JP5687201B2 - 組み合わせ顕微鏡検査法 - Google Patents

組み合わせ顕微鏡検査法 Download PDF

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JP5687201B2
JP5687201B2 JP2011535029A JP2011535029A JP5687201B2 JP 5687201 B2 JP5687201 B2 JP 5687201B2 JP 2011535029 A JP2011535029 A JP 2011535029A JP 2011535029 A JP2011535029 A JP 2011535029A JP 5687201 B2 JP5687201 B2 JP 5687201B2
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sample
illumination
image
microscopy
microscope
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JP2012507756A5 (enExample
JP2012507756A (ja
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ヴォレシェンスキー、ラルフ
クレッペ、インゴ
クラムペルト、ゲルハルト
ケンペ、ミヒャエル
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Carl Zeiss Microscopy GmbH
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Carl Zeiss MicroImaging GmbH
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    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/64Imaging systems using optical elements for stabilisation of the lateral and angular position of the image
    • G02B27/642Optical derotators, i.e. systems for compensating for image rotation, e.g. using rotating prisms, mirrors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/645Specially adapted constructive features of fluorimeters
    • G01N21/6456Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458Fluorescence microscopy
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/645Specially adapted constructive features of fluorimeters
    • G01N21/648Specially adapted constructive features of fluorimeters using evanescent coupling or surface plasmon coupling for the excitation of fluorescence
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052Optical details of the image generation
    • G02B21/0076Optical details of the image generation arrangements using fluorescence or luminescence
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/36Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365Control or image processing arrangements for digital or video microscopes
    • G02B21/367Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/58Optics for apodization or superresolution; Optical synthetic aperture systems

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Multimedia (AREA)
  • Engineering & Computer Science (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP2011535029A 2008-11-03 2009-10-28 組み合わせ顕微鏡検査法 Active JP5687201B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102008054317A DE102008054317A1 (de) 2008-11-03 2008-11-03 Kombinationsmikroskopie
DE102008054317.9 2008-11-03
PCT/EP2009/007693 WO2010060515A1 (de) 2008-11-03 2009-10-28 Kombinationsmikroskopie

Publications (3)

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JP2012507756A JP2012507756A (ja) 2012-03-29
JP2012507756A5 JP2012507756A5 (enExample) 2012-12-13
JP5687201B2 true JP5687201B2 (ja) 2015-03-18

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US (1) US8704196B2 (enExample)
EP (2) EP3206070B1 (enExample)
JP (1) JP5687201B2 (enExample)
DE (1) DE102008054317A1 (enExample)
WO (1) WO2010060515A1 (enExample)

