JP5124373B2 - 電子デバイス,受光・発光デバイス、それを用いた電子集積回路および光集積回路 - Google Patents
電子デバイス,受光・発光デバイス、それを用いた電子集積回路および光集積回路 Download PDFInfo
- Publication number
- JP5124373B2 JP5124373B2 JP2008180863A JP2008180863A JP5124373B2 JP 5124373 B2 JP5124373 B2 JP 5124373B2 JP 2008180863 A JP2008180863 A JP 2008180863A JP 2008180863 A JP2008180863 A JP 2008180863A JP 5124373 B2 JP5124373 B2 JP 5124373B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- substrate
- graphene sheet
- disposed
- underlayer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 230000003287 optical effect Effects 0.000 title claims description 7
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 74
- 229910021389 graphene Inorganic materials 0.000 claims description 63
- 239000000758 substrate Substances 0.000 claims description 44
- 238000000034 method Methods 0.000 claims description 26
- 239000004065 semiconductor Substances 0.000 claims description 9
- 239000000126 substance Substances 0.000 claims description 6
- 238000001947 vapour-phase growth Methods 0.000 claims description 6
- 229910052799 carbon Inorganic materials 0.000 claims description 4
- 239000010410 layer Substances 0.000 description 44
- 230000005669 field effect Effects 0.000 description 7
- 229910002804 graphite Inorganic materials 0.000 description 7
- 239000010439 graphite Substances 0.000 description 7
- 230000015572 biosynthetic process Effects 0.000 description 6
- 238000010586 diagram Methods 0.000 description 6
- 239000007789 gas Substances 0.000 description 4
- 239000002073 nanorod Substances 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 3
- 239000002071 nanotube Substances 0.000 description 3
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 3
- 238000000206 photolithography Methods 0.000 description 3
- HSFWRNGVRCDJHI-UHFFFAOYSA-N alpha-acetylene Natural products C#C HSFWRNGVRCDJHI-UHFFFAOYSA-N 0.000 description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 2
- 238000005452 bending Methods 0.000 description 2
- 125000004432 carbon atom Chemical group C* 0.000 description 2
- 238000001312 dry etching Methods 0.000 description 2
- -1 ethylene, propylene Chemical group 0.000 description 2
- 125000002534 ethynyl group Chemical group [H]C#C* 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 229920003002 synthetic resin Polymers 0.000 description 1
- 239000000057 synthetic resin Substances 0.000 description 1
- 238000001039 wet etching Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/12—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/16—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic Table
- H01L29/1606—Graphene
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/778—Field effect transistors with two-dimensional charge carrier gas channel, e.g. HEMT ; with two-dimensional charge-carrier layer formed at a heterojunction interface
- H01L29/7781—Field effect transistors with two-dimensional charge carrier gas channel, e.g. HEMT ; with two-dimensional charge-carrier layer formed at a heterojunction interface with inverted single heterostructure, i.e. with active layer formed on top of wide bandgap layer, e.g. IHEMT
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/7842—Field effect transistors with field effect produced by an insulated gate means for exerting mechanical stress on the crystal lattice of the channel region, e.g. using a flexible substrate
