JP5437680B2 - 半導体ウェーハの両面研削装置及び両面研削方法 - Google Patents
半導体ウェーハの両面研削装置及び両面研削方法 Download PDFInfo
- Publication number
- JP5437680B2 JP5437680B2 JP2009082708A JP2009082708A JP5437680B2 JP 5437680 B2 JP5437680 B2 JP 5437680B2 JP 2009082708 A JP2009082708 A JP 2009082708A JP 2009082708 A JP2009082708 A JP 2009082708A JP 5437680 B2 JP5437680 B2 JP 5437680B2
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor wafer
- grinding
- double
- contact position
- thickness
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 239000004065 semiconductor Substances 0.000 title claims description 64
- 238000000034 method Methods 0.000 title claims description 59
- 239000012530 fluid Substances 0.000 claims description 15
- 238000012544 monitoring process Methods 0.000 claims description 6
- 230000002706 hydrostatic effect Effects 0.000 claims 2
- 235000012431 wafers Nutrition 0.000 description 114
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 69
- 229910052710 silicon Inorganic materials 0.000 description 69
- 239000010703 silicon Substances 0.000 description 69
- 230000003068 static effect Effects 0.000 description 11
- 230000002093 peripheral effect Effects 0.000 description 8
- 230000005484 gravity Effects 0.000 description 2
- 230000007547 defect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000009191 jumping Effects 0.000 description 1
- 238000006748 scratching Methods 0.000 description 1
- 230000002393 scratching effect Effects 0.000 description 1
- 239000004575 stone Substances 0.000 description 1
Images
Landscapes
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
- Grinding Of Cylindrical And Plane Surfaces (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009082708A JP5437680B2 (ja) | 2009-03-30 | 2009-03-30 | 半導体ウェーハの両面研削装置及び両面研削方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009082708A JP5437680B2 (ja) | 2009-03-30 | 2009-03-30 | 半導体ウェーハの両面研削装置及び両面研削方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2010238765A JP2010238765A (ja) | 2010-10-21 |
| JP2010238765A5 JP2010238765A5 (enExample) | 2012-04-12 |
| JP5437680B2 true JP5437680B2 (ja) | 2014-03-12 |
Family
ID=43092860
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009082708A Active JP5437680B2 (ja) | 2009-03-30 | 2009-03-30 | 半導体ウェーハの両面研削装置及び両面研削方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP5437680B2 (enExample) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6250435B2 (ja) * | 2014-02-26 | 2017-12-20 | 光洋機械工業株式会社 | 両頭平面研削法 |
| CN110744378B (zh) * | 2019-11-14 | 2024-10-11 | 江苏万源新材料股份有限公司 | 一种裤三通自动成型设备 |
| CN110842762A (zh) * | 2019-11-19 | 2020-02-28 | 天津中环领先材料技术有限公司 | 一种大尺寸硅圆片减薄装置及其减薄工艺 |
| CN110860998B (zh) * | 2019-12-09 | 2025-05-27 | 中环领先(徐州)半导体材料有限公司 | 双面减薄的装置和方法 |
| CN114770366B (zh) * | 2022-05-17 | 2023-11-17 | 西安奕斯伟材料科技股份有限公司 | 一种硅片双面研磨装置的静压板及硅片双面研磨装置 |
| CN115070604B (zh) * | 2022-06-09 | 2023-09-29 | 西安奕斯伟材料科技股份有限公司 | 双面研磨装置和双面研磨方法 |
| CN115383616B (zh) * | 2022-09-22 | 2024-05-31 | 西安奕斯伟材料科技股份有限公司 | 研磨装置、研磨方法及硅片 |
| CN119188470A (zh) * | 2024-11-18 | 2024-12-27 | 西安奕斯伟材料科技股份有限公司 | 硅片平坦度调整系统 |
| CN120715743A (zh) * | 2025-04-18 | 2025-09-30 | 浙江求是半导体设备有限公司 | 一种晶圆双面减薄方法和系统 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002346923A (ja) * | 2001-05-29 | 2002-12-04 | Sumitomo Heavy Ind Ltd | 加工装置 |
| JP2002346924A (ja) * | 2001-05-29 | 2002-12-04 | Sumitomo Heavy Ind Ltd | ワークホルダ |
-
2009
- 2009-03-30 JP JP2009082708A patent/JP5437680B2/ja active Active
Also Published As
| Publication number | Publication date |
|---|---|
| JP2010238765A (ja) | 2010-10-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP5437680B2 (ja) | 半導体ウェーハの両面研削装置及び両面研削方法 | |
| EP2762272B1 (en) | Wafer polishing apparatus and method | |
| US11858092B2 (en) | Substrate processing system, substrate processing method and computer-readable recording medium | |
| KR102507675B1 (ko) | 웨이퍼의 가공 방법 | |
| JP6937370B2 (ja) | 研削装置、研削方法及びコンピュータ記憶媒体 | |
| JP2008198906A (ja) | シリコンウェーハの製造方法 | |
| TW201710027A (zh) | 工件的加工裝置 | |
| TWI532091B (zh) | Double-sided grinding method | |
| JP2014030884A (ja) | 研削装置 | |
| JP2013004726A (ja) | 板状物の加工方法 | |
| JP5964637B2 (ja) | 研削装置 | |
| JP5356837B2 (ja) | 研磨パッドの処理方法 | |
| JP2010137349A (ja) | ウェーハ用チャックテーブルおよびウェーハ処理装置 | |
| JP2013202704A (ja) | 研削装置及び研削方法 | |
| JP5943766B2 (ja) | 研削装置 | |
| JP2011143516A (ja) | 加工装置 | |
| KR20190088414A (ko) | 캐리어의 제조방법 및 웨이퍼의 양면 연마방법 | |
| KR101719530B1 (ko) | 웨이퍼 에지 폴리싱 장치 및 방법 | |
| JP6456708B2 (ja) | 研削装置 | |
| KR102886858B1 (ko) | 피가공물의 연삭 방법 | |
| JP2008068338A (ja) | 研磨装置、研磨方法、および半導体装置の製造方法 | |
| JP2016025260A (ja) | ウエーハの研削方法 | |
| JP2006237098A (ja) | 半導体ウェーハの両面研磨装置及び両面研磨方法 | |
| CN103753379A (zh) | 研磨速率侦察装置、研磨设备及实时侦察研磨速率的方法 | |
| JP2024068111A (ja) | 加工装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20120227 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20120227 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20130605 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20130618 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20130807 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20131203 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20131212 |
|
| R150 | Certificate of patent or registration of utility model |
Ref document number: 5437680 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |