JP5796976B2 - Ｘ線撮像装置 - Google Patents

Ｘ線撮像装置 Download PDF

Info

Publication number
JP5796976B2
JP5796976B2 JP2011062047A JP2011062047A JP5796976B2 JP 5796976 B2 JP5796976 B2 JP 5796976B2 JP 2011062047 A JP2011062047 A JP 2011062047A JP 2011062047 A JP2011062047 A JP 2011062047A JP 5796976 B2 JP5796976 B2 JP 5796976B2
Authority
JP
Japan
Prior art keywords
shielding
grating
diffraction grating
ray
phase
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2011062047A
Other languages
English (en)
Japanese (ja)
Other versions
JP2012005820A5 (enExample
JP2012005820A (ja
Inventor
大内　千種
千種 大内
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2011062047A priority Critical patent/JP5796976B2/ja
Publication of JP2012005820A publication Critical patent/JP2012005820A/ja
Publication of JP2012005820A5 publication Critical patent/JP2012005820A5/ja
Application granted granted Critical
Publication of JP5796976B2 publication Critical patent/JP5796976B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/42—Arrangements for detecting radiation specially adapted for radiation diagnosis
    • A61B6/4291—Arrangements for detecting radiation specially adapted for radiation diagnosis the detector being combined with a grid or grating
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/484—Diagnostic techniques involving phase contrast X-ray imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G01J9/0215—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods by shearing interferometric methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/041—Phase-contrast imaging, e.g. using grating interferometers
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/18—Diffraction gratings
    • G02B5/1814—Diffraction gratings structurally combined with one or more further optical elements, e.g. lenses, mirrors, prisms or other diffraction gratings
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/18—Diffraction gratings
    • G02B5/1866—Transmission gratings characterised by their structure, e.g. step profile, contours of substrate or grooves, pitch variations, materials
    • G02B5/1871—Transmissive phase gratings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G01B11/2527—Projection by scanning of the object with phase change by in-plane movement of the patern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/32—Accessories, mechanical or electrical features adjustments of elements during operation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/18—Diffraction gratings
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/18—Diffraction gratings
    • G02B5/1838—Diffraction gratings for use with ultraviolet radiation or X-rays
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/18—Diffraction gratings
    • G02B5/1842—Gratings for image generation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/18—Diffraction gratings
    • G02B5/1876—Diffractive Fresnel lenses; Zone plates; Kinoforms
    • G02B5/189—Structurally combined with optical elements not having diffractive power
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
    • G21K2207/005—Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Medical Informatics (AREA)
  • Optics & Photonics (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • General Physics & Mathematics (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Veterinary Medicine (AREA)
  • Molecular Biology (AREA)
  • Surgery (AREA)
  • Animal Behavior & Ethology (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Public Health (AREA)
  • Biomedical Technology (AREA)
  • Biophysics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2011062047A 2010-05-27 2011-03-22 Ｘ線撮像装置 Expired - Fee Related JP5796976B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2011062047A JP5796976B2 (ja) 2010-05-27 2011-03-22 Ｘ線撮像装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2010121225 2010-05-27
JP2010121225 2010-05-27
JP2011062047A JP5796976B2 (ja) 2010-05-27 2011-03-22 Ｘ線撮像装置

Publications (3)

Publication Number Publication Date
JP2012005820A JP2012005820A (ja) 2012-01-12
JP2012005820A5 JP2012005820A5 (enExample) 2014-04-24
JP5796976B2 true JP5796976B2 (ja) 2015-10-21

Family

ID=44361228

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011062047A Expired - Fee Related JP5796976B2 (ja) 2010-05-27 2011-03-22 Ｘ線撮像装置

Country Status (3)

Country Link
US (1) US9046466B2 (enExample)
JP (1) JP5796976B2 (enExample)
WO (1) WO2011149033A1 (enExample)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2630476B1 (en) * 2010-10-19 2017-12-13 Koninklijke Philips N.V. Differential phase-contrast imaging
JP6228457B2 (ja) * 2010-10-19 2017-11-08 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 微分位相コントラスト画像形成
JP5475737B2 (ja) * 2011-10-04 2014-04-16 富士フイルム株式会社 放射線撮影装置及び画像処理方法
US9757081B2 (en) * 2012-06-27 2017-09-12 Koninklijke Philips N.V. Grating-based differential phase contrast imaging
CN104869905B (zh) * 2012-12-21 2019-08-06 卡尔斯特里姆保健公司 基于微分相衬成像的医疗放射照相光栅
US10096098B2 (en) 2013-12-30 2018-10-09 Carestream Health, Inc. Phase retrieval from differential phase contrast imaging
US9357975B2 (en) 2013-12-30 2016-06-07 Carestream Health, Inc. Large FOV phase contrast imaging based on detuned configuration including acquisition and reconstruction techniques
US10578563B2 (en) 2012-12-21 2020-03-03 Carestream Health, Inc. Phase contrast imaging computed tomography scanner
DE102013213244A1 (de) * 2013-07-05 2015-01-08 Siemens Aktiengesellschaft Röntgenaufnahmesystem zur hochaufgelösten differentiellen Phasenkontrast-Bildgebung eines Untersuchungsobjekts
EP2827339A1 (en) 2013-07-16 2015-01-21 Canon Kabushiki Kaisha Source grating, interferometer, and object information acquisition system
KR20170015886A (ko) * 2014-05-09 2017-02-10 더 존스 홉킨스 유니버시티 위상 콘트라스트 엑스레이 이미징을 위한 시스템 및 방법
US10945690B2 (en) * 2015-06-30 2021-03-16 Koninklijke Philips N.V. Scanning X-ray apparatus with full-field detector
JP6608246B2 (ja) * 2015-10-30 2019-11-20 キヤノン株式会社 Ｘ線回折格子及びｘ線トールボット干渉計
EP3232934B1 (en) * 2015-12-25 2022-03-16 Shanghai United Imaging Healthcare Co., Ltd. Apparatus, system and method for radiation based imaging
IL244180B (en) * 2016-02-18 2022-02-01 Oorym Optics Ltd Dynamic 3D display system
KR102721072B1 (ko) 2016-11-01 2024-10-24 삼성전자주식회사 분광 측정 장치 및 분광 측정 장치를 이용한 분광 측정 방법
US10809210B2 (en) * 2016-11-22 2020-10-20 Shimadzu Corporation X-ray phase imaging apparatus
JP7188261B2 (ja) * 2019-04-24 2022-12-13 株式会社島津製作所 Ｘ線位相イメージング装置
CN110833427B (zh) * 2019-11-29 2021-01-29 清华大学 光栅成像系统及其扫描方法
CN120009314A (zh) * 2025-02-24 2025-05-16 中国工程物理研究院流体物理研究所 一种基于射线源焦点移动的x射线多衬度成像装置及方法

