JP5030772B2 - コンプトン後方散乱によりx線を発生させるためのシステム及び方法 - Google Patents
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- 238000000034 method Methods 0.000 title claims description 24
- 230000003287 optical effect Effects 0.000 claims description 52
- 230000003993 interaction Effects 0.000 claims description 35
- 230000005855 radiation Effects 0.000 claims description 22
- 230000007423 decrease Effects 0.000 claims description 12
- 230000004907 flux Effects 0.000 claims description 12
- 230000004044 response Effects 0.000 claims description 9
- 230000015556 catabolic process Effects 0.000 claims description 5
- 238000006731 degradation reaction Methods 0.000 claims description 5
- 230000009467 reduction Effects 0.000 claims description 5
- 230000001360 synchronised effect Effects 0.000 claims description 5
- 238000007599 discharging Methods 0.000 claims description 2
- 238000004846 x-ray emission Methods 0.000 claims 2
- 230000003247 decreasing effect Effects 0.000 claims 1
- 238000010894 electron beam technology Methods 0.000 description 20
- 210000001624 hip Anatomy 0.000 description 14
- 230000000694 effects Effects 0.000 description 9
- 238000013461 design Methods 0.000 description 8
- 230000008569 process Effects 0.000 description 7
- 230000000737 periodic effect Effects 0.000 description 6
- 239000000758 substrate Substances 0.000 description 5
- 229910004298 SiO 2 Inorganic materials 0.000 description 4
- 230000008901 benefit Effects 0.000 description 4
- 238000002347 injection Methods 0.000 description 4
- 239000007924 injection Substances 0.000 description 4
- 239000007787 solid Substances 0.000 description 4
- 230000005469 synchrotron radiation Effects 0.000 description 4
- 238000012937 correction Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 230000010287 polarization Effects 0.000 description 3
- 238000000926 separation method Methods 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000005284 excitation Effects 0.000 description 2
- 230000036541 health Effects 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000011160 research Methods 0.000 description 2
- RMAQACBXLXPBSY-UHFFFAOYSA-N silicic acid Chemical compound O[Si](O)(O)O RMAQACBXLXPBSY-UHFFFAOYSA-N 0.000 description 2
- 235000012239 silicon dioxide Nutrition 0.000 description 2
- 230000000087 stabilizing effect Effects 0.000 description 2
- 230000001052 transient effect Effects 0.000 description 2
- 239000002699 waste material Substances 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 1
- 229910010413 TiO 2 Inorganic materials 0.000 description 1
- 238000002441 X-ray diffraction Methods 0.000 description 1
- 238000000333 X-ray scattering Methods 0.000 description 1
- 238000000441 X-ray spectroscopy Methods 0.000 description 1
- 238000002083 X-ray spectrum Methods 0.000 description 1
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- 201000009310 astigmatism Diseases 0.000 description 1
- 229910052790 beryllium Inorganic materials 0.000 description 1
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N beryllium atom Chemical compound [Be] ATBAMAFKBVZNFJ-UHFFFAOYSA-N 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
- 238000002050 diffraction method Methods 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000005251 gamma ray Effects 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000000960 laser cooling Methods 0.000 description 1
