JP5357531B2 - 情報取得装置及び情報取得方法 - Google Patents

情報取得装置及び情報取得方法 Download PDF

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Publication number
JP5357531B2
JP5357531B2 JP2008324791A JP2008324791A JP5357531B2 JP 5357531 B2 JP5357531 B2 JP 5357531B2 JP 2008324791 A JP2008324791 A JP 2008324791A JP 2008324791 A JP2008324791 A JP 2008324791A JP 5357531 B2 JP5357531 B2 JP 5357531B2
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JP
Japan
Prior art keywords
optical path
path length
unit
terahertz pulse
light
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Expired - Fee Related
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JP2008324791A
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English (en)
Japanese (ja)
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JP2009210560A5 (enExample
JP2009210560A (ja
Inventor
康介 加治木
敏彦 尾内
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Canon Inc
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Canon Inc
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Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2008324791A priority Critical patent/JP5357531B2/ja
Priority to US12/364,422 priority patent/US8514399B2/en
Publication of JP2009210560A publication Critical patent/JP2009210560A/ja
Publication of JP2009210560A5 publication Critical patent/JP2009210560A5/ja
Application granted granted Critical
Publication of JP5357531B2 publication Critical patent/JP5357531B2/ja
Expired - Fee Related legal-status Critical Current
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G01N21/3586—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation by Terahertz time domain spectroscopy [THz-TDS]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/85—Investigating moving fluids or granular solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2008324791A 2008-02-05 2008-12-19 情報取得装置及び情報取得方法 Expired - Fee Related JP5357531B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2008324791A JP5357531B2 (ja) 2008-02-05 2008-12-19 情報取得装置及び情報取得方法
US12/364,422 US8514399B2 (en) 2008-02-05 2009-02-02 Compensation in terahertz time domain spectroscopy having two delays

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2008024631 2008-02-05
JP2008024631 2008-02-05
JP2008324791A JP5357531B2 (ja) 2008-02-05 2008-12-19 情報取得装置及び情報取得方法

Publications (3)

Publication Number Publication Date
JP2009210560A JP2009210560A (ja) 2009-09-17
JP2009210560A5 JP2009210560A5 (enExample) 2012-03-01
JP5357531B2 true JP5357531B2 (ja) 2013-12-04

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Family Applications (1)

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JP2008324791A Expired - Fee Related JP5357531B2 (ja) 2008-02-05 2008-12-19 情報取得装置及び情報取得方法

Country Status (2)

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US (1) US8514399B2 (enExample)
JP (1) JP5357531B2 (enExample)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4963640B2 (ja) * 2006-10-10 2012-06-27 キヤノン株式会社 物体情報取得装置及び方法
JP4807707B2 (ja) * 2007-11-30 2011-11-02 キヤノン株式会社 波形情報取得装置
JP4834718B2 (ja) * 2008-01-29 2011-12-14 キヤノン株式会社 パルスレーザ装置、テラヘルツ発生装置、テラヘルツ計測装置及びテラヘルツトモグラフィー装置
JP5665305B2 (ja) * 2008-12-25 2015-02-04 キヤノン株式会社 分析装置
JP5612842B2 (ja) 2009-09-07 2014-10-22 キヤノン株式会社 発振器
JP2011153856A (ja) * 2010-01-26 2011-08-11 Toshiba Corp テラヘルツ波を用いた粒径測定装置及び粒径測定方法
DE102010010285B4 (de) * 2010-03-04 2012-03-22 Technische Universität Carolo-Wilhelmina Zu Braunschweig Probenuntersuchung mittels Terahertz-Spektroskopie
JP5455721B2 (ja) 2010-03-12 2014-03-26 キヤノン株式会社 テラヘルツ波測定装置及び測定方法
WO2012091916A1 (en) * 2010-12-30 2012-07-05 Abbott Laboratories Spoilage detection using electromagnetic signal and mathematical modeling
JP5762214B2 (ja) * 2011-08-19 2015-08-12 株式会社Ｓｃｒｅｅｎホールディングス 電磁波パルス測定装置
CN102331403B (zh) * 2011-09-02 2013-01-09 东南大学 近场太赫兹THz时域光谱表征方法及其测试装置
TW201343130A (zh) * 2012-04-25 2013-11-01 Univ Nat Taiwan 用電磁波偵測血糖含量的方法與裝置
US9830523B2 (en) * 2012-05-31 2017-11-28 Korea Institute Of Science And Technology Method and apparatus for recognizing object material using spatial image and spatial radar information
KR101912671B1 (ko) * 2012-09-24 2018-10-29 가부시키가이샤 아드반테스트 광 측정 장치, 방법, 프로그램, 기록 매체
JP2014112078A (ja) * 2012-11-04 2014-06-19 Canon Inc 被検体情報取得装置及び方法
JP6502698B2 (ja) * 2015-02-19 2019-04-17 株式会社Ｓｃｒｅｅｎホールディングス 測定装置および測定方法
JP7130902B2 (ja) * 2017-11-28 2022-09-06 国立大学法人 筑波大学 ボゾンピークの測定値に基づいて、物質の結晶化度及び／又は密度を測定する方法及び測定装置
DE102019109340A1 (de) 2019-04-09 2020-10-15 CiTEX Holding GmbH THz-Messverfahren und THz-Messvorrichtung zum Erfassen eines Materiestroms
CN113074813B (zh) * 2021-03-30 2022-07-15 青岛青源峰达太赫兹科技有限公司 一种太赫兹时域光谱系统及其步长自适应调整方法
CN117848991B (zh) * 2023-11-13 2025-03-07 长春理工大学中山研究院 一种基于等效时间采样技术的太赫兹长距离探测方法
CN117706216B (zh) * 2024-02-06 2024-04-12 广东大湾区空天信息研究院 基于扫描隧道显微镜的太赫兹近场波形采样方法、装置、存储介质及计算机设备

