JP5711981B2 - 酸化スズ粒子及びその製造方法 - Google Patents
酸化スズ粒子及びその製造方法 Download PDFInfo
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- JP5711981B2 JP5711981B2 JP2011008982A JP2011008982A JP5711981B2 JP 5711981 B2 JP5711981 B2 JP 5711981B2 JP 2011008982 A JP2011008982 A JP 2011008982A JP 2011008982 A JP2011008982 A JP 2011008982A JP 5711981 B2 JP5711981 B2 JP 5711981B2
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- JP
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- Prior art keywords
- tin oxide
- oxide particles
- tin
- water
- particles according
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 title claims description 112
- 229910001887 tin oxide Inorganic materials 0.000 title claims description 107
- 239000002245 particle Substances 0.000 title claims description 100
- 238000004519 manufacturing process Methods 0.000 title claims description 15
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 37
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 20
- 239000001301 oxygen Substances 0.000 claims description 20
- 229910052760 oxygen Inorganic materials 0.000 claims description 20
- 238000002834 transmittance Methods 0.000 claims description 19
- 150000001875 compounds Chemical class 0.000 claims description 15
- 150000002894 organic compounds Chemical class 0.000 claims description 14
- 239000004372 Polyvinyl alcohol Substances 0.000 claims description 13
- 239000003513 alkali Substances 0.000 claims description 13
- 239000002019 doping agent Substances 0.000 claims description 13
- 229920002451 polyvinyl alcohol Polymers 0.000 claims description 13
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims description 12
- 238000005259 measurement Methods 0.000 claims description 11
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 10
- 239000006185 dispersion Substances 0.000 claims description 10
- 238000001237 Raman spectrum Methods 0.000 claims description 8
- 239000007787 solid Substances 0.000 claims description 8
- 230000005587 bubbling Effects 0.000 claims description 6
- -1 tin (II) compound Chemical class 0.000 claims description 4
- 239000011261 inert gas Substances 0.000 claims description 3
- 239000003960 organic solvent Substances 0.000 claims description 3
- 229920005862 polyol Polymers 0.000 claims description 3
- 150000003077 polyols Chemical class 0.000 claims description 3
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 34
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- 239000004033 plastic Substances 0.000 description 8
- 239000000243 solution Substances 0.000 description 8
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 7
- 229910006404 SnO 2 Inorganic materials 0.000 description 7
- 230000000052 comparative effect Effects 0.000 description 7
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- WGTYBPLFGIVFAS-UHFFFAOYSA-M tetramethylammonium hydroxide Chemical compound [OH-].C[N+](C)(C)C WGTYBPLFGIVFAS-UHFFFAOYSA-M 0.000 description 4
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- AXZWODMDQAVCJE-UHFFFAOYSA-L tin(II) chloride (anhydrous) Chemical compound [Cl-].[Cl-].[Sn+2] AXZWODMDQAVCJE-UHFFFAOYSA-L 0.000 description 3
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- KBPLFHHGFOOTCA-UHFFFAOYSA-N 1-Octanol Chemical compound CCCCCCCCO KBPLFHHGFOOTCA-UHFFFAOYSA-N 0.000 description 2
