JP5354938B2 - 蛍光顕微鏡装置 - Google Patents

蛍光顕微鏡装置 Download PDF

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Publication number
JP5354938B2
JP5354938B2 JP2008069246A JP2008069246A JP5354938B2 JP 5354938 B2 JP5354938 B2 JP 5354938B2 JP 2008069246 A JP2008069246 A JP 2008069246A JP 2008069246 A JP2008069246 A JP 2008069246A JP 5354938 B2 JP5354938 B2 JP 5354938B2
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Japan
Prior art keywords
optical system
fluorescence
light
sample
scanning
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Expired - Fee Related
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JP2008069246A
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English (en)
Japanese (ja)
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JP2008276191A (ja
JP2008276191A5 (enExample
Inventor
伸二 本村
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Olympus Corp
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Olympus Corp
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Priority to US12/111,659 priority Critical patent/US7902523B2/en
Priority to EP08008298A priority patent/EP2037309A3/en
Publication of JP2008276191A publication Critical patent/JP2008276191A/ja
Publication of JP2008276191A5 publication Critical patent/JP2008276191A5/ja
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/645Specially adapted constructive features of fluorimeters
    • G01N21/6456Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458Fluorescence microscopy
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052Optical details of the image generation
    • G02B21/0076Optical details of the image generation arrangements using fluorescence or luminescence
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/16Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/36Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365Control or image processing arrangements for digital or video microscopes
    • G02B21/367Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N2021/6417Spectrofluorimetric devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N2021/6417Spectrofluorimetric devices
    • G01N2021/6423Spectral mapping, video display

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Multimedia (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP2008069246A 2007-05-02 2008-03-18 蛍光顕微鏡装置 Expired - Fee Related JP5354938B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
US12/111,659 US7902523B2 (en) 2007-05-02 2008-04-29 Fluorescence microscope apparatus
EP08008298A EP2037309A3 (en) 2007-05-02 2008-04-30 Fluorescence microscope apparatus

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US92723707P 2007-05-02 2007-05-02
US60/927,237 2007-05-02

Publications (3)

Publication Number Publication Date
JP2008276191A JP2008276191A (ja) 2008-11-13
JP2008276191A5 JP2008276191A5 (enExample) 2011-03-24
JP5354938B2 true JP5354938B2 (ja) 2013-11-27

Family

ID=40054165

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008069246A Expired - Fee Related JP5354938B2 (ja) 2007-05-02 2008-03-18 蛍光顕微鏡装置

Country Status (3)

Country Link
US (1) US7902523B2 (enExample)
EP (1) EP2037309A3 (enExample)
JP (1) JP5354938B2 (enExample)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010085548A2 (en) * 2009-01-22 2010-07-29 Li-Cor, Inc. Single molecule proteomics with dynamic probes
JP5325620B2 (ja) * 2009-03-18 2013-10-23 オリンパス株式会社 画像解析装置、画像解析方法及びプログラム
JP5208824B2 (ja) * 2009-03-18 2013-06-12 オリンパス株式会社 画像取得装置、画像取得方法及びプログラム
JP5468805B2 (ja) * 2009-03-31 2014-04-09 オリンパス株式会社 画像解析方法および画像解析装置
JP5489541B2 (ja) * 2009-06-05 2014-05-14 オリンパス株式会社 画像解析方法および画像解析装置
DE102009037366A1 (de) * 2009-08-13 2011-02-17 Carl Zeiss Microlmaging Gmbh Mikroskop, insbesondere zur Messung von Totalreflexions-Fluoreszenz, und Betriebsverfahren für ein solches
JP5508809B2 (ja) * 2009-10-15 2014-06-04 オリンパス株式会社 画像解析方法および画像解析装置
JP5508808B2 (ja) * 2009-10-15 2014-06-04 オリンパス株式会社 画像解析方法および画像解析装置
JP5452180B2 (ja) * 2009-11-13 2014-03-26 オリンパス株式会社 顕微鏡装置
JP5555061B2 (ja) * 2010-06-09 2014-07-23 オリンパス株式会社 観察装置および観察方法
JP2012008055A (ja) * 2010-06-25 2012-01-12 Olympus Corp 画像解析方法および画像解析装置
JP5673679B2 (ja) * 2010-07-01 2015-02-18 株式会社ニコン 顕微鏡
CN103189737B (zh) * 2010-10-29 2017-05-31 奥林巴斯株式会社 图像分析方法以及图像分析装置
US9494783B2 (en) 2010-11-30 2016-11-15 Etaluma Inc. Compact, high-resolution fluorescence and brightfield microscope and methods of use
DE102011000090B4 (de) 2011-01-11 2016-03-24 Leica Microsystems Cms Gmbh Verfahren und Einrichtung zur rastermikroskopischen Abbildung eines Objektes
US9110282B2 (en) * 2011-03-30 2015-08-18 The Regents Of The University Of California Nanometer-scale optical imaging by the modulation tracking (MT) method
WO2013063316A1 (en) 2011-10-25 2013-05-02 Daylight Solutions, Inc. Infrared imaging microscope
JP5856814B2 (ja) * 2011-11-10 2016-02-10 オリンパス株式会社 画像解析方法および画像解析装置
JP5926966B2 (ja) * 2012-01-30 2016-05-25 オリンパス株式会社 蛍光観察装置
JP2013195127A (ja) * 2012-03-16 2013-09-30 Olympus Corp 生物試料の画像解析装置、画像解析方法、およびプログラム
JP6525161B2 (ja) 2013-04-12 2019-06-05 デイライト ソリューションズ、インコーポレイテッド 赤外光用屈折対物レンズ・アセンブリ
JP5784790B2 (ja) * 2014-04-28 2015-09-24 オリンパス株式会社 蛍光観察装置
JP6363890B2 (ja) 2014-07-04 2018-07-25 オリンパス株式会社 走査型顕微鏡装置および超解像画像の生成方法
TWI507674B (zh) * 2014-07-09 2015-11-11 Univ Nat Taiwan 以螢光物質檢測器官代謝功能之系統及方法
EP3418710B1 (en) * 2016-02-19 2022-08-24 Nikon Corporation Sample preparation method and sample preparation device
DE102016103382B3 (de) * 2016-02-25 2017-08-10 Abberior Instruments Gmbh Verfahren, Vorrichtung und Laser-Scanning-Mikroskop zum Erzeugen von gerasterten Bildern
WO2020139835A1 (en) * 2018-12-26 2020-07-02 The Regents Of The University Of California Systems and methods for two-dimensional fluorescence wave propagation onto surfaces using deep learning
EP4057047A1 (en) * 2021-03-09 2022-09-14 Leica Instruments (Singapore) Pte. Ltd. Microscope system and corresponding system, method and computer program

