JP5631020B2 - 平板状被検査体の試験装置 - Google Patents

平板状被検査体の試験装置 Download PDF

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Publication number
JP5631020B2
JP5631020B2 JP2010030309A JP2010030309A JP5631020B2 JP 5631020 B2 JP5631020 B2 JP 5631020B2 JP 2010030309 A JP2010030309 A JP 2010030309A JP 2010030309 A JP2010030309 A JP 2010030309A JP 5631020 B2 JP5631020 B2 JP 5631020B2
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Japan
Prior art keywords
moving
panel
test apparatus
receiver
receiving surface
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JP2010030309A
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English (en)
Japanese (ja)
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JP2011085574A (ja
Inventor
勲 植木
勲 植木
藤原　慎治
慎治 藤原
譲 外川
譲 外川
正行 安斎
正行 安斎
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Micronics Japan Co Ltd
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Micronics Japan Co Ltd
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Publication date
Application filed by Micronics Japan Co Ltd filed Critical Micronics Japan Co Ltd
Priority to JP2010030309A priority Critical patent/JP5631020B2/ja
Priority to TW99108272A priority patent/TWI424177B/zh
Priority to KR1020100035308A priority patent/KR101093646B1/ko
Priority to CN201010160703.2A priority patent/CN101876679B/zh
Publication of JP2011085574A publication Critical patent/JP2011085574A/ja
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Publication of JP5631020B2 publication Critical patent/JP5631020B2/ja
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  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2010030309A 2009-05-01 2010-02-15 平板状被検査体の試験装置 Active JP5631020B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2010030309A JP5631020B2 (ja) 2009-05-01 2010-02-15 平板状被検査体の試験装置
TW99108272A TWI424177B (zh) 2009-05-01 2010-03-22 Test device for flat plate-like specimen
KR1020100035308A KR101093646B1 (ko) 2009-05-01 2010-04-16 평판형상 피검사체의 시험장치
CN201010160703.2A CN101876679B (zh) 2009-05-01 2010-04-28 平板状待检查体的试验装置

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2009112119 2009-05-01
JP2009112119 2009-05-01
JP2009216753 2009-09-18
JP2009216753 2009-09-18
JP2010030309A JP5631020B2 (ja) 2009-05-01 2010-02-15 平板状被検査体の試験装置

Publications (2)

Publication Number Publication Date
JP2011085574A JP2011085574A (ja) 2011-04-28
JP5631020B2 true JP5631020B2 (ja) 2014-11-26

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ID=44078608

Family Applications (1)

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JP2010030309A Active JP5631020B2 (ja) 2009-05-01 2010-02-15 平板状被検査体の試験装置

Country Status (2)

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JP (1) JP5631020B2 (zh)
TW (1) TWI424177B (zh)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8402314B2 (en) * 2010-12-09 2013-03-19 Apple Inc. Debug registers for halting processor cores after reset or power off
TWI614548B (zh) * 2013-10-28 2018-02-11 高雄晶傑達光電科技股份有限公司 點燈測試裝置
KR101371370B1 (ko) * 2013-12-13 2014-03-07 한동희 패널 부착유닛과 이를 갖는 패널 부착장치 및 패널 부착방법
JP2015219007A (ja) * 2014-05-13 2015-12-07 日本電産リード株式会社 位置決め装置、及び処理装置
TWI581035B (zh) * 2015-07-24 2017-05-01 惠特科技股份有限公司 液晶測試板定位方法
JP6786381B2 (ja) * 2016-06-30 2020-11-18 日本電産サンキョー株式会社 アライメント装置
CN107765107B (zh) * 2016-08-18 2023-09-15 苏州迈瑞微电子有限公司 指纹识别模组灵敏度测试治具及测试方法
JP7058159B2 (ja) * 2018-03-28 2022-04-21 株式会社エンプラス 位置決め機構および検査装置
CN108732364B (zh) * 2018-07-13 2024-08-06 深圳市活水床旁诊断仪器有限公司 一种温育槽装置
CN111766149B (zh) * 2020-07-15 2023-06-02 江苏辉通检测有限公司 窨井盖边沿强度检测装置
CN112873137B (zh) * 2020-12-29 2022-11-04 北京半导体专用设备研究所（中国电子科技集团公司第四十五研究所） 一种剥离工作台
CN116990628B (zh) * 2023-09-28 2023-12-15 珠海市枫杨科技有限公司 大屏功能测试自动定位对插装置和系统

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4490066B2 (ja) * 2003-09-18 2010-06-23 株式会社日本マイクロニクス 表示用パネルの検査装置
JP4570930B2 (ja) * 2004-10-22 2010-10-27 株式会社日本マイクロニクス パネルの検査装置に用いられる電気的接続装置
WO2006085364A1 (ja) * 2005-02-09 2006-08-17 Advantest Corporation 電子部品試験装置
JP4674151B2 (ja) * 2005-11-16 2011-04-20 株式会社日本マイクロニクス 点灯検査装置
CN101454677B (zh) * 2006-05-31 2012-05-09 应用材料公司 用于tft-lcd测试的微探测器
JP2008188727A (ja) * 2007-02-06 2008-08-21 Joyo Kogaku Kk アライメント方法およびその装置

Also Published As

Publication number Publication date
TWI424177B (zh) 2014-01-21
TW201043983A (en) 2010-12-16
JP2011085574A (ja) 2011-04-28

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