JP5705669B2 - 微細パターン形成用組成物およびそれを用いた微細化されたパターン形成方法 - Google Patents

微細パターン形成用組成物およびそれを用いた微細化されたパターン形成方法 Download PDF

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JP5705669B2
JP5705669B2 JP2011155822A JP2011155822A JP5705669B2 JP 5705669 B2 JP5705669 B2 JP 5705669B2 JP 2011155822 A JP2011155822 A JP 2011155822A JP 2011155822 A JP2011155822 A JP 2011155822A JP 5705669 B2 JP5705669 B2 JP 5705669B2
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acid
forming
composition
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JP2013020211A (ja
JP2013020211A5 (https=
Inventor
村 聡 也 岡
村 聡 也 岡
ゲオルク、ポロウスキー
井 雅 弘 石
井 雅 弘 石
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メルクパフォーマンスマテリアルズＩｐ合同会社
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Priority to JP2011155822A priority Critical patent/JP5705669B2/ja
Priority to TW101125082A priority patent/TWI555786B/zh
Priority to CN201280034718.1A priority patent/CN103649838B/zh
Priority to EP12811582.1A priority patent/EP2733534B1/en
Priority to US14/127,331 priority patent/US9298094B2/en
Priority to PCT/JP2012/067926 priority patent/WO2013008912A1/ja
Priority to KR1020147003670A priority patent/KR101879173B1/ko
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    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26—Processing photosensitive materials; Apparatus therefor
    • G03F7/30—Imagewise removal using liquid means
    • G03F7/32—Liquid compositions therefor, e.g. developers
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F226/00—Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a single or double bond to nitrogen or by a heterocyclic ring containing nitrogen
    • C08F226/02—Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a single or double bond to nitrogen or by a heterocyclic ring containing nitrogen by a single or double bond to nitrogen
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F226/00—Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a single or double bond to nitrogen or by a heterocyclic ring containing nitrogen
    • C08F226/02—Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a single or double bond to nitrogen or by a heterocyclic ring containing nitrogen by a single or double bond to nitrogen
    • C08F226/04—Diallylamine
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F8/00—Chemical modification by after-treatment
    • C08F8/28—Condensation with aldehydes or ketones
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F8/00—Chemical modification by after-treatment
    • C08F8/30—Introducing nitrogen atoms or nitrogen-containing groups
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F8/00—Chemical modification by after-treatment
    • C08F8/34—Introducing sulfur atoms or sulfur-containing groups
    • C—CHEMISTRY; METALLURGY
    • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
    • C09D139/00—Coating compositions based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a single or double bond to nitrogen or by a heterocyclic ring containing nitrogen; Coating compositions based on derivatives of such polymers
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26—Processing photosensitive materials; Apparatus therefor
    • G03F7/40—Treatment after imagewise removal, e.g. baking
    • G03F7/405—Treatment with inorganic or organometallic reagents after imagewise removal
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P76/00—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography
    • H10P76/20—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography of masks comprising organic materials
    • H10P76/204—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography of masks comprising organic materials of organic photoresist masks
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F2800/00—Copolymer characterised by the proportions of the comonomers expressed
    • C08F2800/10—Copolymer characterised by the proportions of the comonomers expressed as molar percentages
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F2810/00—Chemical modification of a polymer
    • C08F2810/30—Chemical modification of a polymer leading to the formation or introduction of aliphatic or alicyclic unsaturated groups
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F2810/00—Chemical modification of a polymer
    • C08F2810/50—Chemical modification of a polymer wherein the polymer is a copolymer and the modification is taking place only on one or more of the monomers present in minority
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00—Stock material or miscellaneous articles
    • Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
    • Y10T428/24802—Discontinuous or differential coating, impregnation or bond [e.g., artwork, printing, retouched photograph, etc.]

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  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • General Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Inorganic Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Wood Science & Technology (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Materials For Photolithography (AREA)
  • Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
JP2011155822A 2011-07-14 2011-07-14 微細パターン形成用組成物およびそれを用いた微細化されたパターン形成方法 Active JP5705669B2 (ja)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP2011155822A JP5705669B2 (ja) 2011-07-14 2011-07-14 微細パターン形成用組成物およびそれを用いた微細化されたパターン形成方法
TW101125082A TWI555786B (zh) 2011-07-14 2012-07-12 微細圖案形成用組成物及使用其之微細化圖案形成方法
EP12811582.1A EP2733534B1 (en) 2011-07-14 2012-07-13 Composition for forming fine pattern and method for forming fined pattern using same
US14/127,331 US9298094B2 (en) 2011-07-14 2012-07-13 Composition for forming fine pattern and method for forming fined pattern using same
CN201280034718.1A CN103649838B (zh) 2011-07-14 2012-07-13 微细图案形成用组合物以及使用其的微细化图案形成方法
PCT/JP2012/067926 WO2013008912A1 (ja) 2011-07-14 2012-07-13 微細パターン形成用組成物およびそれを用いた微細化されたパターン形成方法
KR1020147003670A KR101879173B1 (ko) 2011-07-14 2012-07-13 미세 패턴 형성용 조성물 및 이를 이용한 미세화된 패턴 형성 방법

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011155822A JP5705669B2 (ja) 2011-07-14 2011-07-14 微細パターン形成用組成物およびそれを用いた微細化されたパターン形成方法