- H01L29/7843—Field effect transistors with field effect produced by an insulated gate means for exerting mechanical stress on the crystal lattice of the channel region, e.g. using a flexible substrate the means being an applied insulating layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78684—Thin film transistors, i.e. transistors with a channel being at least partly a thin film having a semiconductor body comprising semiconductor materials of Group IV not being silicon, or alloys including an element of the group IV, e.g. Ge, SiN alloys, SiC alloys
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78696—Thin film transistors, i.e. transistors with a channel being at least partly a thin film characterised by the structure of the channel, e.g. multichannel, transverse or longitudinal shape, length or width, doping structure, or the overlap or alignment between the channel and the gate, the source or the drain, or the contacting structure of the channel
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
- H10K10/40—Organic transistors
- H10K10/46—Field-effect transistors, e.g. organic thin-film transistors [OTFT]
- H10K10/462—Insulated gate field-effect transistors [IGFETs]
- H10K10/484—Insulated gate field-effect transistors [IGFETs] characterised by the channel regions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/02373—Group 14 semiconducting materials
- H01L21/02381—Silicon, silicon germanium, germanium
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02436—Intermediate layers between substrates and deposited layers
- H01L21/02439—Materials
- H01L21/02488—Insulating materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02524—Group 14 semiconducting materials
- H01L21/02527—Carbon, e.g. diamond-like carbon
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/0004—Devices characterised by their operation
- H01L33/0041—Devices characterised by their operation characterised by field-effect operation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/36—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes
- H01L33/40—Materials therefor
Landscapes
- Microelectronics & Electronic Packaging (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Computer Hardware Design (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Thin Film Transistor (AREA)
- Carbon And Carbon Compounds (AREA)
- Light Receiving Elements (AREA)
Description
102,202,302,402,502,602,702,802 下地層
103,203,303,403,503,603,703,803 グラフェン層
504,804 ソース電極
505,805 ドレイン電極
506,806 絶縁層
507,807 ゲート電極
604 プラス電極
605 マイナス電極、
Claims (10)
- 基板と、
前記基板上に配置された電極と、
前記基板上に配置され、少なくとも1つの凸構造または凹構造を有する下地層と、
前記下地層の凸構造または凹構造に沿うように配置され、前記電極と直に接続、又は絶縁層を介して配置された少なくとも1層のグラフェンシートと、
を具備することを特徴とする電子デバイス。 - 炭素系ガスを用いた気相成長法により、前記下地層に選択成長させて前記グラフェンシートを配置することを特徴とする請求項1に記載の電子デバイス。
- ナノメーターサイズの物質を転写するナノトランスファー法により、前記グラフェンシートを前記下地層に配置することを特徴とする請求項1に記載の電子デバイス。
- 前記グラフェンシートの層数が、10層未満であることを特徴とする請求項1に記載の電子デバイス。
- 基板と、
前記基板上に配置された電極と、
前記基板上に配置され、少なくとも1つの凸構造または凹構造を有する下地層と、
前記下地層の凸構造または凹構造に沿うように配置され、前記電極と接続された少なくとも1層のグラフェンシートと、
を具備することを特徴とする受光・発光デバイス。 - 炭素系ガスを用いた気相成長法により、前記下地層に選択成長させて前記グラフェンシートを配置することを特徴とする請求項5に記載の受光・発光デバイス。
- ナノメーターサイズの物質を転写するナノトランスファー法により、前記グラフェンシートを前記下地層に配置することを特徴とする請求項5に記載の受光・発光デバイス。
- 前記グラフェンシートの層数が、10層未満であることを特徴とする請求項5に記載の受光・発光デバイス。
