JP5727796B2 - 半導体装置 - Google Patents
半導体装置 Download PDFInfo
- Publication number
- JP5727796B2 JP5727796B2 JP2011002597A JP2011002597A JP5727796B2 JP 5727796 B2 JP5727796 B2 JP 5727796B2 JP 2011002597 A JP2011002597 A JP 2011002597A JP 2011002597 A JP2011002597 A JP 2011002597A JP 5727796 B2 JP5727796 B2 JP 5727796B2
- Authority
- JP
- Japan
- Prior art keywords
- transistor
- photosensor
- signal line
- potential
- photodiode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
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Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K23/00—Pulse counters comprising counting chains; Frequency dividers comprising counting chains
- H03K23/40—Gating or clocking signals applied to all stages, i.e. synchronous counters
- H03K23/50—Gating or clocking signals applied to all stages, i.e. synchronous counters using bi-stable regenerative trigger circuits
- H03K23/54—Ring counters, i.e. feedback shift register counters
- H03K23/548—Reversible counters
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/803—Pixels having integrated switching, control, storage or amplification elements
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/011—Manufacture or treatment of image sensors covered by group H10F39/12
- H10F39/026—Wafer-level processing
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/191—Photoconductor image sensors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/1205—Multiplexed conversion systems
- H03M1/123—Simultaneous, i.e. using one converter per channel but with common control or reference circuits for multiple converters
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/60—Analogue/digital converters with intermediate conversion to frequency of pulses
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Thin Film Transistor (AREA)
- Light Receiving Elements (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Analogue/Digital Conversion (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011002597A JP5727796B2 (ja) | 2010-01-15 | 2011-01-10 | 半導体装置 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010007249 | 2010-01-15 | ||
| JP2010007249 | 2010-01-15 | ||
| JP2011002597A JP5727796B2 (ja) | 2010-01-15 | 2011-01-10 | 半導体装置 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2015075561A Division JP6025902B2 (ja) | 2010-01-15 | 2015-04-02 | 半導体装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2011166751A JP2011166751A (ja) | 2011-08-25 |
| JP2011166751A5 JP2011166751A5 (enExample) | 2014-02-13 |
| JP5727796B2 true JP5727796B2 (ja) | 2015-06-03 |
Family
ID=44277590
Family Applications (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011002597A Active JP5727796B2 (ja) | 2010-01-15 | 2011-01-10 | 半導体装置 |
| JP2015075561A Expired - Fee Related JP6025902B2 (ja) | 2010-01-15 | 2015-04-02 | 半導体装置 |
| JP2016199897A Expired - Fee Related JP6313393B2 (ja) | 2010-01-15 | 2016-10-11 | 半導体装置 |
Family Applications After (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2015075561A Expired - Fee Related JP6025902B2 (ja) | 2010-01-15 | 2015-04-02 | 半導体装置 |
| JP2016199897A Expired - Fee Related JP6313393B2 (ja) | 2010-01-15 | 2016-10-11 | 半導体装置 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US9871526B2 (enExample) |
| JP (3) | JP5727796B2 (enExample) |
| KR (1) | KR101733755B1 (enExample) |
| CN (1) | CN102725961B (enExample) |
| TW (1) | TWI587701B (enExample) |
| WO (1) | WO2011086829A1 (enExample) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102713999B (zh) | 2010-01-20 | 2016-01-20 | 株式会社半导体能源研究所 | 电子设备和电子系统 |
| KR101805378B1 (ko) | 2010-01-24 | 2017-12-06 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치와 이의 제조 방법 |
