JP5127244B2 - 表示装置及び当該表示装置を具備する電子機器 - Google Patents

表示装置及び当該表示装置を具備する電子機器 Download PDF

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Publication number
JP5127244B2
JP5127244B2 JP2007015719A JP2007015719A JP5127244B2 JP 5127244 B2 JP5127244 B2 JP 5127244B2 JP 2007015719 A JP2007015719 A JP 2007015719A JP 2007015719 A JP2007015719 A JP 2007015719A JP 5127244 B2 JP5127244 B2 JP 5127244B2
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Japan
Prior art keywords
potential
circuit
line
wiring
signal
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Expired - Fee Related
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JP2007015719A
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Japanese (ja)
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JP2007233353A (ja
JP2007233353A5 (enExample
Inventor
勇気 畑
友幸 岩淵
彰宏 木村
修平 長塚
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Semiconductor Energy Laboratory Co Ltd
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Semiconductor Energy Laboratory Co Ltd
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Priority to JP2007015719A priority Critical patent/JP5127244B2/ja
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Publication of JP2007233353A5 publication Critical patent/JP2007233353A5/ja
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  • Liquid Crystal (AREA)
  • Liquid Crystal Display Device Control (AREA)
  • Control Of El Displays (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
JP2007015719A 2006-02-03 2007-01-26 表示装置及び当該表示装置を具備する電子機器 Expired - Fee Related JP5127244B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2007015719A JP5127244B2 (ja) 2006-02-03 2007-01-26 表示装置及び当該表示装置を具備する電子機器

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2006026761 2006-02-03
JP2006026761 2006-02-03
JP2007015719A JP5127244B2 (ja) 2006-02-03 2007-01-26 表示装置及び当該表示装置を具備する電子機器

Publications (3)

Publication Number Publication Date
JP2007233353A JP2007233353A (ja) 2007-09-13
JP2007233353A5 JP2007233353A5 (enExample) 2010-02-12
JP5127244B2 true JP5127244B2 (ja) 2013-01-23

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JP2007015719A Expired - Fee Related JP5127244B2 (ja) 2006-02-03 2007-01-26 表示装置及び当該表示装置を具備する電子機器

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Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5211962B2 (ja) * 2008-09-12 2013-06-12 セイコーエプソン株式会社 表示装置
WO2011081011A1 (en) * 2009-12-28 2011-07-07 Semiconductor Energy Laboratory Co., Ltd. Liquid crystal display device and manufacturing method thereof
US8947337B2 (en) 2010-02-11 2015-02-03 Semiconductor Energy Laboratory Co., Ltd. Display device

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61256382A (ja) * 1985-05-10 1986-11-13 三菱電機株式会社 液晶デイスプレイ装置
JP3353320B2 (ja) * 1992-02-17 2002-12-03 ソニー株式会社 階調補正装置及びレーザ表示装置
JP3203864B2 (ja) * 1992-03-30 2001-08-27 ソニー株式会社 アクティブマトリックス基板の製造方法、検査方法および装置と液晶表示装置の製造方法
JPH10260391A (ja) * 1997-03-19 1998-09-29 Fujitsu Ltd 検査回路を有する液晶表示装置
JP2000020020A (ja) * 1998-06-26 2000-01-21 Canon Inc 電子源駆動装置及び画像形成装置及び電子源の電子放出特性の補正方法
JP4239299B2 (ja) * 1999-06-14 2009-03-18 三菱電機株式会社 アクティブマトリックス型液晶表示装置
US6795046B2 (en) * 2001-08-16 2004-09-21 Koninklijke Philips Electronics N.V. Self-calibrating image display device
JP4610886B2 (ja) * 2002-12-06 2011-01-12 株式会社半導体エネルギー研究所 画像表示装置、電子機器
JP2005013661A (ja) * 2003-06-30 2005-01-20 Og Giken Co Ltd 入浴装置
JP2005043783A (ja) * 2003-07-25 2005-02-17 Oht Inc 液晶表示パネルの検査装置及び液晶パネルの検査方法
JP4465183B2 (ja) * 2003-12-05 2010-05-19 株式会社半導体エネルギー研究所 アクティブマトリクス型液晶表示パネルおよびその不良画素判定方法、アクティブマトリクス型液晶表示パネル用素子基板およびその不良素子判定方法
JP4026618B2 (ja) * 2004-05-20 2007-12-26 セイコーエプソン株式会社 電気光学装置、その検査方法および電子機器

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Publication number Publication date
JP2007233353A (ja) 2007-09-13

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