- 229910052749 magnesium Inorganic materials 0.000 description 1
- 239000011777 magnesium Substances 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 102000004169 proteins and genes Human genes 0.000 description 1
- 108090000623 proteins and genes Proteins 0.000 description 1
- 238000011084 recovery Methods 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
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- G—PHYSICS
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- G02B5/00—Optical elements other than lenses
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Description
Claims (22)
- コンプトン後方散乱によりX線を発生させるためのシステムであって、
電子バンチを誘導及び維持するように構成された電子貯蔵リングであり、前記電子バンチは、前記電子貯蔵リングの一部分に沿って配設された相互作用点を通過する安定した閉軌道内で前記電子貯蔵リングに入射され、前記電子貯蔵リング内に貯蔵された電子バンチの各々は、初期入射後に時間応答に従って低下するコンプトン後方散乱によりX線放出に関係する少なくとも1つの属性を有する、前記電子貯蔵リングと、
前記相互作用点に結合される光子パルスを発生させる光学系であり、前記光子パルスが、対応する電子バンチと前記相互作用点で相互作用するように同期されて、コンプトン後方散乱を介してX線放射を発生させる、前記光学系と、
を備え、前記光学系は、
新しい電子バンチと貯蔵された電子バンチの入射を調整し、前記電子貯蔵リング内で電子バンチを維持し、
コンプトン後方散乱によるX線の前記放出に関係する前記少なくとも1つの属性の時間にわたる前記低下を低減することにより、前記光学系のX線出力特性を改善するように選択されたスケジュールに従って、前記貯蔵された電子バンチを前記新しい電子バンチと置き換える、前記システム。 - 前記システムは、前記電子貯蔵リングが、コンプトン後方散乱に利用可能な電子バンチをほぼ連続して貯蔵するように前記スケジュールに従って、前記貯蔵された電子バンチを前記新しい電子バンチと置き換える、請求項1に記載のシステム。
- 前記システムは、前記電子貯蔵リングが、定常状態動作中のコンプトン後方散乱によるX線発生の為のほぼ100%デューティサイクルを有するように前記スケジュールに従って、前記貯蔵された電子バンチを前記新しい電子バンチと置き換える、請求項1に記載のシステム。
- 前記電子貯蔵リング内の安定した閉軌道に前記新しい電子バンチを空間的に移動させ、前記電子貯蔵リングから前記貯蔵された電子バンチを同時に排出させる高速偏向装置を更に備える、請求項1に記載のシステム。
- 時間応答に伴って低下する時定数未満の周期で、前記電子貯蔵リング内に貯蔵される電子バンチの各々を置き換えるように前記スケジュールが選択される、請求項1に記載のシステム。
- 電子バンチのビーム内散乱の低下時定数未満になるように選択された周期で、前記電子貯蔵リング内に貯蔵された電子バンチの各々が周期的に置き換えられる、請求項1に記載のシステム。
- 前記貯蔵された電子バンチの時間平均されたビームエミッタンスが、初期入射後の3倍以下に低下するように前記スケジュールが選択される、請求項1に記載のシステム。
- 前記電子貯蔵リング内の軌道を回っている電子バンチのエネルギー及び運動量の広がりを、予め選択された分より下に維持するように前記スケジュールが選択される、請求項1に記載のシステム。
- 少なくとも10Hzの割合で電子バンチを置き換えるように前記スケジュールが選択される、請求項1に記載のシステム。
- 置き換えることなく、定常状態動作に比べてX線輝度を増大させるように前記スケジュールが選択される、請求項1に記載のシステム。
- 置き換えることなく、定常状態動作に比べて、選択されたX線帯域幅内でX線束を向上させるように前記スケジュールが選択される、請求項1に記載のシステム。
- コンプトン後方散乱によってX線を発生させるための方法であって、
軌道を回る電子バンチを、相互作用点を含む電子貯蔵リングの周囲に誘導するステップであって、前記軌道を回る電子バンチは、初期入射後に時間応答に従って低下するコンプトン後方散乱によりX線の放出に関係する少なくとも1つの属性を有する、前記ステップと、
前記相互作用点に光子パルスをもたらして、コンプトン後方散乱させるステップと、
新しい電子バンチの入射と、貯蔵された電子バンチとを調整し、前記電子貯蔵リング内に、前記軌道を回る電子バンチを維持することを備え、前記軌道を回っている電子バンチをリフレッシュするステップであって、前記軌道を回る電子バンチの前記リフレッシュは、コンプトン後方散乱によるX線の放出に関係する前記軌道を回る電子バンチの少なくとも1つの属性の時間にわたる低下を低減することにより前記システムのX線出力特性を向上させるように選択されたスケジュールに従って実施される、前記ステップと、
を備える、前記方法。 - 前記軌道を回る電子バンチの前記リフレッシュは、コンプトン後方散乱に利用可能な電子バンチを前記電子貯蔵リングがほぼ連続して貯蔵するように、前記スケジュールに従って実施される、請求項12に記載の方法。
- 前記軌道を回る電子バンチの前記リフレッシュは、正常動作中のコンプトン後方散乱によりX線の発生の為のほぼ100%のデューティサイクルを前記システムが有するように、前記スケジュールに従って実施される、請求項12に記載の方法。
- 前記軌道を回る電子バンチをリフレッシュする前記ステップは、
前記軌道に前記新しい電子バンチを空間的に移動させる工程と、
前記新しい電子バンチを前記空間的に移動させることと同時に前記貯蔵された電子バンチを排出する工程と、を含む、請求項12に記載の方法。 - 前記軌道を回る電子バンチの前記リフレッシュは、前記時間応答に伴う低下時定数未満の周期で、前記電子貯蔵リング内に貯蔵された電子バンチの各々を置き換えるように前記スケジュールを選択することを含む、請求項12に記載の方法。
- 前記軌道を回る電子バンチの前記リフレッシュは、電子バンチのビーム内散乱の低下時定数未満となるように選択された周期で、前記電子貯蔵リング内に貯蔵された電子バンチの各々を周期的に置き換えることを含む、請求項12に記載の方法。
- 前記軌道を回る電子バンチの時間平均されたビームエミッタンスが、前記新しい電子バンチの初期入射後の3倍以下に低下するように前記スケジュールが選択される、請求項12に記載の方法。
- 前記軌道を回る電子バンチの前記リフレッシュは、前記軌道を回っている電子バンチのエネルギー及び運動量の広がりを、予め選択された分より下に維持するように前記スケジュールを選択することを含む、請求項12に記載の方法。