| KR101793534B1 (ko) * | 2011-01-05 | 2017-11-06 | 삼성디스플레이 주식회사 | 포토센서 및 그의 제조방법 |
| JP5902590B2 (ja) * | 2012-09-06 | 2016-04-13 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| KR101886445B1 (ko) | 2012-10-19 | 2018-08-07 | 현대자동차주식회사 | 차량용 슬라이딩 도어의 직선형 센터레일 링크 구조 |
| JP6093726B2 (ja) * | 2013-03-22 | 2017-03-08 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| US9324747B2 (en) * | 2014-03-13 | 2016-04-26 | Semiconductor Energy Laboratory Co., Ltd. | Imaging device |
| JP6545541B2 (ja) * | 2014-06-25 | 2019-07-17 | 株式会社半導体エネルギー研究所 | 撮像装置、監視装置、及び電子機器 |
| KR102553553B1 (ko) * | 2015-06-12 | 2023-07-10 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 촬상 장치, 및 그 동작 방법 및 전자 기기 |
| JP7254826B2 (ja) * | 2018-09-28 | 2023-04-10 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| KR102098700B1 (ko) * | 2018-11-16 | 2020-04-08 | 네메시스 주식회사 | 개선된 동적 범위와 노이즈 특성을 가지는 포토 센싱 장치 |
| JP7169171B2 (ja) * | 2018-11-19 | 2022-11-10 | 株式会社東芝 | 半導体装置及び距離計測装置 |
| KR102869845B1 (ko) | 2019-03-06 | 2025-10-13 | 삼성디스플레이 주식회사 | 디스플레이 패널 및 이를 포함한 디스플레이 장치 |
| CN113836987B (zh) * | 2020-06-24 | 2025-03-04 | 京东方科技集团股份有限公司 | 传感器装置、电子设备和降低信号噪声的方法 |
Family Cites Families (54)
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| US3678500A (en) * | 1970-08-04 | 1972-07-18 | Gen Electric | Analog digital converter |
| US4285584A (en) * | 1979-10-02 | 1981-08-25 | Polaroid Corporation | Photometric device |
| JPS642377A (en) * | 1987-06-25 | 1989-01-06 | Sony Corp | Photosensor |
| JPH02143573A (ja) | 1988-11-25 | 1990-06-01 | Ricoh Co Ltd | 光電変換装置 |
| US5172117A (en) * | 1989-06-19 | 1992-12-15 | Linear Instruments | Analog to digital conversion using an integrater and a sample and hold circuit |
| US5168528A (en) * | 1990-08-20 | 1992-12-01 | Itt Corporation | Differential electronic imaging system |
| JPH07255013A (ja) | 1994-01-31 | 1995-10-03 | Sony Corp | 固体撮像装置 |
| US20010048140A1 (en) | 1997-04-10 | 2001-12-06 | Inao Toyoda | Photo sensing integrated circuit device and related circuit adjustment |
| US5877715A (en) * | 1997-06-12 | 1999-03-02 | International Business Machines Corporation | Correlated double sampling with up/down counter |
| US5982318A (en) * | 1997-10-10 | 1999-11-09 | Lucent Technologies Inc. | Linearizing offset cancelling white balancing and gamma correcting analog to digital converter for active pixel sensor imagers with self calibrating and self adjusting properties |
| US6160282A (en) * | 1998-04-21 | 2000-12-12 | Foveon, Inc. | CMOS image sensor employing silicide exclusion mask to reduce leakage and improve performance |
| JP3507336B2 (ja) | 1998-06-17 | 2004-03-15 | キヤノン株式会社 | 光電変換装置 |
| JP4192305B2 (ja) | 1998-08-27 | 2008-12-10 | 株式会社ニコン | 固体撮像素子 |
| US6380571B1 (en) * | 1998-10-14 | 2002-04-30 | National Semiconductor Corporation | CMOS compatible pixel cell that utilizes a gated diode to reset the cell |
| US6618115B1 (en) | 1999-11-19 | 2003-09-09 | Semiconductor Energy Laboratory Co., Ltd. | Defective pixel compensation system and display device using the system |
| US6747638B2 (en) | 2000-01-31 | 2004-06-08 | Semiconductor Energy Laboratory Co., Ltd. | Adhesion type area sensor and display device having adhesion type area sensor |
| JP4112184B2 (ja) | 2000-01-31 | 2008-07-02 | 株式会社半導体エネルギー研究所 | エリアセンサ及び表示装置 |
| US6995753B2 (en) * | 2000-06-06 | 2006-02-07 | Semiconductor Energy Laboratory Co., Ltd. | Display device and method of manufacturing the same |
| JP4560205B2 (ja) * | 2000-12-18 | 2010-10-13 | キヤノン株式会社 | A/d変換器及びそれを用いた固体撮像装置 |
| JP4485087B2 (ja) | 2001-03-01 | 2010-06-16 | 株式会社半導体エネルギー研究所 | 半導体装置の動作方法 |
| FR2824664A1 (fr) | 2001-05-09 | 2002-11-15 | St Microelectronics Sa | Photodetecteur cmos comportant une photodiode en silicium amorphe |