Families Citing this family (50)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010140609A1 (ja) * 2009-06-02 2010-12-09 株式会社ニコン 画像処理装置、プログラム、および、顕微鏡
DE102009031231A1 (de) 2009-06-26 2010-12-30 Carl Zeiss Microlmaging Gmbh Verfahren und Anordnungen für die Fluoreszenzmikroskopie
DE102010028138A1 (de) * 2010-04-22 2011-10-27 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Bestimmen der Verteilung einer Substanz durch Abtasten mit einer Messfront
DE102010036709A1 (de) * 2010-07-28 2012-02-02 Leica Microsystems Cms Gmbh Einrichtung und Verfahren zur mikroskopischen Bildaufnahme einer Probenstruktur
JP2013539074A (ja) 2010-09-24 2013-10-17 カール・ツァイス・マイクロスコピー・ゲゼルシャフト・ミット・ベシュレンクテル・ハフツング 3d局在顕微鏡法並びに4d局在顕微鏡法及び追跡方法並びに追跡システム
DE102010041426A1 (de) * 2010-09-27 2012-05-03 Siemens Aktiengesellschaft Messeinheit und Verfahren zur optischen Untersuchung einer Flüssigkeit zur Bestimmung einer Analyt-Konzentration
CN103477267B (zh) * 2011-03-01 2016-09-14 通用电气医疗集团生物科学公司 可变取向照明模式旋转器
DE102011007751B4 (de) * 2011-04-20 2023-10-19 Carl Zeiss Microscopy Gmbh Weitfeldmikroskop und Verfahren zur Weitfeldmikroskopie
DE102011100507B4 (de) * 2011-04-29 2020-05-14 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Tragbares optisches Analysegerät
DE102011077269A1 (de) * 2011-06-09 2012-12-13 Carl Zeiss Microimaging Gmbh Hochauflösende Lumineszenzmikroskopie
DE102011083847A1 (de) 2011-09-30 2013-04-04 Carl Zeiss Microscopy Gmbh Mikroskop für die Weitfeldmikroskopie
DE102011084315A1 (de) 2011-10-12 2013-04-18 Carl Zeiss Microscopy Gmbh Hochauflösende Lumineszenzmikroskopie
DE102011087196A1 (de) * 2011-11-28 2013-05-29 Leica Microsystems Cms Gmbh Mikroskopbeleuchtungssystem und -verfahren
US8755122B2 (en) * 2011-12-12 2014-06-17 Corning Incorporated Laser pulse stretching unit and method for using same
US8724203B2 (en) * 2011-12-12 2014-05-13 Corning Incorporated Variable pulse stretching length by variable beamsplitter reflectivity
JP5878756B2 (ja) 2011-12-28 2016-03-08 浜松ホトニクス株式会社 画像処理装置、撮像装置、顕微鏡装置、画像処理方法、及び画像処理プログラム
DE102012007045B4 (de) 2012-04-05 2023-03-16 Carl Zeiss Microscopy Gmbh Vorrichtung und Verfahren zur Mikroskopie
DE102013100172A1 (de) * 2013-01-09 2014-07-10 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Verfahren zum räumlich hochaufgelösten Abbilden einer einen Luminophor aufweisenden Struktur einer Probe
CN105144237B (zh) 2013-03-15 2018-09-18 卢米耐克斯公司 微球的实时跟踪和关联
EP2801854B1 (en) 2013-05-10 2017-07-19 Ruprecht-Karls-Universität Heidelberg Method and apparatus for combination of localization microscopy and structured illumination microscopy
CN104516098B (zh) * 2013-09-30 2017-04-12 西门子公司 一种显微装置及成像方法
DE102013114860B3 (de) 2013-12-23 2015-05-28 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Verfahren und Vorrichtung zur Bestimmung der Orte einzelner Moleküle einer Substanz in einer Probe
DE102014107606A1 (de) * 2014-05-28 2015-12-03 Carl Zeiss Ag Funktionsintegriertes Laser-Scanning-Mikroskop
DE102016117096C5 (de) * 2015-09-22 2023-11-30 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Verfahren zum hochaufgelösten lokalen Abbilden einer Struktur in einer Probe
LU92924B1 (de) * 2015-12-23 2017-08-07 Leica Microsystems Abtastvorrichtung zum Abtasten eines Objekts für den Einsatz in einem Rastermikroskop