- 請求項1乃至4のいずれか1項に記載の電子デバイスを半導体基板またはフレキシブル基板に集積した電子集積回路。
- 請求項5乃至8のいずれか1項に記載の受光・発光デバイスを半導体基板またはフレキシブル基板に集積した光集積回路。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008180863A JP5124373B2 (ja) | 2008-07-11 | 2008-07-11 | 電子デバイス,受光・発光デバイス、それを用いた電子集積回路および光集積回路 |
US13/003,323 US8507893B2 (en) | 2008-07-11 | 2009-05-26 | Electronic device, light-receiving and light-emitting device, electronic integrated circuit and optical integrated circuit using the devices |
PCT/JP2009/002305 WO2010004681A1 (ja) | 2008-07-11 | 2009-05-26 | 電子デバイス、受光・発光デバイス、それを用いた電子集積回路および光集積回路 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008180863A JP5124373B2 (ja) | 2008-07-11 | 2008-07-11 | 電子デバイス,受光・発光デバイス、それを用いた電子集積回路および光集積回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2010021377A JP2010021377A (ja) | 2010-01-28 |
JP5124373B2 true JP5124373B2 (ja) | 2013-01-23 |
Family
ID=41506809
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008180863A Expired - Fee Related JP5124373B2 (ja) | 2008-07-11 | 2008-07-11 | 電子デバイス,受光・発光デバイス、それを用いた電子集積回路および光集積回路 |
Country Status (3)
Country | Link |
---|---|
US (1) | US8507893B2 (ja) |
JP (1) | JP5124373B2 (ja) |
WO (1) | WO2010004681A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7217546B2 (ja) | 2021-01-18 | 2023-02-03 | 原田織物株式会社 | 買物用袋の製造方法及び買物用袋 |
Families Citing this family (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5124373B2 (ja) * | 2008-07-11 | 2013-01-23 | 株式会社日立製作所 | 電子デバイス,受光・発光デバイス、それを用いた電子集積回路および光集積回路 |
JP5155072B2 (ja) * | 2008-09-04 | 2013-02-27 | 日本電信電話株式会社 | 抵抗可変電子素子 |
JP5453045B2 (ja) * | 2008-11-26 | 2014-03-26 | 株式会社日立製作所 | グラフェン層が成長された基板およびそれを用いた電子・光集積回路装置 |
JP5462737B2 (ja) * | 2010-01-21 | 2014-04-02 | 株式会社日立製作所 | グラフェン膜が成長された基板およびそれを用いた電子・光集積回路装置 |
JP4967034B2 (ja) * | 2010-01-27 | 2012-07-04 | 株式会社日立製作所 | グラフェン膜と金属電極とが電気的接合した回路装置 |
JP5407921B2 (ja) * | 2010-02-19 | 2014-02-05 | 富士電機株式会社 | グラフェン膜の製造方法 |
JP5904734B2 (ja) | 2010-09-16 | 2016-04-20 | 三星電子株式会社Samsung Electronics Co.,Ltd. | グラフェン発光素子及びその製造方法 |
JP5629570B2 (ja) * | 2010-12-27 | 2014-11-19 | 株式会社日立製作所 | グラフェン膜と金属電極とが電気的接合した回路装置 |
JP5462219B2 (ja) * | 2011-05-25 | 2014-04-02 | 株式会社日立製作所 | グラフェンセンサ、該センサを利用した物質種分析装置および該センサを利用した物質種検知方法 |
US8610989B2 (en) | 2011-10-31 | 2013-12-17 | International Business Machines Corporation | Optoelectronic device employing a microcavity including a two-dimensional carbon lattice structure |
KR101771427B1 (ko) | 2011-11-02 | 2017-09-05 | 삼성전자주식회사 | 도파로 일체형 그래핀 광검출기 |
JP6155012B2 (ja) * | 2011-11-14 | 2017-06-28 | 学校法人慶應義塾 | グラフェン、多層グラフェン又はグラファイトを用いた発光素子、光源及びフォトカプラ |
KR101878741B1 (ko) | 2012-01-26 | 2018-07-16 | 삼성전자주식회사 | 트랜지스터 및 그 제조방법 |
DE102012203672B4 (de) * | 2012-03-08 | 2018-03-15 | Osram Oled Gmbh | Optoelektronisches Bauelement |
KR101532311B1 (ko) | 2012-04-27 | 2015-06-29 | 삼성전자주식회사 | 그래핀을 이용한 광검출기와 그 제조방법 |
US9174413B2 (en) * | 2012-06-14 | 2015-11-03 | International Business Machines Corporation | Graphene based structures and methods for shielding electromagnetic radiation |
US9413075B2 (en) | 2012-06-14 | 2016-08-09 | Globalfoundries Inc. | Graphene based structures and methods for broadband electromagnetic radiation absorption at the microwave and terahertz frequencies |
JP6031948B2 (ja) * | 2012-10-31 | 2016-11-24 | 株式会社デンソー | 半導体素子の製造方法 |
US9688540B2 (en) * | 2013-01-15 | 2017-06-27 | Solan, LLC | Segmented graphene growth on surfaces of a patterned substrate layer and devices thereof |
