JP5006642B2 - テラヘルツ波発振器 - Google Patents

テラヘルツ波発振器 Download PDF

Info

Publication number
JP5006642B2
JP5006642B2 JP2006349233A JP2006349233A JP5006642B2 JP 5006642 B2 JP5006642 B2 JP 5006642B2 JP 2006349233 A JP2006349233 A JP 2006349233A JP 2006349233 A JP2006349233 A JP 2006349233A JP 5006642 B2 JP5006642 B2 JP 5006642B2
Authority
JP
Japan
Prior art keywords
electrode
substrate
terahertz wave
electromagnetic wave
oscillator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2006349233A
Other languages
English (en)
Japanese (ja)
Other versions
JP2008010811A5 (enExample
JP2008010811A (ja
Inventor
泰史 小山
健明 井辻
敏彦 尾内
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2006349233A priority Critical patent/JP5006642B2/ja
Priority to US11/751,517 priority patent/US7622999B2/en
Publication of JP2008010811A publication Critical patent/JP2008010811A/ja
Publication of JP2008010811A5 publication Critical patent/JP2008010811A5/ja
Priority to US12/606,304 priority patent/US7952441B2/en
Application granted granted Critical
Publication of JP5006642B2 publication Critical patent/JP5006642B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
    • H03B5/00—Generation of oscillations using amplifier with regenerative feedback from output to input
    • H03B5/18—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising distributed inductance and capacitance
    • H03B5/1841—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising distributed inductance and capacitance the frequency-determining element being a strip line resonator
    • H03B5/1847—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising distributed inductance and capacitance the frequency-determining element being a strip line resonator the active element in the amplifier being a semiconductor device
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
    • H03B7/00—Generation of oscillations using active element having a negative resistance between two of its electrodes
    • H03B7/02—Generation of oscillations using active element having a negative resistance between two of its electrodes with frequency-determining element comprising lumped inductance and capacitance
    • H03B7/06—Generation of oscillations using active element having a negative resistance between two of its electrodes with frequency-determining element comprising lumped inductance and capacitance active element being semiconductor device
    • H03B7/08—Generation of oscillations using active element having a negative resistance between two of its electrodes with frequency-determining element comprising lumped inductance and capacitance active element being semiconductor device being a tunnel diode

Landscapes

  • Variable-Direction Aerials And Aerial Arrays (AREA)
  • Inductance-Capacitance Distribution Constants And Capacitance-Resistance Oscillators (AREA)
  • Waveguide Aerials (AREA)
JP2006349233A 2006-05-31 2006-12-26 テラヘルツ波発振器 Active JP5006642B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2006349233A JP5006642B2 (ja) 2006-05-31 2006-12-26 テラヘルツ波発振器
US11/751,517 US7622999B2 (en) 2006-05-31 2007-05-21 Electromagnetic-wave oscillator
US12/606,304 US7952441B2 (en) 2006-05-31 2009-10-27 Electromagnetic-wave oscillator

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2006150924 2006-05-31
JP2006150924 2006-05-31
JP2006349233A JP5006642B2 (ja) 2006-05-31 2006-12-26 テラヘルツ波発振器

Publications (3)

Publication Number Publication Date
JP2008010811A JP2008010811A (ja) 2008-01-17
JP2008010811A5 JP2008010811A5 (enExample) 2009-05-07
JP5006642B2 true JP5006642B2 (ja) 2012-08-22

Family

ID=38789402

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006349233A Active JP5006642B2 (ja) 2006-05-31 2006-12-26 テラヘルツ波発振器

Country Status (2)

