JP5052502B2 - ロードセル - Google Patents
ロードセル Download PDFInfo
- Publication number
- JP5052502B2 JP5052502B2 JP2008504565A JP2008504565A JP5052502B2 JP 5052502 B2 JP5052502 B2 JP 5052502B2 JP 2008504565 A JP2008504565 A JP 2008504565A JP 2008504565 A JP2008504565 A JP 2008504565A JP 5052502 B2 JP5052502 B2 JP 5052502B2
- Authority
- JP
- Japan
- Prior art keywords
- strain
- load cell
- strain generating
- thickness
- adjusted
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
- G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
- G01L1/2206—Special supports with preselected places to mount the resistance strain gauges; Mounting of supports
- G01L1/2243—Special supports with preselected places to mount the resistance strain gauges; Mounting of supports the supports being parallelogram-shaped
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
- G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
- G01L1/2287—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges constructional details of the strain gauges
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Force In General (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Description
2 起歪体
3,3A〜3D,3AA〜3DD 歪み発生部
4,4A〜4D 歪み検出素子
7A,7B 反転部
8 直線部
9,9A〜9D 切削部
Claims (7)
- 歪み発生部が設けられた起歪体と、
前記歪み発生部に対応する箇所の前記起歪体の表面に設けられ、反転部と直線部とを有する歪み検出素子と
を備え、
前記反転部に対応する箇所の前記歪み発生部の肉厚によってクリープ特性が調整されている、ロードセル。 - 前記直線部に対応する箇所の前記歪み発生部の肉厚によって出力値のレベルが調整されている、請求項1に記載のロードセル。
- 前記歪み発生部の肉厚が、前記反転部に対応する箇所と前記直線部に対応する箇所とで互いに異なる、請求項1に記載のロードセル。
- 前記歪み検出素子は、前記直線部を挟んで二つの前記反転部を有しており、
クリープ特性を調整するための前記歪み発生部の肉厚の調整は、前記二つの反転部のうちの一方のみに対して行われている、請求項1に記載のロードセル。 - 前記起歪体には前記歪み発生部が複数設けられており、
複数の前記歪み発生部には、前記反転部に対応する箇所の肉厚が互いに異なる少なくとも二つの歪み発生部が含まれる、請求項1に記載のロードセル。 - 前記歪み発生部の内面に切削部が設けられることによって、前記反転部に対応する箇所の前記歪み発生部の肉厚が調整されている、請求項1に記載のロードセル。
- 前記切削部は、前記起歪体の板厚方向に関して対称となるように設けられている、請求項6に記載のロードセル。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008504565A JP5052502B2 (ja) | 2007-02-02 | 2008-01-28 | ロードセル |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007023643 | 2007-02-02 | ||
JP2007023643 | 2007-02-02 | ||
JP2008504565A JP5052502B2 (ja) | 2007-02-02 | 2008-01-28 | ロードセル |
PCT/JP2008/000096 WO2008099577A1 (ja) | 2007-02-02 | 2008-01-28 | ロードセル |
Publications (2)
Publication Number | Publication Date |
---|---|
JPWO2008099577A1 JPWO2008099577A1 (ja) | 2010-05-27 |
JP5052502B2 true JP5052502B2 (ja) | 2012-10-17 |
Family
ID=39689826
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008504565A Expired - Fee Related JP5052502B2 (ja) | 2007-02-02 | 2008-01-28 | ロードセル |
Country Status (5)
Country | Link |
---|---|
US (1) | US7961074B2 (ja) |
EP (1) | EP1992929A1 (ja) |
JP (1) | JP5052502B2 (ja) |
CN (1) | CN101542256B (ja) |
WO (1) | WO2008099577A1 (ja) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9544911B2 (en) | 2007-08-10 | 2017-01-10 | Futurewei Technologies, Inc. | System and method for assigning communications resources in a wireless communications system |
TWI452261B (zh) * | 2009-07-28 | 2014-09-11 | Vishay Prec Group Inc | 轉換器、溫度補償轉換器、和製造轉換器之方法 |
CN112668091B (zh) * | 2020-12-04 | 2022-04-19 | 中国航空工业集团公司成都飞机设计研究所 | 一种用于载荷分布反演的应变测量位置优选方法 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6196421A (ja) * | 1984-10-17 | 1986-05-15 | Tokyo Electric Co Ltd | ロ−ドセル秤のビ−ム体 |
JPS6379027A (ja) * | 1986-09-22 | 1988-04-09 | Tokyo Electric Co Ltd | ロ−ドセル |
JPH01132902A (ja) * | 1987-10-15 | 1989-05-25 | Commiss Energ Atom | クリープの補償可能な歪ゲージ及びそのような歪ゲージを得る方法 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5306873A (en) * | 1990-09-26 | 1994-04-26 | Ishida Scales Mfg. Co., Ltd. | Load cell with strain gauges having low temperature dependent coefficient of resistance |
JPH0581672U (ja) * | 1992-04-10 | 1993-11-05 | 大和製衡株式会社 | ロードセル |
CN2247331Y (zh) * | 1995-09-13 | 1997-02-12 | 中国科学院合肥智能机械研究所 | 应变式厚膜力传感器 |
JP3998046B2 (ja) | 1997-08-22 | 2007-10-24 | 株式会社イシダ | ロードセルの製造方法およびロードセル |
JP2001343294A (ja) * | 2000-05-31 | 2001-12-14 | Ishida Co Ltd | ロードセル及び秤 |
US6810753B2 (en) * | 2000-08-29 | 2004-11-02 | The Cleveland Clinic Foundation | Displacement transducer |
JP4337595B2 (ja) * | 2004-03-25 | 2009-09-30 | 株式会社島津製作所 | ロードセル |
-
2008
- 2008-01-28 US US12/095,180 patent/US7961074B2/en not_active Expired - Fee Related
- 2008-01-28 WO PCT/JP2008/000096 patent/WO2008099577A1/ja active Application Filing
- 2008-01-28 JP JP2008504565A patent/JP5052502B2/ja not_active Expired - Fee Related
- 2008-01-28 EP EP08710300A patent/EP1992929A1/en not_active Withdrawn
- 2008-01-28 CN CN2008800002917A patent/CN101542256B/zh not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6196421A (ja) * | 1984-10-17 | 1986-05-15 | Tokyo Electric Co Ltd | ロ−ドセル秤のビ−ム体 |
JPS6379027A (ja) * | 1986-09-22 | 1988-04-09 | Tokyo Electric Co Ltd | ロ−ドセル |
JPH01132902A (ja) * | 1987-10-15 | 1989-05-25 | Commiss Energ Atom | クリープの補償可能な歪ゲージ及びそのような歪ゲージを得る方法 |
Also Published As
Publication number | Publication date |
---|---|
US20100148916A1 (en) | 2010-06-17 |
CN101542256A (zh) | 2009-09-23 |
WO2008099577A1 (ja) | 2008-08-21 |
JPWO2008099577A1 (ja) | 2010-05-27 |
US7961074B2 (en) | 2011-06-14 |
EP1992929A1 (en) | 2008-11-19 |
CN101542256B (zh) | 2011-08-17 |
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