US20140272308A1 (en) * | 2013-03-15 | 2014-09-18 | Solan, LLC | Graphite-Based Devices Incorporating A Graphene Layer With A Bending Angle |
CN103227250A (zh) * | 2013-05-07 | 2013-07-31 | 中国科学院半导体研究所 | 柔性透明导电层互联的阵列式led器件制作方法 |
JP6281383B2 (ja) * | 2014-04-02 | 2018-02-21 | 株式会社デンソー | 半導体素子 |
JP6461523B2 (ja) * | 2014-09-05 | 2019-01-30 | 住友電気工業株式会社 | 半導体装置 |
KR102250190B1 (ko) | 2014-10-31 | 2021-05-10 | 삼성전자주식회사 | 나노버블을 가진 그래핀 구조체 및 그 제조방법 |
EP3243366B1 (en) * | 2014-12-10 | 2023-11-15 | NeoGraf Solutions, LLC | Flexible graphite sheet support structure and thermal management arrangement |
US9337392B1 (en) * | 2015-05-01 | 2016-05-10 | The United States Of America As Represented By The Secretary Of The Navy | Nanoscale solid state graphene terahertz emitter |
US9899547B2 (en) | 2016-04-25 | 2018-02-20 | International Business Machines Corporation | Multi-wavelength detector array incorporating two dimensional and one dimensional materials |
US10374106B2 (en) | 2017-04-13 | 2019-08-06 | Globalfoundaries Inc. | Integrated graphene detectors with waveguides |
JP6774452B2 (ja) * | 2018-03-22 | 2020-10-21 | 株式会社東芝 | グラフェン含有構造体、半導体装置、およびグラフェン含有構造体の製造方法 |
US10903396B1 (en) | 2019-08-20 | 2021-01-26 | International Business Machines Corporation | Layered material based quantum light emitting device |
CN111725302A (zh) * | 2020-06-22 | 2020-09-29 | 西安电子科技大学 | 基于图形化衬底的石墨烯晶体管及制备方法 |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4483152B2 (ja) * | 2001-11-27 | 2010-06-16 | 富士ゼロックス株式会社 | 中空グラフェンシート構造体及び電極構造体とそれら製造方法並びにデバイス |
US7071258B1 (en) * | 2002-10-21 | 2006-07-04 | Nanotek Instruments, Inc. | Nano-scaled graphene plates |
EP1636829B1 (en) * | 2003-06-12 | 2016-11-23 | Georgia Tech Research Corporation | Patterned thin film graphite devices |
US7345296B2 (en) * | 2004-09-16 | 2008-03-18 | Atomate Corporation | Nanotube transistor and rectifying devices |
US7566410B2 (en) * | 2006-01-11 | 2009-07-28 | Nanotek Instruments, Inc. | Highly conductive nano-scaled graphene plate nanocomposites |
US7449133B2 (en) * | 2006-06-13 | 2008-11-11 | Unidym, Inc. | Graphene film as transparent and electrically conducting material |
KR101443215B1 (ko) * | 2007-06-13 | 2014-09-24 | 삼성전자주식회사 | 앰비폴라 물질을 이용한 전계효과 트랜지스터 및 논리회로 |
US7732859B2 (en) * | 2007-07-16 | 2010-06-08 | International Business Machines Corporation | Graphene-based transistor |
WO2009015287A2 (en) * | 2007-07-25 | 2009-01-29 | California Institute Of Technology | Functional anchors connecting graphene-like carbon to metal |
US7790242B1 (en) * | 2007-10-09 | 2010-09-07 | University Of Louisville Research Foundation, Inc. | Method for electrostatic deposition of graphene on a substrate |
US7781061B2 (en) * | 2007-12-31 | 2010-08-24 | Alcatel-Lucent Usa Inc. | Devices with graphene layers |
JP5124373B2 (ja) * | 2008-07-11 | 2013-01-23 | 株式会社日立製作所 | 電子デバイス,受光・発光デバイス、それを用いた電子集積回路および光集積回路 |
US7993986B2 (en) * | 2008-08-29 | 2011-08-09 | Advanced Micro Devices, Inc. | Sidewall graphene devices for 3-D electronics |
US8487296B2 (en) * | 2008-11-26 | 2013-07-16 | New Jersey Institute Of Technology | Graphene deposition and graphenated substrates |
US8915151B2 (en) * | 2009-06-05 | 2014-12-23 | Sungkyunkwan University Foundation For Corporate Collaboration | Active skin for conformable tactile interface |
