JP5073314B2 - 顕微測定装置 - Google Patents
顕微測定装置 Download PDFInfo
- Publication number
- JP5073314B2 JP5073314B2 JP2007045800A JP2007045800A JP5073314B2 JP 5073314 B2 JP5073314 B2 JP 5073314B2 JP 2007045800 A JP2007045800 A JP 2007045800A JP 2007045800 A JP2007045800 A JP 2007045800A JP 5073314 B2 JP5073314 B2 JP 5073314B2
- Authority
- JP
- Japan
- Prior art keywords
- lens
- intermediate lens
- moving mechanism
- detector
- half mirror
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/04—Measuring microscopes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Optics & Photonics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Microscoopes, Condenser (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007045800A JP5073314B2 (ja) | 2007-02-26 | 2007-02-26 | 顕微測定装置 |
TW097105533A TW200848836A (en) | 2007-02-26 | 2008-02-18 | Microscopic measurement apparatus |
KR1020080016579A KR20080079203A (ko) | 2007-02-26 | 2008-02-25 | 현미 측정 장치 |
CNA2008100810836A CN101256113A (zh) | 2007-02-26 | 2008-02-26 | 显微测量装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007045800A JP5073314B2 (ja) | 2007-02-26 | 2007-02-26 | 顕微測定装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2008209627A JP2008209627A (ja) | 2008-09-11 |
JP2008209627A5 JP2008209627A5 (zh) | 2010-02-25 |
JP5073314B2 true JP5073314B2 (ja) | 2012-11-14 |
Family
ID=39785994
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007045800A Expired - Fee Related JP5073314B2 (ja) | 2007-02-26 | 2007-02-26 | 顕微測定装置 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP5073314B2 (zh) |
KR (1) | KR20080079203A (zh) |
CN (1) | CN101256113A (zh) |
TW (1) | TW200848836A (zh) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012052921A (ja) | 2010-09-01 | 2012-03-15 | Olympus Corp | 撮像システム |
JP2012073285A (ja) | 2010-09-27 | 2012-04-12 | Olympus Corp | 撮像方法および顕微鏡装置 |
JP6071177B2 (ja) * | 2010-10-29 | 2017-02-01 | キヤノン株式会社 | 顕微鏡、画像取得装置及び画像取得システム |
KR20130083453A (ko) * | 2010-10-29 | 2013-07-22 | 캐논 가부시끼가이샤 | 현미경, 화상 취득 장치 및 화상 취득 시스템 |
CN102353333B (zh) * | 2011-06-29 | 2013-08-14 | 安徽电气工程职业技术学院 | 一种大量程高精度微纳米扫描探头 |
CN102243385A (zh) * | 2011-07-14 | 2011-11-16 | 武汉全真光电科技有限公司 | 测量硅基液晶成像芯片光电特性曲线的装置 |
CN103353388B (zh) * | 2013-05-15 | 2016-04-06 | 西安交通大学 | 一种具摄像功能的双目体式显微成像系统标定方法及装置 |
CN105659142B (zh) * | 2013-07-29 | 2018-08-31 | 生物辐射实验室股份有限公司 | 机械变焦成像装置 |
CN103616754B (zh) * | 2013-12-18 | 2016-05-04 | 东莞市通德光电科技有限公司 | 倍率恒定的双目镜头 |
CN114518217B (zh) * | 2021-12-31 | 2024-03-26 | 深圳市瑞图生物技术有限公司 | 镜头间中心距离确定方法、显微镜控制设备及存储介质 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10123425A (ja) * | 1996-10-22 | 1998-05-15 | Nikon Corp | ズーム機能付き蛍光顕微鏡 |
JP2002031758A (ja) * | 2000-07-17 | 2002-01-31 | Olympus Optical Co Ltd | 顕微鏡 |
JP2006267935A (ja) * | 2005-03-25 | 2006-10-05 | Moritex Corp | 共焦点顕微鏡 |
-
2007
- 2007-02-26 JP JP2007045800A patent/JP5073314B2/ja not_active Expired - Fee Related
-
2008
- 2008-02-18 TW TW097105533A patent/TW200848836A/zh unknown
- 2008-02-25 KR KR1020080016579A patent/KR20080079203A/ko not_active Application Discontinuation
- 2008-02-26 CN CNA2008100810836A patent/CN101256113A/zh active Pending
Also Published As
Publication number | Publication date |
---|---|
TW200848836A (en) | 2008-12-16 |
CN101256113A (zh) | 2008-09-03 |
KR20080079203A (ko) | 2008-08-29 |
JP2008209627A (ja) | 2008-09-11 |
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