JP5200970B2 - 品質管理システムおよび品質管理装置および品質管理プログラム - Google Patents
品質管理システムおよび品質管理装置および品質管理プログラム Download PDFInfo
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- JP5200970B2 JP5200970B2 JP2009023812A JP2009023812A JP5200970B2 JP 5200970 B2 JP5200970 B2 JP 5200970B2 JP 2009023812 A JP2009023812 A JP 2009023812A JP 2009023812 A JP2009023812 A JP 2009023812A JP 5200970 B2 JP5200970 B2 JP 5200970B2
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- 238000003908 quality control method Methods 0.000 title claims description 12
- 230000007547 defect Effects 0.000 claims description 119
- 238000009826 distribution Methods 0.000 claims description 48
- 238000000605 extraction Methods 0.000 claims description 34
- 230000007257 malfunction Effects 0.000 claims description 8
- 230000006870 function Effects 0.000 claims description 5
- 230000008859 change Effects 0.000 description 71
- 238000004519 manufacturing process Methods 0.000 description 42
- 238000012545 processing Methods 0.000 description 18
- 238000010586 diagram Methods 0.000 description 15
- 238000003326 Quality management system Methods 0.000 description 12
- 238000003860 storage Methods 0.000 description 9
- 238000004364 calculation method Methods 0.000 description 7
- 238000004891 communication Methods 0.000 description 7
- 238000004458 analytical method Methods 0.000 description 5
- 239000000284 extract Substances 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- 230000008569 process Effects 0.000 description 4
- 230000002776 aggregation Effects 0.000 description 3
- 238000004220 aggregation Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 230000003247 decreasing effect Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 230000001364 causal effect Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000010365 information processing Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000008439 repair process Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
- G05B23/0243—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model
- G05B23/0245—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model based on a qualitative model, e.g. rule based; if-then decisions
- G05B23/0251—Abstraction hierarchy, e.g. "complex systems", i.e. system is divided in subsystems, subsystems are monitored and results are combined to decide on status of whole system
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
- G06Q50/00—Information and communication technology [ICT] specially adapted for implementation of business processes of specific business sectors, e.g. utilities or tourism
- G06Q50/04—Manufacturing
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/30—Computing systems specially adapted for manufacturing
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- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Business, Economics & Management (AREA)
- Physics & Mathematics (AREA)
- Primary Health Care (AREA)
- Health & Medical Sciences (AREA)
- Human Resources & Organizations (AREA)
- Marketing (AREA)
- Economics (AREA)
- Strategic Management (AREA)
- Tourism & Hospitality (AREA)
- General Health & Medical Sciences (AREA)
- General Business, Economics & Management (AREA)
- Manufacturing & Machinery (AREA)
- Theoretical Computer Science (AREA)