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- HZAXFHJVJLSVMW-UHFFFAOYSA-N 2-Aminoethan-1-ol Chemical compound NCCO HZAXFHJVJLSVMW-UHFFFAOYSA-N 0.000 description 2
- XNWFRZJHXBZDAG-UHFFFAOYSA-N 2-METHOXYETHANOL Chemical compound COCCO XNWFRZJHXBZDAG-UHFFFAOYSA-N 0.000 description 2
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- YEYKMVJDLWJFOA-UHFFFAOYSA-N 2-propoxyethanol Chemical compound CCCOCCO YEYKMVJDLWJFOA-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- AMQJEAYHLZJPGS-UHFFFAOYSA-N N-Pentanol Chemical compound CCCCCO AMQJEAYHLZJPGS-UHFFFAOYSA-N 0.000 description 2
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- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- 229910021626 Tin(II) chloride Inorganic materials 0.000 description 2
- GTTSNKDQDACYLV-UHFFFAOYSA-N Trihydroxybutane Chemical compound CCCC(O)(O)O GTTSNKDQDACYLV-UHFFFAOYSA-N 0.000 description 2
- 239000002253 acid Substances 0.000 description 2
- 150000001298 alcohols Chemical class 0.000 description 2
- 125000002723 alicyclic group Chemical group 0.000 description 2
- 125000001931 aliphatic group Chemical group 0.000 description 2
- WUOACPNHFRMFPN-UHFFFAOYSA-N alpha-terpineol Chemical compound CC1=CCC(C(C)(C)O)CC1 WUOACPNHFRMFPN-UHFFFAOYSA-N 0.000 description 2
- 125000003118 aryl group Chemical group 0.000 description 2
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- CDQSJQSWAWPGKG-UHFFFAOYSA-N butane-1,1-diol Chemical compound CCCC(O)O CDQSJQSWAWPGKG-UHFFFAOYSA-N 0.000 description 2
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- 229910052801 chlorine Inorganic materials 0.000 description 2
- 238000004737 colorimetric analysis Methods 0.000 description 2
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- XBDQKXXYIPTUBI-UHFFFAOYSA-N dimethylselenoniopropionate Natural products CCC(O)=O XBDQKXXYIPTUBI-UHFFFAOYSA-N 0.000 description 2
- 229910001873 dinitrogen Inorganic materials 0.000 description 2
- 239000002612 dispersion medium Substances 0.000 description 2
- 238000004090 dissolution Methods 0.000 description 2
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- TZMQHOJDDMFGQX-UHFFFAOYSA-N hexane-1,1,1-triol Chemical compound CCCCCC(O)(O)O TZMQHOJDDMFGQX-UHFFFAOYSA-N 0.000 description 2
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- 239000010955 niobium Substances 0.000 description 2
- ZWRUINPWMLAQRD-UHFFFAOYSA-N nonan-1-ol Chemical compound CCCCCCCCCO ZWRUINPWMLAQRD-UHFFFAOYSA-N 0.000 description 2
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- FDPIMTJIUBPUKL-UHFFFAOYSA-N pentan-3-one Chemical compound CCC(=O)CC FDPIMTJIUBPUKL-UHFFFAOYSA-N 0.000 description 2
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- 229920001223 polyethylene glycol Polymers 0.000 description 2
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- SQGYOTSLMSWVJD-UHFFFAOYSA-N silver(1+) nitrate Chemical compound [Ag+].[O-]N(=O)=O SQGYOTSLMSWVJD-UHFFFAOYSA-N 0.000 description 2
- 238000001542 size-exclusion chromatography Methods 0.000 description 2
- 235000011150 stannous chloride Nutrition 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- 150000005846 sugar alcohols Polymers 0.000 description 2
- 229910052715 tantalum Inorganic materials 0.000 description 2
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- 150000003606 tin compounds Chemical class 0.000 description 2
