JP2013501221A - ゆがみゲージを利用した変換器における回路補償 - Google Patents
ゆがみゲージを利用した変換器における回路補償 Download PDFInfo
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- JP2013501221A JP2013501221A JP2012522995A JP2012522995A JP2013501221A JP 2013501221 A JP2013501221 A JP 2013501221A JP 2012522995 A JP2012522995 A JP 2012522995A JP 2012522995 A JP2012522995 A JP 2012522995A JP 2013501221 A JP2013501221 A JP 2013501221A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
- G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
- G01L1/2206—Special supports with preselected places to mount the resistance strain gauges; Mounting of supports
- G01L1/2243—Special supports with preselected places to mount the resistance strain gauges; Mounting of supports the supports being parallelogram-shaped
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/045—Correction of measurements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/16—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge
- G01B7/18—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge using change in resistance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
- G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
- G01L1/225—Measuring circuits therefor
- G01L1/2262—Measuring circuits therefor involving simple electrical bridges
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
- G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
- G01L1/2268—Arrangements for correcting or for compensating unwanted effects
- G01L1/2281—Arrangements for correcting or for compensating unwanted effects for temperature variations
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49007—Indicating transducer
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Force In General (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Abstract
【選択図】図8b
Description
L1、L2、L3、L4:電気的接続部分
Claims (7)
- それぞれ正および負の張力ゆがみおよび圧縮ゆがみを与える所定の物理的荷重の作用を受ける反力部分、および
前記反力部分の張力ゆがみエリアおよび圧縮ゆがみエリアにおいて前記反力部分に動作可能に取り付けられ、電気信号を発生する複数のゆがみゲージグリッドを有し、
前記複数のゆがみゲージをホイートストーン・ブリッジ回路に電気的に接続し、クリープによる電気信号を相殺消去することを特徴とする変換器。
- それぞれ正および負の張力ゆがみおよび圧縮ゆがみを与える所定の物理的荷重の作用を受ける反力部分、および
張力ゆがみエリアおよび圧縮ゆがみエリアにおいて前記反力部分に動作可能に取り付けられ、所定の温度Tにおける前記反力部分の物理的変化を補償する複数のゆがみゲージグリッドを有し、かつ前記複数のゆがみゲージがT+/−200℃の温度範囲全体を通して電気信号を発生し、
前記複数のゆがみゲージをホイートストーン・ブリッジ回路に電気的に接続し、T+/−200℃の温度範囲全体を通してクリープによる電気信号を相殺消去することを特徴とする温度補償変換器。
- 物理的入力に対する表面ゆがみに反応する反力部分、
前記物理的入力が変化しなくとも変動する第1可変成分をもつ電気信号を発生する第1ゆがみゲージ構成体、および
前記物理的入力が変化しなくとも変動する第2可変成分をもつ電気信号を発生する第2ゆがみゲージ構成体を有し、
前記第1可変成分および前記第2可変成分が相互に相殺し合うことを特徴とする変換器。
- 物理的入力に対する物理的変化に反応する反力部分、
前記反力部分に連動し、前記物理的入力に変化がなくとも変動する第1可変成分をもつ電気信号を発生する第1ゆがみゲージ構成体、
前記反力部分に連動し、前記物理的入力に変化がなくとも変動する第2可変成分をもつ電気信号を発生する第2ゆがみゲージ構成体、および
前記第1および第2のゆがみゲージ構成体から前記電気信号を受信し、前記第1および第2のゆがみゲージ構成体からの前記電気信号の前記第1および第2の可変成分を相殺するホイートストーン・ブリッジ回路を有することを特徴とする変換器。
- それぞれ正および負の張力ゆがみおよび圧縮ゆがみを与える所定物理的荷重を支持する反力部分、および
所定の温度Tにおける前記反力部分の物理的変化が補償された張力ゆがみエリアおよび圧縮ゆがみエリアにおいて前記反力部分に動作可能に取り付けられる複数のゆがみゲージグリッドを有し、かつ前記複数のゆがみゲージがTを含む温度範囲全体を通してクリープ成分を有する電気信号を発生し、
前記複数のゆがみゲージをホイートストーン・ブリッジ回路に電気的に接続し、前記温度範囲全体を通してクリープによる電気信号を相殺消去することを特徴とする温度補償変換器。
- それぞれ正および負の張力ゆがみおよび圧縮ゆがみを与える所定の物理的荷重の作用を受ける反力部分を有する変換器を形成し、
前記反力部分の張力ゆがみエリアおよび圧縮ゆがみエリアにおいて前記反力部分に動作可能に複数のゆがみゲージグリッドを取り付け、電気信号を発生するように構成し、そして
前記複数のゆがみゲージをホイートストーン・ブリッジ回路に接続し、クリープによる電気信号を相殺消去するように構成することからなることを特徴とする変換器の製造方法。