US10648924B2 (en) * 2016-01-04 2020-05-12 Kla-Tencor Corp. Generating high resolution images from low resolution images for semiconductor applications
JP7027316B2 (ja) 2016-03-07 2022-03-01 マックス-プランク-ゲゼルシャフト ツア フェルデルング デア ヴィッセンシャフテン イー.ヴイ. 多数の対象の対象固有の場所間の輸送方法
US10969573B2 (en) 2016-03-24 2021-04-06 Max-Planck-Gesellschaft Zur Foerderung Der Wissenschaften E.V. Spatio-temporally light modulated imaging system, method for confocal imaging an object and carrier wheel device
EP3252512A1 (en) 2016-06-03 2017-12-06 Leica Instruments (Singapore) Pte. Ltd. Interchangeable optical module and microscopic apparatus
DE102016120683A1 (de) * 2016-10-28 2018-05-03 Carl Zeiss Microscopy Gmbh Lichtblattmikroskop
US10324041B2 (en) 2016-12-21 2019-06-18 Abbott Japan Co., Ltd. Optical imaging system using lateral illumination for digital assays
WO2018131172A1 (ja) 2017-01-16 2018-07-19 株式会社ニコン 画像処理装置、顕微鏡システム、画像処理方法、及びプログラム
US11047854B2 (en) 2017-02-06 2021-06-29 Abbott Japan Llc Methods for reducing noise in signal-generating digital assays
DE102017102604B4 (de) * 2017-02-09 2023-12-14 Abberior Instruments Gmbh Verfahren zum Steuern eines Laserscanning-Mikroskops beim Abtasten einer Probe und Laserscanning-Mikroskop
EP3610313B1 (en) * 2017-04-11 2022-03-02 Calico Life Sciences LLC Fluorescence microscopy system and methods based on stimulated emission
CN109724951A (zh) * 2017-10-27 2019-05-07 黄晓淳 一种动态超分辨荧光成像技术
JP7039261B2 (ja) * 2017-11-17 2022-03-22 株式会社日立製作所 組織切片の特定領域からの生体分子採取方法および装置
DE102018105442A1 (de) * 2018-03-09 2019-09-12 Carl Zeiss Microscopy Gmbh Kameramodul für ein Mikroskop und Verfahren zu dessen Betrieb
WO2020205952A1 (en) 2019-04-02 2020-10-08 Thermo Electron Scientific Instruments Llc Enhanced sample imaging using structured illumination microscopy
GB201907953D0 (en) 2019-06-04 2019-07-17 Smi Drug Discovery Ltd An optical microscope
EP3822687A1 (en) * 2019-11-15 2021-05-19 Leica Microsystems CMS GmbH Optical imaging device for a microscope
DE102019218912A1 (de) * 2019-12-04 2021-06-10 Carl Zeiss Microscopy Gmbh Verfahren und Vorrichtung zur Beleuchtung einer Probenebene
DE102019008989B3 (de) * 2019-12-21 2021-06-24 Abberior Instruments Gmbh Verfahren zur Störungskorrektur und Laserscanningmikroskop mit Störungskorrektur
CN114076750B (zh) * 2020-08-20 2024-05-10 深圳华大智造科技股份有限公司 超分辨成像装置与方法、生物样品识别系统与识别方法
DE102020122535B4 (de) * 2020-08-28 2022-08-11 Carl Zeiss Microscopy Gmbh Verfahren zum Betrieb eines Strahlgeräts, Computerprogrammprodukt und Strahlgerät zum Durchführen des Verfahrens
CN114755200B (zh) * 2022-03-21 2022-11-08 北京大学长三角光电科学研究院 基于光动力治疗的可视化监测系统及方法
EP4253942A1 (en) 2022-03-31 2023-10-04 Abberior GmbH Method and apparatus for optical imaging with a high number of imaging samples
EP4253941A1 (en) * 2022-03-31 2023-10-04 Abberior GmbH Method and apparatus for optical imaging with a high number of imaging samples
DE102022208620A1 (de) * 2022-08-19 2024-02-22 Carl Zeiss Microscopy Gmbh Mikroskopieverfahren, insbesondere für die Fluoreszenzkorrelationsspektroskopie
DE102023119977A1 (de) * 2023-07-27 2025-01-30 Abberior Instruments Gmbh Verfahren, Computerprogramm und Vorrichtung zum Schätzen einer Lage eines Emitters in einer Probe