| WO2003001567A2 (en) * | 2001-06-20 | 2003-01-03 | R3 Logic, Inc. | High resolution, low power, wide dynamic range imager with embedded pixel processor and dram storage |
| US6556155B1 (en) | 2002-02-19 | 2003-04-29 | Texas Advanced Optoelectronic Solutions, Inc. | Method and integrated circuit for temperature coefficient compensation |
| JP3795846B2 (ja) | 2002-08-29 | 2006-07-12 | 富士通株式会社 | 半導体装置 |
| JP4234485B2 (ja) | 2003-04-28 | 2009-03-04 | 浜松ホトニクス株式会社 | I/f変換装置および光検出装置 |
| JP2005079438A (ja) | 2003-09-02 | 2005-03-24 | Toshiba Matsushita Display Technology Co Ltd | フォトダイオードおよびこの駆動方法 |
| DE10342620B4 (de) * | 2003-09-12 | 2010-09-30 | Windmöller & Hölscher Kg | Folienwendestation |
| KR20070003784A (ko) * | 2003-12-15 | 2007-01-05 | 코닌클리케 필립스 일렉트로닉스 엔.브이. | 광센서를 가지는 능동 매트릭스 픽셀 디바이스 |
| JP4192880B2 (ja) | 2004-10-12 | 2008-12-10 | セイコーエプソン株式会社 | 電気光学装置および電子機器 |
| US7453065B2 (en) | 2004-11-10 | 2008-11-18 | Canon Kabushiki Kaisha | Sensor and image pickup device |
| JP2006165530A (ja) | 2004-11-10 | 2006-06-22 | Canon Inc | センサ及び非平面撮像装置 |
| JP4725095B2 (ja) | 2004-12-15 | 2011-07-13 | ソニー株式会社 | 裏面入射型固体撮像装置及びその製造方法 |
| US7115925B2 (en) * | 2005-01-14 | 2006-10-03 | Omnivision Technologies, Inc. | Image sensor and pixel having an optimized floating diffusion |
| US7800594B2 (en) | 2005-02-03 | 2010-09-21 | Toshiba Matsushita Display Technology Co., Ltd. | Display device including function to input information from screen by light |
| JP5005179B2 (ja) | 2005-03-23 | 2012-08-22 | ソニー株式会社 | 固体撮像装置 |
| JPWO2006129428A1 (ja) * | 2005-05-31 | 2008-12-25 | シャープ株式会社 | フォトダイオード及び表示装置 |
| JP5013754B2 (ja) | 2005-06-13 | 2012-08-29 | キヤノン株式会社 | 電磁波検出装置、放射線検出装置、放射線検出システム及びレーザ加工方法 |
| JP5059767B2 (ja) | 2005-09-21 | 2012-10-31 | アール・ジェイ・エス・テクノロジー・インコーポレイテッド | 高ダイナミックレンジ感度センサ素子またはアレイのためのシステムおよび方法 |
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| JP5142943B2 (ja) | 2007-11-05 | 2013-02-13 | キヤノン株式会社 | 放射線検出装置の製造方法、放射線検出装置及び放射線撮像システム |
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| EP2138815B1 (en) | 2008-06-25 | 2013-11-20 | Semiconductor Energy Laboratory Co, Ltd. | Photometric device |
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| JP5317591B2 (ja) * | 2008-09-01 | 2013-10-16 | キヤノン株式会社 | 撮像装置 |
| US8982099B2 (en) | 2009-06-25 | 2015-03-17 | Semiconductor Energy Laboratory Co., Ltd. | Touch panel and driving method of the same |
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-
2010
- 2010-12-16 WO PCT/JP2010/073256 patent/WO2011086829A1/en not_active Ceased
- 2010-12-16 CN CN201080061288.3A patent/CN102725961B/zh not_active Expired - Fee Related
- 2010-12-16 KR KR1020127020021A patent/KR101733755B1/ko not_active Expired - Fee Related
-
2011
- 2011-01-04 US US12/984,061 patent/US9871526B2/en not_active Expired - Fee Related
- 2011-01-05 TW TW100100328A patent/TWI587701B/zh not_active IP Right Cessation
- 2011-01-10 JP JP2011002597A patent/JP5727796B2/ja active Active
-
2015
- 2015-04-02 JP JP2015075561A patent/JP6025902B2/ja not_active Expired - Fee Related
-
2016
- 2016-10-11 JP JP2016199897A patent/JP6313393B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| TWI587701B (zh) | 2017-06-11 |
| KR20120116458A (ko) | 2012-10-22 |
| CN102725961A (zh) | 2012-10-10 |
| WO2011086829A1 (en) | 2011-07-21 |
| US20110176652A1 (en) | 2011-07-21 |
| KR101733755B1 (ko) | 2017-05-08 |
| JP2015149497A (ja) | 2015-08-20 |
| JP6313393B2 (ja) | 2018-04-18 |
| TW201138450A (en) | 2011-11-01 |
| CN102725961B (zh) | 2017-10-13 |
| JP2017063433A (ja) | 2017-03-30 |
| JP6025902B2 (ja) | 2016-11-16 |
| US9871526B2 (en) | 2018-01-16 |
| JP2011166751A (ja) | 2011-08-25 |
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