JP5585228B2 - 画像検査装置、画像検査方法、及び画像形成装置 - Google Patents

画像検査装置、画像検査方法、及び画像形成装置 Download PDF

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Publication number
JP5585228B2
JP5585228B2 JP2010136432A JP2010136432A JP5585228B2 JP 5585228 B2 JP5585228 B2 JP 5585228B2 JP 2010136432 A JP2010136432 A JP 2010136432A JP 2010136432 A JP2010136432 A JP 2010136432A JP 5585228 B2 JP5585228 B2 JP 5585228B2
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Japan
Prior art keywords
light
image
reference plate
image inspection
inspection apparatus
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JP2010136432A
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English (en)
Japanese (ja)
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JP2012002601A (ja
JP2012002601A5 (OSRAM
Inventor
仁志 伊藤
文宏 中重
啓嗣 小島
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Ricoh Co Ltd
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Ricoh Co Ltd
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Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Priority to JP2010136432A priority Critical patent/JP5585228B2/ja
Priority to US13/067,382 priority patent/US8587844B2/en
Priority to EP11169145.7A priority patent/EP2397840B1/en
Publication of JP2012002601A publication Critical patent/JP2012002601A/ja
Publication of JP2012002601A5 publication Critical patent/JP2012002601A5/ja
Application granted granted Critical
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41F—PRINTING MACHINES OR PRESSES
    • B41F33/00—Indicating, counting, warning, control or safety devices
    • B41F33/0036—Devices for scanning or checking the printed matter for quality control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/57—Measuring gloss
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/93—Detection standards; Calibrating baseline adjustment, drift correction

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Quality & Reliability (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2010136432A 2010-06-15 2010-06-15 画像検査装置、画像検査方法、及び画像形成装置 Active JP5585228B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2010136432A JP5585228B2 (ja) 2010-06-15 2010-06-15 画像検査装置、画像検査方法、及び画像形成装置
US13/067,382 US8587844B2 (en) 2010-06-15 2011-05-27 Image inspecting apparatus, image inspecting method, and image forming apparatus
EP11169145.7A EP2397840B1 (en) 2010-06-15 2011-06-08 Image inspecting apparatus, image inspecting method, image forming apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010136432A JP5585228B2 (ja) 2010-06-15 2010-06-15 画像検査装置、画像検査方法、及び画像形成装置

Publications (3)

Publication Number Publication Date
JP2012002601A JP2012002601A (ja) 2012-01-05
JP2012002601A5 JP2012002601A5 (OSRAM) 2013-05-16
JP5585228B2 true JP5585228B2 (ja) 2014-09-10

Family

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Family Applications (1)

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JP2010136432A Active JP5585228B2 (ja) 2010-06-15 2010-06-15 画像検査装置、画像検査方法、及び画像形成装置

Country Status (3)