US8105928B2 (en) * | 2009-11-04 | 2012-01-31 | International Business Machines Corporation | Graphene based switching device having a tunable bandgap |
KR101157105B1 (ko) * | 2011-02-14 | 2012-06-22 | 동국대학교 산학협력단 | 그라핀 옥사이드의 저항 스위칭 특성을 이용한 비휘발성 메모리 소자 및 이의 제조 방법 |
-
2008
- 2008-07-11 JP JP2008180863A patent/JP5124373B2/ja not_active Expired - Fee Related
-
2009
- 2009-05-26 US US13/003,323 patent/US8507893B2/en not_active Expired - Fee Related
- 2009-05-26 WO PCT/JP2009/002305 patent/WO2010004681A1/ja active Application Filing
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7217546B2 (ja) | 2021-01-18 | 2023-02-03 | 原田織物株式会社 | 買物用袋の製造方法及び買物用袋 |
Also Published As
Publication number | Publication date |
---|---|
US8507893B2 (en) | 2013-08-13 |
JP2010021377A (ja) | 2010-01-28 |
WO2010004681A1 (ja) | 2010-01-14 |
US20110108805A1 (en) | 2011-05-12 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5124373B2 (ja) | 電子デバイス,受光・発光デバイス、それを用いた電子集積回路および光集積回路 | |
Kang et al. | Inking elastomeric stamps with micro‐patterned, single layer graphene to create high‐performance OFETs | |
KR101357060B1 (ko) | 그래핀막의 제조 방법, 전자 소자의 제조 방법, 및 기판에의 그래핀막의 전사 방법 | |
TWI588285B (zh) | 在基板上成長碳薄膜或無機材料薄膜的方法 | |
Jang et al. | Graphene‐based flexible and stretchable electronics | |
Xu et al. | Recent progress in fabrication techniques of graphene nanoribbons | |
Jiao et al. | Aligned graphene nanoribbons and crossbars from unzipped carbon nanotubes | |
Kedzierski et al. | Graphene-on-insulator transistors made using C on Ni chemical-vapor deposition | |
Lin et al. | Heterogeneous graphene nanostructures: ZnO nanostructures grown on large‐area graphene layers | |
JP5763302B2 (ja) | グラフェンの製造方法 | |
KR101603771B1 (ko) | 2차원 시트 물질을 이용한 전자 소자 및 그 제조 방법 | |
KR101919424B1 (ko) | 트랜지스터 및 그 제조방법 | |
US9299940B2 (en) | Carbon nanotube network thin-film transistors on flexible/stretchable substrates | |
TW200836353A (en) | Controlled buckling structures in semiconductor interconnects and nanomembranes for stretchable electronics | |
US8274072B2 (en) | Ultrathin spacer formation for carbon-based FET | |
US20110133284A1 (en) | Multiple carbon nanotube transfer and its applications for making high-performance carbon nanotube field-effect transistor (cnfet), transparent electrodes, and three-dimensional integration of cnfets | |
JP5973390B2 (ja) | グラフェン製造方法 | |
TWI526559B (zh) | 藉由物理氣相沉積法在基板上成長碳薄膜或無機材料薄膜的方法 | |
US8673693B2 (en) | Methods for forming materials using micro-heaters and electronic devices including such materials | |
JP6754355B2 (ja) | グラフェンおよび電子素子ならびにこれらの製造方法 | |
KR102037469B1 (ko) | 그래핀 전자 소자 및 그 제조 방법 | |
Zhu et al. | Direct transfer of graphene and application in low-voltage hybrid transistors | |
ES2848704T3 (es) | Grafeno dopado | |
KR20140110431A (ko) | 그래핀 산화물의 국소환원을 이용한 탄소기반 전자소자 및 이의 제조방법 | |
KR20110014847A (ko) | 그라핀 제조방법 및 그라핀층을 포함하는 적층구조물 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20100325 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20121002 |
|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20121029 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20151102 Year of fee payment: 3 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20151102 Year of fee payment: 3 |
|
LAPS | Cancellation because of no payment of annual fees |