JP4878180B2 - 電磁波を用いる検査装置 - Google Patents

電磁波を用いる検査装置 Download PDF

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Publication number
JP4878180B2
JP4878180B2 JP2006056493A JP2006056493A JP4878180B2 JP 4878180 B2 JP4878180 B2 JP 4878180B2 JP 2006056493 A JP2006056493 A JP 2006056493A JP 2006056493 A JP2006056493 A JP 2006056493A JP 4878180 B2 JP4878180 B2 JP 4878180B2
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specimen
inspection apparatus
substrate
unit
wave
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JP2006300925A5 (enExample
JP2006300925A (ja
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健明 井辻
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Canon Inc
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Canon Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Toxicology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2006056493A 2005-03-24 2006-03-02 電磁波を用いる検査装置 Expired - Fee Related JP4878180B2 (ja)

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JP2006056493A JP4878180B2 (ja) 2005-03-24 2006-03-02 電磁波を用いる検査装置

Applications Claiming Priority (3)

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JP2005087326 2005-03-24
JP2005087326 2005-03-24
JP2006056493A JP4878180B2 (ja) 2005-03-24 2006-03-02 電磁波を用いる検査装置

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JP2006300925A JP2006300925A (ja) 2006-11-02
JP2006300925A5 JP2006300925A5 (enExample) 2009-12-17
JP4878180B2 true JP4878180B2 (ja) 2012-02-15

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JP2006056493A Expired - Fee Related JP4878180B2 (ja) 2005-03-24 2006-03-02 電磁波を用いる検査装置

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US (1) US7633299B2 (enExample)
EP (1) EP1864111B1 (enExample)
JP (1) JP4878180B2 (enExample)
AT (1) ATE441847T1 (enExample)
DE (1) DE602006008908D1 (enExample)
WO (1) WO2006101252A1 (enExample)

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US8548415B2 (en) * 2004-12-16 2013-10-01 Northrop Grumman Systems Corporation Carbon nanotube devices and method of fabricating the same
JP4636917B2 (ja) * 2005-03-28 2011-02-23 キヤノン株式会社 検体保持用のデバイス、それを用いた検体検出装置及び検体検出方法
JP5006642B2 (ja) * 2006-05-31 2012-08-22 キヤノン株式会社 テラヘルツ波発振器
JP4398972B2 (ja) 2006-12-11 2010-01-13 株式会社東芝 電磁波センサ、撮像素子及び撮像装置
JP4977048B2 (ja) * 2007-02-01 2012-07-18 キヤノン株式会社 アンテナ素子
JP5186176B2 (ja) * 2007-10-19 2013-04-17 株式会社ジェーシービー 認証システム及び認証用可搬媒体
JP4807707B2 (ja) * 2007-11-30 2011-11-02 キヤノン株式会社 波形情報取得装置
JP4975000B2 (ja) * 2007-12-07 2012-07-11 キヤノン株式会社 電磁波発生素子、電磁波集積素子、及び電磁波検出装置
JP4975001B2 (ja) * 2007-12-28 2012-07-11 キヤノン株式会社 波形情報取得装置及び波形情報取得方法
JP5341488B2 (ja) 2008-01-18 2013-11-13 キヤノン株式会社 テラヘルツ波を測定するための装置及び方法
JP5328319B2 (ja) * 2008-01-29 2013-10-30 キヤノン株式会社 テラヘルツ波を用いた検査装置及び検査方法
JP5328265B2 (ja) * 2008-08-25 2013-10-30 キヤノン株式会社 テラヘルツ波発生素子、及びテラヘルツ波発生装置
US8113427B2 (en) * 2008-12-18 2012-02-14 Ncr Corporation Methods and apparatus for automated product identification in point of sale applications
JP5632599B2 (ja) 2009-09-07 2014-11-26 キヤノン株式会社 発振器
JP5735824B2 (ja) 2011-03-04 2015-06-17 キヤノン株式会社 情報取得装置及び情報取得方法
JP5799538B2 (ja) * 2011-03-18 2015-10-28 セイコーエプソン株式会社 テラヘルツ波発生装置、カメラ、イメージング装置、計測装置および光源装置
JP6214201B2 (ja) * 2013-05-02 2017-10-18 キヤノン株式会社 画像取得装置
DE102013213233A1 (de) * 2013-07-05 2015-01-08 Bayerische Motoren Werke Aktiengesellschaft Verfahren zum Herstellen eines Gehäuses mit einer Schirmung vor elektrischer und/oder magnetischer Strahlung und Gehäuse mit Schirmung vor elektrischer und/oder magnetischer Strahlung
JP2015087163A (ja) * 2013-10-29 2015-05-07 パイオニア株式会社 テラヘルツ波計測装置
CN104132894B (zh) * 2014-06-12 2017-01-11 清华大学 一种用于模拟太赫兹大气传播的实验装置及方法
KR20190056771A (ko) * 2017-11-17 2019-05-27 현대자동차주식회사 수밀 검사 장치 및 방법
JP7362409B2 (ja) 2019-10-17 2023-10-17 キヤノン株式会社 照明装置およびカメラシステム
WO2021124563A1 (ja) * 2019-12-20 2021-06-24 日本電信電話株式会社 誘電率測定方法、誘電率測定装置及び誘電率測定プログラム
CN113219223B (zh) * 2021-03-15 2022-02-01 北京航空航天大学 一种全封闭矩形太赫兹暗室
JP2023157737A (ja) 2022-04-15 2023-10-26 キヤノン株式会社 アンテナ装置、通信装置、及び、撮像システム

