Technologies Ag Leiterplattensystem, Verfahren zum Betreiben eines Leiterplattensystems, Leiterplatteneinrichtung und deren Verwendung, und Halbleitervorrichtung und deren Verwendung
JP3785083B2 (ja) * 2001-11-07 2006-06-14 株式会社東芝 半導体装置、電子カード及びパッド再配置基板
JP2004128155A (ja) * 2002-10-01 2004-04-22 Renesas Technology Corp 半導体パッケージ
JP2004221215A (ja) * 2003-01-14 2004-08-05 Renesas Technology Corp 半導体装置
US7260691B2 (en) * 2004-06-30 2007-08-21 Intel Corporation Apparatus and method for initialization of a double-sided DIMM having at least one pair of mirrored pins
US7372169B2 (en) 2005-10-11 2008-05-13 Via Technologies, Inc. Arrangement of conductive pads on grid array package and on circuit board
JP4906047B2 (ja) * 2005-11-28 2012-03-28 ルネサスエレクトロニクス株式会社 半導体装置
DE102006042775B3 (de) 2006-09-12 2008-03-27 Qimonda Ag Schaltungsmodul und Verfahren zur Herstellung eines Schaltungsmoduls
JP4913640B2 (ja) * 2007-03-19 2012-04-11 ルネサスエレクトロニクス株式会社 半導体装置
TW200842998A (en) * 2007-04-18 2008-11-01 Siliconware Precision Industries Co Ltd Semiconductor device and manufacturing method thereof
US8228679B2 (en) * 2008-04-02 2012-07-24 Spansion Llc Connections for electronic devices on double-sided circuit board
KR20100020772A (ko) * 2008-08-13 2010-02-23 주식회사 하이닉스반도체 반도체 패키지
KR20100046760A (ko) * 2008-10-28 2010-05-07 삼성전자주식회사 반도체 패키지
US8304286B2 (en) * 2009-12-11 2012-11-06 Stats Chippac Ltd. Integrated circuit packaging system with shielded package and method of manufacture thereof

Also Published As

Publication number Publication date
WO2013052411A1 (en) 2013-04-11
TWI511264B (zh) 2015-12-01
WO2013052441A3 (en) 2013-08-15
TW201322417A (zh) 2013-06-01
JP2015501532A (ja) 2015-01-15
EP2766931A1 (en) 2014-08-20
EP2764545A1 (en) 2014-08-13
EP2764545B1 (en) 2018-07-04
TW201322415A (zh) 2013-06-01
KR20140085490A (ko) 2014-07-07
KR20140085489A (ko) 2014-07-07
WO2013052448A1 (en) 2013-04-11
TWI491015B (zh) 2015-07-01
KR101895017B1 (ko) 2018-10-04
WO2013052411A4 (en) 2013-07-04
TWI459537B (zh) 2014-11-01
WO2013052441A2 (en) 2013-04-11
KR101945334B1 (ko) 2019-02-07
JP5857130B2 (ja) 2016-02-10
JP2014534625A (ja) 2014-12-18
TW201324734A (zh) 2013-06-16
EP2766931B1 (en) 2021-12-01

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