JP5628935B2 - メモリ修正用の適応可能な処理制約 - Google Patents

メモリ修正用の適応可能な処理制約 Download PDF

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Publication number
JP5628935B2
JP5628935B2 JP2012545943A JP2012545943A JP5628935B2 JP 5628935 B2 JP5628935 B2 JP 5628935B2 JP 2012545943 A JP2012545943 A JP 2012545943A JP 2012545943 A JP2012545943 A JP 2012545943A JP 5628935 B2 JP5628935 B2 JP 5628935B2
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Japan
Prior art keywords
processing
recipe
individual
laser
parameters
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Expired - Fee Related
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JP2012545943A
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English (en)
Japanese (ja)
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JP2013516067A5 (enExample
JP2013516067A (ja
Inventor
ジェイ． ワトソン，ダニエル
ジェイ． ワトソン，ダニエル
アール． コヘン，ミュアー
アール． コヘン，ミュアー
Original Assignee
エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド
エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド
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Publication of JP2013516067A publication Critical patent/JP2013516067A/ja
Publication of JP2013516067A5 publication Critical patent/JP2013516067A5/ja
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    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00—Working by laser beam, e.g. welding, cutting or boring
    • B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
    • B23K26/03—Observing, e.g. monitoring, the workpiece
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01—Manufacture or treatment
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00—Working by laser beam, e.g. welding, cutting or boring
    • B23K26/08—Devices involving relative movement between laser beam and workpiece
    • B23K26/082—Scanning systems, i.e. devices involving movement of the laser beam relative to the laser head
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00—Working by laser beam, e.g. welding, cutting or boring
    • B23K26/08—Devices involving relative movement between laser beam and workpiece
    • B23K26/083—Devices involving movement of the workpiece in at least one axial direction
    • B23K26/0853—Devices involving movement of the workpiece in at least in two axial directions, e.g. in a plane
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00—Working by laser beam, e.g. welding, cutting or boring
    • B23K26/351—Working by laser beam, e.g. welding, cutting or boring for trimming or tuning of electrical components
    • H10P74/27—
    • H10P95/00—
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K2101/00—Articles made by soldering, welding or cutting
    • B23K2101/36—Electric or electronic devices
    • B23K2101/40—Semiconductor devices
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B12/00—Dynamic random access memory [DRAM] devices
    • H10B12/50—Peripheral circuit region structures
    • H10W20/067—

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  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Mechanical Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
JP2012545943A 2009-12-23 2010-10-29 メモリ修正用の適応可能な処理制約 Expired - Fee Related JP5628935B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/646,402 US8461479B2 (en) 2009-12-23 2009-12-23 Adaptive processing constraints for memory repair
US12/646,402 2009-12-23
PCT/US2010/054633 WO2011087551A1 (en) 2009-12-23 2010-10-29 Adaptive processing constraints for memory repair

Publications (3)

Publication Number Publication Date
JP2013516067A JP2013516067A (ja) 2013-05-09
JP2013516067A5 JP2013516067A5 (enExample) 2013-12-12
JP5628935B2 true JP5628935B2 (ja) 2014-11-19

Family

ID=44149623

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012545943A Expired - Fee Related JP5628935B2 (ja) 2009-12-23 2010-10-29 メモリ修正用の適応可能な処理制約

Country Status (6)

Country Link
US (1) US8461479B2 (enExample)
JP (1) JP5628935B2 (enExample)
KR (1) KR101630492B1 (enExample)
CN (1) CN102687263B (enExample)
TW (1) TWI511235B (enExample)
WO (1) WO2011087551A1 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI511820B (zh) * 2013-12-02 2015-12-11 Ardentec Corp 雷射製程機台的參數載入方法
TWI606531B (zh) * 2017-03-30 2017-11-21 義守大學 適用於三維晶片的缺陷測試方法及系統
WO2019033089A1 (en) * 2017-08-11 2019-02-14 Brava Home, Inc. CONFIGURABLE COOKING SYSTEMS AND METHODS

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5685995A (en) * 1994-11-22 1997-11-11 Electro Scientific Industries, Inc. Method for laser functional trimming of films and devices
DE10005618A1 (de) * 2000-02-09 2001-08-30 Infineon Technologies Ag Integrierter Halbleiterspeicher mit redundanter Einheit von Speicherzellen
DE10034062A1 (de) * 2000-07-13 2002-01-24 Infineon Technologies Ag Integrierter Halbleiterspeicher mit Speicherzellen in mehre-ren Speicherzellenfeldern und Verfahren zur Reparatur eines solchen Speichers
JP3774138B2 (ja) * 2000-11-13 2006-05-10 住友重機械工業株式会社 加工計画方法、装置、及び、加工方法、装置
US6591154B2 (en) 2000-12-15 2003-07-08 International Business Machines Corporation System and method for modifying enclosed areas for ion beam and laser beam bias effects
US6972268B2 (en) 2001-03-29 2005-12-06 Gsi Lumonics Corporation Methods and systems for processing a device, methods and systems for modeling same and the device
JP2003266187A (ja) * 2002-03-12 2003-09-24 Sumitomo Heavy Ind Ltd 加工機の動作速度モデル化方法、装置、動作経路最適化方法、装置、及び、動作速度検定方法、装置
US7358157B2 (en) * 2002-03-27 2008-04-15 Gsi Group Corporation Method and system for high-speed precise laser trimming, scan lens system for use therein and electrical device produced thereby
JP4281292B2 (ja) * 2002-04-23 2009-06-17 パナソニック電工株式会社 ３次元レーザ加工データ作成方法と同データ作成プログラム及び同データ作成プログラムを記録した媒体並びに同加工方法及び装置
US20040144760A1 (en) * 2002-05-17 2004-07-29 Cahill Steven P. Method and system for marking a workpiece such as a semiconductor wafer and laser marker for use therein
TW579525B (en) * 2002-05-30 2004-03-11 Samsung Electronics Co Ltd Semiconductor memory device post-repair circuit and method
JP2004142082A (ja) * 2002-10-28 2004-05-20 Sumitomo Heavy Ind Ltd 加工計画方法及び装置
US7085296B2 (en) * 2003-12-05 2006-08-01 Branson Ultrasonics Corporation Dual parameter laser optical feedback
KR101257029B1 (ko) * 2004-06-18 2013-04-22 일렉트로 싸이언티픽 인더스트리이즈 인코포레이티드 다중 레이저 빔 스폿을 이용하는 반도체 구조 가공
US8049135B2 (en) * 2004-06-18 2011-11-01 Electro Scientific Industries, Inc. Systems and methods for alignment of laser beam(s) for semiconductor link processing
US7687740B2 (en) 2004-06-18 2010-03-30 Electro Scientific Industries, Inc. Semiconductor structure processing using multiple laterally spaced laser beam spots delivering multiple blows
EP1618984B1 (de) 2004-07-08 2006-09-06 TRUMPF Laser GmbH + Co. KG Laserschweissverfahren und -vorrichtung
US8076605B2 (en) * 2007-06-25 2011-12-13 Electro Scientific Industries, Inc. Systems and methods for adapting parameters to increase throughput during laser-based wafer processing

Also Published As

Publication number Publication date
KR101630492B1 (ko) 2016-06-24
US20110147348A1 (en) 2011-06-23
TW201140752A (en) 2011-11-16
WO2011087551A1 (en) 2011-07-21
CN102687263A (zh) 2012-09-19
CN102687263B (zh) 2015-02-18
KR20120110115A (ko) 2012-10-09
TWI511235B (zh) 2015-12-01
US8461479B2 (en) 2013-06-11
JP2013516067A (ja) 2013-05-09

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