JP5150135B2 - シリアルテストインターフェースを有する回路構成、およびシリアルテスト作動モード手順 - Google Patents

シリアルテストインターフェースを有する回路構成、およびシリアルテスト作動モード手順 Download PDF

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Publication number
JP5150135B2
JP5150135B2 JP2007129374A JP2007129374A JP5150135B2 JP 5150135 B2 JP5150135 B2 JP 5150135B2 JP 2007129374 A JP2007129374 A JP 2007129374A JP 2007129374 A JP2007129374 A JP 2007129374A JP 5150135 B2 JP5150135 B2 JP 5150135B2
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Prior art keywords
power supply
circuit configuration
supply voltage
data
voltage
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JP2007129374A
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Japanese (ja)
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JP2007312390A (ja
JP2007312390A5 (enExample
Inventor
ビーデンバッハ ライナー
フランケ ヨルグ
リッター ヨアヒム
ユング クリスティアン
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TDK Micronas GmbH
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TDK Micronas GmbH
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31713—Input or output interfaces for test, e.g. test pins, buffers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2844—Fault-finding or characterising using test interfaces, e.g. adapters, test boxes, switches, PIN drivers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Logic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP2007129374A 2006-05-15 2007-05-15 シリアルテストインターフェースを有する回路構成、およびシリアルテスト作動モード手順 Active JP5150135B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102006022985A DE102006022985A1 (de) 2006-05-15 2006-05-15 Schaltungsanordnung mit einer seriellen Testschnittstelle bzw. serielles Testbetriebsverfahren
DE102006022985.1 2006-05-15

Publications (3)

Publication Number Publication Date
JP2007312390A JP2007312390A (ja) 2007-11-29
JP2007312390A5 JP2007312390A5 (enExample) 2010-06-24
JP5150135B2 true JP5150135B2 (ja) 2013-02-20

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ID=38421163

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007129374A Active JP5150135B2 (ja) 2006-05-15 2007-05-15 シリアルテストインターフェースを有する回路構成、およびシリアルテスト作動モード手順

Country Status (4)

Country Link
US (1) US7761756B2 (enExample)
EP (1) EP1857827B1 (enExample)
JP (1) JP5150135B2 (enExample)
DE (1) DE102006022985A1 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE502008002380D1 (de) * 2008-03-28 2011-03-03 Micronas Gmbh Schaltungsanordnung, Vorrichtung bzw. Verfahren zum seriellen Senden von Daten über einen Anschlusskontakt
DE102012013072B4 (de) 2012-07-02 2015-01-08 Micronas Gmbh Vorrichtung zur Auswertung eines Magnetfeldes
RU2525844C1 (ru) * 2013-01-23 2014-08-20 Открытое акционерное общество "Военно-промышленная корпорация "Научно-производственное объединение машиностроения" Способ теплорадиотехнических испытаний радиопрозрачных обтекателей летательных аппаратов
DE102014014309B4 (de) * 2014-10-01 2018-08-16 Tdk-Micronas Gmbh Verfahren zum Testen eines Signalpfades
DE102016123400B3 (de) 2016-01-19 2017-04-06 Elmos Semiconductor Aktiengesellschaft Eindrahtlichtsteuerbus mit mehreren Pegeln
EP3570056B1 (de) 2016-01-19 2023-04-12 Elmos Semiconductor SE Jtag-schnittstellen zur steuerung der ansteuervorrichtung von leuchtmitteln einer leuchtkette
DE102016100842B3 (de) * 2016-01-19 2017-03-02 Elmos Semiconductor Aktiengesellschaft Bidirektionales JTAG Datenbusprotokoll zur Übertragung von Beleuchtungsdaten
CN108292517B (zh) * 2016-06-03 2021-09-14 富士电机株式会社 半导体装置
RU2626406C1 (ru) * 2016-08-18 2017-07-27 Акционерное общество "Обнинское научно-производственное предприятие "Технология" им. А.Г. Ромашина" Способ тепловых испытаний радиопрозрачных обтекателей
US20180164371A1 (en) * 2016-12-12 2018-06-14 Qualcomm Incorporated Apparatus and method for providing debug information via power rail in power state where debug interface is disabled
DE102017208171B3 (de) 2017-05-15 2018-10-11 Pepperl + Fuchs Gmbh Verfahren zur Überwachung eines Betriebs einer binären Schnittstelle und entsprechende binäre Schnittstelle
KR102884475B1 (ko) * 2021-11-24 2025-11-12 삼성전자주식회사 전자 장치의 진단 방법 및 장치

Family Cites Families (16)

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JPS58115547A (ja) 1981-12-29 1983-07-09 Fujitsu Ltd マイクロプロセツサの動作モ−ド設定方式
US4774493A (en) * 1986-05-15 1988-09-27 Hewlett-Packard Company Method and apparatus for transferring information into electronic systems
ZA919656B (en) * 1990-12-28 1992-09-30 Westinghouse Electric Corp Voltage controlled power supply
DE4420988A1 (de) 1994-06-16 1995-12-21 Philips Patentverwaltung Verfahren zum Testen einer integrierten Schaltung sowie integrierte Schaltungsanordnung mit einer Testschaltung
US5898186A (en) 1996-09-13 1999-04-27 Micron Technology, Inc. Reduced terminal testing system
DE19716011A1 (de) * 1997-04-17 1998-10-22 Abb Research Ltd Verfahren und Vorrichtung zur Informationsübertragung über Stromversorgungsleitungen
DE19819265C1 (de) * 1998-04-30 1999-08-19 Micronas Intermetall Gmbh Verfahren zum Parametrieren einer integrierten Schaltungsanordnung und integrierte Schaltungsanordnung hierfür
DE19912446C1 (de) * 1999-03-19 2000-11-09 Micronas Intermetall Gmbh Einrichtung zum Einstellen von Betriebsgrößen in mehreren programmierbaren integrierten Schaltungen, insbesondere enthaltend jeweils einen Hallgenerator
DE10102871C2 (de) * 2001-01-23 2003-03-06 Infineon Technologies Ag Halbleiterbauelement zum Anschluß an ein Testsystem sowie Testsystem mit dem Halbleiterbauelement
DE10105982A1 (de) * 2001-02-09 2002-10-02 Siemens Ag Verfahren zur Auswertung eines Messwertes und zugehörige Schaltungsanordnung
US6714049B2 (en) * 2001-08-10 2004-03-30 Shakti Systems, Inc. Logic state transition sensor circuit
US7170394B2 (en) * 2003-07-31 2007-01-30 Agilent Technologies, Inc. Remote current sensing and communication over single pair of power feed wires
DE102004010852A1 (de) 2004-03-05 2005-11-17 Infineon Technologies Ag Schaltung mit einem Normalbeitriebsmodus und einem Konfigurationsmodus
US7321482B2 (en) * 2004-03-19 2008-01-22 Hewlett-Packard Development Company, L.P. Sub-circuit voltage manipulation
JP4824319B2 (ja) * 2005-01-21 2011-11-30 ルネサスエレクトロニクス株式会社 故障検出装置及び方法、並びに信号抽出回路
US7710131B1 (en) * 2007-08-18 2010-05-04 Radiation Monitoring Devices, Inc. Non-contact circuit analyzer

Also Published As

Publication number Publication date
JP2007312390A (ja) 2007-11-29
EP1857827B1 (de) 2013-11-20
DE102006022985A1 (de) 2007-11-22
US20070294605A1 (en) 2007-12-20
EP1857827A3 (de) 2010-06-09
US7761756B2 (en) 2010-07-20
EP1857827A2 (de) 2007-11-21

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