- Automation & Control Theory (AREA)
- General Factory Administration (AREA)
- Management, Administration, Business Operations System, And Electronic Commerce (AREA)
Description
102 時系列分布作成部
103 変化点抽出部
104 変化分算出部
105 不具合関連情報作成部
106 記憶部
107 関連性解析部
108 製造情報管理部
109 不具合情報記憶部
Claims (3)
- 電子機器で発生した不具合の時系列分布から当該不具合の発生状態の特徴箇所を抽出する第1の抽出手段と、
前記不具合と関係する前記電子機器を構成する1または複数の部品を特定する部品特定手段と、
前記部品特定手段によって特定した部品の供給元ごとの使用率の時系列分布から当該部品の特徴箇所を抽出する第2の抽出手段と、
前記第1の抽出手段で抽出した前記不具合の発生状態の特徴箇所と前記第2の抽出手段で抽出した前記部品の特徴箇所とが相関関係を有していることにより前記不具合と相関関係を有する部品の供給元を特定する供給元特定手段と
を具備する品質管理装置。 - 電子機器で発生した不具合の時系列分布から当該不具合の発生状態の特徴箇所を抽出する第1の抽出手段と、
前記不具合と関係する前記電子機器を構成する1または複数の部品を特定する部品特定手段と、
前記部品特定手段によって特定した部品の供給元ごとの使用率の時系列分布から当該部品の特徴箇所を抽出する第2の抽出手段と、
前記第1の抽出手段で抽出した前記不具合の発生状態の特徴箇所と前記第2の抽出手段で抽出した前記部品の特徴箇所とが相関関係を有していることにより前記不具合と相関関係を有する部品の供給元を特定する供給元特定手段と
を具備する複数の品質管理装置が階層構造を形成し、部品の不具合に関する情報を、上位階層の品質管理装置が下位階層の前記供給元特定手段によって特定された供給元の品質管理装置に対して送信する品質管理システム。 - コンピュータを、
電子機器で発生した不具合の時系列分布から当該不具合の発生状態の特徴箇所を抽出する第1の抽出手段と、
前記不具合と関係する前記電子機器を構成する1または複数の部品を特定する部品特定手段と、
前記部品特定手段によって特定した部品の供給元ごとの使用率の時系列分布から当該部品の特徴箇所を抽出する第2の抽出手段と、
前記第1の抽出手段で抽出した前記不具合の発生状態の特徴箇所と前記第2の抽出手段で抽出した前記部品の特徴箇所とが相関関係を有していることにより前記不具合と相関関係を有する部品の供給元を特定する供給元特定手段
として機能させる品質管理プログラム。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009023812A JP5200970B2 (ja) | 2009-02-04 | 2009-02-04 | 品質管理システムおよび品質管理装置および品質管理プログラム |
US12/558,659 US8219231B2 (en) | 2009-02-04 | 2009-09-14 | Quality control system, quality control apparatus, quality control method and computer readable medium |
CN200910205573.7A CN101794106B (zh) | 2009-02-04 | 2009-10-16 | 质量控制系统、质量控制装置以及质量控制方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009023812A JP5200970B2 (ja) | 2009-02-04 | 2009-02-04 | 品質管理システムおよび品質管理装置および品質管理プログラム |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2010182015A JP2010182015A (ja) | 2010-08-19 |
JP5200970B2 true JP5200970B2 (ja) | 2013-06-05 |
Family
ID=42398378
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2009023812A Expired - Fee Related JP5200970B2 (ja) | 2009-02-04 | 2009-02-04 | 品質管理システムおよび品質管理装置および品質管理プログラム |
Country Status (3)
Country | Link |
---|---|
US (1) | US8219231B2 (ja) |
JP (1) | JP5200970B2 (ja) |
CN (1) | CN101794106B (ja) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8755589B2 (en) | 2011-09-06 | 2014-06-17 | The Gates Corporation | Measurement of belt wear through edge detection of a raster image |
US9098914B2 (en) | 2013-03-11 | 2015-08-04 | Gates Corporation | Enhanced analysis for image-based serpentine belt wear evaluation |
JP5451927B1 (ja) * | 2013-06-04 | 2014-03-26 | 株式会社PreFEED | 異常発生原因の特定システム、異常発生原因の特定方法、及び異常発生原因の特定プログラム |
JP2015045942A (ja) * | 2013-08-27 | 2015-03-12 | キヤノン株式会社 | 品質管理装置、品質管理方法、及びプログラム |
US20160154802A1 (en) * | 2014-12-02 | 2016-06-02 | Nec Laboratories America, Inc. | Quality control engine for complex physical systems |
US20160321594A1 (en) * | 2015-04-30 | 2016-11-03 | Optimal Plus Ltd. | Correlation between manufacturing segment and end- user device performance |
JP6443312B2 (ja) * | 2015-09-28 | 2018-12-26 | オムロン株式会社 | 管理システム |
WO2017056749A1 (ja) * | 2015-09-28 | 2017-04-06 | オムロン株式会社 | 管理システムおよび管理方法 |
JP6642090B2 (ja) * | 2016-02-19 | 2020-02-05 | 富士ゼロックス株式会社 | 品質管理装置及び品質管理プログラム |
