JP5425005B2 - 圧電部品及びその製造方法 - Google Patents
圧電部品及びその製造方法 Download PDFInfo
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- JP5425005B2 JP5425005B2 JP2010154423A JP2010154423A JP5425005B2 JP 5425005 B2 JP5425005 B2 JP 5425005B2 JP 2010154423 A JP2010154423 A JP 2010154423A JP 2010154423 A JP2010154423 A JP 2010154423A JP 5425005 B2 JP5425005 B2 JP 5425005B2
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- 229920005989 resin Polymers 0.000 claims description 82
- 239000011347 resin Substances 0.000 claims description 82
- 239000000758 substrate Substances 0.000 claims description 53
- 238000010897 surface acoustic wave method Methods 0.000 claims description 40
- 239000000945 filler Substances 0.000 claims description 30
- 239000000463 material Substances 0.000 claims description 23
- 239000002245 particle Substances 0.000 claims description 15
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- 239000010445 mica Substances 0.000 claims description 14
- 229910052618 mica group Inorganic materials 0.000 claims description 14
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 14
- 229910010272 inorganic material Inorganic materials 0.000 claims description 13
- 239000011147 inorganic material Substances 0.000 claims description 13
- 229910052737 gold Inorganic materials 0.000 claims description 8
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- 229910052759 nickel Inorganic materials 0.000 claims description 6
- 239000011368 organic material Substances 0.000 claims description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 4
- 244000126211 Hericium coralloides Species 0.000 claims description 3
- 229910013641 LiNbO 3 Inorganic materials 0.000 claims description 3
- 229910052782 aluminium Inorganic materials 0.000 claims description 3
- 229910052804 chromium Inorganic materials 0.000 claims description 3
- 229910052802 copper Inorganic materials 0.000 claims description 3
- 229910045601 alloy Inorganic materials 0.000 claims description 2
- 239000000956 alloy Substances 0.000 claims description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 2
- 150000001875 compounds Chemical class 0.000 claims description 2
- 229910052738 indium Inorganic materials 0.000 claims description 2
- 229910000765 intermetallic Inorganic materials 0.000 claims description 2
- 238000000034 method Methods 0.000 claims description 2
- 229910052750 molybdenum Inorganic materials 0.000 claims description 2
- 229910052757 nitrogen Inorganic materials 0.000 claims description 2
- 239000001301 oxygen Substances 0.000 claims description 2
- 229910052760 oxygen Inorganic materials 0.000 claims description 2
- 229910052707 ruthenium Inorganic materials 0.000 claims description 2
- 239000010703 silicon Substances 0.000 claims description 2
- 229910052710 silicon Inorganic materials 0.000 claims description 2
- 229910052709 silver Inorganic materials 0.000 claims description 2
- 229910052719 titanium Inorganic materials 0.000 claims description 2
- 229910052721 tungsten Inorganic materials 0.000 claims description 2
- 229910052720 vanadium Inorganic materials 0.000 claims description 2
- 239000010453 quartz Substances 0.000 claims 1
- 239000010408 film Substances 0.000 description 54
- 229910004298 SiO 2 Inorganic materials 0.000 description 16
- 238000007789 sealing Methods 0.000 description 13
- 229910000679 solder Inorganic materials 0.000 description 12
- 238000000206 photolithography Methods 0.000 description 9
