JP5455866B2 - 異常診断装置および産業機械 - Google Patents

異常診断装置および産業機械 Download PDF

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Publication number
JP5455866B2
JP5455866B2 JP2010242180A JP2010242180A JP5455866B2 JP 5455866 B2 JP5455866 B2 JP 5455866B2 JP 2010242180 A JP2010242180 A JP 2010242180A JP 2010242180 A JP2010242180 A JP 2010242180A JP 5455866 B2 JP5455866 B2 JP 5455866B2
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diagnosis
result
diagnostic
time
series data
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JP2010242180A
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Japanese (ja)
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JP2012094044A (ja
JP2012094044A5 (enExample
Inventor
英明 鈴木
浩三 中村
晋也 湯田
宏樹 内山
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Hitachi Ltd
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Hitachi Ltd
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Priority to JP2010242180A priority Critical patent/JP5455866B2/ja
Priority to PCT/JP2011/074218 priority patent/WO2012057001A1/ja
Priority to US13/881,543 priority patent/US9678845B2/en
Priority to EP11836137.7A priority patent/EP2634660B1/en
Priority to CN201180052092.2A priority patent/CN103180793B/zh
Publication of JP2012094044A publication Critical patent/JP2012094044A/ja
Publication of JP2012094044A5 publication Critical patent/JP2012094044A5/ja
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/30—Monitoring
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0208—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/0227—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions
    • G05B23/0237—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions based on parallel systems, e.g. comparing signals produced at the same time by same type systems and detect faulty ones by noticing differences among their responses
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0267—Fault communication, e.g. human machine interface [HMI]
    • G05B23/0272—Presentation of monitored results, e.g. selection of status reports to be displayed; Filtering information to the user
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0221—Preprocessing measurements, e.g. data collection rate adjustment; Standardization of measurements; Time series or signal analysis, e.g. frequency analysis or wavelets; Trustworthiness of measurements; Indexes therefor; Measurements using easily measured parameters to estimate parameters difficult to measure; Virtual sensor creation; De-noising; Sensor fusion; Unconventional preprocessing inherently present in specific fault detection methods like PCA-based methods
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0264—Control of logging system, e.g. decision on which data to store; time-stamping measurements
    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07C—TIME OR ATTENDANCE REGISTERS; REGISTERING OR INDICATING THE WORKING OF MACHINES; GENERATING RANDOM NUMBERS; VOTING OR LOTTERY APPARATUS; ARRANGEMENTS, SYSTEMS OR APPARATUS FOR CHECKING NOT PROVIDED FOR ELSEWHERE
    • G07C3/00—Registering or indicating the condition or the working of machines or other apparatus, other than vehicles

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Theoretical Computer Science (AREA)
  • Human Computer Interaction (AREA)
  • Quality & Reliability (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing And Monitoring For Control Systems (AREA)
JP2010242180A 2010-10-28 2010-10-28 異常診断装置および産業機械 Active JP5455866B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2010242180A JP5455866B2 (ja) 2010-10-28 2010-10-28 異常診断装置および産業機械
PCT/JP2011/074218 WO2012057001A1 (ja) 2010-10-28 2011-10-20 異常診断装置および産業機械
US13/881,543 US9678845B2 (en) 2010-10-28 2011-10-20 Abnormality diagnostic system and industrial machinery
EP11836137.7A EP2634660B1 (en) 2010-10-28 2011-10-20 Anomaly diagnostic device and industrial machine
CN201180052092.2A CN103180793B (zh) 2010-10-28 2011-10-20 异常诊断装置以及工业机械

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010242180A JP5455866B2 (ja) 2010-10-28 2010-10-28 異常診断装置および産業機械

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2013056506A Division JP5485441B2 (ja) 2013-03-19 2013-03-19 異常診断装置および産業機械

Publications (3)

Publication Number Publication Date
JP2012094044A JP2012094044A (ja) 2012-05-17
JP2012094044A5 JP2012094044A5 (enExample) 2013-05-02
JP5455866B2 true JP5455866B2 (ja) 2014-03-26

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JP2010242180A Active JP5455866B2 (ja) 2010-10-28 2010-10-28 異常診断装置および産業機械

Country Status (5)

Country Link
US (1) US9678845B2 (enExample)
EP (1) EP2634660B1 (enExample)
JP (1) JP5455866B2 (enExample)
CN (1) CN103180793B (enExample)
WO (1) WO2012057001A1 (enExample)

