JP5041627B2 - Ｅｌ表示装置、電子機器 - Google Patents

Ｅｌ表示装置、電子機器 Download PDF

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Publication number
JP5041627B2
JP5041627B2 JP2001140333A JP2001140333A JP5041627B2 JP 5041627 B2 JP5041627 B2 JP 5041627B2 JP 2001140333 A JP2001140333 A JP 2001140333A JP 2001140333 A JP2001140333 A JP 2001140333A JP 5041627 B2 JP5041627 B2 JP 5041627B2
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JP
Japan
Prior art keywords
display device
tft
pixel
transistor
source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
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JP2001140333A
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English (en)
Japanese (ja)
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JP2002032035A (ja
JP2002032035A5 (enrdf_load_stackoverflow
Inventor
潤 小山
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Semiconductor Energy Laboratory Co Ltd
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Semiconductor Energy Laboratory Co Ltd
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Application filed by Semiconductor Energy Laboratory Co Ltd filed Critical Semiconductor Energy Laboratory Co Ltd
Priority to JP2001140333A priority Critical patent/JP5041627B2/ja
Publication of JP2002032035A publication Critical patent/JP2002032035A/ja
Publication of JP2002032035A5 publication Critical patent/JP2002032035A5/ja
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Publication of JP5041627B2 publication Critical patent/JP5041627B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Electroluminescent Light Sources (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Control Of El Displays (AREA)
  • Thin Film Transistor (AREA)
JP2001140333A 2000-05-12 2001-05-10 Ｅｌ表示装置、電子機器 Expired - Lifetime JP5041627B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001140333A JP5041627B2 (ja) 2000-05-12 2001-05-10 Ｅｌ表示装置、電子機器

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2000-140751 2000-05-12
JP2000140751 2000-05-12
JP2000140751 2000-05-12
JP2001140333A JP5041627B2 (ja) 2000-05-12 2001-05-10 Ｅｌ表示装置、電子機器

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2011155440A Division JP5298167B2 (ja) 2000-05-12 2011-07-14 Ｅｌ表示装置

Publications (3)

Publication Number Publication Date
JP2002032035A JP2002032035A (ja) 2002-01-31
JP2002032035A5 JP2002032035A5 (enrdf_load_stackoverflow) 2008-05-22
JP5041627B2 true JP5041627B2 (ja) 2012-10-03

Family

ID=26591814

Family Applications (1)

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JP2001140333A Expired - Lifetime JP5041627B2 (ja) 2000-05-12 2001-05-10 Ｅｌ表示装置、電子機器

Country Status (1)

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JP (1) JP5041627B2 (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013228756A (ja) * 2000-05-12 2013-11-07 Semiconductor Energy Lab Co Ltd 表示装置

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3437152B2 (ja) 2000-07-28 2003-08-18 ウインテスト株式会社 有機ｅｌディスプレイの評価装置および評価方法
JP3701924B2 (ja) 2002-03-29 2005-10-05 インターナショナル・ビジネス・マシーンズ・コーポレーション Ｅｌアレイ基板の検査方法及びその検査装置
JP4653775B2 (ja) * 2002-04-26 2011-03-16 東芝モバイルディスプレイ株式会社 Ｅｌ表示装置の検査方法
JP3527726B2 (ja) 2002-05-21 2004-05-17 ウインテスト株式会社 アクティブマトリクス基板の検査方法及び検査装置
JP4112300B2 (ja) 2002-07-26 2008-07-02 株式会社半導体エネルギー研究所 電気的検査方法及び半導体表示装置の作製方法
JP2004294457A (ja) * 2002-12-16 2004-10-21 Agilent Technologies Japan Ltd アクティブマトリクス型の表示装置およびその検査方法
US7205986B2 (en) 2002-12-18 2007-04-17 Semiconductor Energy Laboratory Co., Ltd. Image display device and testing method of the same
WO2004086070A1 (ja) 2003-03-25 2004-10-07 Semiconductor Energy Laboratory Co. Ltd. 半導体装置の検査回路、および検査方法
JP3628014B1 (ja) 2003-09-19 2005-03-09 ウインテスト株式会社 表示装置及びそれに用いるアクティブマトリクス基板の検査方法及び装置
US7518602B2 (en) 2004-12-06 2009-04-14 Semiconductor Energy Laboratory Co., Ltd. Test circuit and display device having the same
JP4974517B2 (ja) * 2004-12-06 2012-07-11 株式会社半導体エネルギー研究所 検査回路
KR101433680B1 (ko) * 2005-12-02 2014-08-25 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치, 디스플레이 장치, 및 전자 장치
JP2008052111A (ja) * 2006-08-25 2008-03-06 Mitsubishi Electric Corp Ｔｆｔアレイ基板、その検査方法および表示装置
JP5224729B2 (ja) * 2007-06-14 2013-07-03 株式会社ジャパンディスプレイウェスト 表示装置、画素駆動方法
JP5218269B2 (ja) 2009-05-13 2013-06-26 ソニー株式会社 表示装置および駆動制御方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63246782A (ja) * 1987-04-01 1988-10-13 松下電器産業株式会社 液晶表示装置の欠陥検出方法
JP2728748B2 (ja) * 1989-10-30 1998-03-18 松下電子工業株式会社 画像表示装置およびその検査方法
US5684365A (en) * 1994-12-14 1997-11-04 Eastman Kodak Company TFT-el display panel using organic electroluminescent media
JPH1092201A (ja) * 1996-09-17 1998-04-10 Toshiba Corp 発光素子、発光素子駆動方法および発光素子アレイ
JP3413043B2 (ja) * 1997-02-13 2003-06-03 株式会社東芝 液晶表示装置
JPH11219133A (ja) * 1998-02-02 1999-08-10 Tdk Corp 画像表示装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013228756A (ja) * 2000-05-12 2013-11-07 Semiconductor Energy Lab Co Ltd 表示装置
JP2015148805A (ja) * 2000-05-12 2015-08-20 株式会社半導体エネルギー研究所 表示装置

Also Published As

Publication number Publication date
JP2002032035A (ja) 2002-01-31

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