- 張力ゆがみエリアおよび圧縮ゆがみエリアにおいて前記反力部分に動作可能に取り付けられ、所定の温度Tにおける前記反力部分の物理的変化を補償する複数のゆがみゲージグリッドを有し、かつ前記複数のゆがみゲージがT+/−200℃の温度範囲全体を通して電気信号を発生する請求項6に記載の製造方法。
Applications Claiming Priority (3)
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US22912309P | 2009-07-28 | 2009-07-28 | |
US61/229,123 | 2009-07-28 | ||
PCT/US2010/043520 WO2011017157A1 (en) | 2009-07-28 | 2010-07-28 | Circuit compensation in strain gage based transducers |
Publications (2)
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JP2013501221A true JP2013501221A (ja) | 2013-01-10 |
JP5571789B2 JP5571789B2 (ja) | 2014-08-13 |
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JP2012522995A Active JP5571789B2 (ja) | 2009-07-28 | 2010-07-28 | ゆがみゲージを利用した変換器における回路補償 |
Country Status (6)
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US (1) | US8161829B2 (ja) |
EP (1) | EP2459977B1 (ja) |
JP (1) | JP5571789B2 (ja) |
KR (1) | KR101505255B1 (ja) |
TW (1) | TWI452261B (ja) |
WO (1) | WO2011017157A1 (ja) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
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US9360383B2 (en) * | 2013-04-04 | 2016-06-07 | Nate J. Coleman and Aexius, LLC | System and method to measure force or location on an L-beam |
JP5243988B2 (ja) * | 2009-02-10 | 2013-07-24 | 本田技研工業株式会社 | 多軸力覚センサおよび加速度センサ |
WO2011017157A1 (en) * | 2009-07-28 | 2011-02-10 | Vishay Precision Group, Inc. | Circuit compensation in strain gage based transducers |
NL2016315B1 (en) * | 2016-02-24 | 2017-01-17 | Xyztec B V | Digital creep and drift correction. |
CN106403804B (zh) * | 2016-08-23 | 2019-10-08 | 上海交通大学 | 一种高温同步补偿薄膜应变计及其制备方法 |
CN108267076A (zh) * | 2016-12-30 | 2018-07-10 | 中国空气动力研究与发展中心超高速空气动力研究所 | 一种温度自补偿应变计 |
WO2018133054A1 (zh) * | 2017-01-21 | 2018-07-26 | 深圳纽迪瑞科技开发有限公司 | 压力感应式结构及电子产品 |
CN107329615B (zh) * | 2017-06-30 | 2020-06-16 | 上海天马微电子有限公司 | 显示面板及显示装置 |
CN109029236A (zh) * | 2018-07-25 | 2018-12-18 | 中铁第四勘察设计院集团有限公司 | 一种消除温度影响的工程结构机械应变测试方法及装置 |
US10919511B2 (en) * | 2018-12-20 | 2021-02-16 | Bendix Commercial Vehicle Systems Llc | System and method for determining status of a brake spring |
JP1669298S (ja) * | 2019-07-17 | 2020-10-05 | ||
JP1661600S (ja) * | 2019-07-17 | 2020-06-15 | ひずみゲージ |
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- 2010-07-28 WO PCT/US2010/043520 patent/WO2011017157A1/en active Application Filing
- 2010-07-28 US US12/844,999 patent/US8161829B2/en active Active
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- 2010-07-28 EP EP10739795.2A patent/EP2459977B1/en active Active
- 2010-07-28 TW TW099124940A patent/TWI452261B/zh active
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TWI452261B (zh) | 2014-09-11 |
US20110023630A1 (en) | 2011-02-03 |
EP2459977A1 (en) | 2012-06-06 |
KR101505255B1 (ko) | 2015-03-23 |
US8161829B2 (en) | 2012-04-24 |
KR20120043035A (ko) | 2012-05-03 |
TW201137308A (en) | 2011-11-01 |
EP2459977B1 (en) | 2018-06-13 |
WO2011017157A1 (en) | 2011-02-10 |
JP5571789B2 (ja) | 2014-08-13 |
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Free format text: JAPANESE INTERMEDIATE CODE: R250 |
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R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
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R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |