JP1661600S - ひずみゲージ - Google Patents

ひずみゲージ

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Publication number
JP1661600S
JP1661600S JP2019016076F JP2019016076F JP1661600S JP 1661600 S JP1661600 S JP 1661600S JP 2019016076 F JP2019016076 F JP 2019016076F JP 2019016076 F JP2019016076 F JP 2019016076F JP 1661600 S JP1661600 S JP 1661600S
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JP
Japan
Prior art keywords
strain
electrode tab
measured
electrical signal
electrically connecting
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Active
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JP2019016076F
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English (en)
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Publication date
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Priority to JP2019016076F priority Critical patent/JP1661600S/ja
Priority to US29/717,352 priority patent/USD953903S1/en
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Publication of JP1661600S publication Critical patent/JP1661600S/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Abstract

本物品は、例えば、金属、プラスチックなどの被測定物(起歪体)に貼り付けられ、外部からの荷重(力)やトルクによって生ずる当該起歪体の変化(ひずみ)を、グリッド抵抗によって電気抵抗の変化として電気信号に変換し、その電気信号を外部へ伝達するためのものである。「各部の名称を示す参考平面図」に示したように、意匠登録を受けようとする部分は、接続パターン部及び電極タブである。接続パターン部は、グリッド抵抗と電極タブを電気的に接続する機能を有する。電極タブは、本物品と外部機器を電気的に接続するための機能を有する。
JP2019016076F 2019-07-17 2019-07-17 ひずみゲージ Active JP1661600S (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2019016076F JP1661600S (ja) 2019-07-17 2019-07-17 ひずみゲージ
US29/717,352 USD953903S1 (en) 2019-07-17 2019-12-17 Strain gauge

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2019016076F JP1661600S (ja) 2019-07-17 2019-07-17 ひずみゲージ

Publications (1)

Publication Number Publication Date
JP1661600S true JP1661600S (ja) 2020-06-15

Family

ID=71078992

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2019016076F Active JP1661600S (ja) 2019-07-17 2019-07-17 ひずみゲージ

Country Status (2)

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US (1) USD953903S1 (ja)
JP (1) JP1661600S (ja)

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7461560B2 (en) * 2005-03-28 2008-12-09 Microstrain, Inc. Strain gauge with moisture barrier and self-testing circuit
US20060288795A1 (en) * 2005-06-27 2006-12-28 Vishay Measurements Group, Inc. Strain gage with off axis creep compensation feature
JP2007271285A (ja) * 2006-03-30 2007-10-18 Millenium Gate Technology Co Ltd ひずみゲージの製造方法
WO2011017157A1 (en) * 2009-07-28 2011-02-10 Vishay Precision Group, Inc. Circuit compensation in strain gage based transducers
US9933321B2 (en) * 2015-05-14 2018-04-03 Vishay Measurements Group, Inc. High gage factor strain gage
JP2017067764A (ja) * 2015-09-29 2017-04-06 ミネベアミツミ株式会社 ひずみゲージ、荷重センサ、及びひずみゲージの製造方法
JP1556899S (ja) * 2015-11-28 2016-08-22
JP1561634S (ja) 2016-01-29 2016-10-24
JP1593195S (ja) * 2017-02-14 2017-12-18
JP2019066313A (ja) * 2017-09-29 2019-04-25 ミネベアミツミ株式会社 ひずみゲージ
JP2019120555A (ja) * 2017-12-28 2019-07-22 ミネベアミツミ株式会社 ひずみゲージ、センサモジュール
JP1620042S (ja) * 2018-01-16 2018-12-10
JP1622664S (ja) * 2018-01-16 2019-01-21 ひずみゲージ
JP1620044S (ja) * 2018-01-16 2018-12-10
US20200088593A1 (en) * 2018-09-17 2020-03-19 Goodrich Corporation Additive manufactured strain gauge on component surfaces for predictive failure monitoring
US11137241B2 (en) * 2019-03-27 2021-10-05 Vishay Advanced Technologies, Ltd. Three dimensional strain gage
US20210190606A1 (en) * 2019-12-20 2021-06-24 Vishay Measurements Group, Inc. Strain gages and methods for manufacturing thereof

Also Published As

Publication number Publication date
USD953903S1 (en) 2022-06-07

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