JP5345598B2 - 検査治具及び接触子 - Google Patents

検査治具及び接触子 Download PDF

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Publication number
JP5345598B2
JP5345598B2 JP2010229524A JP2010229524A JP5345598B2 JP 5345598 B2 JP5345598 B2 JP 5345598B2 JP 2010229524 A JP2010229524 A JP 2010229524A JP 2010229524 A JP2010229524 A JP 2010229524A JP 5345598 B2 JP5345598 B2 JP 5345598B2
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JP
Japan
Prior art keywords
contact
coil spring
diameter
electrode
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
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JP2010229524A
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English (en)
Japanese (ja)
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JP2012073213A (ja
JP2012073213A5 (enrdf_load_stackoverflow
Inventor
秀雄 西川
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Individual
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Individual
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Priority to JP2010229524A priority Critical patent/JP5345598B2/ja
Priority to CN2011800368770A priority patent/CN103026242A/zh
Priority to PCT/JP2011/065930 priority patent/WO2012014673A1/ja
Publication of JP2012073213A publication Critical patent/JP2012073213A/ja
Publication of JP2012073213A5 publication Critical patent/JP2012073213A5/ja
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Publication of JP5345598B2 publication Critical patent/JP5345598B2/ja
Expired - Fee Related legal-status Critical Current
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  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2010229524A 2010-07-29 2010-10-12 検査治具及び接触子 Expired - Fee Related JP5345598B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2010229524A JP5345598B2 (ja) 2010-09-01 2010-10-12 検査治具及び接触子
CN2011800368770A CN103026242A (zh) 2010-07-29 2011-07-13 检验夹具及触头
PCT/JP2011/065930 WO2012014673A1 (ja) 2010-07-29 2011-07-13 検査治具及び接触子

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2010195592 2010-09-01
JP2010195592 2010-09-01
JP2010229524A JP5345598B2 (ja) 2010-09-01 2010-10-12 検査治具及び接触子

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2013097215A Division JP2013156275A (ja) 2010-09-01 2013-05-06 検査治具及び接触子

Publications (3)

Publication Number Publication Date
JP2012073213A JP2012073213A (ja) 2012-04-12
JP2012073213A5 JP2012073213A5 (enrdf_load_stackoverflow) 2012-07-12
JP5345598B2 true JP5345598B2 (ja) 2013-11-20

Family

ID=46169526

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2010229524A Expired - Fee Related JP5345598B2 (ja) 2010-07-29 2010-10-12 検査治具及び接触子
JP2013097215A Pending JP2013156275A (ja) 2010-09-01 2013-05-06 検査治具及び接触子

Family Applications After (1)

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JP2013097215A Pending JP2013156275A (ja) 2010-09-01 2013-05-06 検査治具及び接触子

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JP (2) JP5345598B2 (enrdf_load_stackoverflow)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013232356A (ja) * 2012-04-27 2013-11-14 Junkosha Co Ltd コイル状ケーブル
JP5894718B2 (ja) * 2013-02-25 2016-03-30 秀雄 西川 接触子、検査治具、及び接触子の製造方法
JP6071633B2 (ja) * 2013-02-25 2017-02-01 秀雄 西川 接触子、検査治具、及び接触子の製造方法
JP2015004518A (ja) * 2013-06-19 2015-01-08 大西電子株式会社 検査治具
JP6682681B2 (ja) * 2019-05-13 2020-04-15 日本電子材料株式会社 プローブ

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5543305Y2 (enrdf_load_stackoverflow) * 1975-03-07 1980-10-11
JP3326095B2 (ja) * 1996-12-27 2002-09-17 日本発条株式会社 導電性接触子
JP2000046084A (ja) * 1998-07-27 2000-02-15 Kgm:Kk コイルばね
JP2001311746A (ja) * 2000-04-28 2001-11-09 Mitsubishi Materials Corp コンタクトプローブ及びプローブ装置
US7154286B1 (en) * 2005-06-30 2006-12-26 Interconnect Devices, Inc. Dual tapered spring probe
JP4833011B2 (ja) * 2005-12-20 2011-12-07 株式会社エンプラス 電気部品用ソケット
JP4831614B2 (ja) * 2006-08-15 2011-12-07 株式会社ヨコオ ケルビン検査用治具
JP2009047636A (ja) * 2007-08-22 2009-03-05 Inoue Shoji Kk プリント配線板の導通検査治具

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Publication number Publication date
JP2013156275A (ja) 2013-08-15
JP2012073213A (ja) 2012-04-12

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