- 239000010931 gold Substances 0.000 description 8
- 235000012431 wafers Nutrition 0.000 description 7
- 239000000377 silicon dioxide Substances 0.000 description 6
- 230000000694 effects Effects 0.000 description 4
- 238000007747 plating Methods 0.000 description 4
- 238000007772 electroless plating Methods 0.000 description 3
- 230000009477 glass transition Effects 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 230000001413 cellular effect Effects 0.000 description 2
- 238000001312 dry etching Methods 0.000 description 2
- 239000003822 epoxy resin Substances 0.000 description 2
- 238000000465 moulding Methods 0.000 description 2
- 229920000647 polyepoxide Polymers 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- 238000001721 transfer moulding Methods 0.000 description 2
- 238000007740 vapor deposition Methods 0.000 description 2
- 239000011800 void material Substances 0.000 description 2
- CFAKWWQIUFSQFU-UHFFFAOYSA-N 2-hydroxy-3-methylcyclopent-2-en-1-one Chemical compound CC1=C(O)C(=O)CC1 CFAKWWQIUFSQFU-UHFFFAOYSA-N 0.000 description 1
- WSMQKESQZFQMFW-UHFFFAOYSA-N 5-methyl-pyrazole-3-carboxylic acid Chemical compound CC1=CC(C(O)=O)=NN1 WSMQKESQZFQMFW-UHFFFAOYSA-N 0.000 description 1
- 229920000049 Carbon (fiber) Polymers 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000004917 carbon fiber Substances 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 230000003631 expected effect Effects 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000005304 joining Methods 0.000 description 1
- GQYHUHYESMUTHG-UHFFFAOYSA-N lithium niobate Chemical compound [Li+].[O-][Nb](=O)=O GQYHUHYESMUTHG-UHFFFAOYSA-N 0.000 description 1
- 229910052749 magnesium Inorganic materials 0.000 description 1
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 1
- 238000010295 mobile communication Methods 0.000 description 1
- PXHVJJICTQNCMI-UHFFFAOYSA-N nickel Substances [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- KDLHZDBZIXYQEI-UHFFFAOYSA-N palladium Substances [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/05—Holders; Supports
- H03H9/10—Mounting in enclosures
- H03H9/1064—Mounting in enclosures for surface acoustic wave [SAW] devices
- H03H9/1092—Mounting in enclosures for surface acoustic wave [SAW] devices the enclosure being defined by a cover cap mounted on an element forming part of the surface acoustic wave [SAW] device on the side of the IDT's
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H3/00—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
- H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
- H03H3/08—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of resonators or networks using surface acoustic waves
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/42—Piezoelectric device making
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- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
- Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
Description
図1は、本発明の圧電部品の実施例であるSAWデバイスを示す。
次に、本発明の圧電部品の製造方法を、その実施例であるSAWデバイスの製造方法について、図2に基づいて説明する。
2 圧電基板(ウェハ)
3 櫛歯電極(IDT電極)
4 外囲壁部
5 天井部
6 電極柱
7 端子電極
8 絶縁層
9 再配線層
10 半田ボール電極
C 中空部
Claims (10)
- 圧電基板と、該圧電基板の主面に形成された櫛歯電極と、該櫛歯電極に隣接して配設された素子配線部を有する配線電極とからなる圧電素子と、前記素子配線部の上面に形成された絶縁層と、該絶縁層の上面に形成された再配線層と、該再配線層の上面から、前記櫛歯電極を除き、前記再配線層の全面を覆う無機材料からなる保護膜層と、
該保護膜層上に感光性樹脂フィルムを積層して形成した外囲壁部と、該外囲壁部の開口先端部に前記感光性樹脂フィルムを積層して形成した天井部と、前記外囲壁部及び該天井部を貫通して形成した電極柱と、からなり、