US11188037B2 (en) * | 2016-03-24 | 2021-11-30 | Siemens Aktiengesellschaft | Controlling methods, control systems, and plants using semantic models for quality criteria or adaptation of control rules |
Family Cites Families (22)
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JP2985505B2 (ja) * | 1991-07-08 | 1999-12-06 | 株式会社日立製作所 | 品質情報収集診断システム及びその方法 |
US6009246A (en) * | 1997-01-13 | 1999-12-28 | International Business Machines Corporation | Method and system for evaluating intrusive repair for plurality of devices |
JPH10217048A (ja) * | 1997-02-04 | 1998-08-18 | Nec Corp | 品質改善システム |
US6336078B1 (en) * | 1997-09-30 | 2002-01-01 | Canon Kabushiki Kaisha | Quality management of components |
US6343236B1 (en) * | 1999-04-02 | 2002-01-29 | General Electric Company | Method and system for analyzing fault log data for diagnostics |
KR100510065B1 (ko) * | 1999-06-22 | 2005-08-26 | 주식회사 하이닉스반도체 | 반도체 제조를 위한 오버레이 장비 자동화 방법 |
KR100510068B1 (ko) * | 1999-06-22 | 2005-08-26 | 주식회사 하이닉스반도체 | 반도체 라인관리용 통합 자동화시스템의 감시 시스템 및 방법 |
KR100510066B1 (ko) * | 1999-06-30 | 2005-08-26 | 주식회사 하이닉스반도체 | 반도체 생산라인의 스토커 오류 감시 방법 |
JP2002117107A (ja) * | 1999-09-02 | 2002-04-19 | Ricoh Co Ltd | 生産管理システム、生産管理システムにおけるクライアント、生産管理システムにおける生産管理方法、生産管理システムにおけるデータ検索方法、およびその方法を実行させるためのプログラムを記録したコンピュータが読取可能な記録媒体 |
US6704015B1 (en) * | 2000-03-31 | 2004-03-09 | Ge Mortgage Holdings, Llc | Methods and apparatus for providing a quality control management system |
US6751574B2 (en) * | 2001-02-13 | 2004-06-15 | Honda Giken Kogyo Kabushiki Kaisha | System for predicting a demand for repair parts |
US7707058B2 (en) * | 2001-08-31 | 2010-04-27 | Hewlett-Packard Development Company, L.P. | Predicting parts needed for an onsite repair using expected waste derived from repair history |
US7035877B2 (en) * | 2001-12-28 | 2006-04-25 | Kimberly-Clark Worldwide, Inc. | Quality management and intelligent manufacturing with labels and smart tags in event-based product manufacturing |
US6922656B2 (en) * | 2002-04-18 | 2005-07-26 | Caterpillar Inc | Method and system of identifying a problem prone part |
JP4694843B2 (ja) * | 2002-09-30 | 2011-06-08 | 東京エレクトロン株式会社 | 半導体製作プロセスの監視とコンロトールのための装置 |
ITMI20022109A1 (it) * | 2002-10-04 | 2004-04-05 | Advanced Technologies S R L | Metodo per l'individuazione e la gestione di errori e |
KR100552483B1 (ko) * | 2003-11-17 | 2006-02-15 | 삼성전자주식회사 | 화상 형성 장치의 정착 시스템 및 그 온도 제어 방법 |
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US20060036345A1 (en) * | 2004-08-09 | 2006-02-16 | An Cao | Systems and method for lights-out manufacturing |
US7477960B2 (en) * | 2005-02-16 | 2009-01-13 | Tokyo Electron Limited | Fault detection and classification (FDC) using a run-to-run controller |
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JP5299684B2 (ja) * | 2009-03-03 | 2013-09-25 | 富士ゼロックス株式会社 | 監視装置および情報処理システムおよび監視プログラム |
-
2009
- 2009-02-04 JP JP2009023812A patent/JP5200970B2/ja not_active Expired - Fee Related
- 2009-09-14 US US12/558,659 patent/US8219231B2/en active Active
- 2009-10-16 CN CN200910205573.7A patent/CN101794106B/zh active Active
Also Published As
Publication number | Publication date |
---|---|
JP2010182015A (ja) | 2010-08-19 |
US20100198387A1 (en) | 2010-08-05 |
CN101794106B (zh) | 2014-12-17 |
CN101794106A (zh) | 2010-08-04 |
US8219231B2 (en) | 2012-07-10 |
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