JP4869734B2 - 多光子励起走査型レーザ顕微鏡 - Google Patents

多光子励起走査型レーザ顕微鏡 Download PDF

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Publication number
JP4869734B2
JP4869734B2 JP2006046768A JP2006046768A JP4869734B2 JP 4869734 B2 JP4869734 B2 JP 4869734B2 JP 2006046768 A JP2006046768 A JP 2006046768A JP 2006046768 A JP2006046768 A JP 2006046768A JP 4869734 B2 JP4869734 B2 JP 4869734B2
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pulse laser
ultrashort pulse
wavelength
optical system
laser beam
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JP2006330685A5 (enExample
JP2006330685A (ja
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博一 久保
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Olympus Corp
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Olympus Corp
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Priority to US11/407,300 priority patent/US7329880B2/en
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/44—Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
    • G01J3/4406—Fluorescence spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/008—Details of detection or image processing, including general computer control
    • G02B21/0084—Details of detection or image processing, including general computer control time-scale detection, e.g. strobed, ultra-fast, heterodyne detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06113—Coherent sources; lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/08—Optical fibres; light guides

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Optics & Photonics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Engineering & Computer Science (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP2006046768A 2005-04-25 2006-02-23 多光子励起走査型レーザ顕微鏡 Expired - Fee Related JP4869734B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2006046768A JP4869734B2 (ja) 2005-04-25 2006-02-23 多光子励起走査型レーザ顕微鏡
US11/407,300 US7329880B2 (en) 2005-04-25 2006-04-19 Multiphoton-excitation laser scanning microscope

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2005126592 2005-04-25
JP2005126592 2005-04-25
JP2006046768A JP4869734B2 (ja) 2005-04-25 2006-02-23 多光子励起走査型レーザ顕微鏡

Publications (3)

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JP2006330685A JP2006330685A (ja) 2006-12-07
JP2006330685A5 JP2006330685A5 (enExample) 2009-04-09
JP4869734B2 true JP4869734B2 (ja) 2012-02-08

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JP2006046768A Expired - Fee Related JP4869734B2 (ja) 2005-04-25 2006-02-23 多光子励起走査型レーザ顕微鏡

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US (1) US7329880B2 (enExample)
JP (1) JP4869734B2 (enExample)

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JP4759425B2 (ja) * 2006-03-28 2011-08-31 オリンパス株式会社 多光子励起型観察装置
US20080001320A1 (en) * 2006-06-28 2008-01-03 Knox Wayne H Optical Material and Method for Modifying the Refractive Index
JP4855237B2 (ja) * 2006-12-20 2012-01-18 オリンパス株式会社 顕微鏡画像処理装置および顕微鏡画像処理プログラム
JP2008185432A (ja) * 2007-01-30 2008-08-14 Yokogawa Electric Corp 創薬スクリーニング装置
EP1959292A3 (en) * 2007-02-13 2009-06-17 Olympus Corporation Laser microscope
JP5096760B2 (ja) * 2007-02-23 2012-12-12 オリンパス株式会社 顕微鏡用照明装置および蛍光顕微鏡装置
JP2008225095A (ja) * 2007-03-13 2008-09-25 Olympus Corp 光走査型観察装置
JP5281756B2 (ja) * 2007-04-13 2013-09-04 オリンパス株式会社 走査型光学装置および観察方法
JP5307439B2 (ja) * 2007-04-23 2013-10-02 オリンパス株式会社 レーザ顕微鏡
DE102007028337B4 (de) 2007-06-15 2019-08-29 Leica Microsystems Cms Gmbh Strahlvereiniger und eine Lichtquelle mit einem derartigen Strahlvereiniger
CN101889192B (zh) * 2007-10-25 2012-07-04 纽约州立大学研究基金会 光子光谱仪
JP5185695B2 (ja) * 2008-05-23 2013-04-17 オリンパス株式会社 レーザ顕微鏡装置及び標本画像取得方法
JP5203063B2 (ja) 2008-06-24 2013-06-05 オリンパス株式会社 多光子励起測定装置
US8946655B2 (en) 2009-09-28 2015-02-03 Purdue Research Foundation Multiphoton luminescence imaging of protein crystals
DE102009048710B4 (de) * 2009-10-08 2020-04-02 Leica Microsystems Cms Gmbh Lasersystem für ein Mikroskop und Verfahren zum Betreiben eines Lasersystems für ein Mikroskop
EP2312367A1 (en) * 2009-10-16 2011-04-20 Olympus Corporation Laser scanning microscope
WO2011056658A1 (en) * 2009-10-27 2011-05-12 Duke University Multi-photon microscopy via air interface objective lens
JP2011128288A (ja) * 2009-12-16 2011-06-30 Nikon Corp パルス分割装置、多光子顕微鏡、および、パルス分割素子
JP2011128287A (ja) * 2009-12-16 2011-06-30 Nikon Corp 多光子顕微鏡
KR101200536B1 (ko) * 2010-05-26 2012-11-13 한국과학기술연구원 바이오 물질을 검출하는 빔 스캐닝 시스템
ITRM20100286A1 (it) * 2010-05-28 2011-11-29 Consiglio Nazionale Ricerche Microscopio confocale spettrale in riflettanza a larga banda.
DE102010047237B4 (de) 2010-08-13 2021-07-01 Leica Microsystems Cms Gmbh Verfahren zum Trennen von Detektionssignalen im Strahlengang einer optischen Einrichtung
DE102010037190B4 (de) * 2010-08-27 2015-11-26 Leica Microsystems Cms Gmbh Vorrichtung zum zeitlichen Verschieben von Weißlichtlaserpulsen
US9494781B2 (en) * 2011-01-19 2016-11-15 California Institute Of Technology Plane-projection multi-photon microscopy
DE102011000905A1 (de) 2011-02-24 2012-08-30 Leica Microsystems Cms Gmbh Pulsvereiniger für die verschiedenen Spektralfarben eines Superkontinuum-Lasers
JP5616824B2 (ja) 2011-03-10 2014-10-29 オリンパス株式会社 顕微鏡装置
JP5839897B2 (ja) * 2011-09-02 2016-01-06 オリンパス株式会社 非線形光学顕微鏡
DE102012009780A1 (de) * 2012-05-18 2013-11-21 Leica Microsystems Cms Gmbh Verfahren und Vorrichtung zum Untersuchen einer Probe
JP6501451B2 (ja) * 2014-03-31 2019-04-17 キヤノン株式会社 光源装置およびそれを用いた情報取得装置
US9653867B2 (en) 2014-04-04 2017-05-16 Coherent, Inc. Multi-wavelength source of femtosecond infrared pulses
CN115166959A (zh) * 2015-06-25 2022-10-11 Nkt光子学有限公司 传输光纤组件和宽带光源
CN106444245A (zh) * 2016-08-26 2017-02-22 湖北久之洋红外系统股份有限公司 一种无散斑三基色激光光源
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US7329880B2 (en) 2008-02-12
US20060237666A1 (en) 2006-10-26
JP2006330685A (ja) 2006-12-07

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