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JP5988740B2 (ja) * 2012-07-13 2016-09-07 日立建機株式会社 稼働機械の保守管理装置
JP5836222B2 (ja) * 2012-08-14 2015-12-24 日立オートモティブシステムズ株式会社 車両制御装置および車両制御システム
JP5914382B2 (ja) * 2013-02-20 2016-05-11 日立建機株式会社 状態監視システム、状態監視装置、および端末装置
US20160169771A1 (en) * 2013-06-24 2016-06-16 Hitachi, Ltd. Condition Monitoring Apparatus
JP2015084176A (ja) * 2013-10-25 2015-04-30 日立建機株式会社 故障診断装置および稼働機械
EP2887236A1 (en) * 2013-12-23 2015-06-24 D square N.V. System and method for similarity search in process data
JP5863763B2 (ja) 2013-12-27 2016-02-17 三菱重工業株式会社 油圧機械の診断方法及び診断装置
WO2015132838A1 (ja) * 2014-03-03 2015-09-11 株式会社日立製作所 機械の材料疲労の表示方法、及びその装置
JP6445859B2 (ja) * 2014-12-16 2018-12-26 株式会社東芝 プラント監視装置
FR3041326B1 (fr) * 2015-09-18 2019-05-10 Safran Aircraft Engines Systeme et procede d'aide a la decision pour la maintenance d'une machine avec apprentissage d'un modele de decision supervise par avis d'experts
EP3508833B1 (en) * 2016-09-02 2024-07-17 Hitachi, Ltd. Diagnostic device, diagnostic method, and diagnostic program
US10430021B2 (en) * 2016-10-05 2019-10-01 Snap-On Incorporated System and method for providing an interactive vehicle diagnostic display
JP6842299B2 (ja) * 2016-12-28 2021-03-17 三菱パワー株式会社 診断装置、診断方法及びプログラム
JP6706693B2 (ja) * 2017-01-19 2020-06-10 株式会社日立製作所 保全管理システム及びそれに用いる保全管理確認装置
US11397655B2 (en) * 2017-02-24 2022-07-26 Hitachi, Ltd. Abnormality diagnosis system that reconfigures a diagnostic program based on an optimal diagnosis procedure found by comparing a plurality of diagnosis procedures
JP6829158B2 (ja) * 2017-07-18 2021-02-10 株式会社東芝 データ処理装置、データ処理方法、およびプログラム
CN110096036A (zh) * 2018-01-29 2019-08-06 阿里巴巴集团控股有限公司 一种设备状态的确定方法、装置及设备
JP7074489B2 (ja) * 2018-02-08 2022-05-24 株式会社Ｓｃｒｅｅｎホールディングス データ処理方法、データ処理装置、および、データ処理プログラム
JP7186518B2 (ja) * 2018-06-05 2022-12-09 株式会社東芝 異常診断装置、異常診断システムおよび異常診断方法
JP7461879B2 (ja) * 2018-07-10 2024-04-04 住友重機械工業株式会社 建設機械の表示方法及び建設機械の支援装置
US11093314B2 (en) * 2018-07-23 2021-08-17 Mitsubishi Electric Corporation Time-sequential data diagnosis device, additional learning method, and recording medium
DE102018121270B4 (de) 2018-08-31 2023-12-21 Volkswagen Aktiengesellschaft Diagnoseverfahren, Diagnosesystem und Kraftfahrzeug
CN111340250A (zh) * 2018-12-19 2020-06-26 富泰华工业（深圳）有限公司 设备检修装置、方法及计算机可读存储介质
DE102019219727A1 (de) 2018-12-26 2020-07-02 Presenso Ltd. System und Verfahren zum Detektieren von Anomalien in Sensordaten von industriellen Maschinen, die in einer vorbestimmten Umgebung angeordnet sind
WO2020136823A1 (ja) * 2018-12-27 2020-07-02 三菱電機株式会社 異常診断装置および異常診断方法
JP7357450B2 (ja) * 2019-02-28 2023-10-06 コマツ産機株式会社 学習データを収集するためのシステム、及び方法
CN112988501B (zh) * 2019-12-17 2023-02-03 深信服科技股份有限公司 一种告警信息生成方法、装置、电子设备及存储介质
KR102340395B1 (ko) * 2020-01-02 2021-12-15 두산중공업 주식회사 플랜트의 고장을 진단하기 위한 장치 및 이를 위한 방법
JP7489615B2 (ja) * 2020-09-29 2024-05-24 パナソニックＩｐマネジメント株式会社 診断システム、診断方法及びプログラム
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Also Published As

Publication number Publication date
CN103180793B (zh) 2016-01-20
JP2012094044A (ja) 2012-05-17
US20130218522A1 (en) 2013-08-22
WO2012057001A1 (ja) 2012-05-03
CN103180793A (zh) 2013-06-26
US9678845B2 (en) 2017-06-13
EP2634660B1 (en) 2017-12-27
EP2634660A4 (en) 2016-04-13
EP2634660A1 (en) 2013-09-04

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