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JPH0618421A (ja) 1992-06-30 1994-01-25 Toshiba Corp 溶液成分センサ
US5623145A (en) 1995-02-15 1997-04-22 Lucent Technologies Inc. Method and apparatus for terahertz imaging
DE29711571U1 (de) * 1997-07-02 1998-11-05 Tews Elektronik Dipl.-Ing. Manfred Tews, 22459 Hamburg Feuchte- und Dichtesensor
US6448553B1 (en) * 1999-04-26 2002-09-10 Canon Kabushiki Kaisha Signal detector to be used with scanning probe and atomic force microscope
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JP3477496B2 (ja) 2001-02-27 2003-12-10 独立行政法人通信総合研究所 電磁波検出装置および検出方法
JP2002310882A (ja) * 2001-04-17 2002-10-23 Canon Inc 走査型プローブによる信号検出装置、該装置によるプローブ顕微鏡、及び走査型プローブによる信号検出方法、該方法を用いてサンプル表面を観察する観察方法
US6846454B2 (en) * 2001-12-24 2005-01-25 Agilent Technologies, Inc. Fluid exit in reaction chambers
JP4588947B2 (ja) * 2001-12-28 2010-12-01 日本電波工業株式会社 コプレーナライン型の高周波発振器
US6815683B2 (en) * 2002-05-31 2004-11-09 New Jersey Institute Of Technology Terahertz imaging system and method
JP3764711B2 (ja) * 2002-08-27 2006-04-12 株式会社東芝 管状バイオ検知システム
JP3877661B2 (ja) * 2002-08-29 2007-02-07 三洋電機株式会社 マイクロ化学分析装置
JP4183546B2 (ja) * 2003-04-11 2008-11-19 独立行政法人理化学研究所 テラヘルツ波光学系
US7230244B2 (en) * 2003-05-16 2007-06-12 Sarnoff Corporation Method and apparatus for the detection of terahertz radiation absorption
KR100787988B1 (ko) * 2003-06-25 2007-12-24 캐논 가부시끼가이샤 고주파 전기 신호 제어 장치 및 센싱 시스템
JP3950820B2 (ja) * 2003-06-25 2007-08-01 キヤノン株式会社 高周波電気信号制御装置及びセンシングシステム
JP4533044B2 (ja) * 2003-08-27 2010-08-25 キヤノン株式会社 センサ
JP4136858B2 (ja) * 2003-09-12 2008-08-20 キヤノン株式会社 位置検出装置、及び情報入力装置
JP4217646B2 (ja) * 2004-03-26 2009-02-04 キヤノン株式会社 認証方法及び認証装置
JP5166024B2 (ja) * 2004-05-26 2013-03-21 ピコメトリクス、エルエルシー 荷物及び人を検査するための反射及び透過モードのテラヘルツ画像化
JP3913253B2 (ja) * 2004-07-30 2007-05-09 キヤノン株式会社 光半導体装置およびその製造方法
JP2006121643A (ja) * 2004-09-21 2006-05-11 Canon Inc 平面アンテナ
JP4898472B2 (ja) * 2006-04-11 2012-03-14 キヤノン株式会社 検査装置

Also Published As

Publication number Publication date
EP1864111B1 (en) 2009-09-02
JP2006300925A (ja) 2006-11-02
DE602006008908D1 (de) 2009-10-15
US20090009190A1 (en) 2009-01-08
US7633299B2 (en) 2009-12-15
WO2006101252A1 (en) 2006-09-28
EP1864111A1 (en) 2007-12-12
ATE441847T1 (de) 2009-09-15

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