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5117466A (en) * 1991-04-30 1992-05-26 The United States Of America As Represented By The United States Department Of Energy Integrated fluorescence analysis system
JP3917731B2 (ja) * 1996-11-21 2007-05-23 オリンパス株式会社 レーザ走査顕微鏡
JP3861396B2 (ja) * 1997-08-01 2006-12-20 株式会社ニコン 顕微鏡用画像取得装置
JP4406108B2 (ja) * 1998-03-11 2010-01-27 オリンパス株式会社 多光子励起レーザ顕微鏡
JP2001194303A (ja) * 2000-01-13 2001-07-19 Bunshi Biophotonics Kenkyusho:Kk 蛍光分子拡散運動解析装置
US6690463B2 (en) * 2000-02-10 2004-02-10 Evotec Biosystems Ag Fluorescence intensity and lifetime distribution analysis
WO2002048693A1 (fr) * 2000-12-14 2002-06-20 Olympus Optical Co., Ltd. Analyseur fluorometrique et analyse fluorometrique
JP4136440B2 (ja) * 2002-04-26 2008-08-20 オリンパス株式会社 顕微鏡装置
JP4377811B2 (ja) * 2002-06-21 2009-12-02 オリンパス株式会社 生体分子解析装置および生体分子解析方法
US7136161B2 (en) * 2003-08-01 2006-11-14 Shimadzu Corporation Component analyzing apparatus with microchip
JP2005083980A (ja) * 2003-09-10 2005-03-31 Olympus Corp 共焦点光学顕微鏡およびそれを用いた分析方法
JP4756819B2 (ja) * 2003-10-21 2011-08-24 オリンパス株式会社 走査型顕微鏡システム
JP4468684B2 (ja) * 2003-12-05 2010-05-26 オリンパス株式会社 走査型共焦点顕微鏡装置
JP4224640B2 (ja) * 2004-03-29 2009-02-18 オリンパス株式会社 蛍光分光分析装置
DE102004032952A1 (de) * 2004-07-07 2006-01-26 Leica Microsystems Cms Gmbh Rastermikroskop und Verfahren zur Untersuchung von biologischen Proben mit einem Rastermikroskop
DE102004034963A1 (de) * 2004-07-16 2006-02-16 Carl Zeiss Jena Gmbh Verfahren zur bildlichen Erfassung von Objekten mittels eines Lichtrastermikroskopes
US7330255B2 (en) * 2004-12-09 2008-02-12 University Of Chicago Total internal reflection fluorescence apparatus
JP5132052B2 (ja) * 2005-11-30 2013-01-30 オリンパス株式会社 走査型レーザ顕微鏡の条件設定装置及び走査型レーザ顕微鏡システム

Also Published As

Publication number Publication date
EP2037309A2 (en) 2009-03-18
JP2008276191A (ja) 2008-11-13
US20080290293A1 (en) 2008-11-27
EP2037309A3 (en) 2010-01-13
US7902523B2 (en) 2011-03-08

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