WO2008099577A1 - ロードセル - Google Patents

ロードセル Download PDF

Info

Publication number
WO2008099577A1
WO2008099577A1 PCT/JP2008/000096 JP2008000096W WO2008099577A1 WO 2008099577 A1 WO2008099577 A1 WO 2008099577A1 JP 2008000096 W JP2008000096 W JP 2008000096W WO 2008099577 A1 WO2008099577 A1 WO 2008099577A1
Authority
WO
WIPO (PCT)
Prior art keywords
distortion
load cell
generating part
position corresponding
creep characteristics
Prior art date
Application number
PCT/JP2008/000096
Other languages
English (en)
French (fr)
Inventor
Shoko Tajiri
Shinji Takeichi
Hiroki Fujioka
Kazuteru Oda
Original Assignee
Ishida Co., Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ishida Co., Ltd. filed Critical Ishida Co., Ltd.
Priority to EP08710300A priority Critical patent/EP1992929A1/en
Priority to US12/095,180 priority patent/US7961074B2/en
Priority to JP2008504565A priority patent/JP5052502B2/ja
Priority to CN2008800002917A priority patent/CN101542256B/zh
Publication of WO2008099577A1 publication Critical patent/WO2008099577A1/ja

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/2206—Special supports with preselected places to mount the resistance strain gauges; Mounting of supports
    • G01L1/2243—Special supports with preselected places to mount the resistance strain gauges; Mounting of supports the supports being parallelogram-shaped
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/2287—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges constructional details of the strain gauges

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Force In General (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)

Abstract

　クリープ特性の調整をタブ比の変更以外の手法によって実現することが可能なロードセルを得る。ロードセル（１）は、歪み発生部（３）が設けられた起歪体（２）と、歪み発生部（３）に対応する箇所の起歪体（２）の表面に設けられ、反転部（７）と直線部（８）とを有する歪み検出素子（４）とを備えており、反転部（７）に対応する箇所の歪み発生部（３）の肉厚によってクリープ特性が調整されている。
PCT/JP2008/000096 2007-02-02 2008-01-28 ロードセル WO2008099577A1 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
EP08710300A EP1992929A1 (en) 2007-02-02 2008-01-28 Load cell
US12/095,180 US7961074B2 (en) 2007-02-02 2008-01-28 Load cell
JP2008504565A JP5052502B2 (ja) 2007-02-02 2008-01-28 ロードセル
CN2008800002917A CN101542256B (zh) 2007-02-02 2008-01-28 负载传感器

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007-023643 2007-02-02
JP2007023643 2007-02-02

Publications (1)

Publication Number Publication Date
WO2008099577A1 true WO2008099577A1 (ja) 2008-08-21

Family

ID=39689826

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/000096 WO2008099577A1 (ja) 2007-02-02 2008-01-28 ロードセル

Country Status (5)

Country Link
US (1) US7961074B2 (ja)
EP (1) EP1992929A1 (ja)
JP (1) JP5052502B2 (ja)
CN (1) CN101542256B (ja)
WO (1) WO2008099577A1 (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013501221A (ja) * 2009-07-28 2013-01-10 ヴィシャイ プレシジョン グループ，インコーポレイテッド ゆがみゲージを利用した変換器における回路補償
US9544911B2 (en) 2007-08-10 2017-01-10 Futurewei Technologies, Inc. System and method for assigning communications resources in a wireless communications system
CN112668091A (zh) * 2020-12-04 2021-04-16 中国航空工业集团公司成都飞机设计研究所 一种用于载荷分布反演的应变测量位置优选方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6196421A (ja) * 1984-10-17 1986-05-15 Tokyo Electric Co Ltd ロ−ドセル秤のビ−ム体
JPS6379027A (ja) * 1986-09-22 1988-04-09 Tokyo Electric Co Ltd ロ−ドセル
JPH01132902A (ja) * 1987-10-15 1989-05-25 Commiss Energ Atom クリープの補償可能な歪ゲージ及びそのような歪ゲージを得る方法
JPH0581672U (ja) * 1992-04-10 1993-11-05 大和製衡株式会社 ロードセル

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5306873A (en) * 1990-09-26 1994-04-26 Ishida Scales Mfg. Co., Ltd. Load cell with strain gauges having low temperature dependent coefficient of resistance
CN2247331Y (zh) * 1995-09-13 1997-02-12 中国科学院合肥智能机械研究所 应变式厚膜力传感器
JP3998046B2 (ja) 1997-08-22 2007-10-24 株式会社イシダ ロードセルの製造方法およびロードセル
JP2001343294A (ja) * 2000-05-31 2001-12-14 Ishida Co Ltd ロードセル及び秤
US6810753B2 (en) * 2000-08-29 2004-11-02 The Cleveland Clinic Foundation Displacement transducer
JP4337595B2 (ja) * 2004-03-25 2009-09-30 株式会社島津製作所 ロードセル

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6196421A (ja) * 1984-10-17 1986-05-15 Tokyo Electric Co Ltd ロ−ドセル秤のビ−ム体
JPS6379027A (ja) * 1986-09-22 1988-04-09 Tokyo Electric Co Ltd ロ−ドセル
JPH01132902A (ja) * 1987-10-15 1989-05-25 Commiss Energ Atom クリープの補償可能な歪ゲージ及びそのような歪ゲージを得る方法
JPH0581672U (ja) * 1992-04-10 1993-11-05 大和製衡株式会社 ロードセル

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9544911B2 (en) 2007-08-10 2017-01-10 Futurewei Technologies, Inc. System and method for assigning communications resources in a wireless communications system
JP2013501221A (ja) * 2009-07-28 2013-01-10 ヴィシャイ プレシジョン グループ，インコーポレイテッド ゆがみゲージを利用した変換器における回路補償
CN112668091A (zh) * 2020-12-04 2021-04-16 中国航空工业集团公司成都飞机设计研究所 一种用于载荷分布反演的应变测量位置优选方法
CN112668091B (zh) * 2020-12-04 2022-04-19 中国航空工业集团公司成都飞机设计研究所 一种用于载荷分布反演的应变测量位置优选方法

Also Published As

Publication number Publication date
US20100148916A1 (en) 2010-06-17
JPWO2008099577A1 (ja) 2010-05-27
EP1992929A1 (en) 2008-11-19
CN101542256A (zh) 2009-09-23
JP5052502B2 (ja) 2012-10-17
CN101542256B (zh) 2011-08-17
US7961074B2 (en) 2011-06-14

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