Country Link
US (2) US7622999B2 (enExample)
JP (1) JP5006642B2 (enExample)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4390147B2 (ja) * 2005-03-28 2009-12-24 キヤノン株式会社 周波数可変発振器
JP4773839B2 (ja) * 2006-02-15 2011-09-14 キヤノン株式会社 対象物の情報を検出する検出装置
JP5028068B2 (ja) * 2006-05-31 2012-09-19 キヤノン株式会社 アクティブアンテナ発振器
JP4861220B2 (ja) * 2006-08-28 2012-01-25 キヤノン株式会社 電磁波を用いた検査装置
JP4963640B2 (ja) * 2006-10-10 2012-06-27 キヤノン株式会社 物体情報取得装置及び方法
JP5031330B2 (ja) * 2006-11-15 2012-09-19 キヤノン株式会社 検体分析装置、及び検体分析方法
JP5035618B2 (ja) * 2006-12-05 2012-09-26 独立行政法人理化学研究所 電磁波を用いた検出方法、及び検出装置
JP5037929B2 (ja) * 2006-12-18 2012-10-03 キヤノン株式会社 テラヘルツ波を用いた対象物の情報取得装置及び方法
JP4977048B2 (ja) * 2007-02-01 2012-07-18 キヤノン株式会社 アンテナ素子
JP5043488B2 (ja) 2007-03-30 2012-10-10 キヤノン株式会社 検出装置、及びイメージング装置
EP2031374B1 (en) * 2007-08-31 2012-10-10 Canon Kabushiki Kaisha Apparatus and method for obtaining information related to terahertz waves
JP5328265B2 (ja) * 2008-08-25 2013-10-30 キヤノン株式会社 テラヘルツ波発生素子、及びテラヘルツ波発生装置
US9035258B2 (en) 2011-01-08 2015-05-19 Canon Kabushiki Kaisha Tomography apparatus and electromagnetic pulse transmitting apparatus
JP5735824B2 (ja) * 2011-03-04 2015-06-17 キヤノン株式会社 情報取得装置及び情報取得方法
JP6282029B2 (ja) * 2012-03-08 2018-02-21 キヤノン株式会社 電磁波を放射または受信する装置
JP6280310B2 (ja) * 2012-06-06 2018-02-14 キヤノン株式会社 発振器
JP6373010B2 (ja) * 2013-03-12 2018-08-15 キヤノン株式会社 発振素子
JP6282041B2 (ja) * 2013-03-29 2018-02-21 キヤノン株式会社 発振器
WO2016067906A1 (ja) * 2014-10-30 2016-05-06 三菱電機株式会社 アレイアンテナ装置およびその製造方法
KR101888869B1 (ko) * 2017-02-06 2018-08-16 광주과학기술원 공간 광 변조기
FR3083002B1 (fr) * 2018-06-20 2020-07-31 Aledia Dispositif optoelectronique comprenant une matrice de diodes
JP7208032B2 (ja) 2019-01-28 2023-01-18 キヤノン株式会社 半導体装置
JP7395281B2 (ja) * 2019-08-23 2023-12-11 キヤノン株式会社 素子
JP7493922B2 (ja) 2019-08-26 2024-06-03 キヤノン株式会社 発振器、撮像装置
JP7317653B2 (ja) * 2019-09-24 2023-07-31 キヤノン株式会社 素子
JP7748328B2 (ja) * 2022-04-15 2025-10-02 キヤノン株式会社 アンテナ装置、通信装置、および撮像システム
US12273146B1 (en) * 2023-06-01 2025-04-08 Darwin Hu Apparatus embedded with terahertz transceivers using Gunn diodes