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4445397B2 (ja) 2002-12-26 2010-04-07 敦 百生 Ｘ線撮像装置および撮像方法
EP1731099A1 (en) 2005-06-06 2006-12-13 Paul Scherrer Institut Interferometer for quantitative phase contrast imaging and tomography with an incoherent polychromatic x-ray source
JP2010063646A (ja) * 2008-09-11 2010-03-25 Fujifilm Corp 放射線位相画像撮影装置
CN101413905B (zh) * 2008-10-10 2011-03-16 深圳大学 X射线微分干涉相衬成像系统
CN102197303A (zh) * 2008-10-29 2011-09-21 佳能株式会社 X射线成像装置和x射线成像方法
JP5238460B2 (ja) 2008-11-17 2013-07-17 株式会社添島勲商店 織物
DE102009004702B4 (de) * 2009-01-15 2019-01-31 Paul Scherer Institut Anordnung und Verfahren zur projektiven und/oder tomographischen Phasenkontrastbildgebung mit Röntgenstrahlung
CN102802529B (zh) * 2009-06-16 2015-09-16 皇家飞利浦电子股份有限公司 用于微分相衬成像的校正方法
JP5631013B2 (ja) 2010-01-28 2014-11-26 キヤノン株式会社 Ｘ線撮像装置
JP5586986B2 (ja) 2010-02-23 2014-09-10 キヤノン株式会社 Ｘ線撮像装置
JP5378335B2 (ja) * 2010-03-26 2013-12-25 富士フイルム株式会社 放射線撮影システム
JP2012166010A (ja) * 2011-01-26 2012-09-06 Fujifilm Corp 放射線画像撮影装置および放射線画像検出器
US9066704B2 (en) 2011-03-14 2015-06-30 Canon Kabushiki Kaisha X-ray imaging apparatus
JP2013063099A (ja) * 2011-09-15 2013-04-11 Canon Inc Ｘ線撮像装置

Also Published As

Publication number Publication date
US9046466B2 (en) 2015-06-02
US20130034209A1 (en) 2013-02-07
WO2011149033A1 (en) 2011-12-01
JP2012005820A (ja) 2012-01-12

Similar Documents

Publication Publication Date Title
JP5796976B2 (ja) Ｘ線撮像装置
JP5631013B2 (ja) Ｘ線撮像装置
US9080858B2 (en) Wavefront measuring apparatus, wavefront measuring method, and computer-readable medium storing program
JP5777360B2 (ja) Ｘ線撮像装置
JP5586986B2 (ja) Ｘ線撮像装置
JP5725870B2 (ja) Ｘ線撮像装置およびｘ線撮像方法
US20110158493A1 (en) Analysis method, radiation imaging apparatus using analysis method, and analysis program for executing analysis method
JP5792961B2 (ja) トールボット干渉計及び撮像方法
JP5875280B2 (ja) トールボット干渉を用いた撮像装置および撮像装置の調整方法
JP2014171799A (ja) Ｘ線撮像装置及びｘ線撮像システム
JP2013050441A5 (ja) 波面測定装置、波面測定方法、及びプログラム並びにｘ線コンピュータ断層撮影装置
EP2552318A1 (en) Radiation detection device, radiographic apparatus and radiographic system
US20140286475A1 (en) Interferometer and object information acquisition system
JP2011153969A5 (enExample)
CN107850680A (zh) 用于相位对比和/或暗场成像的x射线探测器
EP3105763B1 (en) X-ray talbot interferometer and x-ray talbot interferometer system
JP2013042983A (ja) トモシンセシス撮像装置及びトモシンセシス画像の撮像方法
JP2013164339A (ja) Ｘ線撮像装置
JP6604772B2 (ja) Ｘ線トールボット干渉計
JP6566839B2 (ja) Ｘ線トールボット干渉計及びトールボット干渉計システム
JP2017093496A (ja) 撮像装置
JP2017090414A (ja) 二次元干渉パターン撮像装置
JP2017083413A (ja) Ｘ線トールボット干渉計
JP2015227784A (ja) 干渉計

Legal Events

Date Code Title Description
RD01 Notification of change of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7421

Effective date: 20131212

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20140306

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20140306

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20141114

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20141216

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20150216

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20150721

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20150818

R151 Written notification of patent or utility model registration

Ref document number: 5796976

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R151

LAPS Cancellation because of no payment of annual fees