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4237363B2 (ja) * 1999-11-10 2009-03-11 日本分光株式会社 赤外分光装置
GB2402471B (en) 2003-06-02 2006-01-18 Teraview Ltd An analysis method and apparatus
KR100787988B1 (ko) 2003-06-25 2007-12-24 캐논 가부시끼가이샤 고주파 전기 신호 제어 장치 및 센싱 시스템
JP2005069840A (ja) * 2003-08-22 2005-03-17 Japan Science & Technology Agency 時系列変換パルス分光計測装置の時系列信号取得のための光路差補償機構
GB2405466B (en) * 2003-08-27 2006-01-25 Teraview Ltd Method and apparatus for investigating a non-planner sample
JP4546326B2 (ja) 2004-07-30 2010-09-15 キヤノン株式会社 センシング装置
JP2006275910A (ja) 2005-03-30 2006-10-12 Canon Inc 位置センシング装置及び位置センシング方法
JP4769490B2 (ja) * 2005-05-27 2011-09-07 キヤノン株式会社 光路長制御装置
JP4402026B2 (ja) 2005-08-30 2010-01-20 キヤノン株式会社 センシング装置
JP4773839B2 (ja) 2006-02-15 2011-09-14 キヤノン株式会社 対象物の情報を検出する検出装置
JP5132146B2 (ja) 2006-03-17 2013-01-30 キヤノン株式会社 分析方法、分析装置、及び検体保持部材
JP4709059B2 (ja) 2006-04-28 2011-06-22 キヤノン株式会社 検査装置及び検査方法
US7781737B2 (en) * 2006-12-20 2010-08-24 Schlumberger Technology Corporation Apparatus and methods for oil-water-gas analysis using terahertz radiation
JP5144175B2 (ja) 2007-08-31 2013-02-13 キヤノン株式会社 電磁波を用いる検査装置及び検査方法
EP2031374B1 (en) * 2007-08-31 2012-10-10 Canon Kabushiki Kaisha Apparatus and method for obtaining information related to terahertz waves
JP4834718B2 (ja) 2008-01-29 2011-12-14 キヤノン株式会社 パルスレーザ装置、テラヘルツ発生装置、テラヘルツ計測装置及びテラヘルツトモグラフィー装置
JP5284184B2 (ja) * 2009-06-05 2013-09-11 キヤノン株式会社 テラヘルツ波の時間波形を取得するための装置及び方法

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Publication number Publication date
US20090198466A1 (en) 2009-08-06
US8514399B2 (en) 2013-08-20
JP2009210560A (ja) 2009-09-17

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