Country Link
US (1) US8587844B2 (OSRAM)
EP (1) EP2397840B1 (OSRAM)
JP (1) JP5585228B2 (OSRAM)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4913075B2 (ja) * 2008-01-16 2012-04-11 京セラミタ株式会社 画像読取装置
JP5585228B2 (ja) * 2010-06-15 2014-09-10 株式会社リコー 画像検査装置、画像検査方法、及び画像形成装置
JP5636885B2 (ja) * 2010-11-08 2014-12-10 株式会社リコー 画像処理装置、画像形成装置、及び画像処理システム
JP5445983B2 (ja) * 2012-02-03 2014-03-19 横河電機株式会社 塗工寸法測定装置
JP5904454B2 (ja) * 2012-03-14 2016-04-13 株式会社リコー 画像形成装置及びトナー濃度検出方法
FI124434B (en) * 2012-10-31 2014-08-29 Metso Automation Oy Method and apparatus for track monitoring
US9156278B2 (en) 2013-06-18 2015-10-13 Ricoh Company, Ltd. Quality analysis of printheads with clear fluid
JP6477076B2 (ja) * 2014-03-18 2019-03-06 株式会社リコー 画像検査装置、画像形成システム、画像検査方法及び画像検査プログラム
DE102015114575B4 (de) * 2015-09-01 2017-05-24 Stephan Krebs Vorrichtung zur Druckbildkontrolle
KR102291429B1 (ko) * 2016-05-30 2021-08-19 봅스트 맥스 에스에이 표면 검사 시스템 및 표면 검사 방법
JP6842615B2 (ja) * 2016-07-13 2021-03-17 株式会社小森コーポレーション 印刷品質検査装置
US11307027B2 (en) * 2017-04-25 2022-04-19 Hewlett-Packard Development Company, L.P. Determining a characteristic of a substrate
JP2020008542A (ja) * 2018-07-03 2020-01-16 株式会社リコー 検査装置、検査方法、及びプログラム
CN109708750A (zh) * 2018-12-11 2019-05-03 北京卫星环境工程研究所 空间电离层远紫外探测器灵敏度标定系统
EP3889582B1 (en) * 2019-01-10 2024-04-03 Konica Minolta, Inc. Optical characteristic analysis apparatus and program
JP7234800B2 (ja) * 2019-05-27 2023-03-08 マツダ株式会社 金属調質感の評価方法
JP2022016023A (ja) * 2020-07-10 2022-01-21 コニカミノルタ株式会社 光沢度検査装置、光沢度検査方法、及び画像形成装置
JP7775604B2 (ja) * 2021-09-16 2025-11-26 コニカミノルタ株式会社 光沢度検出装置、画像形成装置及び用紙搬送システム

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Publication number Priority date Publication date Assignee Title
JPH07325016A (ja) * 1994-05-31 1995-12-12 Shimadzu Corp 反射率測定装置
JP2001027604A (ja) * 1999-07-14 2001-01-30 Moritex Corp つや計
US6713775B2 (en) 2002-06-21 2004-03-30 Lexmark International, Inc. Method to correct for sensitivity variation of media sensors
US6819886B2 (en) 2002-10-23 2004-11-16 Nex Press Solutions Llc Gloss/density measurement device with feedback to control gloss and density of images produced by an electrographic reproduction apparatus
JP2004205463A (ja) * 2002-12-26 2004-07-22 Fuji Photo Film Co Ltd 光沢度測定装置、光沢度測定方法およびキャリブレーション方法
JP3964323B2 (ja) * 2002-12-27 2007-08-22 株式会社コーセー 毛髪のつや測定器具
EP1457840B1 (en) * 2003-03-14 2014-07-30 Ricoh Company, Ltd. Colour image forming apparatus, which controls the image density by evaluating a reflection signal and a diffuse reflection signal of an optical detecting unit
JP2005053016A (ja) * 2003-08-08 2005-03-03 Fuji Xerox Co Ltd プリンタ装置
JP2005277678A (ja) 2004-03-24 2005-10-06 Fuji Xerox Co Ltd 画像読取装置
JP4842536B2 (ja) 2004-11-15 2011-12-21 株式会社リコー 画像形成装置
JP4782405B2 (ja) 2004-11-15 2011-09-28 株式会社リコー 画像形成装置
US7763876B2 (en) 2007-04-06 2010-07-27 Xerox Corporation Gloss and differential gloss measuring system
JP5288235B2 (ja) 2007-09-11 2013-09-11 株式会社リコー 画像形成装置
US20090231551A1 (en) * 2008-03-11 2009-09-17 Robe Show Lighting S.R.O. Digital imaging system
JP2010066566A (ja) * 2008-09-11 2010-03-25 Fuji Xerox Co Ltd 検出装置及び画像形成装置
JP5585228B2 (ja) * 2010-06-15 2014-09-10 株式会社リコー 画像検査装置、画像検査方法、及び画像形成装置

Also Published As

Publication number Publication date
EP2397840A2 (en) 2011-12-21
EP2397840A3 (en) 2013-06-26
JP2012002601A (ja) 2012-01-05
US20110304862A1 (en) 2011-12-15
EP2397840B1 (en) 2016-08-17
US8587844B2 (en) 2013-11-19

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