Family Cites Families (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3611146A (en) * 1969-05-20 1971-10-05 Westinghouse Electric Corp Integrated microwave radiator and generator
US3659222A (en) * 1970-09-01 1972-04-25 Rca Corp High efficiency mode avalanche diode oscillator
US4232277A (en) * 1979-03-09 1980-11-04 The United States Of America As Represented By The Secretary Of The Army Microwave oscillator for microwave integrated circuit applications
NL1000329C2 (nl) * 1995-05-09 1996-11-12 Imec Vzw Interuniversitair Mic Geïntegreerd oscillatorcircuit en werkwijzen voor het vervaardigen, respectievelijk het ontwerpen daarvan.
JP2002134810A (ja) * 2000-10-27 2002-05-10 New Japan Radio Co Ltd ガンダイオード
KR100787988B1 (ko) 2003-06-25 2007-12-24 캐논 가부시끼가이샤 고주파 전기 신호 제어 장치 및 센싱 시스템
JP4533044B2 (ja) 2003-08-27 2010-08-25 キヤノン株式会社 センサ
JP4136858B2 (ja) 2003-09-12 2008-08-20 キヤノン株式会社 位置検出装置、及び情報入力装置
JP2005123385A (ja) * 2003-10-16 2005-05-12 Matsushita Electric Ind Co Ltd 半導体装置
JP2005123458A (ja) * 2003-10-17 2005-05-12 Matsushita Electric Ind Co Ltd 半導体装置
JP2005157601A (ja) 2003-11-25 2005-06-16 Canon Inc 電磁波による積層状物体計数装置及び計数方法
JP4217646B2 (ja) 2004-03-26 2009-02-04 キヤノン株式会社 認証方法及び認証装置
JP4546326B2 (ja) 2004-07-30 2010-09-15 キヤノン株式会社 センシング装置
JP3913253B2 (ja) * 2004-07-30 2007-05-09 キヤノン株式会社 光半導体装置およびその製造方法
JP2006121643A (ja) 2004-09-21 2006-05-11 Canon Inc 平面アンテナ
JP4878180B2 (ja) 2005-03-24 2012-02-15 キヤノン株式会社 電磁波を用いる検査装置
JP4390147B2 (ja) 2005-03-28 2009-12-24 キヤノン株式会社 周波数可変発振器
JP4250603B2 (ja) 2005-03-28 2009-04-08 キヤノン株式会社 テラヘルツ波の発生素子、及びその製造方法
JP2006275910A (ja) 2005-03-30 2006-10-12 Canon Inc 位置センシング装置及び位置センシング方法
JP4402026B2 (ja) 2005-08-30 2010-01-20 キヤノン株式会社 センシング装置
JP4773839B2 (ja) 2006-02-15 2011-09-14 キヤノン株式会社 対象物の情報を検出する検出装置
JP4732201B2 (ja) 2006-03-17 2011-07-27 キヤノン株式会社 電磁波を用いたセンシング装置
JP5132146B2 (ja) 2006-03-17 2013-01-30 キヤノン株式会社 分析方法、分析装置、及び検体保持部材
JP4481946B2 (ja) 2006-03-17 2010-06-16 キヤノン株式会社 検出素子及び画像形成装置
JP4898472B2 (ja) 2006-04-11 2012-03-14 キヤノン株式会社 検査装置
JP4709059B2 (ja) 2006-04-28 2011-06-22 キヤノン株式会社 検査装置及び検査方法
JP4829669B2 (ja) 2006-04-28 2011-12-07 キヤノン株式会社 検体情報取得装置、及び検体情報取得方法
JP5028068B2 (ja) 2006-05-31 2012-09-19 キヤノン株式会社 アクティブアンテナ発振器
JP5196750B2 (ja) 2006-08-25 2013-05-15 キヤノン株式会社 発振素子
JP4861220B2 (ja) 2006-08-28 2012-01-25 キヤノン株式会社 電磁波を用いた検査装置
JP5031330B2 (ja) 2006-11-15 2012-09-19 キヤノン株式会社 検体分析装置、及び検体分析方法

Also Published As

Publication number Publication date
US20100045392A1 (en) 2010-02-25
US20070279136A1 (en) 2007-12-06
US7952441B2 (en) 2011-05-31
JP2008010811A (ja) 2008-01-17
US7622999B2 (en) 2009-11-24

Similar Documents

Publication Publication Date Title
JP5006642B2 (ja) テラヘルツ波発振器
Koyama et al. A high-power terahertz source over 10 mW at 0.45 THz using an active antenna array with integrated patch antennas and resonant-tunneling diodes
JP5028068B2 (ja) アクティブアンテナ発振器
JP5612842B2 (ja) 発振器
JP5717336B2 (ja) 発振器
US7570216B2 (en) Antenna device
US9041415B2 (en) Waveguide, method of manufacturing the same, and electromagnetic wave analysis apparatus
JP7686731B2 (ja) 素子
US9236833B2 (en) Electromagnetic wave generation device and detection device
JP5808560B2 (ja) テラヘルツ発振検出素子
JP2013236326A (ja) 発振素子、受信素子、及び測定装置
US8319565B2 (en) Resonator tunnel device
JP5958890B2 (ja) テラヘルツ検出素子
JP5129443B2 (ja) ミリ波及びサブミリ波用電磁波を生成する量子井戸共鳴トンネルジェネレータを安定化するマイクロストリップ
JP2012191520A (ja) テラヘルツ無線通信方式
WO2022024788A1 (ja) 半導体素子
Hirata et al. A 120-GHz microstrip antenna monolithically integrated with a photodiode on Si
Alharbi High performance terahertz resonant tunnelling diode sources and broadband antenna for air-side radiation
JP2006013405A (ja) 電磁波発生・検出素子およびその製造方法
JP7744871B2 (ja) アンテナ装置、通信装置、および撮像システム
Kim et al. Quantum-dot laser coupled bowtie antenna
JP2011155433A (ja) 発振素子

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20090319

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20090319

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20120306

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20120426

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20120522

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20120525

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20150601

Year of fee payment: 3

R151 Written notification of patent or utility model registration

Ref document number: 5006642

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R151

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20150601

Year of fee payment: 3

RD03 Notification of appointment of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: R3D03