- 229910001432 tin ion Inorganic materials 0.000 description 2
- ZIBGPFATKBEMQZ-UHFFFAOYSA-N triethylene glycol Chemical compound OCCOCCOCCO ZIBGPFATKBEMQZ-UHFFFAOYSA-N 0.000 description 2
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- SXYRTDICSOVQNZ-UHFFFAOYSA-N 1-(2-methoxyethoxy)ethanol Chemical compound COCCOC(C)O SXYRTDICSOVQNZ-UHFFFAOYSA-N 0.000 description 1
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- 229920002799 BoPET Polymers 0.000 description 1
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- IUVKMZGDUIUOCP-BTNSXGMBSA-N quinbolone Chemical compound O([C@H]1CC[C@H]2[C@H]3[C@@H]([C@]4(C=CC(=O)C=C4CC3)C)CC[C@@]21C)C1=CCCC1 IUVKMZGDUIUOCP-BTNSXGMBSA-N 0.000 description 1
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- 238000004879 turbidimetry Methods 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y30/00—Nanotechnology for materials or surface science, e.g. nanocomposites
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01G—COMPOUNDS CONTAINING METALS NOT COVERED BY SUBCLASSES C01D OR C01F
- C01G19/00—Compounds of tin
- C01G19/02—Oxides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B1/00—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
- H01B1/06—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors mainly consisting of other non-metallic substances
- H01B1/08—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors mainly consisting of other non-metallic substances oxides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B1/00—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
- H01B1/14—Conductive material dispersed in non-conductive inorganic material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B1/00—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
- H01B1/20—Conductive material dispersed in non-conductive organic material
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2002/00—Crystal-structural characteristics
- C01P2002/50—Solid solutions
- C01P2002/52—Solid solutions containing elements as dopants
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2002/00—Crystal-structural characteristics
- C01P2002/50—Solid solutions
- C01P2002/52—Solid solutions containing elements as dopants
- C01P2002/54—Solid solutions containing elements as dopants one element only
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2002/00—Crystal-structural characteristics
- C01P2002/80—Crystal-structural characteristics defined by measured data other than those specified in group C01P2002/70
- C01P2002/82—Crystal-structural characteristics defined by measured data other than those specified in group C01P2002/70 by IR- or Raman-data
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2004/00—Particle morphology
- C01P2004/60—Particles characterised by their size
- C01P2004/62—Submicrometer sized, i.e. from 0.1-1 micrometer
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- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2004/00—Particle morphology
- C01P2004/60—Particles characterised by their size
- C01P2004/64—Nanometer sized, i.e. from 1-100 nanometer
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- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2006/00—Physical properties of inorganic compounds
- C01P2006/40—Electric properties