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JP2013020211A JP2013020211A (ja) 2013-01-31
JP2013020211A5 JP2013020211A5 (https=) 2014-07-17
JP5705669B2 true JP5705669B2 (ja) 2015-04-22

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Country Status (7)

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US (1) US9298094B2 (https=)
EP (1) EP2733534B1 (https=)
JP (1) JP5705669B2 (https=)
KR (1) KR101879173B1 (https=)
CN (1) CN103649838B (https=)
TW (1) TWI555786B (https=)
WO (1) WO2013008912A1 (https=)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6239833B2 (ja) * 2013-02-26 2017-11-29 アーゼッド・エレクトロニック・マテリアルズ（ルクセンブルグ）ソシエテ・ア・レスポンサビリテ・リミテ 微細レジストパターン形成用組成物およびそれを用いたパターン形成方法
JP6157151B2 (ja) * 2013-03-05 2017-07-05 アーゼッド・エレクトロニック・マテリアルズ（ルクセンブルグ）ソシエテ・ア・レスポンサビリテ・リミテ 微細レジストパターン形成用組成物およびそれを用いたパターン形成方法
JP6427450B2 (ja) * 2014-03-31 2018-11-21 積水化学工業株式会社 変性ポリビニルアセタール樹脂
JP6459759B2 (ja) * 2014-05-26 2019-01-30 信越化学工業株式会社 パターン形成方法及びシュリンク剤
JP6722433B2 (ja) * 2015-09-30 2020-07-15 東京応化工業株式会社 レジストパターン形成方法及びパターン厚肉化用ポリマー組成物
JP6503206B2 (ja) 2015-03-19 2019-04-17 東京応化工業株式会社 レジストパターン修復方法
TWI627220B (zh) * 2015-06-03 2018-06-21 羅門哈斯電子材料有限公司 用於圖案處理之組合物及方法
TWI617900B (zh) * 2015-06-03 2018-03-11 羅門哈斯電子材料有限公司 圖案處理方法
TWI615460B (zh) * 2015-06-03 2018-02-21 羅門哈斯電子材料有限公司 用於圖案處理的組合物和方法
JP2017129774A (ja) * 2016-01-21 2017-07-27 凸版印刷株式会社 緑色感光性着色組成物、それを用いたカラーフィルタ及びカラー表示装置
JP6741471B2 (ja) * 2016-05-17 2020-08-19 東京応化工業株式会社 レジストパターン形成方法
JP6745167B2 (ja) * 2016-08-19 2020-08-26 東京応化工業株式会社 レジストパターン形成方法、及びパターン厚肉化用ポリマー組成物
JP6789158B2 (ja) * 2017-03-21 2020-11-25 東京応化工業株式会社 ポリマーの製造方法及びレジストパターン形成方法

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US5086111A (en) * 1990-05-17 1992-02-04 Air Products And Chemicals, Inc. Amine functional polymers containing acetal groups
DE4413720A1 (de) * 1994-04-20 1995-10-26 Basf Ag Farbstoffübertragungsinhibitoren für Waschmittel
KR101076623B1 (ko) * 2003-07-17 2011-10-27 에이제토 엘렉토로닉 마티리알즈 가부시키가이샤 미세 패턴 형성 재료 및 이를 사용한 미세 패턴 형성방법
KR100585138B1 (ko) * 2004-04-08 2006-05-30 삼성전자주식회사 반도체 소자 제조용 마스크 패턴 및 그 형성 방법과 미세패턴을 가지는 반도체 소자의 제조 방법
US7595141B2 (en) * 2004-10-26 2009-09-29 Az Electronic Materials Usa Corp. Composition for coating over a photoresist pattern
JP4952012B2 (ja) * 2005-03-29 2012-06-13 Ｊｓｒ株式会社 微細パターン形成用樹脂組成物および微細パターン形成方法
JP5000260B2 (ja) * 2006-10-19 2012-08-15 ＡｚエレクトロニックマテリアルズＩｐ株式会社 微細化されたパターンの形成方法およびそれに用いるレジスト基板処理液
JP2008102343A (ja) * 2006-10-19 2008-05-01 Az Electronic Materials Kk 現像済みレジスト基板処理液とそれを用いたレジスト基板の処理方法
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JP5375412B2 (ja) * 2009-07-30 2013-12-25 Ｊｓｒ株式会社 微細パターン形成用樹脂組成物および微細パターン形成方法
JP5925454B2 (ja) * 2010-12-16 2016-05-25 花王株式会社 磁気ディスク基板用研磨液組成物

Also Published As

Publication number Publication date
TWI555786B (zh) 2016-11-01
US9298094B2 (en) 2016-03-29
EP2733534A1 (en) 2014-05-21
CN103649838B (zh) 2016-08-24
WO2013008912A1 (ja) 2013-01-17
JP2013020211A (ja) 2013-01-31
TW201313820A (zh) 2013-04-01
KR101879173B1 (ko) 2018-07-18
EP2733534A4 (en) 2015-03-11
KR20140050055A (ko) 2014-04-28
CN103649838A (zh) 2014-03-19
US20140127478A1 (en) 2014-05-08
EP2733534B1 (en) 2016-09-14

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