ここで、前記感光性樹脂フィルムが、平均粒径が1.0nm以下の無機材料からなるナノフィラーを添加し、かつ、弾性率が3.0GPa以上である感光性樹脂からなることを、特徴とする圧電部品。 - 前記天井部を構成する前記感光性樹脂フィルムに、前記ナノフィラーに加えて、マイカフィラーを添加したことを特徴とする請求項1に記載の圧電部品。
- 前記天井部を前記ナノフィラーに加えて、前記マイカフィラーを10重量%〜45重量%添加した感光性樹脂フィルムにより形成したことを特徴とする請求項2に記載の圧電部品。
- 前記ナノフィラーの添加量が、1%〜30%(重量%)であることを特徴とする請求項1から3のいずれか一項に記載の圧電部品。
- 前記素子配線部の上面に形成された前記絶縁層が、前記素子配線部の上面に形成された有機材料からなる絶縁膜と、さらに、該絶縁膜の上面に形成された厚さが200オングストローム以上の無機材料と、からなる絶縁膜からなることを特徴とする請求項1から4のいずれか一項に記載の圧電部品。
- 前記圧電素子が、弾性表面波素子、であることを特徴とする請求項1から5のいずれか一項に記載の圧電部品。
- 前記素子配線部が、Al、Cu、Au、Cr、Ru、Ni、Ti、W、V、Ta、Mg、Mo、Ag、In、Suのうちのいずれから主成分とする材料からなり、また、これらの材料と酸素、窒素、けい素の化合物、またはこれらの材料の合金、または、金属間化合物あるいはこれらを多層に積層した配線から構成されていることを特徴とする請求項1から6のいずれか一項に記載の圧電部品。
- 前記圧電基板が、LiTaO3、LiNbO3、水晶の圧電性基板、または基板上に形成した圧電機能を有する基板から形成されることを特徴とする請求項1から7のいずれか一項に記載の圧電部品
- 集合圧電基板と、該集合圧電基板の主面に形成された圧電素子と、前記集合圧電基板に形成された配線部と、該配線部に接続され前記集合圧電基板に形成された貫通電極と、前記圧電素子の上面を囲むように設けた中空部とからなる圧電部品の製造方法において、
前記集合圧電基板の主面に形成された前記圧電素子を囲む外囲壁部を、感光性樹脂フィルムを前記集合圧電基板の主面に積層して形成する工程と、
前記外囲壁部の上面に感光性樹脂フィルムを積層して天井部を形成する工程と、
からなり、前記外囲壁部と前記天井部を形成する前記感光性樹脂フィルムに、平均粒径が1.0nm以下の無機材料からなるナノフィラーを含み、かつ、弾性率が3.0GPa以上の感光性樹脂を用いたことを特徴とする圧電部品の製造方法。 - 前記貫通電極が、電解メッキにより前記外囲壁部と前記天井部を貫いて形成されることを特徴とする請求項9に記載の圧電部品の製造方法。
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010154423A JP5425005B2 (ja) | 2009-08-19 | 2010-07-07 | 圧電部品及びその製造方法 |
TW099126453A TWI515933B (zh) | 2009-08-19 | 2010-08-09 | 壓電零件及其製造方法 |
KR1020100077774A KR101695495B1 (ko) | 2009-08-19 | 2010-08-12 | 압전 부품 및 그 제조 방법 |
US12/806,475 US8471441B2 (en) | 2009-08-19 | 2010-08-13 | Piezoelectric component and manufacturing method thereof |
CN201010255655.5A CN101997511B (zh) | 2009-08-19 | 2010-08-16 | 压电部件及其制造方法 |
EP20100251461 EP2290816A3 (en) | 2009-08-19 | 2010-08-19 | Piezoelectric component and manufacturing method thereof |
Applications Claiming Priority (5)
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JP2009190010 | 2009-08-19 | ||
JP2009190010 | 2009-08-19 | ||
JP2009285880 | 2009-12-17 | ||
JP2009285880 | 2009-12-17 | ||
JP2010154423A JP5425005B2 (ja) | 2009-08-19 | 2010-07-07 | 圧電部品及びその製造方法 |
Publications (2)
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JP2011147098A JP2011147098A (ja) | 2011-07-28 |
JP5425005B2 true JP5425005B2 (ja) | 2014-02-26 |
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US (1) | US8471441B2 (ja) |
EP (1) | EP2290816A3 (ja) |
JP (1) | JP5425005B2 (ja) |
KR (1) | KR101695495B1 (ja) |
CN (1) | CN101997511B (ja) |
TW (1) | TWI515933B (ja) |
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JP5424973B2 (ja) * | 2009-05-26 | 2014-02-26 | 日本電波工業株式会社 | 圧電部品及びその製造方法 |
JP2012151698A (ja) * | 2011-01-19 | 2012-08-09 | Taiyo Yuden Co Ltd | 弾性波デバイス |
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-
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- 2010-08-09 TW TW099126453A patent/TWI515933B/zh active
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- 2010-08-13 US US12/806,475 patent/US8471441B2/en active Active
- 2010-08-16 CN CN201010255655.5A patent/CN101997511B/zh active Active
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CN101997511A (zh) | 2011-03-30 |
KR20110019332A (ko) | 2011-02-25 |
EP2290816A3 (en) | 2014-08-06 |
US8471441B2 (en) | 2013-06-25 |
CN101997511B (zh) | 2015-04-22 |
JP2011147098A (ja) | 2011-07-28 |
TW201117442A (en) | 2011-05-16 |
US20110043078A1 (en) | 2011-02-24 |
EP2290816A2 (en) | 2011-03-02 |
KR101695495B1 (ko) | 2017-01-11 |
TWI515933B (zh) | 2016-01-01 |
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