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- Condensed Matter Physics & Semiconductors (AREA)
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Description
溶存酸素を除去した水中に、水溶性スズ(II)化合物を固体の状態で添加しこれを溶解させ、次いでアルカリを添加することを特徴とする酸化スズ粒子の製造方法を提供するものである。
3.98gの水酸化ナトリウムを490gの純水に溶解し、中和用のアルカリ水溶液を調製した(A液)。
これとは別に、純水490gが入ったビーカーに、1mmφのパイレックス(登録商標)製ガラス管を水面下まで差し込み、100mL/分で窒素ガスをバブリングして溶存酸素を除去した。純水中の溶存酸素の濃度は3ppmであった。そこに、ポリビニルアルコール(平均重合度n=400〜600、完全けん化型、以下「PVA」という。)0.5gを加え、85℃に加熱しながら溶解させてPVA水溶液を得た(B液)。
次いで、引き続き85℃に加熱されかつバブリングされたB液中に固体の無水二塩化スズ12.58gを溶解させてスズ水溶液を得た(C液)。溶解後、先に準備したA液を直ちに全量ゆっくりとフィードして母液を得た。母液の温度は85℃に維持しておいた。バブリングも継続させた。このときの母液のpHは2〜3であった。
A液の添加終了後、バブリングを停止して5分間母液のエージングを行った。次いで30%の過酸化水素水7.5gを純水30gに希釈した水溶液を、5mL/分で母液に全量フィードした。その後、5分間母液をエージングし、目的とする酸化スズ粒子を得た。
この粒子を含むスラリーを、ろ紙(アドバンテック社製 5C)を用いてろ過し、ろ過後、1Lの純水を加え通水洗浄した。このようにして得られたケーキを純水1Lにリパルプ洗浄し再度、ろ過及び通水洗浄した。この操作を3回繰り返して粒子を洗浄した。洗浄ケーキを120℃設定した熱風乾燥機で大気中において10時間乾燥させた。この粉末について、ラマン分光、圧粉抵抗、可視光の全光線透過率、波長1500nmの赤外光透過率、一次粒子の平均粒径、化学分析測定を以下の方法で実施した。ラマン分光の測定結果を図1に示す。図2には、可視光から赤外光の波長領域における透過率の測定結果が示されている(ただし実施例1及び比較例1のみ)。圧粉抵抗、可視光の全光線透過率、波長1500nmでの赤外光透過率、一次粒子の平均粒径及び化学分析の結果は、以下の表1に示されている。
レーザーラマン「NRS−2100」日本分光社製を用い、顕微分析法によって測定した。励起光には、He−Neレーザー(λ=632.8nm)を使用し、25〜600cm-1の範囲を4.81cm-1毎に測定してスペクトルを得た。測定試料はペレットとした。ペレットは、粉末0.2gを10φの金型に充填し、1ton/cm2プレスすることで作製した。
圧力500kgf/cm2で圧縮して得られたサンプルについて、三菱化学社製ロレスタPAPD−41を用い、四端子法に従い抵抗を測定した。
酸化スズ粒子7.4gを市販のアクリル樹脂6.4gとともにトルエン:ブタノール=7:3(重量比)混合溶液10gに添加し、ペイントシェーカを用いてビーズ分散して分散液を調製した。この分散液をPETフィルムに塗布し、1時間風乾して透明薄膜を形成した。この薄膜の膜厚を電子顕微鏡で観察したところ2μmであった。この薄膜を日本電色工業社の光線透過率測定装置NDH−1001DPを用いて全光線透過率を測定した。
可視光の全光線透過率の測定で形成した前記の薄膜の赤外光透過率を、分光光度計「U−4000」日立ハイテクノロジー社製を用いて測定した。
20個の酸化スズ粒子をSEM観察し、最大横断長を測定してその平均値を算出した。この値を一次粒子の平均粒径とした。
スズは、ICP(SPS−3000/SIIナノテクノロジー社製)を用いて定量した。酸素はガス分析装置(EMGA−620/堀場製作所社製)を用いて定量した。不純物元素である炭素は、ガス分析装置(EMIA−920V、堀場製作所製)を用いて定量した。同じく不純物元素である塩素は、吸光光度法(硝酸銀比濁法)によって定量した(無機応用比色分析編集委員会編「無機比色分析2」共立出版を参照のこと。)
実施例1において使用したPVAを添加しなかった。その代わりに、水酸化ナトリウムの使用量を2.66gに減量して、これを490gの純水に溶解し、中和用のアルカリ水溶液を調製した(A液)。これら以外は実施例1と同様にして酸化スズ粒子を得た。得られた酸化スズ粒子について実施例1と同様の評価を行った。
実施例1で得られた酸化スズ粒子を大気中450℃で3時間焼成した。焼成後の酸化スズ粒子について実施例1と同様の評価を行った。
酸化スズ粒子として高純度化学社製の試薬を用いた。この酸化スズ粒子について実施例1と同様の評価を行った。
また、表1及び図2に示す結果から明らかなように、各実施例で得られた酸化スズ粒子は、導電性が高く、可視光の透過率が高く、かつ赤外光の遮蔽性が高いことが判る。
Claims (9)
- ラマンスペクトル測定において、少なくとも37±9cm-1、57±9cm-1、97±9cm-1、142±9cm-1、205±9cm-1、255±9cm-1にピークを示す構造を有することを特徴とする酸化スズ粒子。
- 波長1500nmにおける赤外光の透過率が80%以下である請求項1に記載の酸化スズ粒子。
- 導電性を有する請求項1又は2に記載の酸化スズ粒子。
- 導電性を発現するドーパント元素を含まない請求項3に記載の酸化スズ粒子。
- 請求項1記載の酸化スズ粒子が水又は有機溶媒に分散してなる透明分散液。
- 請求項1記載の酸化スズ粒子の製造方法であって、
溶存酸素を除去した水中に、水溶性スズ(II)化合物を固体の状態で添加しこれを溶解させ、次いでアルカリを添加することを特徴とする酸化スズ粒子の製造方法。 - 不活性ガスのバブリングによって前記水中の溶存酸素を除去する請求項6に記載の酸化スズ粒子の製造方法。
- 前記水が水酸基を有する有機化合物を含む請求項6又は7に記載の酸化スズ粒子の製造方法。
- 水酸基を有する有機化合物がポリビニルアルコール、ポリオール又は一価の低級アルコールである請求項8に記載の酸化スズ粒子の製造方法。
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US13/992,862 US8916070B2 (en) | 2011-01-19 | 2012-01-10 | Tin oxide particles and method for producing same |
PCT/JP2012/050252 WO2012098948A1 (ja) | 2011-01-19 | 2012-01-10 | 酸化スズ粒子及びその製造方法 |
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JP6200814B2 (ja) * | 2013-02-05 | 2017-09-20 | 三井金属鉱業株式会社 | リンを含む酸化スズ粒子及びリンを含む酸化スズゾルの製造方法 |
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JP3980523B2 (ja) | 2003-06-02 | 2007-09-26 | 多木化学株式会社 | アルカリ安定型酸化スズゾル及びその製造方法 |
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