Family Cites Families (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US23686A (en) 1859-04-19 Coen-shellek
DE3436167A1 (de) 1984-10-03 1986-04-10 Ernst Leitz Wetzlar Gmbh, 6330 Wetzlar Prismensystem zur drehung der bildlage
JP3324780B2 (ja) * 1991-05-16 2002-09-17 オリンパス光学工業株式会社 紫外線顕微鏡
DE4416558C2 (de) 1994-02-01 1997-09-04 Hell Stefan Verfahren zum optischen Messen eines Probenpunkts einer Probe und Vorrichtung zur Durchführung des Verfahrens
ATE204086T1 (de) 1994-02-01 2001-08-15 Hell Stefan Vorrichtung und verfahren zum optischen messen eines probenpunktes einer probe mit hoher ortsauflösung
US5866911A (en) 1994-07-15 1999-02-02 Baer; Stephen C. Method and apparatus for improving resolution in scanned optical system
DE19654208C2 (de) 1996-12-24 2001-05-10 Leica Microsystems Mikroskop
US6072625A (en) * 1997-02-03 2000-06-06 Olympus Optical Co., Ltd. Optical microscope apparatus
DE19908883A1 (de) 1999-03-02 2000-09-07 Rainer Heintzmann Verfahren zur Erhöhung der Auflösung optischer Abbildung
JP2002062261A (ja) 2000-08-21 2002-02-28 Olympus Optical Co Ltd 光学装置および顕微鏡
JP3902939B2 (ja) 2001-10-26 2007-04-11 株式会社日立ハイテクノロジーズ 標本中の微小領域測定装置及び方法
US6924490B2 (en) 2002-01-10 2005-08-02 Olympus Optical Co., Ltd. Microscope system
DE10325460A1 (de) 2003-04-13 2004-11-11 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Räumlich hochauflösendes Abbilden
US7430045B2 (en) 2003-04-13 2008-09-30 Max-Planck-Gesellschaft Zur Forderung Der Wissenschaften E.V. High spatial resolution imaging
DE102004034999A1 (de) 2004-03-10 2005-10-13 TOGE-Dübel A. Gerhard KG Leitplanken-Pfosten
DE102004034962A1 (de) * 2004-07-16 2006-02-16 Carl Zeiss Jena Gmbh Mikroskop mit erhöhter Auflösung
DE102004034998A1 (de) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Lichtrastermikroskop mit bewegter Lochscheibe und Verwendung
DE102004034983A1 (de) 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Lichtrastermikroskop
JP4602731B2 (ja) * 2004-10-05 2010-12-22 オリンパス株式会社 顕微鏡システム
US7816654B2 (en) * 2005-01-16 2010-10-19 Baer Stephen C Single wavelength stimulated emission depletion microscopy
EP3203235A1 (en) 2005-05-23 2017-08-09 Harald F. Hess Optical microscopy with phototransformable optical labels
JP4878815B2 (ja) * 2005-06-10 2012-02-15 オリンパス株式会社 顕微鏡装置
DE102005034443A1 (de) * 2005-07-22 2007-02-22 Carl Zeiss Jena Gmbh Auflösungsgesteigerte Lumineszenz-Mikroskopie
ATE441103T1 (de) 2005-07-22 2009-09-15 Zeiss Carl Microimaging Gmbh Auflísungsgesteigerte lumineszenz-mikroskopie
US7485875B2 (en) 2005-07-22 2009-02-03 Carl Zeiss Microimaging Gmbh Resolution-enhanced luminescence microscopy
US7929738B2 (en) * 2005-10-11 2011-04-19 Olympus Corporation Microscope apparatus and microscope system
US7679741B2 (en) 2006-03-01 2010-03-16 Leica Microsystems Cms Gmbh Method and microscope for high spatial resolution examination of samples
DE102006009831B4 (de) * 2006-03-01 2013-07-04 Leica Microsystems Cms Gmbh Verfahren und Mikroskop zur räumlich hochauflösenden Untersuchung von Proben
DE102006021317B3 (de) 2006-05-06 2007-10-11 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Verfahren und Fluoreszenzlichtmikroskop zum räumlich hochauflösenden Abbilden einer Struktur einer Probe
US8421035B2 (en) 2006-08-11 2013-04-16 The Regents Of The University Of California High-resolution microscope using optical amplification
DE102006046369A1 (de) 2006-09-29 2008-04-03 Carl Zeiss Microimaging Gmbh Auflösungsgesteigerte Lumineszenzmikroskopie
DE102006047912A1 (de) 2006-10-06 2008-04-10 Carl Zeiss Microimaging Gmbh Verfahren und Anordnung zur parallelisierten mikroskopischen Bildgebung
DE102006060180B9 (de) 2006-12-18 2013-08-08 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Verfahren und Vorrichtung zum räumlich hochaufgelösten Abbilden einer mit einer Substanz markierten Struktur
DE102008009216A1 (de) 2008-02-13 2009-08-20 Carl Zeiss Microimaging Gmbh Vorrichtung und Verfahren zum räumlich hochauflösenden Abbilden einer Struktur einer Probe

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WO2010060515A1 (de) 2010-06-03
US8704196B2 (en) 2014-04-22
EP3206070A1 (de) 2017-08-16
JP2012507756A (ja) 2012-03-29
DE102008054317A1 (de) 2010-05-06
EP3206070B1 (de) 2018-05-23
EP2350726B1 (de) 2017-04-19
US20110284767A1 (en) 2011-11-24
EP2350726A1 (de) 2011-08-03

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