JP5073314B2 - 顕微測定装置 - Google Patents

顕微測定装置 Download PDF

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Publication number
JP5073314B2
JP5073314B2 JP2007045800A JP2007045800A JP5073314B2 JP 5073314 B2 JP5073314 B2 JP 5073314B2 JP 2007045800 A JP2007045800 A JP 2007045800A JP 2007045800 A JP2007045800 A JP 2007045800A JP 5073314 B2 JP5073314 B2 JP 5073314B2
Authority
JP
Japan
Prior art keywords
lens
intermediate lens
moving mechanism
detector
half mirror
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2007045800A
Other languages
English (en)
Japanese (ja)
Other versions
JP2008209627A (ja
JP2008209627A5 (zh
Inventor
雅也 瀧沢
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Otsuka Electronics Co Ltd
Original Assignee
Otsuka Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Otsuka Electronics Co Ltd filed Critical Otsuka Electronics Co Ltd
Priority to JP2007045800A priority Critical patent/JP5073314B2/ja
Priority to TW097105533A priority patent/TW200848836A/zh
Priority to KR1020080016579A priority patent/KR20080079203A/ko
Priority to CNA2008100810836A priority patent/CN101256113A/zh
Publication of JP2008209627A publication Critical patent/JP2008209627A/ja
Publication of JP2008209627A5 publication Critical patent/JP2008209627A5/ja
Application granted granted Critical
Publication of JP5073314B2 publication Critical patent/JP5073314B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/04Measuring microscopes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2007045800A 2007-02-26 2007-02-26 顕微測定装置 Expired - Fee Related JP5073314B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2007045800A JP5073314B2 (ja) 2007-02-26 2007-02-26 顕微測定装置
TW097105533A TW200848836A (en) 2007-02-26 2008-02-18 Microscopic measurement apparatus
KR1020080016579A KR20080079203A (ko) 2007-02-26 2008-02-25 현미 측정 장치
CNA2008100810836A CN101256113A (zh) 2007-02-26 2008-02-26 显微测量装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007045800A JP5073314B2 (ja) 2007-02-26 2007-02-26 顕微測定装置

Publications (3)

Publication Number Publication Date
JP2008209627A JP2008209627A (ja) 2008-09-11
JP2008209627A5 JP2008209627A5 (zh) 2010-02-25
JP5073314B2 true JP5073314B2 (ja) 2012-11-14

Family

ID=39785994

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007045800A Expired - Fee Related JP5073314B2 (ja) 2007-02-26 2007-02-26 顕微測定装置

Country Status (4)

Country Link
JP (1) JP5073314B2 (zh)
KR (1) KR20080079203A (zh)
CN (1) CN101256113A (zh)
TW (1) TW200848836A (zh)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012052921A (ja) 2010-09-01 2012-03-15 Olympus Corp 撮像システム
JP2012073285A (ja) 2010-09-27 2012-04-12 Olympus Corp 撮像方法および顕微鏡装置
JP6071177B2 (ja) * 2010-10-29 2017-02-01 キヤノン株式会社 顕微鏡、画像取得装置及び画像取得システム
KR20130083453A (ko) * 2010-10-29 2013-07-22 캐논 가부시끼가이샤 현미경, 화상 취득 장치 및 화상 취득 시스템
CN102353333B (zh) * 2011-06-29 2013-08-14 安徽电气工程职业技术学院 一种大量程高精度微纳米扫描探头
CN102243385A (zh) * 2011-07-14 2011-11-16 武汉全真光电科技有限公司 测量硅基液晶成像芯片光电特性曲线的装置
CN103353388B (zh) * 2013-05-15 2016-04-06 西安交通大学 一种具摄像功能的双目体式显微成像系统标定方法及装置
CN105659142B (zh) * 2013-07-29 2018-08-31 生物辐射实验室股份有限公司 机械变焦成像装置
CN103616754B (zh) * 2013-12-18 2016-05-04 东莞市通德光电科技有限公司 倍率恒定的双目镜头
CN114518217B (zh) * 2021-12-31 2024-03-26 深圳市瑞图生物技术有限公司 镜头间中心距离确定方法、显微镜控制设备及存储介质

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10123425A (ja) * 1996-10-22 1998-05-15 Nikon Corp ズーム機能付き蛍光顕微鏡
JP2002031758A (ja) * 2000-07-17 2002-01-31 Olympus Optical Co Ltd 顕微鏡
JP2006267935A (ja) * 2005-03-25 2006-10-05 Moritex Corp 共焦点顕微鏡

Also Published As

Publication number Publication date
TW200848836A (en) 2008-12-16
CN101256113A (zh) 2008-09-03
KR20080079203A (ko) 2008-08-29
JP2008209627A (ja) 2008-09-11

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