JP5610487B2 - 機械加工装置及び機械加工方法 - Google Patents
機械加工装置及び機械加工方法 Download PDFInfo
- Publication number
- JP5610487B2 JP5610487B2 JP2011267444A JP2011267444A JP5610487B2 JP 5610487 B2 JP5610487 B2 JP 5610487B2 JP 2011267444 A JP2011267444 A JP 2011267444A JP 2011267444 A JP2011267444 A JP 2011267444A JP 5610487 B2 JP5610487 B2 JP 5610487B2
- Authority
- JP
- Japan
- Prior art keywords
- cutting fluid
- fine
- bubble
- fine bubbles
- processing tool
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Dicing (AREA)
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2011267444A JP5610487B2 (ja) | 2010-12-10 | 2011-12-07 | 機械加工装置及び機械加工方法 |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010276195 | 2010-12-10 | ||
JP2010276195 | 2010-12-10 | ||
JP2011267444A JP5610487B2 (ja) | 2010-12-10 | 2011-12-07 | 機械加工装置及び機械加工方法 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2012135869A JP2012135869A (ja) | 2012-07-19 |
JP2012135869A5 JP2012135869A5 (enrdf_load_stackoverflow) | 2013-12-12 |
JP5610487B2 true JP5610487B2 (ja) | 2014-10-22 |
Family
ID=46337314
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2011267444A Expired - Fee Related JP5610487B2 (ja) | 2010-12-10 | 2011-12-07 | 機械加工装置及び機械加工方法 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP5610487B2 (enrdf_load_stackoverflow) |
KR (1) | KR101325295B1 (enrdf_load_stackoverflow) |
CN (1) | CN102528624B (enrdf_load_stackoverflow) |
TW (1) | TWI492290B (enrdf_load_stackoverflow) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013111713A (ja) * | 2011-11-29 | 2013-06-10 | Tokyo Seimitsu Co Ltd | 切削水の供給装置及び供給方法 |
JP6200685B2 (ja) * | 2013-05-09 | 2017-09-20 | 株式会社ディスコ | 加工装置 |
WO2018168912A1 (ja) * | 2017-03-16 | 2018-09-20 | Idec株式会社 | 研削液生成装置、研削液生成方法、研削装置および研削液 |
CN109382922A (zh) * | 2018-11-28 | 2019-02-26 | 江苏晶成光学有限公司 | 一种单晶硅片用线切割机切削液供给装置 |
JP2020104230A (ja) * | 2018-12-28 | 2020-07-09 | 株式会社ナガセインテグレックス | ワーク切削方法 |
JP7165079B2 (ja) * | 2019-03-12 | 2022-11-02 | 日本タングステン株式会社 | 加工用クーラント供給機構、および、加工用クーラントの供給方法 |
JP7712132B2 (ja) * | 2021-07-29 | 2025-07-23 | 株式会社ディスコ | 加工装置 |
JP2024050022A (ja) * | 2022-09-29 | 2024-04-10 | 株式会社ディスコ | 切削装置及び切削方法 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3105057B2 (ja) * | 1992-02-20 | 2000-10-30 | 株式会社東京精密 | ダイシング装置及びダイシング装置の目立て方法 |
US5632886A (en) * | 1993-04-02 | 1997-05-27 | Harvey Universal, Inc. | Cutting oil treatment apparatus |
DE69733160T8 (de) * | 1996-02-15 | 2006-06-08 | Zeta Heiwa Ltd., Ashiya | Vorrichtung zum Abscheiden von Verunreinigungen aus einer Kühlflüssigkeit in einer Werkzeugmaschine |
JP2003068677A (ja) * | 2001-08-21 | 2003-03-07 | Sony Corp | ダイシング装置およびダイシング方法 |
US7048863B2 (en) * | 2003-07-08 | 2006-05-23 | Ashland Licensing And Intellectual Property Llc | Device and process for treating cutting fluids using ultrasound |
JP2006012966A (ja) | 2004-06-23 | 2006-01-12 | Seiko Epson Corp | 切削方法 |
JP2007160175A (ja) * | 2005-12-12 | 2007-06-28 | Sharp Corp | 洗浄装置 |
JP2007331088A (ja) * | 2006-06-15 | 2007-12-27 | Kazumasa Onishi | マイクロバブルを用いた機械加工装置 |
WO2010122985A1 (ja) * | 2009-04-20 | 2010-10-28 | 日立化成工業株式会社 | 半導体基板用研磨液及び半導体基板の研磨方法 |
-
2011
- 2011-11-22 TW TW100142706A patent/TWI492290B/zh not_active IP Right Cessation
- 2011-12-07 KR KR1020110130076A patent/KR101325295B1/ko not_active Expired - Fee Related
- 2011-12-07 JP JP2011267444A patent/JP5610487B2/ja not_active Expired - Fee Related
- 2011-12-09 CN CN201110409433.9A patent/CN102528624B/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP2012135869A (ja) | 2012-07-19 |
KR20120065239A (ko) | 2012-06-20 |
TW201234468A (en) | 2012-08-16 |
TWI492290B (zh) | 2015-07-11 |
CN102528624B (zh) | 2014-08-27 |
CN102528624A (zh) | 2012-07-04 |
KR101325295B1 (ko) | 2013-11-08 |
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