JP5144170B2 - 半導体装置の実装方法 - Google Patents

半導体装置の実装方法 Download PDF

Info

Publication number
JP5144170B2
JP5144170B2 JP2007213554A JP2007213554A JP5144170B2 JP 5144170 B2 JP5144170 B2 JP 5144170B2 JP 2007213554 A JP2007213554 A JP 2007213554A JP 2007213554 A JP2007213554 A JP 2007213554A JP 5144170 B2 JP5144170 B2 JP 5144170B2
Authority
JP
Japan
Prior art keywords
semiconductor device
terminal
connection
circuit
bumps
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2007213554A
Other languages
English (en)
Japanese (ja)
Other versions
JP2009049170A5 (enrdf_load_stackoverflow
JP2009049170A (ja
Inventor
俊彦 秋葉
斉尚 佐藤
孝洋 内藤
一繁 山岸
文次 安村
尚宏 槇平
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renesas Electronics Corp
Original Assignee
Renesas Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renesas Electronics Corp filed Critical Renesas Electronics Corp
Priority to JP2007213554A priority Critical patent/JP5144170B2/ja
Publication of JP2009049170A publication Critical patent/JP2009049170A/ja
Publication of JP2009049170A5 publication Critical patent/JP2009049170A5/ja
Application granted granted Critical
Publication of JP5144170B2 publication Critical patent/JP5144170B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA

Landscapes

  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
JP2007213554A 2007-08-20 2007-08-20 半導体装置の実装方法 Expired - Fee Related JP5144170B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2007213554A JP5144170B2 (ja) 2007-08-20 2007-08-20 半導体装置の実装方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007213554A JP5144170B2 (ja) 2007-08-20 2007-08-20 半導体装置の実装方法

Publications (3)

Publication Number Publication Date
JP2009049170A JP2009049170A (ja) 2009-03-05
JP2009049170A5 JP2009049170A5 (enrdf_load_stackoverflow) 2010-09-30
JP5144170B2 true JP5144170B2 (ja) 2013-02-13

Family

ID=40501128

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007213554A Expired - Fee Related JP5144170B2 (ja) 2007-08-20 2007-08-20 半導体装置の実装方法

Country Status (1)

Country Link
JP (1) JP5144170B2 (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5342422B2 (ja) 2009-12-10 2013-11-13 ルネサスエレクトロニクス株式会社 半導体装置およびその製造方法
CN110473839B (zh) 2018-05-11 2025-03-21 三星电子株式会社 半导体封装系统
US10991638B2 (en) 2018-05-14 2021-04-27 Samsung Electronics Co., Ltd. Semiconductor package system

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63271966A (ja) * 1987-04-28 1988-11-09 Nec Corp 半導体集積回路
JPH03172782A (ja) * 1989-12-01 1991-07-26 Hitachi Ltd 半導体集積回路
JP4509437B2 (ja) * 2000-09-11 2010-07-21 Hoya株式会社 多層配線基板の製造方法
JP2004335858A (ja) * 2003-05-09 2004-11-25 Murata Mfg Co Ltd 電子部品およびそれを用いた電子機器
JP2004078996A (ja) * 2003-11-17 2004-03-11 Renesas Technology Corp データ処理装置
JP2007115904A (ja) * 2005-10-20 2007-05-10 Renesas Technology Corp 半導体装置の製造方法

Also Published As

Publication number Publication date
JP2009049170A (ja) 2009-03-05

Similar Documents

Publication Publication Date Title
JP5165404B2 (ja) 半導体装置と半導体装置の製造方法及びテスト方法
US8202740B2 (en) Method of manufacturing a semiconductor device and a testing method of the same
TWI447408B (zh) 具有主動電路元件之測試中介器及其方法
JP2005209239A (ja) 半導体集積回路装置
US7476555B2 (en) Method of chip manufacturing
US20100264950A1 (en) Electronic device including electronic part and wiring substrate
JP2010278471A (ja) 半導体装置とモジュール
US20040017216A1 (en) Multi-socket board for open/short tester
JP5144170B2 (ja) 半導体装置の実装方法
JP2016514367A (ja) ファインピッチトレース上にテスト用パッドを有するパッケージ基板
JP7500994B2 (ja) 半導体装置
JP4539396B2 (ja) 半導体装置の実装構造
US11683883B2 (en) Semiconductor apparatus
JP4022698B2 (ja) 検査回路基板
JP2004311535A (ja) チップサイズパッケージ半導体装置
US7521918B2 (en) Microcomputer chip with function capable of supporting emulation
JP7400536B2 (ja) 半導体装置
JP2002007164A (ja) 半導体集積回路用チップ及びエミュレーションシステム
JP4627306B2 (ja) 半導体装置
JP2011103405A (ja) 半導体装置
JP2010062469A (ja) 半導体モジュール
CN101562168A (zh) 多晶粒模块化的封装结构及其封装方法
JP2002124633A (ja) 半導体装置

Legal Events

Date Code Title Description
A711 Notification of change in applicant

Free format text: JAPANESE INTERMEDIATE CODE: A712

Effective date: 20100507

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20100816

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20100816

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20120131

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20120209

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20120329

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20121115

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20121122

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20151130

Year of fee payment: 3

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

S531 Written request for registration of change of domicile

Free format text: JAPANESE INTERMEDIATE CODE: R313531

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

LAPS Cancellation because of no payment of annual fees