- 前記軌道を回る電子バンチの前記リフレッシュは、少なくとも10Hzの割合で電子バンチを置き換えるように前記スケジュールを選択することを含む、請求項12に記載の方法。
- 置き換えることなく、定常状態動作に比べてX線輝度を増大させるように前記スケジュールを選択することを含む、請求項12に記載の方法。
- 置き換えることなく、定常状態動作に比べて、選択されたX線帯域幅内でX線束を向上させるように前記スケジュールを選択することを含む、請求項12に記載の方法。
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US56086404P | 2004-04-09 | 2004-04-09 | |
US56101404P | 2004-04-09 | 2004-04-09 | |
US56084504P | 2004-04-09 | 2004-04-09 | |
US56084804P | 2004-04-09 | 2004-04-09 | |
US56084904P | 2004-04-09 | 2004-04-09 | |
US60/560,848 | 2004-04-09 | ||
US60/560,845 | 2004-04-09 | ||
US60/560,864 | 2004-04-09 | ||
US60/560,849 | 2004-04-09 | ||
US60/561,014 | 2004-04-09 | ||
US11/077,524 US7277526B2 (en) | 2004-04-09 | 2005-03-09 | Apparatus, system, and method for high flux, compact compton x-ray source |
US11/077,524 | 2005-03-09 | ||
PCT/US2005/012043 WO2005101926A2 (en) | 2004-04-09 | 2005-04-08 | Apparatus, system, and method for high flux, compact compton x-ray source |
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JP2007533081A JP2007533081A (ja) | 2007-11-15 |
JP5030772B2 true JP5030772B2 (ja) | 2012-09-19 |
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US (7) | US7277526B2 (ja) |
EP (1) | EP1745682B1 (ja) |
JP (1) | JP5030772B2 (ja) |
DK (1) | DK1745682T3 (ja) |
HK (1) | HK1100117A1 (ja) |
WO (3) | WO2005101925A2 (ja) |
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- 2005-04-08 US US11/101,790 patent/US7242748B2/en active Active
- 2005-04-08 US US11/102,597 patent/US20050254535A1/en not_active Abandoned
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- 2005-04-08 JP JP2007507544A patent/JP5030772B2/ja not_active Expired - Fee Related
- 2005-04-08 US US11/102,473 patent/US7301972B2/en active Active
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- 2005-04-08 WO PCT/US2005/011916 patent/WO2005112525A2/en active Application Filing
- 2005-04-08 EP EP05744868A patent/EP1745682B1/en active Active
- 2005-04-08 DK DK05744868.0T patent/DK1745682T3/da active
- 2005-04-08 WO PCT/US2005/012043 patent/WO2005101926A2/en active Application Filing
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2007
- 2007-05-21 US US11/751,545 patent/US7443956B2/en not_active Expired - Fee Related
- 2007-07-24 HK HK07108009.5A patent/HK1100117A1/xx unknown
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Also Published As
Publication number | Publication date |
---|---|
US20080031420A1 (en) | 2008-02-07 |
JP2007533081A (ja) | 2007-11-15 |
WO2005101926A2 (en) | 2005-10-27 |
EP1745682A2 (en) | 2007-01-24 |
US7295653B2 (en) | 2007-11-13 |
EP1745682B1 (en) | 2012-10-17 |
US7277526B2 (en) | 2007-10-02 |
US20050243966A1 (en) | 2005-11-03 |
US7443956B2 (en) | 2008-10-28 |
WO2005112525A3 (en) | 2007-03-29 |
WO2005101925A2 (en) | 2005-10-27 |
US20080002813A1 (en) | 2008-01-03 |
WO2005101925A3 (en) | 2007-04-05 |
US20050271185A1 (en) | 2005-12-08 |
HK1100117A1 (en) | 2007-09-07 |
US20050254534A1 (en) | 2005-11-17 |
US20050226383A1 (en) | 2005-10-13 |
DK1745682T3 (da) | 2013-01-21 |
US7301972B2 (en) | 2007-11-27 |
US7242748B2 (en) | 2007-07-10 |
WO2005101926A3 (en) | 2006-11-02 |
EP1745682A4 (en) | 2010-08-18 |
US20050254535A1 (en) | 2005-11-17 |
US7596208B2 (en) | 2009-09-29 |
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