JP5038094B2 - レーザー走査型顕微鏡 - Google Patents

レーザー走査型顕微鏡 Download PDF

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Publication number
JP5038094B2
JP5038094B2 JP2007282653A JP2007282653A JP5038094B2 JP 5038094 B2 JP5038094 B2 JP 5038094B2 JP 2007282653 A JP2007282653 A JP 2007282653A JP 2007282653 A JP2007282653 A JP 2007282653A JP 5038094 B2 JP5038094 B2 JP 5038094B2
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JP
Japan
Prior art keywords
light
infrared light
infrared
condenser lens
scanning microscope
Prior art date
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Expired - Fee Related
Application number
JP2007282653A
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English (en)
Japanese (ja)
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JP2009109788A5 (enExample
JP2009109788A (ja
Inventor
英司 横井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Corp
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Filing date
Publication date
Application filed by Olympus Corp filed Critical Olympus Corp
Priority to JP2007282653A priority Critical patent/JP5038094B2/ja
Priority to US12/250,680 priority patent/US7915575B2/en
Publication of JP2009109788A publication Critical patent/JP2009109788A/ja
Publication of JP2009109788A5 publication Critical patent/JP2009109788A5/ja
Application granted granted Critical
Publication of JP5038094B2 publication Critical patent/JP5038094B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP2007282653A 2007-10-31 2007-10-31 レーザー走査型顕微鏡 Expired - Fee Related JP5038094B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2007282653A JP5038094B2 (ja) 2007-10-31 2007-10-31 レーザー走査型顕微鏡
US12/250,680 US7915575B2 (en) 2007-10-31 2008-10-14 Laser scanning microscope having an IR partial transmission filter for realizing oblique illumination

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007282653A JP5038094B2 (ja) 2007-10-31 2007-10-31 レーザー走査型顕微鏡

Publications (3)

Publication Number Publication Date
JP2009109788A JP2009109788A (ja) 2009-05-21
JP2009109788A5 JP2009109788A5 (enExample) 2010-12-16
JP5038094B2 true JP5038094B2 (ja) 2012-10-03

Family

ID=40581626

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007282653A Expired - Fee Related JP5038094B2 (ja) 2007-10-31 2007-10-31 レーザー走査型顕微鏡

Country Status (2)

Country Link
US (1) US7915575B2 (enExample)
JP (1) JP5038094B2 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5363199B2 (ja) * 2009-06-04 2013-12-11 日本分光株式会社 顕微全反射測定装置
KR20130095636A (ko) * 2010-04-09 2013-08-28 노스이스턴 유니버시티 튜너블 레이저-기반 적외선 이미징 시스템 및 그것의 이용 방법
JP5653944B2 (ja) * 2011-04-12 2015-01-14 パナソニック株式会社 有機ｅｌ素子の製造方法及びレーザー焦点位置設定方法
WO2013063316A1 (en) 2011-10-25 2013-05-02 Daylight Solutions, Inc. Infrared imaging microscope
CN103676128A (zh) * 2012-09-17 2014-03-26 昆山尚达智机械有限公司 一种新型的光学比较显微仪器
JP6525161B2 (ja) 2013-04-12 2019-06-05 デイライト ソリューションズ、インコーポレイテッド 赤外光用屈折対物レンズ・アセンブリ
WO2016056148A1 (ja) * 2014-10-08 2016-04-14 オリンパス株式会社 結像光学系、照明装置および観察装置
US11506877B2 (en) 2016-11-10 2022-11-22 The Trustees Of Columbia University In The City Of New York Imaging instrument having objective axis and light sheet or light beam projector axis intersecting at less than 90 degrees
US20190101489A1 (en) * 2017-09-29 2019-04-04 Michael John Darwin Method and Apparatus for Simultaneously Measuring 3Dimensional Structures and Spectral Content of Said Structures
CN108387562B (zh) * 2018-02-02 2020-09-15 中国科学院上海光学精密机械研究所 共聚焦显微系统中针孔轴向位置的调节方法

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH036511A (ja) * 1989-06-05 1991-01-14 Nikon Corp 赤外線用可変濃度フィルタ
DE69418248T2 (de) 1993-06-03 1999-10-14 Hamamatsu Photonics Kk Optisches Laser-Abtastsystem mit Axikon
JP2931268B2 (ja) 1993-06-03 1999-08-09 浜松ホトニクス株式会社 レーザスキャン光学装置
JPH1020198A (ja) * 1996-07-02 1998-01-23 Olympus Optical Co Ltd 近赤外線顕微鏡及びこれを用いた顕微鏡観察システム
CN1145820C (zh) 1997-08-29 2004-04-14 奥林巴斯光学工业株式会社 显微镜透过明视野照明装置
JP4503716B2 (ja) * 1997-08-29 2010-07-14 オリンパス株式会社 顕微鏡透過照明装置
GB2349033B (en) * 1998-01-27 2002-06-26 Wisconsin Alumni Res Found Signal enhancement for fluorescence microscopy
DE19858206C2 (de) * 1998-12-17 2001-10-11 Leica Microsystems Verfahren zur Anpassung von Anregungsintensitäten bei einem Multiband-Fluoreszenz-Mikroskop und Multiband-Fluoreszenz-Mikroskop zur Durchführung des Verfahrens
DE10003570A1 (de) * 2000-01-27 2001-08-02 Leica Microsystems Mikroskop-Aufbau
JP2002031758A (ja) * 2000-07-17 2002-01-31 Olympus Optical Co Ltd 顕微鏡
JP2003042845A (ja) * 2001-07-30 2003-02-13 Sony Corp 光学装置
JP2003264842A (ja) * 2002-03-08 2003-09-19 Hitachi Kokusai Electric Inc フィルタ及び調光板及び固体撮像素子
JP2004302421A (ja) * 2003-03-17 2004-10-28 Nikon Corp 全反射顕微鏡
HU227859B1 (en) * 2005-01-27 2012-05-02 E Szilveszter Vizi Real-time 3d nonlinear microscope measuring system and its application
JP4512698B2 (ja) * 2005-08-30 2010-07-28 ナノフォトン株式会社 レーザ顕微鏡
US7542137B2 (en) * 2006-07-24 2009-06-02 University Of Ottawa Pathogen detection using coherent anti-stokes Raman scattering microscopy
KR100829439B1 (ko) * 2007-06-08 2008-05-15 한국표준과학연구원 적외선 사광파 혼합 편광 이미징 장치

Also Published As

Publication number Publication date
US7915575B2 (en) 2011-03-29
US20090108187A1 (en) 2009-04-30
JP2009109788A (ja) 2009-05-21

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